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    • 6. 发明专利
    • GAS LASER OSCILLATING EQUIPMENT
    • JPH0362580A
    • 1991-03-18
    • JP19674189
    • 1989-07-31
    • TOSHIBA CORP
    • SUMINO TSUTOMUGOTO TATSUMI
    • H01S3/038H01S3/097H01S3/0971
    • PURPOSE:To increase preliminary ionization capability by arranging a third electrode between a first and a second electrode facing each other, and generating main discharge between the second and the third electrode with charged particles generated by the preliminary ionization between the first and the third electrode. CONSTITUTION:When a switch of a charging and discharging circuit 20 is opened, a charging and discharging capacitor C10 is charged. By closing a switch 21, the charge stored in the capacitor C10 transfers to each of the discharging capacitors CP1, CP2. As the result of the above transfer, corona discharge generates between a lead wire 13 and a glass tube 14. By this corona discharge, trigger discharge is induced in a discharging space A between the first electrode 10 and the third electrode 12, and charged particles are supplied to a discharging space B. Since, in the above state, a high voltage is applied between the second electrode 11 and the third electrode 12 from a high voltage power supply H.V, gas laser medium between the electrodes 11 and 12 is excited, so that main discharge generates between the electrode 11 and the electrode 12. By this constitution, preliminary ionization capability is increased, and the life of the glass tube 14 is lengthened.
    • 7. 发明专利
    • GAS LASER OSCILLATION DEVICE
    • JPH02292878A
    • 1990-12-04
    • JP11376589
    • 1989-05-08
    • TOSHIBA CORP
    • SUMINO TSUTOMUUCHIDA YUTAKA
    • G01R31/24H01S3/00
    • PURPOSE:To obtain a gas laser oscillation device which is provided with a pair of plate-like primary discharge electrodes and a means capable of surely detecting an arc discharge occurring in the device by a method wherein a detecting means which detects the discharge sound of the primary electrodes, a frequency analyzer, and a discriminating section which discriminates a discharge state by comparing the waveform of the discharge sound with a reference waveform are provided. CONSTITUTION:In a gas laser oscillation device provided with, at least, a pair of primary electrodes 4 and 5 which are provided in a hermetically sealed vessel 1 facing each other and excite gas laser medium filled in the hermetically sealed vessel 1, a detecting means 11 which detects the discharge sound of the electrodes 4 and 5, a frequency analyzer 12 which analyzes the frequency of the discharge sound detected by the detecting means 11, and a discriminating section 13 which discriminates a discharge state by comparing the waveform of the discharge sound obtained by the frequency analyzer 12 with a reference waveform are provided. For instance, a detecting means which detects a discharge state picking a discharge sound is composed of a microphone 11, the frequency analyzer 12, and the discriminating section 13 which discriminates a discharge state comparing the waveform signal transmitted from the frequency analyzer 12 with the waveform of frequency at the start of an arc as a reference signal and transmits a control signal to a control section 10.
    • 8. 发明专利
    • LASER OSCILLATION DEVICE
    • JPH02218186A
    • 1990-08-30
    • JP3823789
    • 1989-02-20
    • TOSHIBA CORP
    • UCHIDA YUTAKASUMINO TSUTOMUSATO SABURO
    • H01S3/08H01S3/105H01S3/1055
    • PURPOSE:To make it possible to select a prescribed wavelength by a simple operation by a method wherein a high-reflecting mirror is constituted of a first high-reflecting surface part, which faces a diffraction grating in parallel on a resonance axis, and a second high-reflecting surface part to reflect a laser beam, which is diffracted by the diffraction grating and has a prescribed wavelength, to the incident optical path of this laser beam. CONSTITUTION:A high-reflecting mirror 12 faces the surface 13a of a diffraction grating 13 in parallel and is constituted of a first high-reflecting surface part 12a provided on the axial line of a gas laser tube 10 and a second high-reflecting surface part 12b provided in such a way as to be able to adjust freely its angle. As this part 12b reflects a laser beam, which is diffracted by the grating 13 and has a prescribed wavelength, to the diffracting optical path of this laser beam, an optical axis set on the part 12a at the time of optical axis adjustment can be preserved. Thereby, the grating 13 can be installed intact on the optical axis subjected to optical axis adjustment by the laser beam and a complicated optical axis adjustment operation in a laser oscillation of a selection of wavelength can be dissolved.
    • 9. 发明专利
    • Laser annealing method, laser annealing device, and manufacturing method for thin-film transistor
    • 激光退火方法,激光退火装置和薄膜晶体管的制造方法
    • JP2013191743A
    • 2013-09-26
    • JP2012057269
    • 2012-03-14
    • Toshiba Corp株式会社東芝
    • SUMINO TSUTOMUTOGAWA RYUICHIITO HIROSHI
    • H01L21/20H01L21/268H01L21/336H01L29/786
    • H01L21/2636B23K26/0066B23K26/0738B23K26/083C30B1/02C30B1/023C30B28/08C30B29/06C30B35/00H01L21/268
    • PROBLEM TO BE SOLVED: To provide a laser annealing method that predicts process results from an intensity distribution of a laser beam and can detect a state having a high probability that grains outside a range of a desired grain size are generated, and further to provide a laser annealing device and a manufacturing method for a thin-film transistor.SOLUTION: A laser annealing method includes the steps of: detecting an intensity distribution of a laser beam emitted from a laser device and formed as a line beam by a line beam optical system emitted from a laser device; dividing a width of the line beam in a short axis direction in the detected intensity distribution by dividing the width by a number of times of irradiation per one place; and calculating an increased amount of a grain size of an amorphous thin film with respect to energy density corresponding to a peak value of the divided intensity distribution and adding the increased amount by a number of times of pulse irradiation. In a case where the energy density of the laser beam is greater than a threshold value by which the grain size of the amorphous thin film is changed to be decreased, the increased amount added before the energy density is greater than the threshold value is made zero.
    • 要解决的问题:提供一种激光退火方法,其从激光束的强度分布预测过程结果,并且可以检测产生具有期望晶粒尺寸范围之外的晶粒的可能性高的状态,并且还可以提供 激光退火装置和薄膜晶体管的制造方法。解决方案:激光退火方法包括以下步骤:检测从激光装置发射的激光束的强度分布并通过线束光学系统形成为线束 从激光装置发射; 通过将宽度除以每一次的照射次数,将检测的强度分布中的线束的宽度沿短轴方向分割; 并计算相对于与分割强度分布的峰值对应的能量密度的非晶薄膜的晶粒尺寸的增加量,并且将增加的量加上脉冲照射次数。 在激光束的能量密度大于非晶态薄膜的晶粒尺寸变化的阈值的情况下,在能量密度大于阈值之前添加的增加量为零 。