会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明专利
    • ELECTRON BEAM-EXCITED ION SOURCE
    • JPS63190229A
    • 1988-08-05
    • JP2130287
    • 1987-01-31
    • TOKYO ELECTRON LTDRIKAGAKU KENKYUSHO
    • ISHII NOBUOTAKAYAMA NAOKIKAWAMURA GOHEIHARA TAMIOHAMAGAKI MANABUNANBA SUSUMUAOYANAGI KATSUNOBU
    • H05H1/24H01J27/20H01J37/08
    • PURPOSE:To efficiently generate a large quantity of ions and obtain an ion beam with low energy and a large current by providing an ion generation chamber, a means radiating an electron beam to generate ions, and a means forming the multi-pole magnetic field in the chamber. CONSTITUTION:An anode 2 made of a Mo thin plate disk arranged with many small through holes 2b, 3b except on the periphery and an accelerating electrode 3 are arranged at a fixed distance in an enclosed container 1. A cathode tube 4 made of Ta with a through hole 5 is arranged on a side wall 1a facing the electrode 2. A conductive plate with a narrow path 6 (fine hole) is inserted between the electrodes 4 and 2, and the most portion of the anode 2 side is covered with an insulating material 7. Ar is introduced through the electrode 4, and the discharge voltage 8 is applied across the electrodes 4 and 2 to generate plasma. The electrode 3 extracts and accelerates electrons and feeds them into a chamber 10. Many permanent magnets 10a with different polarity at adjacent positions are arranged on the conductor wall of the chamber 10 having the same potential as the electrode 3, As gas is fed, the introduced electron beam collides with As molecules to generate dense plasma, which is enclosed by the magnets 10a and extracted through slits 11, 12.