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    • 4. 发明专利
    • Tester and semiconductor device test apparatus with the same
    • 测试仪和半导体器件测试装置
    • JP2011039048A
    • 2011-02-24
    • JP2010173637
    • 2010-08-02
    • Samsung Electronics Co Ltd三星電子株式会社Samsung Electronics Co.,Ltd.
    • KIM BYOUNG-JOOHWANG INSEOKKIM JUNG-WOO
    • G01R31/28G01R1/073H01L21/66
    • G01R31/2891
    • PROBLEM TO BE SOLVED: To provide a tester capable of maintaining the horizontality of a prober, and a semiconductor device test apparatus having such a tester.
      SOLUTION: The tester and the semiconductor device test apparatus having such a tester are characterized in that a leveling unit provided on the base of a tester head maintains the horizontality of a probe card by applying a load to a top surface of the probe card in a downward direction. According to such a characteristic, bending of the probe card is prevented and thus contact between the probers of the probe card and the electrode terminals of semiconductor devices can reliably be realized, whereby the reliability of the electrical property inspection of the semiconductor devices is improved.
      COPYRIGHT: (C)2011,JPO&INPIT
    • 要解决的问题:提供能够保持探测器的水平度的测试器以及具有这种测试器的半导体器件测试设备。 具有这种测试器的测试器和半导体器件测试装置的特征在于,设置在测试头的基座上的调平单元通过向探头的顶表面施加负载来保持探针卡的水平度 卡向下方向。 根据这样的特征,可以防止探针卡的弯曲,从而能够可靠地实现探针卡的探测器和半导体器件的电极端子之间的接触,从而提高半导体器件的电气性能检查的可靠性。 版权所有(C)2011,JPO&INPIT
    • 8. 发明专利
    • Display substrate, method for manufacturing the same, and display device having the same
    • 显示基板,其制造方法和具有该显示基板的显示装置
    • JP2007140516A
    • 2007-06-07
    • JP2006306794
    • 2006-11-13
    • Samsung Electronics Co Ltd三星電子株式会社Samsung Electronics Co.,Ltd.
    • KIN SHOSHUSHIM YI-SEOPKIM BYOUNG-JOOKIM SHI-YULSHU SHINGOJO GUG-RAECHAI CHONG-CHULCHOI JI-WON
    • G02F1/1333G02B5/20G02F1/1335G02F1/1337G02F1/1339G02F1/1343G02F1/1368
    • G02F1/1362G02F1/136227G02F2001/136222
    • PROBLEM TO BE SOLVED: To provide a display substrate capable of removing display defects, a method for manufacturing the same, and a display device having the same. SOLUTION: A display substrate 100 includes a thin film transistor layer 280, a color filter layer 120, pixel electrodes, a first cover layer 141, and an alignment film 150. The thin film transistor layer 280 includes a pixel part. The color filter later 120 is formed on the thin film transistor layer 280. The pixel electrode is formed on the color filter layer 120. At least one gap is defined between adjacent pixel electrodes. The first cover layer 141 is disposed within the gap between the adjacent pixel electrodes and covers a part of the color filter layer exposed by the gap between the adjacent pixel electrodes. The alignment film 150 is formed on the pixel electrodes and the first cover layer 141. Consequently, display defects such as afterimage can be removed by interrupting direct contact between the color filter layer 120 and the alignment film 150. COPYRIGHT: (C)2007,JPO&INPIT
    • 要解决的问题:提供能够去除显示缺陷的显示基板,其制造方法以及具有该显示缺陷的显示装置。 解决方案:显示基板100包括薄膜晶体管层280,滤色器层120,像素电极,第一覆盖层141和取向膜150.薄膜晶体管层280包括像素部分。 在薄膜晶体管层280上形成滤色器120.像素电极形成在滤色器层120上。在相邻的像素电极之间限定至少一个间隙。 第一覆盖层141设置在相邻像素电极之间的间隙内,并且覆盖由相邻像素电极之间的间隙暴露的滤色器层的一部分。 取向膜150形成在像素电极和第一覆盖层141上。因此,可以通过中断滤色器层120和取向膜150之间的直接接触来去除诸如残像之类的显示缺陷。版权所有:(C )2007,JPO&INPIT