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    • 3. 发明专利
    • Manufacturing method for bonding equipment and semiconductor ic device
    • 用于连接设备和半导体IC器件的制造方法
    • JP2006032987A
    • 2006-02-02
    • JP2005279744
    • 2005-09-27
    • Renesas Eastern Japan Semiconductor IncRenesas Technology Corp株式会社ルネサステクノロジ株式会社ルネサス東日本セミコンダクタ
    • ISHIGURO TAKANORIHIGUCHI KAZUNORISUDA TOMIJI
    • H01L21/60
    • PROBLEM TO BE SOLVED: To prevent the horizontal slippage of carriers, and to shorten the bonding time.
      SOLUTION: In bonding equipment 20, where a tape carrier 2 is conveyed by rollers R1-R6 and a chip 12 is bonded at a specified position, the rollers R1-R6 are opened and closed instantaneously, and the horizontal slippages can be prevented by the restoration capability of the tape carrier 2 itself. Slacks are alternately formed between rollers R2 and R3, as well as between R4 and R5 due to the delivery of the tape carrier 2, while the slack on both sides can be dissolved alternately due to the delivery of the tape carrier 2. Since the tape carrier can be delivered at a faster pace when the slack is dissolved, the whole conveying time can be set to be short and a long bonding time can be secured. The chip 12 is supplied to the specified position of the tape carrier 2, after offsetting, and the chip 12 is reset at a regular position after correcting the position, which is performed after the recognition of the electrode pad position of the chip. The bonding of the chip to the carrier can be performed accurately, in a short amount of time.
      COPYRIGHT: (C)2006,JPO&NCIPI
    • 要解决的问题:为了防止载体的水平滑动,并缩短粘合时间。

      解决方案:在粘合设备20中,通过辊子R1-R6输送带架2并且在特定位置处接合芯片12,辊子R1-R6立即打开和关闭,并且水平滑动可以 通过带载体2自身的恢复能力来防止。 由于带式载体2的传送,在辊R2和R3之间以及R4和R5之间交替地形成了松弛,同时由于带式载体2的传送,两侧的松弛可以交替地溶解。由于带 当松弛溶解时,载体可以以更快的速度递送,整个输送时间可以设定得短并且可以确保长的粘合时间。 芯片12在偏移之后提供给带载器2的指定位置,并且在校正在识别芯片的电极焊盘位置之后执行的位置的情况下将芯片12复位在规则位置。 可以在短时间内精确地执行芯片与载体的接合。 版权所有(C)2006,JPO&NCIPI

    • 5. 发明专利
    • Methods of manufacturing semiconductor device and semiconductor electronic component, and semiconductor electronic component
    • 制造半导体器件和半导体电子元件的方法和半导体电子元件
    • JP2009194234A
    • 2009-08-27
    • JP2008035006
    • 2008-02-15
    • Renesas Technology Corp株式会社ルネサステクノロジ
    • ISHIGURO TAKANORI
    • H01L21/60H01L21/677
    • H01L2224/45144H01L2224/48091H01L2924/00014H01L2924/00
    • PROBLEM TO BE SOLVED: To enable an adsorption jig for use in a semiconductor device manufacturing technology to be heat-resistant at 300°C or more. SOLUTION: The adsorption jig such as a collet 60 and the like mounted on a collet holder 61 is provided with high heat resistance. Adoption of such structure as above allows the collet 60 which has so far caused heat deterioration at temperature applied in gold/tin eutectic bonding and the like to be used without causing the heat deterioration and the like. A predetermined high heat resistance silicon resin is preferably used for the high heat resistance. Such a commercial product as FX-T154 can be enumerated as an example. The high heat resistance silicon resin whose Shore A hardness is 10 to 90 is preferably used. Further, proper conductivity may be applied to the high heat resistance silicon resin by adding conductive agent thereto. COPYRIGHT: (C)2009,JPO&INPIT
    • 要解决的问题:为了使在半导体器件制造技术中使用的吸附夹具能够在300℃以上耐热。 解决方案:安装在夹头保持器61上的诸如夹头60等的吸附夹具具有高耐热性。 采用上述结构允许使用迄今为止在使用金/锡共晶接合等的温度下引起热劣化的夹头60而不引起热劣化等。 优选使用预定的高耐热性硅树脂来获得高耐热性。 像FX-T154这样的商业产品可以列举为例。 优选使用肖氏A硬度为10〜90的高耐热性硅树脂。 此外,通过向其中加入导电剂可以对高耐热硅树脂施加适当的导电性。 版权所有(C)2009,JPO&INPIT