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    • 8. 发明专利
    • Production of micro fresnel lens
    • 生产微型镜片
    • JPS61137101A
    • 1986-06-24
    • JP25848484
    • 1984-12-07
    • Pioneer Electronic Corp
    • NIRIKI TAKASHI
    • G02B3/08G02B5/18
    • G02B5/1876
    • PURPOSE:To improve performance by forming a titled lens of layers each of which except a resist layer has a uniform film thickness thereby making uniform the film thickness from the center to the outside circumference of the lens and maintaining an adequate sectional shape. CONSTITUTION:The film thickness of the multi-layered films 20 formed by growing a silicon oxide film 15 on a silicon wafer 14, forming a nitride film layer 16 thereon and a silicon oxide film layer 17 thereon and forming successively a nitride film layer 18 and a silicon oxide film layer 19 is made equal to the design film thickness. The resist 21 is coated on such films 20 and after an annular pattern 22 of the 1st layer is drawn, the process from development of the resist layer 21 up to the removal of the resist after the etching of the layer 19 is executed. The resist 21 is then coated on the substrate and is positioned with the pattern of the 1st layer. The annular pattern 23 of the 2nd layer is drawn and the etching of the film 18 is executed after the developing process by which the resist is removed. The section approximate to the saw tooth-shaped staircase is obtd. to the films 20 by repeating the above- mentioned similar stage.
    • 目的:为了通过形成除了抗蚀剂层之外的层的标题透镜具​​有均匀的膜厚度来提高性能,从而使得从透镜的中心到外周均匀的膜厚度并保持适当的截面形状。 构成:通过在硅晶片14上生长氧化硅膜15,在其上形成氮化物膜层16和其上的氧化硅膜层17形成的多层膜20的膜厚度,并依次形成氮化物膜层18和 使氧化硅膜层19等于设计膜厚度。 抗蚀剂21涂覆在这样的膜20上,并且在第一层的环形图案22被拉伸之后,执行从抗蚀剂层21的显影直到去除蚀刻层19之后的抗蚀剂的过程。 然后将抗蚀剂21涂覆在基底上并且以第一层的图案定位。 绘制第二层的环状图案23,并且在除去抗蚀剂的显影处理之后执行膜18的蚀刻。 接近锯齿形楼梯的部分是可以接受的。 通过重复上述类似的阶段到膜20。
    • 9. 发明专利
    • MANUFACTURE OF MICRO FRESNEL LENS
    • JPS6242102A
    • 1987-02-24
    • JP18105385
    • 1985-08-20
    • PIONEER ELECTRONIC CORP
    • NIRIKI TAKASHISUEMITSU HISASHI
    • G02B3/08G02B5/18
    • PURPOSE:To improve lens characteristics by varying the quantity or range exposure of resist according to gamma characteristics of the resist and approximating the shape of the stepwise saw-tooth waves of the remaining film of the resist to the ideal curve of a micro Fresnel lens. CONSTITUTION:A figure (a) shows variation in the thickness of the remaining film with the quantity of exposure of the resist and a curve in a figure (b) varies the range of exposure, so its gamma characteristics are used as they are. Then, 13-18 of the same exposure are projected on this curve and shifted onto the phase shift function psi(gamma) of an ideal curve in a figure (c) to determine the exposure range of each time in a radius-(gamma) direction. At this time, the thickness of the remaining film remains according to longitudinal axes 25-30, but the exposure range in the radius-(gamma) direction is corrected by the gamma characteristic curve in the figure (b) as to the phase shift function psi(gamma), so the shape of stepwise saw-tooth waves of the remaining resist film which is formed actually conforms to the phase shift function psi(gamma) of the ideal curve in a figure (d). Consequently, lens characteristics such as primary efficiency of convergence and a beam spot diameter are improved.