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1. 发明专利

JP2002022640A SCANNING PROXIMITY FIELD OPTICAL MICROSCOPE 失效
公开(公告)号：JP2002022640A
公开(公告)日：2002-01-23
申请号：JP2000205178
申请日：2000-07-06
申请人： OLYMPUS OPTICAL CO
发明人： YAMAGUCHI MITSUSHIRO
IPC分类号： G01B11/00 , G01Q20/02 , G01Q60/06 , G01Q60/18 , G01Q60/22 , G01Q60/24 , G02B21/00 , G01N13/14 , G12B21/06
摘要： PROBLEM TO BE SOLVED: To provide a scanning proximity field optical microscope improved to obtain an AFM image along with an SNOM image. SOLUTION: A scanning optical microscope comprising means for irradiating a specimen with light, a granular probe for scanning the specimen while keeping a constant distance therefrom, and means for detecting the intensity of proximity field light from the specimen is further provided with means for detecting the position of the granular probe by detecting the proximity field light therefrom.

2. 发明专利

JPH09299087A ANALYSIS RELATED TO NUCLEIC ACID USING SCANNING TYPE PROBE MICROSCOPE 失效
公开(公告)号：JPH09299087A
公开(公告)日：1997-11-25
申请号：JP12183996
申请日：1996-05-16
申请人： OLYMPUS OPTICAL CO
发明人： TAKAHASHI TAKEO , OKADA TAKAO , HORI KUNIO , YAMAGUCHI MITSUSHIRO
IPC分类号： G01N33/50 , C07H21/02 , C07H21/04 , C12N15/09 , C12Q1/34 , C12Q1/68 , G06F17/30
摘要： PROBLEM TO BE SOLVED: To provide a method for carrying out the determination of a base sequence, mapping of a gene and analysis, etc., of exonuclease characteristics based on the high-order structure of a single-stranded nucleic acid and a linear shape of a double-stranded nucleic acid by directly observing an individual nucleic acid molecule itself such as a DNA and an RNA. SOLUTION: This method for determining a base sequence of a nucleic acid comprises (a) a step for constructing a database related to a high-order structure of a single-stranded nucleic acid and a base sequence corresponding to the high-order structure, (b) a step for preparing a nucleic acid for measurement in which at least a part expected to determine the base sequence is a single- stranded nucleic acid, (c) a step for measuring the nucleic acid for the measurement under a scanning type probe microscope and thereby providing a data for the high-order structure of the single-stranded part of the nucleic acid for measurement and (d) a step for comparing the data for the high-order structure of the nucleic acid for time measurement with the database and searching for the base sequence having the same high-order structure.

3. 发明专利

JPH11326345A NEAR-FIELD OPTICAL MICROSCOPE 失效
公开(公告)号：JPH11326345A
公开(公告)日：1999-11-26
申请号：JP12591098
申请日：1998-05-08
申请人： OLYMPUS OPTICAL CO
发明人： YAMAGUCHI MITSUSHIRO
IPC分类号： G01B11/30 , G01J1/22 , G01N37/00 , G01Q60/18
摘要： PROBLEM TO BE SOLVED: To provide a near-field optical microscope which can measure stably without being affected by an intensity change of an output light of a light source. SOLUTION: A luminous flux projected from a wavelength variable laser light source 3 enters a neutral density(ND) continuous filter 4. The ND continuous filter 4 has a continuous density distribution, attenuating the entering light in accordance with a position where the light enters. The ND continuous filter 4 is supported to be able to change a position where it traverses an optical path and is moved by a driving motor 8. The luminous flux passing the ND continuous filter 4 is split to two by a beam splitter 5, and the light passing the beam splitter 5 is reflected at a mirror 9 and irradiated to a sample 1 and a probe 12 arranged in the vicinity of a front face of the sample. The luminous flux reflected by the beam splitter 5 enters a photodetector 6. A control circuit 7 controls by the driving motor 8 the position where the ND continuous filter 4 traverses the optical path so that an output of the photodetector 6, namely, the light output from the light source 3 has a constant intensity.

4. 发明专利

JPH05302829A 失效
公开(公告)号：JPH05302829A
公开(公告)日：1993-11-16
申请号：JP10973192
申请日：1992-04-28
申请人： OLYMPUS OPTICAL CO
发明人： YAMAGUCHI MITSUSHIRO , KAJIMURA HIROSHI
IPC分类号： G01B21/30 , G01N37/00 , G01Q60/24 , G01Q60/38 , G01Q70/02 , H01J37/28
摘要： PURPOSE:To obtain a microcantilever chip for an inter atomic force microscope capable of attaching work easily for AFM attaching mechanism and protecting the cantilever and the probe in treatment. CONSTITUTION:At an end of a microcantilever chip main body 1, a cantilever 2 is formed to be projected against it. On the microcantilever chip where a probe 3 is formed on the cantilever 2, a jig 4 with nearly L shape cross section for protecting this is placed.

5. 发明专利

JPH09329605A SCANNING PROBE MICROSCOPE 失效
公开(公告)号：JPH09329605A
公开(公告)日：1997-12-22
申请号：JP15127296
申请日：1996-06-12
申请人： OLYMPUS OPTICAL CO
发明人： YAMAGUCHI MITSUSHIRO , OKADA TAKAO , TAKAHASHI TAKEO , HORI KUNIO
IPC分类号： G01B21/30 , G01N37/00 , G01Q60/02 , G01Q90/00 , H01J37/28
摘要： PROBLEM TO BE SOLVED: To provide a scanning probe microscope having high reproducbility and sensitivity by enhancing the spatial resolution through an analytical method when different information is obtained from the same pixel. SOLUTION: When a voltage is applied from a bias voltage supply circuit 18 to a sample 15 and a micro cantilever 21 approaches the surface of the sample 15 from above, reflected light from the micro cantilever 21 is detected by a displacement detection system 23. Electrical information of the sample 15 is obtained based on the surface profile of the sample 15 and the output from a current/voltage conversion circuit 22 through the displacement detection system 23. Furthermore, the sample 15 is irradiated with a laser light from a laser light source 17 through a critical angle prism 16 simultaneously with the measurement. When the probe 20 of the micro cantilever 21 comes into contact with an evanescent field 25 on the surface of the sample 15, an evanescent light is emitted and inputted to a photomultiplier 24 which produces optical information of the sample 15.

6. 发明专利

JPH06273156A PROBE FOR SCANNING PROBE MICROSCOPE 失效
公开(公告)号：JPH06273156A
公开(公告)日：1994-09-30
申请号：JP6176793
申请日：1993-03-22
申请人： OLYMPUS OPTICAL CO
发明人： TODA AKITOSHI , MATSUYAMA KATSUHIRO , YAMAGUCHI MITSUSHIRO
IPC分类号： G01B21/30 , G01Q60/38 , H01J37/28
摘要： PURPOSE:To provide a probe of a scanning probe microscope suitable for liquid immersion measuring with high resolution. CONSTITUTION:A cantilever tip 10 of a scanning probe microscope comprises a cantilever 16 consisting of silicon nitride which is so constituted that after a silicon nitride layer 14 is formed on a silicon substrate, patterning is applied on the layer to obtain a prescribe shape. The cantilever 16 is supported by a supporting section 12 which is formed by etching the silicon substrate in a prescribed shape and is having a quadrangular-pyramid-shaped probe 18 on its free end. The surface of the probe 18 is rendered hydrophilic by an oxygen plasma treatment.

7. 发明专利

JPH06258070A SCANNING PROBE MICROSCOPE 失效
公开(公告)号：JPH06258070A
公开(公告)日：1994-09-16
申请号：JP4638593
申请日：1993-03-08
申请人： OLYMPUS OPTICAL CO
发明人： YAMAGUCHI MITSUSHIRO
IPC分类号： G01B7/34 , G01B21/30 , G01Q10/02 , G01Q10/04 , G01Q60/24 , G01Q60/50 , H01J37/28
摘要： PURPOSE:To remove a slope of a sample placed on a moving stage in the stage using a cylindrical piezoelectric element. CONSTITUTION:A finely moving position regulator 20 for scanning a sample with respect to a probe of a scanning probe microscope for obtaining information of a sample surface by making the probe approach the surface of the sample and relatively scanning it by using a cantilever implanted with the probe has a cylindrical element 22 having divided electrodes disposed on a peripheral surface, a sample base 21 having an upper surface for placing the sample and a protruding bottom, and supports 24, 25 disposed at an upper part of the element 22 to tiltably hold the base 21 in contact with the bottom of the base 21.

8. 发明专利

JP2001165842A ANGLE OF INCIDENCE DETERMINING METHOD, AND SCAN NEAR- FIELD OPTICAL MICROSCOPE 失效
公开(公告)号：JP2001165842A
公开(公告)日：2001-06-22
申请号：JP35441699
申请日：1999-12-14
申请人： OLYMPUS OPTICAL CO
发明人： YAMAGUCHI MITSUSHIRO
IPC分类号： G01Q60/18 , G01N13/14
摘要： PROBLEM TO BE SOLVED: To provide a method for determining the angle of incidence of the irradiating light to irradiate a portion in the vicinity of a tip of a probe to realize the high resolution and high contrast, and a scan near-field optical microscope. SOLUTION: The method for determining the angle of incidence of the irradiating light to irradiate the portion in the vicinity of the tip of the prove in the scan near-field optical microscope comprises a step of irradiating the irradiating light on a portion to be observed of a sample and receiving the reflected light while changing the angle of incidence of the irradiating light, and seeking the angle of incidence to minimize the angle dependency of the intensity of the reflected light. The scan near-field optical microscope comprises a light source for irradiating light on the location to be observed of the sample and adjusting the angle of incidence, and a detecting means to detect the irradiating light reflected by the sample, and can measure the angle dependency to the angle of incidence of the intensity of the reflected light detected by the detecting means.

9. 发明专利

JP2000329676A CANTILEVER FOR SCANNING NEAR-FIELD OPTICAL MICROSCOPE 失效
公开(公告)号：JP2000329676A
公开(公告)日：2000-11-30
申请号：JP14327799
申请日：1999-05-24
申请人： OLYMPUS OPTICAL CO
发明人： YAMAGUCHI MITSUSHIRO
IPC分类号： G01B11/30 , G01N37/00 , G01Q60/22 , G01Q70/00 , G12B1/00 , G01N13/14
摘要： PROBLEM TO BE SOLVED: To obtain a cantilever, for a scanning near-field optical microscope(SNOM), in which the scattering efficiency of a probe tip is increased more than that of a probe part other than the tip. SOLUTION: This cantilever 10 for an SNOM is provided with a lever part 14 which is supported by a support part 12 in an overhang mounted manner. A triangular pyramid-shaped probe 16 is formed at the free end of the lever part 14. A very small spherical scattering body 18 is installed at the tip part of the probe 16. The lever part 14 and the probe 16 are constituted mainly of silicon or silicon nitride. In addition, the very small spherical scattering body 12 is constituted of a substance whose scattering efficiency is large as compared with that of silicon or silicon nitride which constitutes the lever part 14 and the probe 16. Preferably, it is constituted of gold colloid.

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