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    • 1. 发明专利
    • MICRO-MANIPULATOR
    • JP2000081576A
    • 2000-03-21
    • JP25134398
    • 1998-09-04
    • OLYMPUS OPTICAL CO
    • SAKAI NOBUAKI
    • B25J7/00G02B21/32
    • PROBLEM TO BE SOLVED: To measure elastic modulus of a cell by a micro-manipulator. SOLUTION: This micro-manipulator has an operating needle 14 to be controlled under a visual field of a microscope, and a force sensor 17 holding the operating needle 14. Further, the micro-manipulator is provided with an operation part 10 to input operation factors such as a moving direction, a moving length, a moving speed, etc., of the operating needle and to output an operation instruction signal according to the inputted operation factors, X-, Y-, and Z-control circuits 11 and X-, Y-, and Z-stages 12, a holder 13 which receives kinetic energy from the X-, Y-, and Z-stages 12 and geometrically displace the operating needle 14, a sensor 17 to detect a force acting on the operating needle 14, and a converter 18 and a force calculation circuit 19. Thus, an elastic modulus of an organism sample 15 such as cells is detected.
    • 3. 发明专利
    • SPHERICAL ACTUATOR
    • JPH10122809A
    • 1998-05-15
    • JP28254696
    • 1996-10-24
    • OLYMPUS OPTICAL CO
    • SAKAI NOBUAKI
    • G01B7/30B25J17/00B25J19/00G02B21/32
    • PROBLEM TO BE SOLVED: To detect the rotary angle of a spherical body accurately by a compact and simple configuration by arranging an electrode plate for constituting a capacitance in a space that is formed at an area to an electrode part while the capacitance opposes the electrode part provided on the surface of the spherical body. SOLUTION: A spherical body 10 that is supported so that it can rotate freely is formed nearly spherically of insulation material such as ceramic and a shaft part 11 is connected to an upper surface. A nearly square electrode film 12 is applied to the lower surface of the spherical body 10 and electrode plates 13-16 that are divided into four portions are arranged at the lower part of the electrode film 12. The electrode plates 13-16 form a concentric spherical shape with the spherical part of the spherical body 10 and the gap between the electrode plates 13-16, and the spherical body 10 is constant, thus a capacitance is constituted between the electrode film 12 and the electrode plates 13-16. A capacitance detection circuit detects the capacitance between the electrode film 12 and the electrode plates 13-16, and each output CA, CB, CC, CD, and G are supplied to an operation circuit, thus the rotary angle of the spherical body 10 is calculated.
    • 5. 发明专利
    • IMAGE DISPLAY DEVICE
    • JPH0683873A
    • 1994-03-25
    • JP23701692
    • 1992-09-04
    • OLYMPUS OPTICAL CO
    • SAKAI NOBUAKI
    • G06F17/30G06T1/00G06F15/40G06F15/62
    • PURPOSE:To improve the work efficiency relating to the retrieval of a sample optical developed image and a sample measuring image by constituting a device so that the sample optical developed image and the sample measuring image which are desired can be retrieved quickly by a simple operation. CONSTITUTION:In a magnetic recording part provided at every frame of a silver salt film 13, retrieval information for reading out image data relating to a sample optical developed image recording in each frame is written in advance, and in the case the frame (sample optical developed image) is designated from an input device 22 by a user of a sample image, the retrieval information is read from the magnetic recording part of the designated frame, and also, based on the read retrieval information, the sample measuring image concerned is read out of an electronic file 12 and subjected to multi-display on a monitor 21 together with the sample optical developed image.
    • 6. 发明专利
    • MICROSCOPIC SYSTEM
    • JP2002341248A
    • 2002-11-27
    • JP2002067376
    • 2002-03-12
    • OLYMPUS OPTICAL CO
    • YONEYAMA TAKASHISAKAI NOBUAKI
    • G02B21/00G02B21/24
    • PROBLEM TO BE SOLVED: To provide a microscopic system which has an overcontact preventive function capable of detecting the contact of an observation object and an objective lens with high accuracy and preventing the overcontact of both. SOLUTION: The microscope system which makes at least either of a stage 2 loaded with a specimen 4 and an objective lens 6 relatively movable in an optical axis direction decides the possibility of the contact of the specimen 4 and the objective lens 6 from the result obtained by comparing the detection output of a contact detecting sensor 11 for detecting the contact of the specimen 4 and the objective lens 6 and a preset threshold value in a contact decision section 12, evades the overcontact of the specimen 4 and the objective lens 6 by the result of the decision and updates the threshold value in the contact decision section 12 in accordance with the output of the contact detecting sensor 11 at every prescribed time.
    • 7. 发明专利
    • MICROMANIPULATOR
    • JP2000098258A
    • 2000-04-07
    • JP27016198
    • 1998-09-24
    • OLYMPUS OPTICAL CO
    • SAKAI NOBUAKI
    • C12M1/00B25J7/00G02B21/32G05D3/12
    • PROBLEM TO BE SOLVED: To prevent the damage of a manipulation needle and a specimen by automatically switching the coarse movement and fine movement of the manipulation needle. SOLUTION: The micromanipulator for fine manipulation of the specimen 15 by using the manipulation needle 14 under the visual field of a microscope has a manipulation section 10 which acts as an input means for inputting the operation contents, such as moving direction, moving distance and moving speed, of the manipulation needle 14 and an operation command means for outputting an operation command signal according to the inputted operation contents, an actuator 12 which converts the operation command signal outputted from the manipulation section 10 to the mechanical kinetic energy corresponding to the operation contents, a movable body 13 which receives the kinetic energy from the actuator 12 and geometrically displaces the manipulation needle 14, a force detecting means 17 which detects the force acting on the manipulation needle 14 and a decision circuit 19 and variable gain amplifier 20 which control the moving speed of the manipulation needle 14 in accordance with the output of the force detecting means 17.
    • 8. 发明专利
    • Scanning type probe microscope
    • 扫描型探针显微镜
    • JPH11271346A
    • 1999-10-08
    • JP7450698
    • 1998-03-23
    • Olympus Optical Co Ltdオリンパス光学工業株式会社
    • SAKAI NOBUAKI
    • G01B11/30G01N37/00G01Q20/02G01Q60/24G01Q60/38
    • PROBLEM TO BE SOLVED: To provide a scanning type probe microscope that can accurately detect the displacement of a cantilever by stably reading reflection light from the cantilever without being optically affected by light that stays off the cantilever.
      SOLUTION: A scanning type probe microscope is provided with a displacement sensor with a cantilever 12 where a probe 13 is formed at a free end, a laser diode 14 that can emit laser beams 17 toward the cantilever 12 so that the displacement state of the cantilever 12 can be optical detected, and a two- division photo detector 18 that can receive reflection light from the cantilever, and a lever structure body 12a that regulates, in a fixed direction, the reflection direction of light being spread in a region other than the cantilever out of laser beams being emitted from the laser diode.
      COPYRIGHT: (C)1999,JPO
    • 要解决的问题:提供一种扫描型探针显微镜,其可以通过稳定地读取来自悬臂的反射光而不受静止在悬臂上的光的光学影响而精确地检测悬臂的位移。 解决方案:扫描型探针显微镜具有位移传感器,其具有悬臂12,探针13在自由端形成,激光二极管14能够朝向悬臂12发射激光束17,使得悬臂的位移状态 12可以是光学检测的,并且可以接收来自悬臂的反射光的二分光电检测器18和杆结构体12a,其在固定的方向上调节光的反射方向在除了 从激光二极管发射的激光束悬臂。