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1. 发明专利

JP2009250822A Inspection method for seawater piping 审中-公开
标题翻译：海水管道检查方法
公开(公告)号：JP2009250822A
公开(公告)日：2009-10-29
申请号：JP2008100136
申请日：2008-04-08
申请人： Non-Destructive Inspection Co Ltd , Tokyo Energy & Systems Inc , 株式会社東京エネシス , 非破壊検査株式会社
发明人： KANEKAWA SHOTAI , NITTA KAORU , NAGANO YOSHIHIRO , SETO SHIZUO
IPC分类号： G01N29/04 , G01N27/90
摘要： PROBLEM TO BE SOLVED: To provide a method for inspecting seawater piping which enables the rational inspection of a concealed portion in piping and a method for quickly inspecting each section.
SOLUTION: The inside surface of the seawater piping 100 is inspected from the outer surface thereof. A probe 11 is contacted to the outer surface of a straight piping portion A2 of the piping outside the concealed portion A1 formed by a flange 104 and a penetrator 103 or a support band 105. Guided waves are transmitted from the probe 11 to the concealed portion A1. The inside surface of the piping 100 in the concealed portion A1 is inspected by receiving the guided waves.
COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：提供一种检查管道中的隐藏部分的合理检查的海水管道的方法和用于快速检查每个部分的方法。解决方案：从其外表面检查海水管道100的内表面。探针11与由凸缘104和穿透器103或支撑带105形成的隐蔽部分A1外部的管道的直管道部分A2的外表面接触。引导波从探针11传递到隐藏部分 A1。通过接收导波来检查隐蔽部分A1中的管道100的内表面。版权所有（C）2010，JPO＆INPIT

2. 发明专利

JP2004245598A Probe and material evaluation test method using the same 有权
标题翻译：使用它的探测和材料评估测试方法
公开(公告)号：JP2004245598A
公开(公告)日：2004-09-02
申请号：JP2003032664
申请日：2003-02-10
申请人： Idemitsu Eng Co Ltd , Non-Destructive Inspection Co Ltd , 出光エンジニアリング株式会社 , 非破壊検査株式会社
发明人： YOKONO YASUKAZU , NAGANO YOSHIHIRO , YOTSUTSUJI YOSHITOSHI
IPC分类号： G01N29/04 , G01N29/10
CPC分类号： G01N2291/0258 , G01N2291/0421 , G01N2291/044
摘要： PROBLEM TO BE SOLVED: To provide a probe allowing a specimen to be evaluated for deterioration/damage without being affected by surface reflected wave and a material evaluation test method using the probe.
SOLUTION: This probe comprises a transmitter 3 and a receiver 4 having delaying materials 11 and 12 and a holding body 15 for installing a contact medium W between the opposed faces 14 of the delaying materials 11 and 12 to a specimen and the surface 101 of the specimen. The thickness D of the holding body 15 is set so that the waveform of the surface reflected wave reflected on the surface 101 of the specimen and the waveform of multiplex reflected wave generated between the surface 101 of the specimen and the opposed faces of the delaying materials 11 and 12 on the specimen side can be identified. Also, a sound isolating body 16 for cutting off the multiplex reflected wave or crosstalk generated between the surface 101 of the specimen and the delaying materials 11 and 12 is installed on the opposed face 14 on the specimen side between the pair of delaying materials 11 and 12.
COPYRIGHT: (C)2004,JPO&NCIPI
摘要翻译：要解决的问题：提供一种允许对样品进行劣化/损伤评估而不受表面反射波的影响的探针和使用该探针的材料评价试验方法。解决方案：该探头包括具有延迟材料11和12的发射器3和接收器4以及用于将延迟材料11和12的相对面14之间的接触介质W安装到试样和表面的保持体15 101标本。保持体15的厚度D被设定为使得在样本的表面101上反射的表面反射波的波形和在样本的表面101和延迟材料的相对面之间产生的多路反射波的波形可以识别样品侧的11和12。此外，用于切断多个反射波的声音隔离体16或在试样的表面101与延迟材料11和12之间产生的串扰被安装在一对延迟材料11和22之间的试样侧的相对面14上 12.版权所有（C）2004，JPO＆NCIPI

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