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    • 1. 发明专利
    • MEASURING APPARATUS FOR LIGHT INTENSITY OF XENON LAMP
    • JPH0399235A
    • 1991-04-24
    • JP23563189
    • 1989-09-13
    • NIPPON TYPEWRITER
    • ITO KENJIRO
    • G01J1/00G01J1/02
    • PURPOSE:To make it possible to measure the dispersion in light intensity of a xenon lamp readily by emitting the light from the xenon lamp by a plurality of times, and detecting the light intensity through a filter, a half mirror, a condenser lens and a reflecting plate. CONSTITUTION:Light is emitted from a xenon lamp 1 by a plurality of times at a specified time interval with a trigger oscillator 14. The light is transmitted through a filter 5, a half mirror 7 and a condenser lens 8. The light is reflected from a reflecting plate 11 and the mirror 7 and detected with a photocell 9. The output of the cell 9 is amplified in a photoelectric conversion amplifier 16 through a connector 17. Then the peak values at a voltage axis and a time axis corresponding to the number of the light emitting times are sampled and stored in a memory 19. When the specified number of the light emitting times is finished, comparison and operation are performed according to the respective rotations based on the data in the memory 19, and the results are displayed on an output device 20. Thus, the dispersion in light intensity can be measured readily.