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    • 9. 发明专利
    • METHOD AND INSTRUMENT FOR MEASURING STRUCTURE OF OPTICALLY ANISOTROPIC MATERIAL
    • JPH02213752A
    • 1990-08-24
    • JP3366989
    • 1989-02-15
    • NIPPON STEEL CORPNIPPON STEEL CHEMICAL CO
    • HIGUCHI MASAKAZUSUNAGO HIROFUMITOMIOKA NORIOFUJIMOTO KENICHI
    • G01N21/21
    • PURPOSE:To measure the structure in the orientation direction of the optically anisotropic material by changing the direction of the oscillation plane of polarized light with respect to the anisotropic material and measuring the quantity of the transmitted or reflected light. CONSTITUTION:The reflectivity of graphite having a laminated structure has the anisotropy when, for example, the graphite belonging to the optical negative crystal of a hexagonal system is observed by a reflection method. The max. reflectivity Romega is exhibited in the direction parallel with the direction of lamination of, for example, the face A. The min. reflectivity Repsilon is exhibited in the direction perpendicular to the direction of the lamination. The max. reflectivity Romega is exhibited in the all directions with the face B. The intermediate reflectivity Repsilon' which is between Romega and Repsilon is exhibited on the face C diagonal to the lamination direction. the max. reflectivity Romega is exhibited in the direction parallel with the lamination direction on this face as well. The direction where the max. reflectivity Romega is exhibited indicates always the direction of lamination in such a manner. The structure of the optically anisotropic material is, therefore, measured by changing the direction of the oscillation of the polarized light, measuring the quantity of the transmitted or reflected light, dividing the measuring face to plural picture elements, and detecting the orientability of the structure in accordance with the change in the light quantity of the respective picture elements.