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    • 2. 发明专利
    • Semiconductor laser
    • 半导体激光器
    • JP2011023493A
    • 2011-02-03
    • JP2009166346
    • 2009-07-15
    • Mitsubishi Electric Corp三菱電機株式会社
    • SHIMADA NAOYUKIYOSHIKAWA MAKOTO
    • H01S5/343H01S5/16
    • PROBLEM TO BE SOLVED: To obtain a semiconductor laser which hardly causes COD, and which has a high output beam stability. SOLUTION: A horizontal resonator type semiconductor laser with an oscillation wavelength less than 650 nm, has the following configuration. An n-type clad layer 12, an optical waveguide layer, and a p-type clad layer 20 are sequentially formed on an n-type GaAs substrate 10 as a semiconductor lamination structure. The optical waveguide layer has a quantum well active layer 16 including a well layer 28 and a barrier layer 30. A window structure 32 in which the constituent element of each layer of the semiconductor lamination structure is mutually diffused is formed in the vicinity of an end surface. Each layer of the optical waveguide layer other than the well layer 28 consists of (Al x Ga 1-x )InP of 0.66 COPYRIGHT: (C)2011,JPO&INPIT
    • 要解决的问题:获得几乎不引起COD并具有高输出光束稳定性的半导体激光器。 解决方案:振荡波长小于650nm的水平谐振器型半导体激光器具有以下结构。 在n型GaAs衬底10上依次形成n型覆盖层12,光波导层和p型覆盖层20作为半导体层叠结构。 光波导层具有包括阱层28和势垒层30的量子阱活性层16.在半导体层叠结构的各层的构成元素相互扩散的窗结构体32的端部附近形成 表面。 除了阱层28以外的光波导层的每个层由0.66
    • 4. 发明专利
    • Optical semiconductor module
    • 光学半导体模块
    • JP2006128236A
    • 2006-05-18
    • JP2004311798
    • 2004-10-27
    • Mitsubishi Electric Corp三菱電機株式会社
    • SHIMADA NAOYUKIYAGI TETSUYA
    • H01S5/022
    • H01S5/4025H01L2224/48091H01L2224/48465H01L2224/49111H01S5/02276H01S5/024H01S5/4031H01L2924/00014H01L2924/00
    • PROBLEM TO BE SOLVED: To provide an LD array in which the other LDs in the same array can oscillate even when one single LD causes short circuiting and which can compensate the lost portion of the optical output from the short-circuiting LD by increasing the currents flowing to the other LDs, by automatically making the current flowing to the defective LD until the short circuiting occurs to flow to the other LDs in a dispersed state when the array is driven with a constant current.
      SOLUTION: The LD array is provided with one or a plurality of semiconductor chips 31A-31D respectively containing one or a plurality of laser diodes 3A-3G, a sub-mount 2 or heat sink to which one or the plurality of semiconductor chips 31A-31D are attached, and bonding wires 7 through which operating currents are supplied to the semiconductor chips 31A-31D. The material, diameter, and shape of each bonding wire 7 are decided so that the wire 7 may be fused when a prescribed overcurrent higher than the operating current of each laser diode 3A-3G flows.
      COPYRIGHT: (C)2006,JPO&NCIPI
    • 要解决的问题:为了提供一种LD阵列,其中同一阵列中的其它LD可以振荡,即使当单个LD引起短路并且可以通过以下方式补偿来自短路LD的光输出的丢失部分 通过自动使电流流向有缺陷的LD,直到发生短路而以恒定电流驱动阵列时以分散状态流向其它LDs,增加流向其它LD的电流。 解决方案:LD阵列设置有分别包含一个或多个激光二极管3A-3G,子座2或散热器的一个或多个半导体芯片31A-31D,一个或多个半导体 芯片31A-31D以及将半导体芯片31A-31D供给工作电流的接合线7。 决定每个接合线7的材料,直径和形状,使得当高于每个激光二极管3A-3G的工作电流的规定过电流流动时,导线7可以熔合。 版权所有(C)2006,JPO&NCIPI
    • 5. 发明专利
    • Semiconductor optical element
    • 半导体光学元件
    • JP2006245341A
    • 2006-09-14
    • JP2005059595
    • 2005-03-03
    • Mitsubishi Electric Corp三菱電機株式会社
    • HANAMAKI YOSHIHIKOONO KENICHISHIGIHARA KIMIOKAWASAKI KAZUESHIBATA KIMITAKASHIMADA NAOYUKI
    • H01S5/343H01S5/22
    • H01S5/22H01S5/323
    • PROBLEM TO BE SOLVED: To obtain a semiconductor optical element in which an output is improved and the reliability of operation can be improved by preventing the mixture of impurities into an active layer.
      SOLUTION: The semiconductor optical element has a structure in which an n-type GaAs buffer layer, an n-type AlGaInP cladding layer, a first InGaAsP (also including no As composition) guiding layer having no added impurities, an InGaAsP (also including no In composition) active layer, a second InGaAsP (also including no As composition) guiding layer having no added impurities, a p-type AlGaInP cladding layer, a p-type discontinuity mitigation layer and a p-type GaAs contact layer are successively laminated on an n-type GaAs substrate. C or Mg is used as p-type impurities for the p-type GaAs contact layer, the p-type discontinuity mitigation layer and the p-type AlGaInP cladding layer.
      COPYRIGHT: (C)2006,JPO&NCIPI
    • 要解决的问题:为了获得提高输出的半导体光学元件,并且可以通过防止杂质混入活性层来提高操作的可靠性。 解决方案:半导体光学元件具有其中没有添加杂质的n型GaAs缓冲层,n型AlGaInP包层,第一InGaAsP(也不包括As组成)引导层的InGaAsP( 还包括无In组分)的有源层,不含添加杂质的第二InGaAsP(也不包括As组成)引导层,p型AlGaInP包层,p型不连续性缓解层和p型GaAs接触层, 依次层压在n型GaAs衬底上。 C或Mg用作p型GaAs接触层,p型不连续性缓解层和p型AlGaInP包层的p型杂质。 版权所有(C)2006,JPO&NCIPI