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1. 发明专利

JP2007180350A Prober operation management system 审中-公开
标题翻译：探索操作管理系统
公开(公告)号：JP2007180350A
公开(公告)日：2007-07-12
申请号：JP2005378471
申请日：2005-12-28
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： KOSAKA YUTAKA , SATO KAZUO , IMOTO SHINICHIRO
IPC分类号： H01L21/02
摘要： PROBLEM TO BE SOLVED: To improve an inspection accuracy and an entire utilization of probers 1 by solving a lighting failure.
SOLUTION: A prober operation management system comprises: an input means such as a touch panel for inputting the ID of a probe block 17 or a probe unit 4 for a prober 1; a searching means for searching a database for contact frequency information corresponding to the ID; a determining means for determining whether a contact frequency exceeds a predetermined value when the contact frequency information corresponding to the ID exists in the database; an alarming means for alarming on a display screen or the like when the contact frequency exceeds the predetermined value; an inspecting means for performing inspecting operation by bringing a probe needle of the probe block 17 into contact with a liquid crystal panel P; a counting means for counting a contact frequency every time the probe needle of the probe block 17 is contacted with the liquid crystal panel P; and an adding means for adding the counted contact frequency to the existing contact frequency information.
COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：通过解决照明故障来提高检测精度和检测器1的整体利用。解决方案：探测器操作管理系统包括：诸如用于输入探测块17的ID或用于探测器1的探测单元4的触摸面板的输入装置; 搜索装置，用于搜索与数据库相对应的联系频率信息的数据库; 确定装置，用于当数据库中存在与ID对应的联系频率信息时，确定接触频率是否超过预定值; 当接触频率超过预定值时，用于在显示屏幕等上报警的报警装置; 检测装置，用于通过使探针块17的探针与液晶面板P接触来进行检查动作; 计数装置，用于每当探针块17的探针与液晶面板P接触时对接触频率进行计数; 以及用于将计数的接触频率添加到现有接触频率信息的加法装置。版权所有（C）2007，JPO＆INPIT

2. 发明专利

JP2003004588A Test device for display board 审中-公开
标题翻译：显示板测试装置
公开(公告)号：JP2003004588A
公开(公告)日：2003-01-08
申请号：JP2001183147
申请日：2001-06-18
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： KOSAKA YUTAKA , FUJIWARA SHINJI , UEKI ISAO
IPC分类号： G01B21/00 , G01M11/00 , G01N21/84 , G01R31/02 , G02F1/13 , G09F9/00
摘要： PROBLEM TO BE SOLVED: To make it possible to read and photograph alignment marks even in the case the kind of board to be tested is changed.
SOLUTION: The test device two-dimensionally moves a video camera for photographing the alignment mark in a plane parallel to the board supported on a test stage and a camera stage of a test station in first and second directions crossing each other. A head for reading identifying codes, which are arranged in a carrying station, can also be two-dimensionally moved in the carrying station by using a head stage.
COPYRIGHT: (C)2003,JPO
摘要翻译：要解决的问题：即使在要测试的板的类型改变的情况下，也可以读取和照片对准标记。解决方案：测试装置在平行于支撑在测试台上的板的平面中的两个方向上移动用于拍摄对准标记的摄像机，并且在彼此相交的第一和第二方向上测试台的相机台。用于读取识别代码的头部，其布置在承载站中，也可以通过使用头阶段在承载站中二维地移动。

3. 发明专利

JP2002228701A INSPECTION DEVICE FOR BOARD FOR DISPLAY 失效
公开(公告)号：JP2002228701A
公开(公告)日：2002-08-14
申请号：JP2001023204
申请日：2001-01-31
申请人： MICRONICS JAPAN CO LTD
发明人： OISHI KAMIHITO , KOSAKA YUTAKA , UEKI ISAO , UEHARA HIROAKI
IPC分类号： G01R1/06 , G01R31/02 , G01R31/28 , G09F9/00
摘要： PROBLEM TO BE SOLVED: To eliminate the transferring of a board for display in an inspection station. SOLUTION: In this inspection device, a guide extending from the inspection station to a board mounting-dismounting station is mounted to an inspection stage in a shiftable manner with respect to a probe device by the inspection stage, and a chuck detachably supporting the board for display is disposed to the guide movably to the inspection station and the board mounting- dismounting station.

4. 发明专利

JP2002016127A CHUCK TOP 失效
公开(公告)号：JP2002016127A
公开(公告)日：2002-01-18
申请号：JP2000195758
申请日：2000-06-29
申请人： MICRONICS JAPAN CO LTD
发明人： OISHI KAMIHITO , KOSAKA YUTAKA , ANDO YOSHIYUKI , UEKI ISAO
IPC分类号： G01R1/06 , G01R31/02 , G01R31/28 , G02F1/13 , G09F9/00 , H01L21/68 , H01L21/683
摘要： PROBLEM TO BE SOLVED: To securely attract the edge of a display panel to a suction groove. SOLUTION: A chuck top includes a base member having one or above grooves opened to a panel receiving face for sucking the panel receiving face receiving the display panel and the display panel so that they can be released and a plurality of pusher mechanisms pressing the edge of the display panel received by the panel receiving face to the panel receiving face so that it can be released.

5. 发明专利

JP2009169340A Processing method and device for display panel 审中-公开
标题翻译：显示面板的处理方法和装置
公开(公告)号：JP2009169340A
公开(公告)日：2009-07-30
申请号：JP2008010220
申请日：2008-01-21
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： KOSAKA YUTAKA , MIZUNO KUNIHIRO
IPC分类号： G02F1/13 , G01B11/00 , G01M11/00 , G01N21/84 , G09F9/00
摘要： PROBLEM TO BE SOLVED: To easily and accurately obtain an address of a defective pixel without using a complicated structure.
SOLUTION: In the processing method for a display panel, a photographing device is moved to a place capable of photographing at least one of at least four regions to be photographed of the display panel to which the defective pixel obtained by visual lighting inspection of the display panel belongs and which includes an end edge in a direction X and an end edge in a direction Y of the display panel, the corresponding region to be photographed is photographed by the photographing device at the place where the photographing device has been moved, and image processing of an output signal of the photographing device is performed to obtain coordinate values from end edges in the directions X and Y in the image obtained by the photographing device to the defective pixel.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：为了容易且准确地获得缺陷像素的地址而不使用复杂的结构。解决方案：在显示面板的处理方法中，将拍摄装置移动到能够拍摄要通过视觉照明检查获得的缺陷像素的显示面板的至少四个区域中的至少四个区域中的至少一个的位置属于并且包括在方向X上的端边缘和在显示面板的方向Y上的端边缘的情况下，在拍摄装置移动的地方由拍摄装置拍摄要拍摄的对应区域并且执行拍摄装置的输出信号的图像处理以从由拍摄装置获得的图像中的方向X和Y的端边缘到缺陷像素获得坐标值。版权所有（C）2009，JPO＆INPIT

6. 发明专利

JP2006133099A Inspection device of display panel 审中-公开
标题翻译：显示面板检查装置
公开(公告)号：JP2006133099A
公开(公告)日：2006-05-25
申请号：JP2004323164
申请日：2004-11-08
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： ANZAI MASAYUKI , IKEUCHI HIDEKI , KOSAKA YUTAKA
IPC分类号： G01R31/00 , G02F1/13
摘要： PROBLEM TO BE SOLVED: To inspect right and left viewing angles by displacing an inspection stage.
SOLUTION: This inspection device includes the inspection stage for receiving a display panel, a base stand for supporting the inspection stage, the first rotating mechanism for rotating the inspection stage around the first axis extending in the vertical direction relative to the base stand, and the second rotating mechanism for rotating the inspection stage around the second axis extending in the horizontal direction relative to the base stand.
COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：通过移动检查台来检查右视角和左视角。
解决方案：该检查装置包括用于接收显示面板的检查台，用于支撑检查台的基座，用于使检查台绕相对于基座在垂直方向上延伸的第一轴线旋转的第一旋转机构以及第二旋转机构，用于使检查台绕相对于基座在水平方向上延伸的第二轴线旋转。版权所有（C）2006，JPO＆NCIPI

7. 发明专利

JP2002368058A Carrier for display substrate 有权
标题翻译：显示基板载体
公开(公告)号：JP2002368058A
公开(公告)日：2002-12-20
申请号：JP2001168635
申请日：2001-06-04
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： OISHI KAMIHITO , KOSAKA YUTAKA , FUJIWARA SHINJI , UEKI ISAO
IPC分类号： G02F1/13 , B25J15/08 , B65G49/06 , G09F9/00 , H01L21/677 , H01L21/68
摘要： PROBLEM TO BE SOLVED: To prevent a display substrate from slipping down from a carrier arm in the way of carrying.
SOLUTION: The carrier carries a display substrate in the first direction. The carrier comprises at least a pair of carrying arms spaced apart in the second direction intersecting the first direction. These carrying arms comprise resilient bodies for clamping the opposite end edge parts of the display substrate together and are moved synchronously in the first and second directions by means of a drive mechanism.
COPYRIGHT: (C)2003,JPO
摘要翻译：要解决的问题：防止显示基板以承载方式从承载臂滑落。解决方案：载体沿第一方向承载显示基板。载体包括沿与第一方向相交的第二方向间隔开的至少一对承载臂。这些承载臂包括用于将显示基板的相对端边缘部分夹持在一起并且通过驱动机构在第一和第二方向上同步移动的弹性体。

8. 发明专利

JP2002014047A EQUIPMENT FOR ANALYZING DISPLAY PANEL 失效
公开(公告)号：JP2002014047A
公开(公告)日：2002-01-18
申请号：JP2000194613
申请日：2000-06-28
申请人： MICRONICS JAPAN CO LTD
发明人： OISHI KAMIHITO , KOSAKA YUTAKA , FUJIWARA SHINJI , UEKI ISAO
IPC分类号： G01R31/02 , G01N21/84 , G02F1/13 , G09F9/00
摘要： PROBLEM TO BE SOLVED: To reduce the height dimension of an inspection stage as much as possible in a direction orthogonal to a display panel. SOLUTION: The inspection equipment in cludes a body, at least two probe units corresponding, respectively, to at least two sides of an imaginary square each provided with a planar probe base extending along the corresponding side and a plurality of probe blocks arranged on the probe base, and at least two moving units corresponding to respective probe units and moving the corresponding probe unit in a first direction intersecting a display panel to be inspected.

9. 发明专利

JPH11237596A INSPECTION STAGE 失效
公开(公告)号：JPH11237596A
公开(公告)日：1999-08-31
申请号：JP5270498
申请日：1998-02-19
申请人： MICRONICS JAPAN CO LTD
发明人： KOSAKA YUTAKA , FUJIWARA SHINJI
IPC分类号： G01R31/28 , G02F1/13
摘要： PROBLEM TO BE SOLVED: To make reducible the position deviation between the electrode of a body to be inspected and a probe even when an unbalanced load by the probe is applied onto a receiving base by transmitting a load acting on the receiving base to a supporting means with a first connection means on a rotation center side and plural second connection means around it. SOLUTION: When the electrode of a single tab type liquid crystal substrate is pressed by the probe, since a pressing force acts on the two adjacent edge parts of the liquid crystal substrate, an unbalanced load acts on a Z stage 26 and a receiving base 60. However, in this stage, a Z slider 88 transmits the load acting on it to the receiving base 60 by a Z driving mechanism arranged at the corner part of a virtual square analogous to the liquid crystal substrate, so that inclination and deflection are prevented. Also, since the receiving base 60 transmits the load acting on it to a θ base and Y slider 46 by a bearing 62 on the center side and plural curve guides 64 around it, the inclination and the deflection are prevented.

10. 发明专利

JPH11183863A INSPECTION DEVICE FOR SUBSTRATE TO BE MEASURED 失效
公开(公告)号：JPH11183863A
公开(公告)日：1999-07-09
申请号：JP36477097
申请日：1997-12-22
申请人： MICRONICS JAPAN CO LTD
发明人： FUJIWARA SHINJI , FURUKAWA JUNICHI , KOSAKA YUTAKA , OISHI KAMIHITO
IPC分类号： G02F1/13 , G09F9/00 , H01L21/677 , H01L21/68
摘要： PROBLEM TO BE SOLVED: To lower the cost of an inspection device by providing an alignment means aligning a received substrate to be measured while selectively displacing the substrate to be measured in a horizontal state and in an inclined state to simplify the constitution of the device. SOLUTION: An air cylinder 96 is extended and a link stage 60 is rotated around the axial line of a shaft 94 and an alignment stage 54 is inclined in a state in which a substrate to be measured 12 is attracted to an attracting pad 70 and the state of the substrate 12 is changed from the horizontal state to the inclined state. In this state, the transferring of the substrate 12 to an alignment mechanism and a relay mechanism is performed. When the substrate 12 is transferred from the alignment mechanism to the relay mechanisms, the first movable body of one side of either of a first or a second relay mechanism is moved to a first position where a transfer with respect to a measuring stage is to be performed and the first movable body of the other side is moved to a second position where a transfer with respect to the alignment mechanism is to be performed.

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