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1. 发明专利

JP2003270296A Automatic inspection device for semiconductor device 审中-公开
标题翻译：半导体器件自动检测装置
公开(公告)号：JP2003270296A
公开(公告)日：2003-09-25
申请号：JP2002076252
申请日：2002-03-19
申请人： Juki Corp , ジューキ株式会社
发明人： KINOSHITA TADASHI , TAKUSHIMA MASAMITSU , YAMAMOTO YUJI , TAUCHI TSUKASA , YOSHIHIRA MITSUHIRO , TAKAHARA TOSHIAKI
IPC分类号： G01R31/26
摘要： PROBLEM TO BE SOLVED: To provide an automatic semiconductor inspecting device by which a semiconductor device to which a cable has been connected can be inspected with high precision efficiently.
SOLUTION: The automatic semiconductor device inspecting device 10 is formed comprising trays 20 for holding semiconductor devices 18, a tray storage portion 22, a conveying device 26 for conveying the trays 20 successively from the storage portion 22 to an inspection area 24, an inspecting connector 28 which is automatically coupled to a connector 16 in the inspection area 24, a probe 30 which touches the terminal area 14A of the device body 14 and inputs/outputs signals, a pressure application device 36 which applies pressure to the terminal area 14A in the direction of the probe 30, and an inspection appliance 38 which inspects each of the semiconductor devices 18 by inputting an input signal from one of the inspecting connector 28 and the probe 30 and obtaining an output signal from the other.
COPYRIGHT: (C)2003,JPO
摘要翻译：要解决的问题：提供一种自动半导体检查装置，通过该自动半导体检查装置可以高精度地检查连接有电缆的半导体装置。解决方案：自动半导体器件检查装置10形成为包括用于保持半导体器件18的托盘20，托盘存储部分22，用于将托盘20从存储部分22连续地传送到检查区域24的输送装置26，自动耦合到检查区域24中的连接器16的检查连接器28，接触装置主体14的端子区域14A的输入/输出信号的探针30，向终端区域施加压力的压力施加装置36 14A，并且通过从检测连接器28和探头30中的一个输入输入信号并从另一个获得输出信号来检查每个半导体器件18的检查装置38。版权所有（C）2003，JPO

2. 发明专利

JP2004177125A Automatic inspection device for semiconductor device 审中-公开
标题翻译：半导体器件自动检测装置
公开(公告)号：JP2004177125A
公开(公告)日：2004-06-24
申请号：JP2002339845
申请日：2002-11-22
申请人： Juki Corp , ジューキ株式会社
发明人： TAUCHI TSUKASA
IPC分类号： G01R31/26
摘要： PROBLEM TO BE SOLVED: To reduce the burden of setting work for executing inspection for a plurality of inspection patterns, and to remarkably improve the working efficiency for inspection.
SOLUTION: This automatic semiconductor inspecting device 10 is provided with an inspection data control means 20 for controlling a measuring pattern setting data and a processing pattern setting data for executing one of the inspection patterns as one inspection pattern setting data group, and for storing a plurality of kinds of the inspection pattern setting data groups, and a conveying means 16 for storing a plurality of semiconductor devices 12 to be conveyed to a measuring means 14 in order. The inspection pattern setting data group is selected from the inspection data control means 20 to conduct the setting for the execution of the inspection for the corresponding inspection pattern.
COPYRIGHT: (C)2004,JPO
摘要翻译：要解决的问题：为了减少执行多个检查图案的检查的设定工作的负担，并且显着提高检查的工作效率。解决方案：该自动半导体检查装置10设置有用于控制测量图案设置数据的检查数据控制装置20和用于执行其中一个检查图案作为一个检查图案设置数据组的处理图案设置数据，并且存储多种检查图案设定数据组，以及传送装置16，用于存储要依次传送到测量装置14的多个半导体装置12。从检查数据控制装置20中选择检查图案设置数据组，以进行用于执行相应检查图案的检查的设置。版权所有（C）2004，JPO

3. 发明专利

JP2004335930A Method and device for cleaving wafer 审中-公开
标题翻译：用于清洗波浪的方法和装置
公开(公告)号：JP2004335930A
公开(公告)日：2004-11-25
申请号：JP2003132917
申请日：2003-05-12
申请人： Juki Corp , ジューキ株式会社
发明人： TAKAHARA TOSHIAKI , TAUCHI TSUKASA , NAKAMURA MASAO
IPC分类号： H01L21/301
摘要： PROBLEM TO BE SOLVED: To satisfactorily perform a cleavage in a manufacturing process in which a compound semiconductor wafer is chipped. SOLUTION: A wafer cleaning device comprises a scribing mechanism 50 for scribing the wafer W; a wafer retention mechanism 20 that has a placement surface for placing the wafer W and retains the wafer W while one end projects outside the placement surface; a stress application mechanism 60 coming into contact with the projection site of the wafer W for pressing to apply bending stress; and flexible sheet materials 27 and 69 interposed between the placement surface and the wafer W, and between the stress application mechanism 60 and the wafer W, respectively. COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：为了在化合物半导体晶片被切削的制造工艺中令人满意地进行切割。解决方案：晶片清洗装置包括用于划线晶片W的划线机构50; 晶片保持机构20具有用于放置晶片W的放置表面并且在一端突出放置表面的同时保持晶片W; 应力施加机构60与晶片W的投影部位接触，用于施加弯曲应力; 以及插入在放置表面和晶片W之间以及应力施加机构60和晶片W之间的柔性片材27和69。版权所有（C）2005，JPO＆NCIPI

4. 发明专利

JP2004317432A Temperature regulator for semiconductor device, and inspection device for semiconductor device 审中-公开
公开(公告)号：JP2004317432A
公开(公告)日：2004-11-11
申请号：JP2003114665
申请日：2003-04-18
申请人： Juki Corp , ジューキ株式会社
发明人： TAUCHI TSUKASA , YOSHIHIRA MITSUHIRO , IKEDA KENJI
IPC分类号： G01R31/26 , H01L21/027
摘要： PROBLEM TO BE SOLVED: To efficiently and uniformly regulate a temperature of a semiconductor device having a cable.
SOLUTION: This temperature regulator 10 for the semiconductor device is provided with a device main body shielding means 18 for shielding the semiconductor device 16 having a device main body 12 and the cable 14 connected to the device main body 12 from its outside, limited to a peripheral part of the device main body 12, and a temperature regulating gas supply means 20 for supplying a prescribed temperature of temperature regulating gas into an inside of the device main body shielding means 18.
COPYRIGHT: (C)2005,JPO&NCIPI

5. 发明专利

JP2003021664A Semiconductor device automatic inspection device 审中-公开
标题翻译：半导体器件自动检测器件
公开(公告)号：JP2003021664A
公开(公告)日：2003-01-24
申请号：JP2001206553
申请日：2001-07-06
申请人： Juki Corp , ジューキ株式会社
发明人： MIYASAKO MASAMI , KINOSHITA TADASHI , YAMAMOTO YUJI , TAUCHI TSUKASA , YOSHIHIRA MITSUHIRO
IPC分类号： G01R31/26 , G01R1/06 , G01R31/28
摘要： PROBLEM TO BE SOLVED: To provide a semiconductor device automatic inspection device capable of inspecting, highly accurately and efficiently, a semiconductor device to which a cable is connected.
SOLUTION: This semiconductor device automatic inspection device 10 comprises a tray 20 for holding the semiconductor device 18, a conveyance device 24 for conveying successively the tray 20 to an inspection area 22 in the holding state of the semiconductor device 18, an inspection connector 26 to be automatically coupled with a connector 16 in the held state by the tray 20, a probe 28, a transfer device 30 for transferring the tray 20 toward the probe 28, and thereby allowing a terminal 14A of a device body 14 and a terminal 28A of the probe 28 to approach mutually, and inspection equipment 32 for inspecting the semiconductor device 18 by inputting an input signal from the inspection connector 26 and by acquiring an output signal from the probe 28.
COPYRIGHT: (C)2003,JPO
摘要翻译：要解决的问题：提供一种半导体装置自动检查装置，其能够高精度地且有效地检测连接有电缆的半导体装置。解决方案：该半导体装置自动检查装置10包括用于保持半导体装置18的托盘20，用于在半导体装置18的保持状态下将托盘20连续地传送到检查区域22的输送装置24，检查连接器26 在保持状态下通过托盘20自动联接连接器16，探针28，用于将托盘20朝向探针28传送的传送装置30，从而允许装置主体14的端子14A和端子28A的端子探针28相互接近，以及检查设备32，用于通过从检查连接器26输入输入信号并且从探针28获取输出信号来检查半导体器件18。

6. 发明专利

JP2006050875A Linear motor control method of gate type stage system 审中-公开
标题翻译：门型系统的线性电机控制方法
公开(公告)号：JP2006050875A
公开(公告)日：2006-02-16
申请号：JP2004232418
申请日：2004-08-09
申请人： Juki Corp , Juki株式会社
发明人： TAUCHI TSUKASA
IPC分类号： H02P25/06 , H02P5/52
摘要： PROBLEM TO BE SOLVED: To easily and quickly match magnetic poles with high precision, for two linear motors of a gate type stage system. SOLUTION: The gate type stage system comprises a gate type stage 1 and two linear motors 30a and 30b for making the gate type stage move. A moving member 32a is moved in the forward and the reverse directions at least once, respectively, by energizing only one linear motor 30a. The energizing phase angle of the moving member relative to a stator 31a of the linea motor is acquired for each movement. A unique energizing phase angle is determined by statistical processing from among the energizing phase angles acquired for each movement in the forward and the reverse directions. In the same way, a unique energizing phase angle is determined for the linear motor, as well, by energizing only with respect to the other linear motor 30b. COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：为了容易且快速地匹配高精度的磁极，对于门式平台系统的两个线性电动机。解决方案：门型舞台系统包括门型舞台1和两个用于使门型舞台移动的线性电动机30a和30b。移动构件32a分别通过仅施加一个线性电动机30a而在前后方向上移动至少一次。针对每个移动获取移动构件相对于线性马达的定子31a的通电相位角。通过在向前和反向的每次移动获得的激励相位角中的统计处理来确定独特的通电相位角。以相同的方式，通过仅通过相对于另一直线电动机30b的激励来确定线性电动机的独特的通电相位角。版权所有（C）2006，JPO＆NCIPI

7. 发明专利

JP2008110256A Control box of sewing machine 审中-公开
标题翻译：缝纫机控制箱
公开(公告)号：JP2008110256A
公开(公告)日：2008-05-15
申请号：JP2008022882
申请日：2008-02-01
申请人： Juki Corp , Juki株式会社
发明人： TAUCHI TSUKASA , WADA MINORU , KOTAKI HIROSHI , MURAI KENJI , KUBOTA YOSHIHIKO
IPC分类号： D05B69/18
摘要： PROBLEM TO BE SOLVED: To provide a control box of a sewing machine which facilitates the attachment and detachment or the opening and closing of a cover part and facilitates its maintenance such as the checkup or replacement of inside an electrical components. SOLUTION: The control box 10 of the sewing machine, which is attached under a sewing machine table and incorporates the electrical components 41, has a frame part 20 fixed under the sewing machine table, the electrical component 41 mounted on a vertical surface of the frame part, and the cover part 50 fixed to the frame part in order to cover the electrical component. The cover part is detachably attached to the frame part, and an auxiliary cover part 70 is turnably installed on the cover part. COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提供一种便于安装和拆卸或打开和关闭盖部件的缝纫机的控制箱，并且便于其维护，例如检查或更换电气部件内部。
解决方案：缝纫机的控制箱10安装在缝纫机台下并结合有电气部件41，具有固定在缝纫机台下的框架部20，安装在垂直面上的电气部件41 的框架部分，并且盖部分50固定到框架部分以覆盖电气部件。盖部分可拆卸地附接到框架部分，并且辅助盖部分70可转动地安装在盖部上。版权所有（C）2008，JPO＆INPIT

8. 发明专利

JP2006166652A Motor controller for sewing machine 审中-公开
标题翻译：缝纫机电机控制器
公开(公告)号：JP2006166652A
公开(公告)日：2006-06-22
申请号：JP2004356886
申请日：2004-12-09
申请人： Juki Corp , Juki株式会社
发明人： TAUCHI TSUKASA
IPC分类号： H02P6/20
摘要： PROBLEM TO BE SOLVED: To realize a cost reduction by dispensing with a Hall sensor which detects the absolute position of the rotor magnetic poles of a motor which drives a main shaft of a sewing machine, while enabling the sewing machine to be operated immediately upon turning on a power source. SOLUTION: The position of the rotor magnetic poles of a motor is roughly detected in a step S4. The position of the rotor magnetic poles of a motor is detected in detail in a step S5. At a time of initialization such as turning on a power source or the like in a step S3, the rough detection means and the detailed detection means are switched corresponding to the vertical position of a needle pointer, to carry out the detection of the position of the rotor magnetic poles. COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：通过分配霍尔传感器来实现成本降低，霍尔传感器检测驱动缝纫机的主轴的电动机的转子磁极的绝对位置，同时使缝纫机能够被操作马上打开电源。解决方案：在步骤S4中粗略地检测电机的转子磁极的位置。在步骤S5中详细检测电机的转子磁极的位置。在步骤S3中，在诸如接通电源等的初始化时，粗针检测装置和详细检测装置根据针指针的垂直位置进行切换，以便检测位置的位置转子磁极。版权所有（C）2006，JPO＆NCIPI

9. 发明专利

JP2005295729A Drive control device and drive control method 有权
标题翻译：驱动控制装置和驱动控制方法
公开(公告)号：JP2005295729A
公开(公告)日：2005-10-20
申请号：JP2004109669
申请日：2004-04-02
申请人： Juki Corp , Juki株式会社
发明人： TAUCHI TSUKASA
IPC分类号： H02P5/00 , H02P7/67
摘要： PROBLEM TO BE SOLVED: To control the driving state of a motor to reduce in instantaneous power consumption. SOLUTION: For the prescribed operation of a drive control device, a determining device determines the presence of the motor of which the timing of a first step of accelerating motion or a third step of decelerating motion overlaps with each other in timing that each of the motor set by a setting device operates. A first comparison determination device and a second comparison determination device determines a span of the entire operation of the motor which is determined to have the timing of mutually overlapping by the determination device. A main timing changing device is provided to change the driving timing of one of the motors so that the first step to the third step of the motor is set within the second step of a uniform motion of the other motor. COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：控制电动机的驱动状态以降低瞬时功率消耗。解决方案：对于驱动控制装置的规定操作，确定装置确定加速运动的第一步骤的定时或减速运动的第三步骤的电动机的存在，其中每个由设定装置进行的电动机的动作。第一比较确定装置和第二比较确定装置确定由确定装置确定为具有相互重叠的定时的电动机的整个操作的跨度。提供主定时改变装置来改变其中一个电动机的驱动定时，使得电动机的第一步骤到第三步骤被设置在另一个电动机的均匀运动的第二步骤内。版权所有（C）2006，JPO＆NCIPI

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