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1. 发明专利

JP2008224341A Face distortion measuring instrument and method 有权
标题翻译：表面失真测量仪器和方法
公开(公告)号：JP2008224341A
公开(公告)日：2008-09-25
申请号：JP2007061242
申请日：2007-03-12
申请人： Jfe Steel Kk , Jfe Techno Research Corp , Jfeスチール株式会社 , Jfeテクノリサーチ株式会社
发明人： SATO KENTARO , IWAMA TAKASHI , URABE TOSHIAKI , UESUGI MITSUAKI
IPC分类号： G01B11/16 , G01B11/25
摘要： PROBLEM TO BE SOLVED: To provide a face distortion measuring instrument and method, capable of measuring and evaluating quantitatively, quickly and precisely a face distortion distribution in all the observable places on a measuring objective specular or half-mirror face, using an optical means, without being affected by a three-dimensional shape of a measuring object.
SOLUTION: This face distortion measuring instrument for measuring a face distortion on the specular or half-mirror face is provided with a pattern display means capable of displaying switchingly a plurality of kinds of light and dark patterns, a photographing means 3 for photographing mirror images with the plurality of light and dark patterns reflected on the face of the specular or half-mirror measuring object, and displayed on the pattern display means, and a face distortion distribution computing means for processing the photographed specular images of the plurality of photographed light and dark patterns, and for computing the face distortion distribution on the measuring objective face. The face distortion measuring instrument is provided further with a macro shape measuring means for measuring a macro three-dimensional shape of the measuring object, and a macro shape correcting means for correcting a computed face distortion distribution, based on the measured macro three-dimensional shape.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提供一种面部变形测量仪器和方法，能够在测量目标镜面或半镜面上的所有可观察的位置中定量，快速和精确地测量和评估面部畸变分布，使用光学装置，而不受测量对象的三维形状的影响。解决方案：用于测量镜面或半镜面上的脸部畸变的脸部畸变测量仪器设置有能够切换显示多种类型的明暗图案的图案显示装置，用于拍摄的拍摄装置3 具有在镜面或半透镜测量对象的表面上反射并且显示在图案显示装置上的多个亮和暗图案的镜像，以及一个用于处理多个拍摄的照片的被拍摄的镜面图像的面部失真分布计算装置光和暗图案，并用于计算测量目标面上的面部失真分布。面部畸变测量仪器还具有用于测量测量对象的宏观三维形状的宏观测量装置，以及用于根据所测量的宏观三维形状校正计算出的面部畸变分布的宏观形状校正装置。版权所有（C）2008，JPO＆INPIT

2. 发明专利

JP2007147587A Surface distortion measuring device and method 有权
标题翻译：表面失真测量装置和方法
公开(公告)号：JP2007147587A
公开(公告)日：2007-06-14
申请号：JP2006194514
申请日：2006-07-14
申请人： Jfe Steel Kk , Jfe Techno Research Corp , Jfeスチール株式会社 , Jfeテクノリサーチ株式会社
发明人： SAITO TAKANOBU , SATO KENTARO , YOSHITAKE AKIHIDE , IWAMA TAKASHI , UESUGI MITSUAKI
IPC分类号： G01B11/16 , G01B11/25
CPC分类号： G01B11/2536 , G01B11/2527 , G01B11/2531 , G01M11/005 , G01N21/8806 , G06T7/521
摘要： PROBLEM TO BE SOLVED: To quantitatively, quickly and precisely measure and evaluate a surface distortion distribution in all the observable points on a measuring objective specular or half-mirror-like surface. SOLUTION: A surface distortion measuring device includes a pattern display means 2 capable of displaying switchingly a plurality of kinds of light and dark patterns 5, a photographing means 3 for photographing mirror images of the plurality of light and dark patterns reflected on the surface of the specular or half-mirror-like measuring object 1, and displayed on the pattern display means, and a surface distortion distribution computing means 10 for processing the photographed specular images of the plurality of light and dark patterns to compute the surface distortion distribution on the measuring objective surface. COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：定量地，快速和精确地测量和评估测量目标镜面或半透明表面上的所有可观察点中的表面失真分布。解决方案：表面失真测量装置包括能够切换地显示多种光和暗图案5的图案显示装置2，拍摄装置3，用于拍摄反映在该图像上的多个光和暗图案的镜像并且显示在图案显示装置上的表面失真分布计算装置10，用于处理多个亮和暗图案的拍摄镜面图像以计算表面失真分布在测量目标表面上。版权所有（C）2007，JPO＆INPIT

3. 发明专利

JP2010216870A Apparatus and method for measuring surface strain 审中-公开
标题翻译：测量表面菌株的装置和方法
公开(公告)号：JP2010216870A
公开(公告)日：2010-09-30
申请号：JP2009061622
申请日：2009-03-13
申请人： Jfe Techno Research Corp , Jfeテクノリサーチ株式会社
发明人： UESUGI MITSUAKI
IPC分类号： G01B11/16 , G01B11/30 , G01N19/08 , G01N21/88 , G01N21/892
摘要： PROBLEM TO BE SOLVED: To provide an apparatus and method for measuring surface strain, which can determine the quantitative surface strain distribution of an object under measurement at high speed and with high precision owing to less restrictions to measurement conditions such as the movement of the object under measurement.
SOLUTION: The apparatus for measuring surface strain includes: a linear light generation means 2 for generating linear diffusion light against the object under measurement 1; a photographing means 3 for photographing the mirror image of the linear diffusion light on the surface of the object under measurement 1; a movement means 4 for changing the relative position of the object under measurement 1 with respect to the linear light generation means 2 and the photographing means 3; and a surface strain distribution calculation means 10 for calculating the surface strain distribution of the object under measurement 1 by performing image processing on a mirror image on the basis of a temporal change in the relative position between the linear light generation means 2 and the photographing means 3 and the object under measurement 1 obtained by the photographing means 3.
COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：提供一种用于测量表面应变的装置和方法，其可以由于对诸如运动的测量条件的较少限制，以高速和高精度确定测量中的物体的定量表面应变分布的被测物体。解决方案：用于测量表面应变的装置包括：线性光产生装置2，用于产生对被测物体1的线性漫射光; 拍摄装置3，用于拍摄被测物1的表面上的线状扩散光的镜像; 用于相对于线形光发生装置2和拍摄装置3改变被测物体1的相对位置的移动装置4; 以及表面应变分布计算装置10，用于通过基于线性光产生装置2和拍摄装置2之间的相对位置的时间变化对镜像进行图像处理来计算被测物体1的表面应变分布 3和由拍摄装置3获得的被测物体1。版权所有（C）2010，JPO＆INPIT

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