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1. 发明专利

JP2004156932A Surface inspection apparatus 审中-公开
公开(公告)号：JP2004156932A
公开(公告)日：2004-06-03
申请号：JP2002320593
申请日：2002-11-05
申请人： Jfe Steel Kk , Jfeスチール株式会社
发明人： OSHIGE TAKAHIKO , UESUGI MITSUAKI
IPC分类号： G01N21/892
摘要： PROBLEM TO BE SOLVED: To provide an apparatus capable of detecting any type of flaws such as a dot-like flaw, a long flaw in the width direction of a body to be tested, and a long flaw in the length direction of the body to be tested.
SOLUTION: In the apparatus, a light source 4 which is disposed in a detecting head 3 irradiates a surface of a steel sheet 1 with parallel light having wavelength values in the visible region at a large incident angle θ of approximate 90 degrees. The surface of the steel sheet 1 is irradiated at the above incident angle after the parallel light is reflected by a mirror 5. The light reflected by the surface of the steel sheet 1 is focused to make an image on a translucent screen 6. The image is photographed by a two-dimensional camera 7 from the rear face of the screen 6, and irregular flaws are detected by an image processing device 8 executing its image processing. The incident angle of the parallel light which is set at an intermediate position of the steel sheet 1 in both width and length directions, is determined from a shape of the above minute irregular flaw being an object to be detected in the width direction, a shape in the length direction and a shape of the body to be tested.
COPYRIGHT: (C)2004,JPO

2. 发明专利

JP2006064608A Surface inspection method and surface inspection device 审中-公开
标题翻译：表面检查方法和表面检查装置
公开(公告)号：JP2006064608A
公开(公告)日：2006-03-09
申请号：JP2004249501
申请日：2004-08-30
申请人： Jfe Steel Kk , Jfeスチール株式会社
发明人： OSHIGE TAKAHIKO
IPC分类号： G01N21/892 , G01B11/30
摘要： PROBLEM TO BE SOLVED: To provide a surface inspection method capable of detecting a small-sized flaw even if an inspection target is flat, and to provide a surface inspection device.
SOLUTION: In the surface inspection method wherein luminous flux is thrown on the surface of a planar surface inspection target at a predetermined incident angle and the light reflected from the surface of the inspection target is detected to detect a minute uneven flaw, the relation between the wavelength λ of the light source and the incident angle θ to the wavelength λ of the light source is selected so that the ratio cosθ/λ of the cosine value of the incident angle θ to the wavelength λ of the light source becomes a predetermined value, which is determined corresponding to the surface roughness of the inspection target, or below and the luminous flux incident on the surface of the inspection target is set to diffused light.
COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：提供即使检查目标是平坦的也能够检测小尺寸缺陷的表面检查方法，并且提供表面检查装置。解决方案：在以预定入射角将光通量投射在平面检查对象物的表面上的表面检查方法中，检测出从检查对象物表面反射的光以检测微小的不均匀缺陷，选择光源的波长λ与光源的入射角度θ与波长λ之间的关系，使得入射角θ的余弦值与光源的波长λ的比值cosθ/λ成为将与检查对象的表面粗糙度相对应地确定的预定值和入射到检查对象的表面上的光束设定为漫射光。版权所有（C）2006，JPO＆NCIPI

3. 发明专利

JP2005227054A Method and device for automatically designing flaw type determination logic and surface defect meter 审中-公开
标题翻译：用于自动设计FLAW类型确定逻辑和表面缺陷计的方法和装置
公开(公告)号：JP2005227054A
公开(公告)日：2005-08-25
申请号：JP2004034436
申请日：2004-02-12
申请人： Jfe Steel Kk , Jfeスチール株式会社
发明人： NAKAMOTO SHIGEMI , OSHIGE TAKAHIKO
IPC分类号： G01N21/892 , B21C51/00 , G06T7/00
摘要： PROBLEM TO BE SOLVED: To provide a method and device for automatically designing flaw type determination logic to simply find out a rule for flaw type determination even when feature quantities are obtained in plenty, and to provide a surface defect meter. SOLUTION: Processing is started at the start (S100) to collect a prescribed number of teacher data with flaw type determination results added thereto (S101 and S102). Based on the teacher data, the flaw type determination logic is optimized (S103) by means of hereditary programming based on the teacher data. An optimized flaw type determination logic resulting therefrom is stored (S104) to finish the processing at the end (S105). COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：提供一种用于自动设计缺陷型确定逻辑的方法和装置，以便即使在大量获得特征量时也可以简单地找出缺陷型确定的规则，并提供表面缺陷计。解决方案：开始处理（S100），收集规定数量的教师数据，并附加有缺陷型确定结果（S101和S102）。基于教师数据，通过基于教师数据的遗传编程来对缺陷类型确定逻辑进行优化（S103）。存储由此产生的优化的瑕疵型确定逻辑（S104），以结束处理（S105）。版权所有（C）2005，JPO＆NCIPI

4. 发明专利

JP2005003691A Surface inspection apparatus 有权
标题翻译：表面检查装置
公开(公告)号：JP2005003691A
公开(公告)日：2005-01-06
申请号：JP2004277357
申请日：2004-09-24
申请人： Jfe Steel Kk , Jfeスチール株式会社
发明人： OSHIGE TAKAHIKO , UESUGI MITSUAKI , KOSHIHARA TAKAHIRO
IPC分类号： G01N21/892
摘要： PROBLEM TO BE SOLVED: To provide a device and method capable of surely detecting minute irregular flaws with irregularities of about several μm even in an inspection object with a large surface roughness.
SOLUTION: In the apparatus, a light source 4 which is disposed in a detecting head 3 irradiates a surface of a steel sheet 1 with parallel light having wavelength values in the visible region at a large incident angle θ of approximate 90°. The light reflected by the surface of the steel sheet 1 is focused to make an image on a translucent screen 6. The image is photographed by a two-dimensional camera 7 from the rear face of the screen 6, and image-processed by a signal processor 8, whereby irregular flaws are detected. When the wavelength of the light from the light source is λ, and the incident angle of the irradiating light to the steel sheet 1 is θ, cosθ/λ is set to a predetermined value. According to this, although the reflected light from the surface of the steel sheet at the incident angle is mirror reflected light, when irregular flaws are present, the corresponding parts are projected black on the screen 6. Therefore, the presence of the flaws can be detected.
COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：提供一种即使在具有大的表面粗糙度的检查对象中也能够可靠地检测出具有约几μm的不规则性的微小不规则缺陷的装置和方法。解决方案：在该装置中，设置在检测头3中的光源4以约90°的大入射角θ将具有波长值的平行光以可见区域的大角度θ照射在钢板1的表面上。由钢板1的表面反射的光被聚焦以在半透明屏幕6上形成图像。通过二维照相机7从屏幕6的背面拍摄图像，并且通过信号进行图像处理处理器8，由此检测不规则的缺陷。当来自光源的光的波长为λ，照射光与钢板1的入射角为θ时，将cosθ/λ设定为规定值。据此，虽然来自钢板表面的入射角的反射光是镜面反射光，但是当存在不规则的缺陷时，相应的部件在屏幕6上投射黑色。因此，存在缺陷可以是检测。版权所有（C）2005，JPO＆NCIPI

5. 发明专利

JP2006220527A Manufacturing method of metal strip, and the metal strip with marking 有权
标题翻译：金属条的制造方法和标记金属条
公开(公告)号：JP2006220527A
公开(公告)日：2006-08-24
申请号：JP2005033989
申请日：2005-02-10
申请人： Jfe Steel Kk , Jfeスチール株式会社
发明人： KATO HIROHARU , KOSHIHARA TAKAHIRO , NAGAMUNE AKIO , OSHIGE TAKAHIKO
IPC分类号： G01N21/892 , B21C51/00 , G01N27/83
摘要： PROBLEM TO BE SOLVED: To provide a manufacturing method of a metal strip, capable of enhancing surface flaw quality using an inspection method for inspecting the surface flaws on the metal strip with high accuracy, and to provide the metal strip with marking having flaw data. SOLUTION: Since the inspection method for surface flaws on the metal strip is constituted so that not only the properties of the surface of the metal strip, but also the properties of the surface layer part of the metal strip are measured in a process prior to a process of performing the inspection of the surface flaw to estimate whether the abnormal part detected by this measurement is exposed as the surface flaw in the inspection stage of the surface flaw, a surface flaw meter indicating part is compared with a flaw exposure estimating part due to the property measurement of the surface part to recognize whether the cause of the surface flow has occurred prior to or after the property measurement of the surface part during the metal strip manufacturing method even if the abnormal part is not exposed as the surface flaw in the inspection stage of the surface flaw and the occurrence cause of the surface flaw is specified easily. As a result, manufacturing process can be improved rapidly. COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：为了提供一种金属带的制造方法，其能够使用用于高精度地检查金属带上的表面缺陷的检查方法来提高表面缺陷质量，并且为金属带提供具有标记的标记，缺陷数据。解决方案：由于金属带上的表面缺陷的检查方法被构造成使得不仅金属带的表面的性质，而且金属带的表面层部分的性质也被测量在执行表面缺陷检查的过程之前，通过该测量检测到的异常部分是否暴露在表面缺陷的检查阶段中的表面缺陷，将表面缺陷计指示部分与缺陷暴露估计部分由于表面部分的性质测量，以识别在金属带制造方法期间，即使异常部分不暴露为表面缺陷，在金属带制造方法中在表面部件的性能测量之前或之后是否发生了表面流动的原因在表面缺陷的检查阶段和表面缺陷的发生原因易于指定。结果，制造工艺可以快速提高。版权所有（C）2006，JPO＆NCIPI

6. 发明专利

JP2006177789A Inspection device of rolling roll flaw 有权
标题翻译：滚子滚轴检查装置
公开(公告)号：JP2006177789A
公开(公告)日：2006-07-06
申请号：JP2004371640
申请日：2004-12-22
申请人： Jfe Steel Kk , Jfeスチール株式会社
发明人： OSHIGE TAKAHIKO , JINNAI TATSUYA
IPC分类号： G01N21/892
摘要： PROBLEM TO BE SOLVED: To provide an inspection device of a rolling roll flaw for precisely detecting the roll flaw in the rolling process of a steel sheet from a light degree to a heavy degree.
SOLUTION: The inspection device 15 of the rolling roll flaw is installed on a run-out table behind a cooling zone 12 between the final stand of the finish rolling machine 11 of a hot rolling line and the pinch roll 13 before a down coil 14 and its floodlight projection part emits light to the surface to be inspected by an inspection target obliquely in the width direction of the inspection target.
COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：提供一种用于在钢板从轻度到重度的轧制过程中精确检测轧辊缺陷的轧辊缺陷检查装置。解决方案：轧辊缺陷的检查装置15安装在热轧线的精轧机11的最终机架和压下辊13之间的冷却区12之后的排出台上线圈14及其泛光灯投影部分在检查对象物的宽度方向上倾斜地向检查对象物发光。版权所有（C）2006，JPO＆NCIPI

7. 发明专利

JP2014202528A 温度測定装置および温度測定方法有权
标题翻译：温度测量装置和温度测量方法
公开(公告)号：JP2014202528A
公开(公告)日：2014-10-27
申请号：JP2013076956
申请日：2013-04-02
申请人： Jfeスチール株式会社 , Jfe Steel Corp
发明人： KOSHIHARA TAKAHIRO , SHIMAMOTO HIROYUKI , OSHIGE TAKAHIKO , FUKUDA YOSHINORI
IPC分类号： G01J5/48 , B22D11/16 , G01J5/00
摘要：【課題】ダイナミックレンジが狭い撮像手段を用いても温度域の広い高温体の表面温度を高温度分解能で測定すること。【解決手段】本発明の温度測定装置は、鋳片6から放射される光線の強度若しくはエネルギーを検出する光電変換素子をアレイ配列してなる撮像手段10aと、撮像手段10aの露光時間を切換えて複数の異なる露光時間による撮像データを取得するデータ取得手段12aと、データ取得手段12aが取得した複数の異なる露光時間による撮像データのアレイ配列に対応する画素を、各露光時間毎に決められた変換範囲に区分けするデータ分割手段12bと、データ分割手段12bにより分割された撮像データの輝度を露光時間に応じて変換して温度分布を取得する温度変換手段12cと、温度変換手段12cにより取得された温度分布を統合して、高温体の表面温度分布を得る温度分布統合手段12dとを備える。【選択図】図4
摘要翻译：要解决的问题：即使使用动态范围窄的成像装置，也可以测量具有高温度分辨率的高温度的高温体的表面温度。解决方案：温度测量装置包括：用于阵列排列的成像装置10a 用于检测从铸片6发射的光的强度或能量的光电转换元件; 数据获取装置12a，用于通过切换成像装置10a的曝光时间来获取根据多个不同曝光时间的图像数据; 数据划分装置12b，用于根据由数据获取装置12a获取的多个不同的曝光时间将对应于图像数据的阵列排列的像素划分成为每个曝光时间确定的转换范围; 温度转换装置12c，用于根据曝光时间转换由数据划分装置12b分割的成像数据的亮度，并获取温度分布; 以及温度分布整合装置12d，用于对由温度转换装置12c获取的温度分布进行积分并获取高温体的表面温度分布。

8. 发明专利

JP2013221788A Temperature measuring method and temperature measuring device 有权
标题翻译：温度测量方法和温度测量装置
公开(公告)号：JP2013221788A
公开(公告)日：2013-10-28
申请号：JP2012091994
申请日：2012-04-13
申请人： Jfe Steel Corp , Jfeスチール株式会社
发明人： OSHIGE TAKAHIKO
IPC分类号： G01J5/60 , G01J5/00
CPC分类号： G01K7/08 , G01J5/601 , G01J2005/0048
摘要： PROBLEM TO BE SOLVED: To highly accurately measure the temperature of a measurement object without calculating a combination solution of emittance and without being affected by fluctuation in emittance.SOLUTION: A regressive creation part 3 analyzes the basis of spectral information used for creating a calibration curve defined by a temperature measured value obtained by measuring a measuring object 5 by using a contact type thermometer 30, calculates a score a(k, j) of the basis, and calculates a multiple regression coefficient (c(k), k=1, 2) from the score a(k, j) and the temperature of the temperature instruction value of the contact type thermometer 30 corresponding to the spectral information for calibration curve creation. A temperature estimation part 4 calculates a score of the basis, based on the spectral information of the measuring object and the basis calculated by the regressive creation part 3, and estimates the temperature of the measuring object, based on the calculated store a(k, j) and the multiple regression coefficient (c(k), k=1, 2). Thus, without calculating a combination solution of emittance, the temperature of the measuring object can be highly accurately measured without being affected by fluctuation in emittance.
摘要翻译：要解决的问题：高精度地测量测量对象的温度，而不用计算发射率的组合解而不受发射波动的影响。解决方案：回归创建部分3分析用于创建校准曲线的谱信息的基础由通过使用接触式温度计30测量测量对象5获得的温度测量值来定义，计算基准的分数a（k，j），并计算多项回归系数（c（k），k = 1， 2）从得分a（k，j）和对应于用于校准曲线创建的光谱信息的接触型温度计30的温度指令值的温度。温度估计部分4基于测量对象的光谱信息和由回归创建部分3计算的基础来计算基准的分数，并且基于计算的存储器a（k，k）来估计测量对象的温度， j）和多元回归系数（c（k），k = 1,2）。因此，在不计算发射率的组合解的情况下，可以高精度地测量测量对象的温度，而不受发射波动的影响。

9. 发明专利

JP2013068392A Solar heat collecting pipe, and solar heat collector using the same 审中-公开
标题翻译：太阳能热收集管和使用其的太阳能热收集器
公开(公告)号：JP2013068392A
公开(公告)日：2013-04-18
申请号：JP2011208992
申请日：2011-09-26
申请人： Jfe Steel Corp , Jfeスチール株式会社
发明人： SASHI KAZUMICHI , OSHIGE TAKAHIKO , NISHIYAMA NAOKI , SAKAMOTO YOSHIHITO
IPC分类号： F24J2/24 , F24J2/48
CPC分类号： Y02E10/44
摘要： PROBLEM TO BE SOLVED: To provide a solar heat collecting pipe with high efficiency of heat collection, and to provide a solar heat collector using the same.SOLUTION: The solar heat collecting pipe collects solar to heat a heat medium. The solar heat collecting pipe is formed of a partly-cut cylindrical shape having a slit-like opening across the whole area in a long axis direction. The ratio of areas of an inner wall and the opening (opening/inner wall) is 2.5 to 30.0%.

10. 发明专利

JP2013044503A Solar light reflecting plate and light collecting and heat collecting apparatus 有权
标题翻译：太阳光反射板和光收集和热收集装置
公开(公告)号：JP2013044503A
公开(公告)日：2013-03-04
申请号：JP2011184502
申请日：2011-08-26
申请人： Jfe Steel Corp , Jfeスチール株式会社
发明人： SASHI KAZUMICHI , OSHIGE TAKAHIKO , NISHIYAMA NAOKI , SAKAMOTO YOSHIHITO
IPC分类号： F24J2/10 , F24J2/14 , G02B5/08 , G02B5/10
CPC分类号： F24J2/12 , C23C14/025 , C23C14/028 , C23C14/081 , C23C14/10 , F24J2/1057 , F24J2/14 , F24J2/4607 , F24J2/4652 , F24J2002/1071 , G02B7/183 , Y02E10/45
摘要： PROBLEM TO BE SOLVED: To provide an solar light reflecting plate and a light collecting and heat collecting apparatus that can have superior light collecting properties.SOLUTION: There is provided the solar light reflecting plate used for the light collecting and heat collecting apparatus including the solar light reflecting plate which reflects and collects the solar light and a heat collecting tube which is heated by receiving the solar light collected by the solar light reflecting plate. The solar light reflecting plate includes at least a rolled base material, a solar light reflecting surface as an outermost surface reflecting the solar light has a surface roughness of 0.02-1.0 μm in terms of arithmetic mean roughness Ra, and the solar light reflecting plate is arranged in such a way that the angle between the rolling direction of the base material and the longitudinal direction of the heat collecting tube is 80-100°.
摘要翻译：要解决的问题：提供一种能够具有优异的聚光性的太阳光反射板和集光和热收集装置。解决方案：提供了一种用于集光和集热装置的太阳光反射板，包括反射和收集太阳光的太阳光反射板，以及通过接收由太阳光收集的太阳光而被加热的集热管太阳能反光板。太阳光反射板至少包括轧制基材，作为反射太阳光的最外表面的太阳光反射面的算术平均粗糙度Ra为0.02〜1.0μm，太阳光反射板为以使基材的轧制方向和集热管的长度方向之间的角度为80〜100°的方式配置。版权所有（C）2013，JPO＆INPIT

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