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    • 1. 发明专利
    • Film thickness measuring method and device therefor
    • 薄膜厚度测量方法及其设备
    • JP2012008062A
    • 2012-01-12
    • JP2010145799
    • 2010-06-28
    • Jfe Steel CorpJfeスチール株式会社
    • TSUDA KAZUTOMOOSHIGE TAKAHIKO
    • G01B11/06G01N21/27
    • PROBLEM TO BE SOLVED: To provide a film thickness measuring method and device capable of highly accurately measuring a film thickness.SOLUTION: The film thickness measuring method for estimating a film thickness by signal-processing spectrum information includes: a process of executing base decomposition of the spectrum information for calibration curve preparation, obtaining a first coefficient applied to the base as a representative value of the spectrum information and obtaining a multiple regression coefficient from the first coefficient and film thickness data corresponding to the spectrum information; and a process of obtaining a second coefficient applied to the base on the basis of the spectrum information of a measurement object and the base and estimating the film thickness of the measurement object on the basis of the second coefficient and the multiple regression coefficient.
    • 要解决的问题:提供能够高精度地测量膜厚度的膜厚测量方法和装置。 解决方案:用于通过信号处理频谱信息估算膜厚度的膜厚度测量方法包括:执行用于校准曲线制备的光谱信息的基本分解的处理,获得施加到基底的第一系数作为代表值 并从与频谱信息对应的第一系数和胶片厚度数据获得多元回归系数; 以及基于测量对象和基底的光谱信息获得施加到基底的第二系数的处理,并且基于第二系数和多元回归系数估计测量对象的膜厚度。 版权所有(C)2012,JPO&INPIT
    • 2. 发明专利
    • Method and device for measurement of oxide film thickness on surface of steel plate
    • 用于测量钢板表面氧化膜厚度的方法和装置
    • JP2011202968A
    • 2011-10-13
    • JP2010067751
    • 2010-03-24
    • Jfe Steel CorpJfeスチール株式会社
    • OSHIGE TAKAHIKO
    • G01B11/06
    • PROBLEM TO BE SOLVED: To propose a method and device for measurement of an oxide film thickness on the surface of a steel plate, capable of performing an accurate on-line and continuous measurement of the film thickness of an iron-based oxide formed on the surface of the steel plate, from outside a heating furnace being far from the steel plate.SOLUTION: The surface of the steel plate is irradiated intermittently with infrared light. When irradiated with the infrared light, the energy being the total of spontaneous light radiation energy radiated from the surface of the steel plate and reflected light energy of the radiated infrared light from the surface of the steel plate is detected in two different infrared wavelength bands. When irradiation with the infrared light is intercepted, only the spontaneous radiation energy from the steel plate is detected likewise. Out of detection values detected by the intermittent irradiation with the infrared light, the detection value detected upon interception of the infrared light is deducted from that detected upon irradiation, so as to calculate the reflected light energy. As to the calculated reflected light energy, the ratio between the energies in the two different infrared wavelength bands is computed on the entrance and exit sides of the heating furnace, and the ratio between them computed on these sides is computed.
    • 要解决的问题:提出一种用于测量钢板表面上的氧化膜厚度的方法和装置,其能够对在其上形成的铁基氧化物形成的铁基氧化物的膜厚进行准确的在线连续测量 钢板表面,远离钢板的加热炉外部。解决方案:钢板表面间隔地用红外线照射。 当用红外光照射时,能量是从钢板表面辐射的自发光辐射能量和来自钢板表面的辐射红外光的反射光能的总和在两个不同的红外波段中检测。 当用红外光照射时,同样检测到来自钢板的自发辐射能量。 通过用红外光的间歇照射检测到的检测值中,从照射后检测出的红外光中检测出的检测值被扣除,从而计算出反射光能。 对于计算出的反射光能,在加热炉的入射侧和出射侧计算两个不同红外波长带中的能量之间的比率,并计算它们之间在这些边上计算的比率。
    • 4. 发明专利
    • 温度測定装置および温度測定方法
    • 温度测量装置和温度测量方法
    • JP2014202528A
    • 2014-10-27
    • JP2013076956
    • 2013-04-02
    • Jfeスチール株式会社Jfe Steel Corp
    • KOSHIHARA TAKAHIROSHIMAMOTO HIROYUKIOSHIGE TAKAHIKOFUKUDA YOSHINORI
    • G01J5/48B22D11/16G01J5/00
    • 【課題】ダイナミックレンジが狭い撮像手段を用いても温度域の広い高温体の表面温度を高温度分解能で測定すること。【解決手段】本発明の温度測定装置は、鋳片6から放射される光線の強度若しくはエネルギーを検出する光電変換素子をアレイ配列してなる撮像手段10aと、撮像手段10aの露光時間を切換えて複数の異なる露光時間による撮像データを取得するデータ取得手段12aと、データ取得手段12aが取得した複数の異なる露光時間による撮像データのアレイ配列に対応する画素を、各露光時間毎に決められた変換範囲に区分けするデータ分割手段12bと、データ分割手段12bにより分割された撮像データの輝度を露光時間に応じて変換して温度分布を取得する温度変換手段12cと、温度変換手段12cにより取得された温度分布を統合して、高温体の表面温度分布を得る温度分布統合手段12dとを備える。【選択図】図4
    • 要解决的问题:即使使用动态范围窄的成像装置,也可以测量具有高温度分辨率的高温度的高温体的表面温度。解决方案:温度测量装置包括:用于阵列排列的成像装置10a 用于检测从铸片6发射的光的强度或能量的光电转换元件; 数据获取装置12a,用于通过切换成像装置10a的曝光时间来获取根据多个不同曝光时间的图像数据; 数据划分装置12b,用于根据由数据获取装置12a获取的多个不同的曝光时间将对应于图像数据的阵列排列的像素划分成为每个曝光时间确定的转换范围; 温度转换装置12c,用于根据曝光时间转换由数据划分装置12b分割的成像数据的亮度,并获取温度分布; 以及温度分布整合装置12d,用于对由温度转换装置12c获取的温度分布进行积分并获取高温体的表面温度分布。
    • 5. 发明专利
    • Temperature measuring method and temperature measuring device
    • 温度测量方法和温度测量装置
    • JP2013221788A
    • 2013-10-28
    • JP2012091994
    • 2012-04-13
    • Jfe Steel CorpJfeスチール株式会社
    • OSHIGE TAKAHIKO
    • G01J5/60G01J5/00
    • G01K7/08G01J5/601G01J2005/0048
    • PROBLEM TO BE SOLVED: To highly accurately measure the temperature of a measurement object without calculating a combination solution of emittance and without being affected by fluctuation in emittance.SOLUTION: A regressive creation part 3 analyzes the basis of spectral information used for creating a calibration curve defined by a temperature measured value obtained by measuring a measuring object 5 by using a contact type thermometer 30, calculates a score a(k, j) of the basis, and calculates a multiple regression coefficient (c(k), k=1, 2) from the score a(k, j) and the temperature of the temperature instruction value of the contact type thermometer 30 corresponding to the spectral information for calibration curve creation. A temperature estimation part 4 calculates a score of the basis, based on the spectral information of the measuring object and the basis calculated by the regressive creation part 3, and estimates the temperature of the measuring object, based on the calculated store a(k, j) and the multiple regression coefficient (c(k), k=1, 2). Thus, without calculating a combination solution of emittance, the temperature of the measuring object can be highly accurately measured without being affected by fluctuation in emittance.
    • 要解决的问题:高精度地测量测量对象的温度,而不用计算发射率的组合解而不受发射波动的影响。解决方案:回归创建部分3分析用于创建校准曲线的谱信息的基础 由通过使用接触式温度计30测量测量对象5获得的温度测量值来定义,计算基准的分数a(k,j),并计算多项回归系数(c(k),k = 1, 2)从得分a(k,j)和对应于用于校准曲线创建的光谱信息的接触型温度计30的温度指令值的温度。 温度估计部分4基于测量对象的光谱信息和由回归创建部分3计算的基础来计算基准的分数,并且基于计算的存储器a(k,k)来估计测量对象的温度, j)和多元回归系数(c(k),k = 1,2)。 因此,在不计算发射率的组合解的情况下,可以高精度地测量测量对象的温度,而不受发射波动的影响。
    • 8. 发明专利
    • Surface inspection apparatus and surface inspection method
    • 表面检查装置和表面检查方法
    • JP2013152220A
    • 2013-08-08
    • JP2012271483
    • 2012-12-12
    • Jfe Steel CorpJfeスチール株式会社
    • KOSHIHARA TAKAHIROOSHIGE TAKAHIKONISHIZAWA YUJI
    • G01N21/892
    • PROBLEM TO BE SOLVED: To provide a surface inspection apparatus and method which detect a minute irregularity defect equivalent to the roughness of a metal surface with an influence of the roughness of the metal surface eliminated and which quantitatively evaluate the size of the irregularity of the defect.SOLUTION: A surface inspection apparatus includes: a terahertz wave generator 20 generating a terahertz wave 7; a lens 17 which collimates the terahertz wave 7 generated by the terahertz wave generator 20 so as to apply it to a steel plate 8; a terahertz wave detector 18 detecting an intensity distribution of the terahertz wave 7 reflected on a surface of the steel plate 8 on a plane vertical in a travelling direction; a defect determination device 19 detecting an irregularity defect of the steel plate 8 on the basis of the intensity distribution of the terahertz wave 7.
    • 要解决的问题:提供一种表面检查装置和方法,该表面检查装置和方法在消除了金属表面粗糙度的影响下检测与金属表面的粗糙度相当的微小不规则缺陷,并定量评估缺陷的不规则尺寸 解决方案:表面检查装置包括:产生太赫兹波7的太赫兹波发生器20; 准直由太赫兹波发生器20产生的太赫兹波7以将其施加到钢板8的透镜17; 太赫兹波检测器18检测在行进方向垂直的平面上在钢板8的表面上反射的太赫兹波7的强度分布; 基于太赫兹波7的强度分布来检测钢板8的不规则缺陷的缺陷判定装置19。
    • 9. 发明专利
    • Surface inspection device
    • 表面检查装置
    • JP2012127941A
    • 2012-07-05
    • JP2011241297
    • 2011-11-02
    • Jfe Steel CorpJfeスチール株式会社
    • OSHIGE TAKAHIKO
    • G01N21/88G01N21/892
    • PROBLEM TO BE SOLVED: To stably detect a flaw on an object to be inspected even when the traveling speed of the object to be inspected is largely changed.SOLUTION: A surface inspection device includes a line sensor camera 1 for receiving light reflected from a moving object to be inspected 2, an imaging signal buffer 6 for temporarily storing an imaging signal output from the line sensor camera 1 at a constant cycle, a rotary encoder 9 for detecting a moving distance of the object to be inspected 2, an image capture control unit 8b for performing control of reading out the imaging signal temporarily stored in the imaging signal buffer 6 when the moving distance of the object to be inspected 2 detected by the rotary encoder 9 reaches a predetermined distance, and a flaw detection portion for detecting a flaw candidate point on the surface of the object to be inspected 2 from the imaging signal read out from the imaging signal buffer 6.
    • 要解决的问题:即使当被检查物体的行进速度发生很大变化时,也能够稳定地检测被检查物体的缺陷。 解决方案:表面检查装置包括用于接收从待检查的移动物体反射的光线2的线传感器相机1,用于临时存储从线传感器相机1输出的成像信号以恒定周期的成像信号缓冲器6 ,用于检测被检查物体的移动距离的旋转编码器9;图像拍摄控制单元8b,用于当要对象物的移动距离时执行暂时存储在成像信号缓冲器6中的成像信号的读出控制 由旋转编码器9检测到的检查2到达预定距离,以及用于从从成像信号缓冲器6读出的成像信号中检测被检查物体表面上的缺陷候选点2的探伤部分。 版权所有(C)2012,JPO&INPIT