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1. 发明专利

JP2011007565A Leakage flux flaw detector 审中-公开
标题翻译：泄漏流量检测器
公开(公告)号：JP2011007565A
公开(公告)日：2011-01-13
申请号：JP2009149946
申请日：2009-06-24
申请人： Jfe Engineering Corp , Jfeエンジニアリング株式会社
发明人： MANJO SHIN , AMANO TETSUYA
IPC分类号： G01N27/83
摘要： PROBLEM TO BE SOLVED: To provide a leakage flux flaw detector capable of easily eliminating a magnetizer from a specimen and capable of evaluating the healthiness of the specimen even under environment difficult to feed large power.SOLUTION: The magnetizer which constitutes the leakage flux flaw detector is composed of a first permanent magnet provided so that the specimen and an N pole come into contact with each other, the second permanent magnet arranged so as to leave an interval with respect to the first permanent magnet and provided so that the specimen and an S pole come into contact with each other and a third permanent magnet mutually connecting the magnetic poles on the side not coming into contact with the specimen of the first and second permanent magnets. The third permanent magnet is provided so that the relative positional relation between the N-pole and S-pole of the first permanent magnet and the first and second permanent magnets is made changeable.
摘要翻译：要解决的问题：提供一种能够容易地从试样中除去磁化器的漏磁通探伤仪，并且即使在难以供给大功率的环境下也能够评估试样的健康性。解决方案：构成漏磁通探伤仪的磁化器由第一永磁体构成，第一永久磁铁被设置为使得所述试样和N极彼此接触，所述第二永磁体被布置成相对于所述第一永磁体留出间隔，并且设置成使得所述试样和S 极彼此接触，并且第三永磁体将不与第一和第二永磁体的试样接触的一侧的磁极相互连接。第三永久磁铁被设置为使得第一永久磁铁和第一永久磁铁与第二永久磁铁的N极和S极之间的相对位置关系可变。

2. 发明专利

JP2014077108A Clathrate production apparatus and production method 审中-公开
标题翻译：撕裂生产装置和生产方法
公开(公告)号：JP2014077108A
公开(公告)日：2014-05-01
申请号：JP2013023224
申请日：2013-02-08
申请人： Jfe Engineering Corp , Jfeエンジニアリング株式会社
发明人： HAYASHI KANETOSHI , IDA HIROYUKI , MANJO SHIN
IPC分类号： C09K5/06 , B01D53/62 , B01J3/08 , C09K5/08
摘要： PROBLEM TO BE SOLVED: To provide a clathrate production apparatus and production method in which a generated clathrate does not fasten to a cooler and pipe arrangement or the like, and a clathrate can be stably produced.SOLUTION: A clathrate production apparatus 1 in which a host agent of a liquid phase and a guest agent of a gas phase are reacted to produce a clathrate includes: a cooler 4 in which at least one of the host agent and the guest agent is cooled so that a gas-liquid mixed phase fluid in which the host agent and the guest agent are mixed may be made an overcooling state; a venturi tube 6 in which the gas-liquid mixed phase fluid in an overcooling state is circulated; and a transportation apparatus 3 in which the gas-liquid mixed phase fluid is circulated in a contraction part 6B of the venturi tube 6 by acoustic velocity, wherein current velocity of the gas-liquid mixed phase fluid is made super acoustic velocity by an enlarged diameter part 6C of a downstream of the contraction part 6B to generate an impulse wave, thereby an overcooling state of the gas-liquid mixed phase fluid is cancelled to generate a clathrate.
摘要翻译：要解决的问题：提供一种其中生成的包合物不固定到冷却器和管道布置等的包合物生产设备和生产方法，并且可以稳定地生产包合物。解决方案：一种包合物生产设备1，其中将液相的主体剂和气相的客体反应以产生包合物，其包括：冷却器4，其中宿主剂和客体物质中的至少一种被冷却，使得气液混合相流体在宿主剂和客体混合物可以制成过冷状态; 文丘里管6，其中过冷状态的气液混合相流体循环; 以及输送装置3，其中气液混合相流体通过声速在文丘里管6的收缩部6B中循环，其中气液混合相流体的流速通过扩大的直径成为超声速度在收缩部6B的下游的部分6C产生脉冲波，从而消除气液混合相流体的过冷状态以产生包合物。

3. 发明专利

JP2013228333A Method and device for measuring particle beam distribution 有权
标题翻译：用于测量颗粒束分布的方法和装置
公开(公告)号：JP2013228333A
公开(公告)日：2013-11-07
申请号：JP2012101797
申请日：2012-04-26
申请人： Jfe Engineering Corp , Jfeエンジニアリング株式会社
发明人： DOI MAKOTO , HATTORI TAKUMI , MATSUMOTO TORU , MANJO SHIN
IPC分类号： G01T1/29 , G01T1/20 , G01T1/28 , G21K5/04 , G21K5/08
摘要： PROBLEM TO BE SOLVED: To provide a method and device for measuring a particle beam distribution, which can easily measure the distribution of high-voltage and high-output particle beams with high accuracy without using an amperometric element.SOLUTION: A metal plate 20 is arranged at a boundary between a vacuum at a particle beam application part (including a cathode electron gun 10) and an atmosphere or on an atmospheric side of a transmission window 18. Particle beams (electrons 12) are made collide with the metal plate 20, so that X-rays 21 are generated. The X-rays 21 generated at the metal plate 20 are converted to light by a scintillator 22 arranged on the atmospheric side, so that the light generated from the scintillator 22 is captured by a camera (a CCD camera 24).
摘要翻译：要解决的问题：提供一种用于测量粒子束分布的方法和装置，其可以在不使用电流分析元件的情况下以高精度容易地测量高电压和高输出粒子束的分布。解决方案：金属板20是布置在粒子束施加部（包括阴极电子枪10）的真空与透光窗18的气氛或大气侧之间的边界处。粒子束（电子12）与金属板20碰撞，从而产生X射线21。在金属板20上产生的X射线21通过布置在大气侧的闪烁器22转换为光，从而由闪光体22产生的光被照相机（CCD照相机24）捕获。

4. 发明专利

JP2011012979A Flaw evaluation method 审中-公开
标题翻译： FLAW评估方法
公开(公告)号：JP2011012979A
公开(公告)日：2011-01-20
申请号：JP2009154824
申请日：2009-06-30
申请人： Jfe Engineering Corp , Jfeエンジニアリング株式会社
发明人： MANJO SHIN , AMANO TETSUYA
IPC分类号： G01N27/90
摘要： PROBLEM TO BE SOLVED: To provide a method for evaluating the flaw of a specimen capable of accurately specifying the flaw depth of the specimen.SOLUTION: The flaw evaluation method is constituted so that an eddy current is produced by applying an AC magnetic field to the specimen and a change in the eddy current is detected by a sensor to evaluate the flaw of the specimen and has a second amplitude signal detection process for detecting the second amplitude signal produced outside the first amplitude signal produced at both end parts of the flaw of the specimen, an evaluation curve preparation process for preparing an evaluation curve obtained by entering the numerical value data of the second amplitude signal of the specimen known in flaw depth on two-dimensional coordinates wherein the flaw depth is set to the axis of abscissas and the second amplitude is set to the axis of ordinates and a flaw depth determination process for determining the flaw depth of the specimen on the basis of the evaluation curve and the second amplitude signal detected by the second amplitude signal detection process.
摘要翻译：要解决的问题：提供一种用于评价能够准确地规定试样的缺陷深度的试样的缺陷的方法。解决方案：所述缺陷评价方法构成为通过对所述试样施加交流磁场来产生涡流通过传感器检测试样和涡电流的变化，以评估样品的缺陷，并具有第二幅度信号检测处理，用于检测在第二幅度信号的两端产生的第一幅度信号之外产生的第二幅度信号试样，评价曲线制备方法，用于制备评价曲线，其通过将缺陷深度已知的试样的第二振幅信号的数值数据输入到二维坐标上，其中缺陷深度设定为横轴，第二振幅信号振幅被设定为纵坐标轴和用于基于此确定样本的缺陷深度的缺陷深度确定处理评估曲线和由第二振幅信号检测处理检测到的第二振幅信号。

5. 发明专利

JP2014021086A Wear depth estimation method and apparatus 有权
标题翻译：佩戴深度估计方法和装置
公开(公告)号：JP2014021086A
公开(公告)日：2014-02-03
申请号：JP2012163267
申请日：2012-07-24
申请人： Jfe Engineering Corp , Jfeエンジニアリング株式会社
发明人： MANJO SHIN
IPC分类号： G01N27/83
摘要： PROBLEM TO BE SOLVED: To provide a wear depth estimation method and apparatus capable of precisely detecting wear depth even when the configuration of wear is other than circular.SOLUTION: The wear depth estimation uses a data base 5 in which the leakage magnetic flux density in a direction parallel to an objective plane in the leakage magnetic flux density leaking from a magnetized object 3 to be inspected and a cross sectional area of the wear of the object to be inspected are associated with each other. The wear depth estimation method includes: a leakage magnetic flux density detection step to detect the leakage magnetic flux density in a direction parallel to the surface of the object to be inspected by scanning the object 3 to be inspected; a wear cross section estimation step to estimate the cross section area of the wear based on the leakage magnetic flux density detected in the leakage magnetic flux density detection step and the data base 5; a wear width estimation step to estimate the width of the wear based on the leakage magnetic flux density detected in the leakage magnetic flux density detection step; and a wear depth calculation step to calculate the wear depth based on the wear width estimated in the wear width estimation step and the cross section area of the wear estimated in the wear cross section estimation step.
摘要翻译：要解决的问题：提供一种磨损深度估计方法和装置，即使当磨损的构造不是圆形时也能够精确地检测磨损深度。解决方案：磨损深度估计使用数据库5，其中泄漏磁通密度在从被检查的被磁化物体3泄漏的漏磁通密度中平行于物平面的方向和待检查物体的磨损的横截面面积相互关联。磨损深度估计方法包括：泄漏磁通密度检测步骤，通过扫描被检查物体3来检测与被检查物体的表面平行的方向上的漏磁通密度; 磨损横截面估计步骤，用于基于在泄漏磁通密度检测步骤和数据库5中检测到的泄漏磁通密度来估计磨损的横截面面积; 磨损宽度估计步骤，用于基于在所述泄漏磁通密度检测步骤中检测到的所述泄漏磁通密度来估计所述磨损的宽度; 以及磨损深度计算步骤，基于在磨损宽度估计步骤中估计的磨损宽度和在磨损横截面估计步骤中估计的磨损的横截面面积来计算磨损深度。

6. 发明专利

JP2012216441A Field emission lamp 审中-公开
标题翻译：场发射灯
公开(公告)号：JP2012216441A
公开(公告)日：2012-11-08
申请号：JP2011081421
申请日：2011-04-01
申请人： Jfe Engineering Corp , Jfeエンジニアリング株式会社
发明人： NISHIGAYA TAKEHIKO , NISHI YASUHIKO , SOMIYA KENJI , MANJO SHIN
IPC分类号： H01J63/06 , H01J1/304
摘要： PROBLEM TO BE SOLVED: To provide a field emission lamp that has a bipolar structure owing to resistance to ion attack.SOLUTION: In the field emission lamp having a cathode electrode, a field emission layer disposed on a surface of the cathode electrode, an anode electrode and a phosphor layer formed on the anode electrode, the field emission layer comprises a carbon nanotube aggregate, and the carbon nanotube aggregate includes a parallel oriented bond of a plurality of adjacent triple- or more-walled multiwall carbon nanotubes, has a peak A in 1,860±20 cmand a peak B in 1,580±20 cmon a Raman spectrum resulting from the radiation of a laser having a wavelength of 532 nm, and has a relative intensity of the peak A at least 0.2 times that of the peak B.
摘要翻译：要解决的问题：提供由于抵抗离子攻击而具有双极结构的场致发射灯。解决方案：在具有阴极电极的场致发射灯中，设置在阴极电极的表面上的场致发射层，形成在阳极电极上的阳极电极和荧光体层，场致发射层包括碳纳米管集合体，并且碳纳米管集合体包括多个相邻的三壁或更多壁多壁碳纳米管的平行取向键，其具有在1,860±20cm的峰A和/ 由波长为532nm的激光的辐射产生的拉曼光谱的1580±20cm的峰B，其峰A的相对强度为至少是峰B的0.2倍。版权所有（C）2013，JPO＆INPIT

7. 发明专利

JP2011007570A Leakage flux flaw detector 审中-公开
标题翻译：泄漏流量检测器
公开(公告)号：JP2011007570A
公开(公告)日：2011-01-13
申请号：JP2009150071
申请日：2009-06-24
申请人： Jfe Engineering Corp , Jfeエンジニアリング株式会社
发明人： MANJO SHIN , AMANO TETSUYA
IPC分类号： G01N27/83
摘要： PROBLEM TO BE SOLVED: To provide a leakage flux flaw detector facilitating the elimination from a specimen and capable of evaluating the healthiness of the specimen without requiring large power.SOLUTION: In the leakage flux flaw detector equipped with a magnetizer for magnetizing the specimen and a magnetism sensor for detecting the leakage flux from the specimen magnetized by the magnetizer, the magnetizer is constituted by combining a permanent magnet with an electromagnet and is variable in its magnetization properties.
摘要翻译：要解决的问题：提供一种便于从试样中去除并能够评估样品的健康性而不需要大功率的漏磁通探伤仪。解决方案：在具有用于磁化样品的磁化器的漏磁通探伤仪和用于检测由磁化器磁化的试样的漏磁通的磁传感器，磁化器是通过将永磁体与电磁体组合而构成的，其磁化特性是可变的。

8. 发明专利

JP2009175027A Magnetizing device, and pipe inspection device 审中-公开
标题翻译：磁化装置和管道检查装置
公开(公告)号：JP2009175027A
公开(公告)日：2009-08-06
申请号：JP2008014775
申请日：2008-01-25
申请人： Jfe Engineering Corp , Jfeエンジニアリング株式会社
发明人： AMANO TETSUYA , MANJO SHIN , HARAYAMA MASAMI , KOBAYASHI MOTOI , NAKANO MINORUYO
IPC分类号： G01N27/83
摘要： PROBLEM TO BE SOLVED: To provide a magnetizing device that adjusts the magnetization level according to the condition of an analyte and reduces the weight when the required magnetization level is small.
SOLUTION: This magnetizing device 100 used for detecting a defect by a leakage magnetic flux method comprises a permanent magnet 110 and a magnetic substance 120 for connecting the permanent magnet 110. The permanent magnet 110 is formed by interconnecting a plurality of individual permanent magnets.
COPYRIGHT: (C)2009,JPO&INPIT

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