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    • 2. 发明专利
    • Joint surface inspecting device
    • 联合表面检测设备
    • JPS58202859A
    • 1983-11-26
    • JP8483182
    • 1982-05-21
    • Hitachi Ltd
    • KAMINAGA RETSUKOMORI YOSHITERUTAKAHOSHI TAKEO
    • G01N3/08G01N3/00G01N19/04G01N29/14
    • G01N29/14
    • PURPOSE:To facilitate the evaluation and inspection of the quality of a joint surface by connecting an amplifier to a detector for elastic wave through a wire code after it is mounted on a load for applying a direct load on a sample fitting. CONSTITUTION:In this apparatus, a detector 15 for an elastic wave is mounted on a load body 14 for applying a direct load on a sample fitting 13, an amplifier 17 connected the detector 15 through a wire code 16 and a waveform processor 21 connected the amplifier 17 through a wire code 20. Then, all elastic waves including noises are caught and processed with the waveform processor 21 to evaluate. In this enbodiment, the quality of adhesion between the rubber of a rubber roller and a fitting can be inspected totally in a non-destruction manner without misjudgement.
    • 目的:为了便于对接头表面的质量进行评估和检查,将放大器连接到用于弹性波的检测器,将其安装在用于对样品接头施加直接载荷的负载上后,通过导线代码。 构成:在这种装置中,用于弹性波的检测器15安装在负载体14上,用于对样本装置13施加直接负载,放大器17通过线代码16连接检测器15,并将波形处理器21连接到 放大器17通过线码20.然后,所有包含噪声的弹性波被波形处理器21捕捉和处理以进行评估。 在该实施例中,橡胶辊的橡胶和配件之间的粘合质量可以以非破坏的方式完全检查而没有错误的判断。
    • 6. 发明专利
    • DISPLACEMENT MEASURING DEVICE
    • JPS6058511A
    • 1985-04-04
    • JP16792383
    • 1983-09-12
    • HITACHI LTD
    • KAMINAGA RETSU
    • G01D5/26G01H9/00
    • PURPOSE:To perform accurate measurements simultaneously in real time, by attaching light emitting bodies, receiving the light beams from said light emitting bodies, and measuring the amount of displacement or the amount of vibration of bodies. CONSTITUTION:Light emitting diodes 18-21 are attached to bodies or a measuring points. A lens, which is provided in front of an electrooptical displacement measuring device, is selected in correspondence with the attaching range, so that the bodies are located in the field of view. Then the diodes are sequentially turned ON and OFF by a 1/4 ring counter and AND gate circuits 14-17. The flashing period is determined by the response frequency of the electrooptical displacement measuring device, the number and displacement of the bodies or the measuring points, and the frequency of vibration. For example, when the frequency of vibration is 100Hz, each of the light emitting diodes 18-21 may be flashed at every 0.005sec. At the displacement frequency of 500Hz, the number of bodies or measuring points up to 25 can be measured in real time.
    • 7. 发明专利
    • IMPACT TESTER
    • JPS5844328A
    • 1983-03-15
    • JP14224081
    • 1981-09-11
    • HITACHI LTD
    • KAMINAGA RETSU
    • G01N3/32G01N3/00G01N3/30G01N3/34
    • PURPOSE:To facilitate the conversion of set impact force value by varying the set values of the amplitude and the frequency of a vibrator base according to a natural frequency in the vibration system supported through an elastic body and a coefficient of restitution between an impact body and a sample. CONSTITUTION:A sample 24 is set on one side section on a pedestal 21 of a vibrator base 20 while a support post 23 is erected pivoting a lever 31 on the other side section. The lever 31 is pivoted rotatably on the support post 23 at one end thereof with a pin 32 while at the other end thereof, an impact body is arranged at the position facing the sample 24 and is supportively hung with a spring 30 mounted on a fixed wall 28. Thus, a vibration system 27 is constructed. When given a vibration by vertically moving the vibration base 20 at an arbitrary frequency, the vibration system 27 resonates. So, the vibrator base 20 is vibrated to match the natural frequency of the vibration system 27. This causes the sample 20 to move so vertically to hit the impact body 26. Thus, the sample 24 gains an impact force.
    • 8. 发明专利
    • Tester for rubber roller
    • 橡胶滚筒试验机
    • JPS59187244A
    • 1984-10-24
    • JP6081783
    • 1983-04-08
    • Hitachi Ltd
    • KAMINAGA RETSUKOMORI YOSHITERU
    • G01M13/00G01N19/04
    • G01N19/04
    • PURPOSE:To enable the easy determination of whether the bonded part of rubber and metal is excellent or not, by detecting elastic waves generated by a slight exfoliation in said bonded part and by subjecting said elastic waves to waveform processing. CONSTITUTION:When a load applied to a metal fitting 22 of a body to be tested and increased gradually reaches a certain level, a slight exfoliation is generated in the bonded part of rubber 20 of a said body and the metal fitting 22 thereof. Elastic waves are generated at this time. Since the outputs of these elastic waves are very small, they are amplified by an amplifier 26, and output signals therefrom are monitored by a synchroscope 27. The elastic waves are generated discontinuously on the occasion since the exfoliation in the bonded part is irregular, and thus it is hard to determine a real elastic wave from the raw waveforms thereof even by the monitoring by said synchroscope. Therefore, all the elastic waves which are caught are stored in a memory of a waveform processing device 28 and subjected to operations, and the result thus obtained is displayed on a CRT of the device 28.
    • 目的:为了能够容易地确定橡胶和金属的粘合部分是否优异,通过检测由所述接合部分中的轻微剥离产生的弹性波并且对所述弹性波进行波形处理。 构成:当被加载物体的金属配件22的载荷逐渐达到一定程度时,在所述主体的橡胶20的接合部和金属配件22上产生轻微的剥离。 此时产生弹性波。 由于这些弹性波的输出非常小,所以它们由放大器26放大,其输出信号由同步器27监视。由于接合部分的剥离是不规则的,弹性波是不连续地产生的,并且 因此即使通过所述同步器的监视,也难以从其原始波形确定实际的弹性波。 因此,捕获的所有弹性波被存储在波形处理装置28的存储器中并进行操作,并且将如此获得的结果显示在装置28的CRT上。
    • 10. 发明专利
    • MAGNETIZING DEVICE
    • JPS57116249A
    • 1982-07-20
    • JP209181
    • 1981-01-12
    • HITACHI LTD
    • KAMINAGA RETSUNAKAZAWA SATOSHIKOJIMA WAHEI
    • G01N27/83G01N27/82
    • PURPOSE:To enable uniform magnetization a whole defect-finding surface even for a material to be tested having an uneven surface, by a method wherein a magnet is mounted through a cushioning substance, expanding and contracting vertically, transversely and longitudinally, on a coupling body guided over the material to be tested by two guide rollers. CONSTITUTION:A magnet 20 is mounted to a coupling body 16 via a leaf spring 22, and thereby even if concavities and convexities are formed in a defect-finding surface 26 of a material 26 to be tested and in a rolling direction of guide rollers 12A and 12B and in a direction perpendicular to said direction, the magnet 20 can move vertically, transversely, and longitudinally against the rolling direction of the guide rollers 12A and 12B through the working of the leaf spring 22, and thereby slides along the defect-finding surface 26A to magnetize it uniformly and thoroughly. This enables to perform a highly precise magnetization defect-finding.