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JP2009139382A Electronic parts tester, spectral analyzer, electronic parts test method, and tester for magnetic head parts/magnetic media parts 有权
标题翻译：电子部件测试仪，光谱分析仪，电子部件测试方法和磁头部件/磁性部件测试仪
公开(公告)号：JP2009139382A
公开(公告)日：2009-06-25
申请号：JP2008310297
申请日：2008-12-04
申请人： Headway Technologies Inc , ヘッドウェイテクノロジーズインコーポレイテッド
发明人： LOU SHRINKLE , CRILL PETER , YO MEIKI , KO GENKI
IPC分类号： G01R31/00 , G01R23/173
CPC分类号： G01R29/26 , G01R23/16 , G01R31/319 , G01R33/0029 , G01R33/1207
摘要： PROBLEM TO BE SOLVED: To provide a simple and low-cost system and a method for testing properties of electronic parts such as magnetic head parts and magnetic media parts. SOLUTION: A magnetic head/media parts tester includes a tester process controller 235 which generates a calibration control signal for the electronic parts tester, and a spectral analyzer 220. This spectral analyzer 220 receives a response characteristic signal (f(t))217 from a magnetic head 205 to determine its frequency spectrum and then transmits this frequency spectrum to the tester process controller 235. This spectral analyzer 220 also receives the calibration control signal from the tester process controller 235 to eliminate the effect of image frequency from the frequency spectrum, determining noise bandwidth of the frequency spectrum. Especially when electronic parts are magnetic head/media parts, magnetic head/media parts tester suitable for measurement of signal-to-noise ratio or overwrite capability, etc. is be obtained. COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：提供一种简单且低成本的系统和用于测试诸如磁头部件和磁性介质部件的电子部件的性能的方法。解决方案：磁头/介质部件测试器包括产生用于电子部件测试器的校准控制信号的测试器过程控制器235和光谱分析器220.该光谱分析器220接收响应特性信号（f（t））217，以确定其频谱，然后将该频谱传输到测试器过程控制器235.该光谱分析器220还从测试器过程控制器235接收校准控制信号，以消除来自测试器过程控制器235的图像频率的影响频谱，确定频谱的噪声带宽。特别是当电子部件是磁头/介质部件时，可以获得适合于测量信噪比或覆盖能力等的磁头/介质部件测试器。版权所有（C）2009，JPO＆INPIT

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