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    • 4. 发明专利
    • POSITION MEASURING EQUIPMENT
    • JPS57139607A
    • 1982-08-28
    • JP2432981
    • 1981-02-23
    • HITACHI LTDNIPPON TELEGRAPH & TELEPHONE
    • KATOU YASUOHOKOTANI YOSHIOOZASA SUSUMUIDO SATOSHIFUJINAMI AKIHIRA
    • G03B27/34G01B11/00G01B11/02G01C3/06H01L21/027H01L21/30
    • PURPOSE:To measure the position of the surface of an object with high accuracy even if the reflectance of the surface differs from place to place by controlling the intensity of the light source in such a manner that the quantity of the light which enters a detector after being reflected by a small light spot on the object is to be the standard value established beforehand. CONSTITUTION:The light from a semiconductor laser 11 is focused on the surface of an object 14 through a diaphragm 12 and a lens 13. At the time the diameter of the spot is made less than ten times of the measurement error. The reflected light is forcused on a detector 16 through a lens 15. When the spot on the surface of the object 14 moves from position A to position A', the image on the detector 16 moves from B to B' and the output voltage difference a-b of terminals a and b of the detector 16 changes according to the displacement of the image. The output c of an amplifier 17 corresponding to a+b is fed back to the semiconductor laser 11 by an amplifier 19 so as to become equal to the standard voltage. The ratio of a-b to a+b is put out through the amplifier 17 and a divider. With this constitution, the position of the object can be measured with high accuracy even if the reflectance of the surface differs from place to place.
    • 10. 发明专利
    • SAMPLE HOLDING DEVICE
    • JPS57148356A
    • 1982-09-13
    • JP3260481
    • 1981-03-09
    • HITACHI LTDNIPPON TELEGRAPH & TELEPHONE
    • HOKOTANI YOSHIOMIYATA TOSHIMITSUIDO SATOSHIKOMATA FUJIO
    • B25B11/00H01L21/67H01L21/68H01L21/683
    • PURPOSE:To enable to perform steady attraction at a low application voltage of several hundred volts as well as to eliminate the dielectric breakdown of a sample by a method wherein, when the sample is electrostatically attracted to the supporting member consisting of a semiconductive dielectric, the dielectric is composed of cellulose carbon or graphite wherein the volume resistivity of the dielectric is formed at 10 -10 OMEGA/cm. CONSTITUTION:An attracting stand, consisting of a semiconductive dielectric (b) which electrostatically attracts a conductive sample (a), is formed by the material consisting of the cellulosic carbon, pyrolytic graphite and the like, volume resistivity of which is prescribed at 10 -10 OMEGA/cm. Then, an electrode (c) is coated on the back of the dielectric (b), and the sample (a) is electrostatically attracted on the surface of the dielectric (b) by applying voltage to the sample (a) and the electrode (c). Accordingly, the electrostatic attraction force of several kg/cm can be obtained by applying a low voltage of several hundred volts, and also the dielectric breakdown phenomenon of the sample, which is the intrinsic defect of an electrostatic chuck, can be prevented.