会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 3. 发明专利
    • NON-CONTACT IC CARD
    • JP2000276567A
    • 2000-10-06
    • JP8302999
    • 1999-03-26
    • HITACHI LTD
    • TSUJI KAZUTAKASAMEJIMA KENJI
    • G06K19/07B42D15/10G06K19/077
    • PROBLEM TO BE SOLVED: To provide a thin non-contact IC card which requires no strict machining accuracy for attaining high mechanical strength against the local bending and the load applied concentrically to a chip mounting part by strengthening a 2nd reinforcing plate that is laminated on an IC chip by means of a 1st reinforcing plate that is placed around the IC chip. SOLUTION: A 2nd reinforcing plate that is laminated on an IC chip is strengthened by a 1st reinforcing plate that is placed around the IC chip. In regard to this IC card, for example, a 1st reinforcing plate 106 is adhered to a wiring 103 and a printed circuit board 104 via an insulating adhesive layer 107 and placed with one of its both sides set at almost the same level of the back of an IC chip 101. Meanwhile, a 2nd reinforcing plate 108 is made of the stainless steel and covers the entire surface of the chip 101 and a part of inside of the plate 106. Thus, the IC card is constituted by holding the chip 101 mounted on the board 104 having the plate 106 around it and the plate 108 on its back between the card surface layers 109 and 110.
    • 5. 发明专利
    • ENDOSCOPE DEVICE
    • JPH0980319A
    • 1997-03-28
    • JP23800295
    • 1995-09-18
    • HITACHI LTD
    • SAMEJIMA KENJITAKEDA YASUTSUGUTSUJI KAZUTAKAUMETANI KEIJIKAJIYAMA TOMOHARU
    • G02B23/24A61B1/04
    • PROBLEM TO BE SOLVED: To obtain an endoscope device whose obtained image sensitivity and resolution, and S/N are high even when a scope diameter is made small by providing an image pickup device which utilizes electron multiplying operation in a semiconductor. SOLUTION: An image pickup tube 100 which performs electric charge multiplying operation in the semiconductor is provided at the terminal part of the image guide 105 of the optical endoscope. An optical image projected from the external end surface of this image guide fiber 105 is formed on the photoconductive target of the image pickup tube 100 which performs the electric charge multiplying operation in the semiconductor through an optical lens 108. The electron beam of the image pickup tube 100 is deflected and converged with a voltage supplied from an electron beam scanning circuit 109 to the electrode and coil 110 in the tube to scan a photoconductive target, and then a specific target voltage is applied from a target electrode 111 to a transparent electrode provided on the light incidence side of the photoconductive target. Consequently, even when the scope diameter is small and the quantity of illumination light is small, the subject image can be observed with sufficient sensitivity.