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    • 1. 发明专利
    • DEVICE FOR GROWING PLANT
    • JPH01235521A
    • 1989-09-20
    • JP6043488
    • 1988-03-16
    • HITACHI LTDHITACHI SHIMIZU ENG KK
    • UZAKI MANAKOHOSOE YOSHIHISAOGAWA TAKEOONO MASATOSHIHOJO TOSHIYUKI
    • A01G7/00
    • PURPOSE:To enable accurate control of temperature and humidity in a sample chamber whenever illuminators are lit or not, by installing a temperature and humidity control point of a cultivation space in the sample chamber for growing a plant on the lee outside the sample chamber in a vessel. CONSTITUTION:In an air circuit in a vessel, air is sucked from a blower suction chamber 2 by a circulating blower 5, passed through a blower blowoff chamber 3 and subjected to temperature and humidity conditioning with a cooling dehumidifier 6, a heater 7 and a humidifier 8 and the air at the conditioned temperature and humidity is then blown off from an outlet 4' for blowing the air into the vessel provided in temperature and humidity conditioning chamber 4 into the sample chamber 1. On the other hand, light energy with an illuminance required for growth of a plant is irradiated from illuminators 10 provided in sample chamber 1. The temperature distribution in lighting the illuminators at this time is such that a position at the same temperature as that of the central part in the sample chamber is present in the blower suction chamber 2 where is on the lee in the vessel. In a controlling part 11, sensed values of temperature and humidity inputted from a temperature and humidity sensor 9 are compared with the preset values of temperature and humidity. If both values are different, commands are sent to the circulating blower 5, cooling dehumidifier 6, heater 7 and humidifier 8 for making the sensed values in agreement with the set values of the temperature and humidity. Thereby, the temperature and humidity of the air blown into the sample chamber 1 are controlled.
    • 4. 发明专利
    • JPH05335386A
    • 1993-12-17
    • JP13656592
    • 1992-05-28
    • HITACHI LTDHITACHI SHIMIZU ENG KK
    • YABE KYOJISUGIYAMA SHIGEAKIKAWASHIMA EIJIOGAWA TAKEO
    • G01R31/26H01L21/66
    • PURPOSE:To perform the characteristic inspection and the lead outward-appearance inspection of an IC within the same process by a method wherein an IC lead inspection mechanism which is provided with a function to perform the lead outward-appearance inspection of the IC is installed inside a handler main body. CONSTITUTION:An IC lead inspection mechanism 2 which is provided with a function to perform the lead outward-appearance inspection of an IC is provided inside a handler main holy 1. For example, a supply container in which uninspected ICs have been loaded and stacked is set in a container feed part 5; the ICs in the container at the uppermost part are conveyed one by one, and their characteristic inspection is performed in test sockets 18, 19. Then, the ICs whose characteristic inspection has been finished are conveyed up to the position of an IC lead inspection part 27; the IC lead outward-appearance inspection is performed by means of the IC lead inspection part 27. The ICs whose inspection has been finished are sucked by means of a head 13 in a collection robot 12. According to the judgment of whether the result of the characteristic inspection is good or not and whether the result of the lead outward-appearance inspection in the lead inspection mechanism 2 is good or not, the ICs are sorted and collected in housing containers 7 to 9.