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1. 发明专利

JPS6068714A DELAY CIRCUIT 失效
公开(公告)号：JPS6068714A
公开(公告)日：1985-04-19
申请号：JP17627983
申请日：1983-09-26
申请人： HITACHI LTD , HITACHI ELECTR ENG
发明人： NIIZAKI SHINYA , SAITOU TAKASHI , YAMAMURA HIDEHO , HAYASHI SHINICHI
IPC分类号： H03K5/00 , H03K5/04 , H03K5/13
摘要： PURPOSE:To absorb the fluctuation of delay time due to variation of characteristic of components by changing the leading and trailing time of a pulse with a current from a variable constant current circuit and comparing the pulse with a reference voltage. CONSTITUTION:When a voltage at an input terminal IN changes to H or L level, the leading and trailing of an output pulse E of a waveform shaping circuit 1 is changed as shown in solid or broken lines in response to a current ID applied from the variable constant current circuit 2. The pulse E and a comparison voltage Vref (waveform F) are compared by a comparator 3 and a pulse output whose leading and trailing are delayed as shown in Fig. (c) is obtained from an output terminal OUT.

2. 发明专利

JPS60103822A DELAY CIRCUIT 失效
公开(公告)号：JPS60103822A
公开(公告)日：1985-06-08
申请号：JP21097783
申请日：1983-11-11
申请人： HITACHI LTD , HITACHI ELECTR ENG
发明人： NIIZAKI SHINYA , SAITOU TAKASHI , YAMAMURA HIDEHO , HAYASHI SHINICHI
IPC分类号： H03K5/00 , H03K5/13 , H03K5/133
摘要： PURPOSE:To obtain a delay circuit in which a maximum variable delay time is set optionally by providing a waveform shaping circuit having an output stage of open emitter and a comparator circuit comparing the output of waveform shaping circuit with a reference voltage in response to a desired delay time and obtaining an output pulse giving a desired delay time to the front edge or the rear edge to decrease the control voltage. CONSTITUTION:An IC1 is a comparator (or line receiver) whose output stage is open emitter and a constant current circuit CG and a capacitor C are connected to the output terminal. An IC2 is a comparator (or line receiver) with a high input impedance, an output of the comparator IC1 is connected to one input terminal E and a DC reference voltage Vref is applied to the other input terminal F. The constant current circuit CG can be a circuit comprising an operatonal amplifier IC, a transistor Q and a resistor R, the maximum variable delay time is set optionally and the delay time of the front edge and rear edge of an input pulse waveform is set independently.

3. 发明专利

JPS6054515A DELAY CIRCUIT 失效
公开(公告)号：JPS6054515A
公开(公告)日：1985-03-29
申请号：JP16208183
申请日：1983-09-05
申请人： HITACHI LTD , HITACHI ELECTR ENG
发明人： SAITOU TAKASHI , NIIZAKI SHINYA , YAMAMURA HIDEHO , HAYASHI SHINICHI
IPC分类号： H03K5/00 , H03K5/04 , H03K5/13
摘要： PURPOSE:To change delay times of the rise and the fall of a pulse signal independently of each other by using an open emitter or open collector transistor (TR) as an output TR of a comparator (COM). CONSTITUTION:When an input signal rises in a COM1A using an open emitter TR as the output TR, the output TR of the COM1A is made conductive, and an output impedance is small, and therefore, an input of the second COM2A has a waveform (d) and is compared with a reference voltage at a point (e), and the result is outputted from the COM2A. When the input signal falls in the COM1A, the output impedance of the COM1A is large, and the input of the COM2A falls by the time constant due to a resistance 21 and a varicap 5 as shown by (d) in the figure and is compared with the voltage at the point (e), and an output (f) is outputted from the COM2A. When a reverse bias voltage VB is changed, the capacity is changed to control the delay time.

4. 发明专利

JPS60260861A PROBE 失效
公开(公告)号：JPS60260861A
公开(公告)日：1985-12-24
申请号：JP11639084
申请日：1984-06-08
申请人： HITACHI LTD
发明人： NIIZAKI SHINYA , YAMAMURA HIDEHO , SAITOU TAKASHI
IPC分类号： G01R31/26 , G01R1/06 , G01R1/073 , H01L21/66
摘要： PURPOSE:To transmit a signal of high frequency and high speed without distortion, and to inspect a semiconductor pellet of high frequency and high speed by structuring the part extending to the tip of a probe by a micro strip line. CONSTITUTION:A micro strip line is formed by constituting one face of a base film 6 of a ground electric conductor, and providing a signal wire 7 on the other face. A dam 10 consisting of an organic substance is formed in the tip of a probe, namely, a contact part with a semiconductor pellet, and a contactor 9 is formed adjacently to said dam. The other end of the probe is connected to a probe card 2 consisting of a strip line structure. When executing an inspection, a force is applied to the probe part by using a probe holding jig 13 from the upper part of the probe, and the probe is brought into contact with a semiconductor pellet to be measure 1. In this case, the force applied to a terminal electrode 5 of the semiconductor pellet can be adjusted by adjusting the applied force of the probe holding jig 13.

5. 发明专利

JPS60249095A METHOD OF DECONTAMINATING STAGNATION SECTION 失效
公开(公告)号：JPS60249095A
公开(公告)日：1985-12-09
申请号：JP10459484
申请日：1984-05-25
申请人： HITACHI LTD , HITACHI ENG CO LTD
发明人： SUMIDA NOBUO , ITOU HISAO , SAITOU TAKASHI , KOBAYASHI MASATO
IPC分类号： C23G1/00 , G21F9/00 , G21F9/28 , G21F9/30

6. 发明专利

JPS60214546A Semiconductor device 失效
标题翻译：半导体器件
公开(公告)号：JPS60214546A
公开(公告)日：1985-10-26
申请号：JP7255084
申请日：1984-04-10
申请人： Hitachi Ltd
发明人： HARADA EIJI , SAKAMOTO HISASHI , MATSUZAKI HITOSHI , SAITOU TAKASHI , HIRAYAMA HIDEO
IPC分类号： H01L23/12 , H01L21/52 , H01L21/58 , H01L23/02 , H01L23/13
CPC分类号： H01L23/13 , H01L2224/37147 , H01L2224/3754 , H01L2224/37599 , H01L2224/40 , H01L2224/40091 , H01L2224/40225 , H01L2224/83801 , H01L2224/84801 , H01L2924/00014 , H01L2924/00012
摘要： PURPOSE:To contrive to eliminate the generaion of a crack and a deficit in the semiconductor substrate by a method wherein a space is formed on the side of an electrode plate in the inner wall of the aperture of the ring-shaped insulating material and the semiconductor substrate and the insulating material are not brought into contact with each other by the formation of the space. CONSTITUTION:A ring-shaped insulating material 108 has been performed a chambering work on the side of an anode electrode plate 7 in the inner wall of its aperture and a space S1 has been formed there. The space S1 is formed in a dimension (l2) that a semiconductor substrate 1 doesn't come into contact with the insulating material 108 even through the minimum relative deviation (l1) arised due to the following two: the maximum relative deviation (l1) between the semiconductor substrate 1 and the insulating material 108 due to the dimensional torelance of a positioning jig (not shown in the diagram), which is used when the semiconductor substrate 1 is bonded, parts and so forth; and the thickness (t1) of the semiconductor substrate 1. (Provided that, l2>l1 and t2>t1). Accordingly, there is no possibility that the semiconductor substrate 1 and the insulating material 108 come into contact with each other. As a result, as no contact of both generates even during the time when heat is dropping, no crack and deficit generate in the semiconductor substrate 1.
摘要翻译：目的：通过在环状绝缘材料的孔的内壁上的电极板的侧面形成空间的方法和半导体衬底的半导体衬底中，形成半导体衬底的裂纹和缺陷的方法，基板和绝缘材料不会通过形成空间而彼此接触。构成：已经在其孔的内壁中的阳极板7的侧面上进行了环状绝缘材料108的制作，并且在其中形成了空间S1。空间S1形成在半导体衬底1不与绝缘材料108接触的尺寸（12）中，即使由于以下两个原因而导致的最小相对偏差（l1）：最大相对偏差（l1）由于半导体基板1被接合时使用的定位夹具（图中未示出）的尺寸相关性，在半导体基板1和绝缘材料108之间。和半导体衬底1的厚度（t1）（假设l2> l1和t2> t1）。因此，半导体衬底1和绝缘材料108不可能彼此接触。结果，即使在热量下降的时间内两者的接触也不会产生，在半导体衬底1中不产生裂纹和缺陷。

7. 发明专利

JPS60117127A THERMAL FATIGUE TESTER USING PURE WATER 失效
公开(公告)号：JPS60117127A
公开(公告)日：1985-06-24
申请号：JP22422983
申请日：1983-11-30
申请人： HITACHI LTD
发明人： HAYASHI MAKOTO , ENOMOTO KUNIO , SHIMIZU TASUKU , SAITOU TAKASHI , SATOU TAKEMICHI
IPC分类号： G01N3/18 , G01N3/60
摘要： PURPOSE:To enable testing of thermal fatigue under the pure water environment by providing a small autoclave about a test piece to repeatedly jet high and low temperature pure waters alternatively to the surface of a gauge section thereof. CONSTITUTION:The capacity of an autoclave 17 is minimized enough to be mounted on a test piece 18 surrounding a gauge section thereof and the heating of pure water is done with small-capacity heaters 5 and 6. Inlet nozzles for inflow of high and low temperature pure waters and output nozzles for outflow thereof are provided to uniformize the temperature distribution in the circumferential direction of the test piece while a reflux water from the autoclave 17 for high temperature pure water is introduced into a heat exchanger 7 for preheating of the low temperature pure water. Thus, a thermal fatigue testing in the pure water environment can be done efficiently in various temperature ranges.

8. 发明专利

JPS6048614A DELAY CIRCUIT 失效
公开(公告)号：JPS6048614A
公开(公告)日：1985-03-16
申请号：JP15625183
申请日：1983-08-29
申请人： HITACHI LTD
发明人： SAITOU TAKASHI , TSUNODA TOYOJI , NIIZAKI SHINYA
IPC分类号： H03K5/04 , H03K5/13
摘要： PURPOSE:To improve the selectivity of a delay to the leading and trailing of a pulse signal waveform by impressing an NOT output of a differential amplifier circuit to a diode and a capacitor connected in series and connecting a resistor to the diode and the capacitor in parallel. CONSTITUTION:A pulse is inputted differentially to inputs 15, 16 of the differential amplifier 14 and its output 17 is impressed to an impedance comprising the series connection of the diode 18 and the capacitor 19. Further, the resistors 22, 23 are connected respectively in parallel with the diode 18 and the capacitor 19 in order to operate the diode and form an RC integration circuit in said termination impedance. When the level of the NOT output 17 of the differential amplifier in the circuit goes from Lo to Hi, the diode 18 is conductive, the capacitor 19 is charged in a short time so as to quicken the leading of the pulse signal waveform. When the level goes from Hi to Lo, a reverse bias is applied to the diode 18, which is made nonconductive thereby slowing down the trailing of the waveform. As a result, a waveform where the difference between the leading time and the trailing time is large is obtained so as to improve the selectivity of the delay.

9. 发明专利

JPS6033373A METHOD FOR PREVENTING ATMOSPHERIC CORROSION OF STAINLESS STEEL PRODUCT 失效
公开(公告)号：JPS6033373A
公开(公告)日：1985-02-20
申请号：JP14315883
申请日：1983-08-05
申请人： HITACHI LTD
发明人： SHIYOUJI SABUROU , OONAKA NORIYUKI , MINATO AKIRA , ITOU HISAO , KIMURA TAKASHI , SAITOU TAKASHI , SUMIDA NOBUO
IPC分类号： C23F15/00
摘要： PURPOSE:To effectively prevent the atmospheric corrosion of a stainless steel product under an environment easy to adhere a marine salt particle, by controlling the relative humidity or less of an atmosphere to limit relative humidity of atmospheric corrosion inherent to a corrosive substance. CONSTITUTION:The relative humidity of the atmosphere contacted with the surface of a stainless steel product used in the seashore is controlled so as to reach limit relative humidity or less of atmospheric corrosion inherent to a corrosive substance such as a marine salt particle adhered to the surface of said product. This control of relative humidity is performed by dehumidifying the atmosphere contacted with the surface of the stainless steel product and raising and falling said product or raising the surface temp. of the product. By this control of the atmosphere, the corrosion trouble of the stainless steel product or structure constructed in the vicinity of the seashore can be prevented and the enhancement in the safety and operation efficiency of a plant is achieved.

10. 发明专利

JPS59224598A ELECTROLYTIC REGENERATING METHOD OF USED ION-EXCHANGE RESIN 失效
公开(公告)号：JPS59224598A
公开(公告)日：1984-12-17
申请号：JP9913783
申请日：1983-06-03
申请人： HITACHI LTD , HITACHI ENG CO LTD , HITACHI SERVICE ENG
发明人： SUMIDA NOBUO , ITOU HISAO , SAITOU TAKASHI , USHIDA YOSHIYUKI , KIMURA TAKASHI , SAWA TOSHIO , SUZUKI KATSUMI , KATAOKA ICHIROU , OOSUMI KATSUMI
IPC分类号： B01J49/00 , G21F9/00 , G21F9/12 , G21F9/30

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