专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明专利

JPH0251082A FLUX METER AND FLUX METER PART 失效
公开(公告)号：JPH0251082A
公开(公告)日：1990-02-21
申请号：JP20185188
申请日：1988-08-15
申请人： HITACHI LTD
发明人： OGUCHI YUKO , YOSHIMURA TOSHIHIKO , ISHIKAWA YUICHI
IPC分类号： G01R33/02
摘要： PURPOSE:To achieve a highly accurate detection by arranging a magnetic flux transmission circuit which has a probe coil applying a printed coil so set to face an object to be measured and a SQUID provided within a range of being reached by a magnetic flux generated from the circuit. CONSTITUTION:A diamond thin film 4 is arranged on the side facing an object 2 to be measured of a pickup coil 3. This eliminates a damage to a pickup coil 3 otherwise caused by a ruggedness of the surface of a sample while enabling the coil 3 to approach the object to be measured as close as several mum. This also can keep a distance to the object to be measured constant. Thus, a higher sensitivity and a higher reliability are achieved as magnetic flux meter, thereby permitting highly accurate detection of a degree of degrading of a ferrite-containing stainless steel which is used under a high temperature environment of a chemical plant, nuclear power plant or the like.

2. 发明专利

JPS6476916A PRODUCTION OF OXIDE SUPERCONDUCTING MATERIAL 失效
公开(公告)号：JPS6476916A
公开(公告)日：1989-03-23
申请号：JP1697588
申请日：1988-01-29
申请人： OGUSHI TETSUYA , HITACHI LTD
发明人： OGUSHI TETSUYA , SHIRAKU YOSHINORI , OGATA HISANAO , ISHIKAWA YUICHI , OGUCHI YUKO
IPC分类号： C01G3/00 , C01G1/00 , C01G23/00 , C01G25/00 , C01G27/00 , C01G31/00 , C01G33/00 , C01G35/00 , C23C14/08 , H01B12/00 , H01B13/00 , H01L39/12
摘要： PURPOSE:To obtain the titled superconducting material having high superconducting transition temperature and usable without necessitating ultra-low temperature environment, by substituting a part or total of Cu in a group Ia or IIIa element - group IIa element - Cu oxide with other metallic element. CONSTITUTION:Powder of e.g. an oxide of an element L selected from group IIa metal element and group IIIa element (e.g., La2O3), powder of e.g. a carbonate of an element A selected from group IIa element (e.g., SrCO3) and CuO powder are weighed to attain a prescribed composition and mixed with each other. The powder mixture is reacted by heating at 900-1,000 deg.C in an oxidizing atmosphere to obtain an oxide mixture powder of formula I (0 =150 deg.K.

3. 发明专利

JPH042937A MEASURING METHOD AND APPARATUS OF SUPERHIGH VACUUM 失效
公开(公告)号：JPH042937A
公开(公告)日：1992-01-07
申请号：JP10314590
申请日：1990-04-20
申请人： HITACHI LTD
发明人： OGUCHI YUKO , NISHIKAWA OSAMU , ISHIKAWA YUICHI , YOSHIMURA TOSHIHIKO
IPC分类号： G01L21/00
摘要： PURPOSE:To measure the degree of vacuum and gas partial pressure of extremely high vacuum by directly measuring the change of a field radiation current caused by the gas adsorption to the surface of a multichip. CONSTITUTION:A grid 2 is insulated from a multichip 1. A field radiation is brought about by impressing a direct current high voltage to the multichip 1. At this time, while the voltage is maintained constant, the change with time of the field radiation current running in the grid 2 is measured by an ammeter 3. After heating at high temperatures, a gas is adsorbed to the surface of the chip as time goes by, and the field radiation current is changed. The change of the field radiation current is dependent on the kind of the surface of the chip and adsorption gas and the adsorption of the gas. Therefore, since the residual gas in the vacuum is adsorbed with time after the chip is heated at high temperatures to clean the surface thereof, the work relation of the surface of the chip is increased and the field radiation current is decreased gradually. The entering frequency of the gas molecules and the degree of vacuum can be determined from the decreasing ratio of the field radiation current.

4. 发明专利

JPH02213764A DEFECT INSPECTING DEVICE 失效
公开(公告)号：JPH02213764A
公开(公告)日：1990-08-24
申请号：JP3360889
申请日：1989-02-15
申请人： HITACHI LTD
发明人： OTAKA MASAHIRO , TAKAKU KAZUO , HASEGAWA KUNIO , YOSHIMURA TOSHIHIKO , ISHIKAWA YUICHI , OGUCHI YUKO , HIRANO AKIHIKO , SHIMIZU TASUKU
IPC分类号： G01R33/12 , G01N27/82
摘要： PURPOSE:To obtain a SQUID measuring system which operates stably in a sweeping magnetic field and can detect corrosion and cracks by feeding back the output signal of the SQUID to the pickup coil of the SQUID. CONSTITUTION:A cryostat 40 housing a superconducting coil as an excitation coil 20, an SQUID sensor 50, a pickup coil 51, and a magnetic body 60 for balancing is disposed in the upper part of a measuring body 1. A refrigerant 41, such as liquid He, is packed in the cryostat 40 and is kept at the working temp. of the SQUID element 50 and the superconducting excitation coil 20. The excitation coil 20 is controlled by an excitation controller 21 and impresses a cyclic magnetic field to the measuring body 1. The previously determined magnetic characteristics when there are no corrosion and cracks are previously stored in a data base 72 and the degrees of the cracks and corrosion of the measuring body 1 are decided from the comparison and computation of the data measured with an arithmetic device 70 and the data base 72.

5. 发明专利

JPH02138469A MATERIAL FOR VACUUM HAVING DIAMOND SURFACE, SURFACE TREATMENT OF THIS MATERIAL FOR VACUUM PRODUCTION, OF DIAMOND FILM SURFACE, VACUUM VESSEL AND ITS PARTS FORMED BY USING MATERIAL FOR VACUUM, IN-VACUUM DRIVING MECHANISM, ELECTRON RELEASE SOURCE, IN-VACUUM HEATER AND VESSEL OF VAPOR DEPOSITION SOURCE 失效
公开(公告)号：JPH02138469A
公开(公告)日：1990-05-28
申请号：JP28769288
申请日：1988-11-16
申请人： HITACHI LTD
发明人： ISHIKAWA YUICHI , OGUCHI YUKO
IPC分类号： B01J3/00 , C01B31/06 , C23C14/06 , C23C14/32 , C23C14/34 , C23C14/58 , C23C16/26 , C23C16/27 , C23C16/511 , C23C16/56 , C30B29/04 , H01J1/304
摘要： PURPOSE:To produce a base material for an excellent high vacuum vessel by putting a base material into a vacuum chamber, supplying a gaseous mixture composed of methane and hydrogen mixed at specific ratios into the chamber and forming a thin diamond film on the surface of the base material by a DC plasma CVD method at the time of producing the base material for the high vacuum vessel. CONSTITUTION:A stainless steel or the like 12 as the base material for the high vacuum vessel is put into a vacuum reaction vessel 9 and is heated by a heater 13 to, for example, 800 deg.C. The gaseous mixture composed of the gaseous methane 6 and the gaseous hydrogen 5 is supplied through a valve 8 into the vessel. Plasma discharge is generated by impressing a high voltage to an Mo cathode 10 and a Cu anode 11 from a DC power source 14 to form the diamond film by cracking of the gaseous methane on the surface of the base material 12. The base material 12 is then heated to 90 deg.C and thereafter, the gaseous hydrogen 5 is introduced into the vacuum vessel 9 so that the hydrogen is reactively adsorbed on the surface of the diamond film. The base material for the high vacuum vessel which does not adsorb moisture even when exposed to the atm. air and extremely decreases the gas to be released from the surface at the time of restoring the vacuum is thus obtd.

6. 发明专利

JPH01158784A METHOD OF FORMING HIGH TEMPERATURE SUPERCONDUCTIVE THIN FILM 失效
公开(公告)号：JPH01158784A
公开(公告)日：1989-06-21
申请号：JP31627787
申请日：1987-12-16
申请人： HITACHI LTD
发明人： OGUCHI YUKO , ISHIKAWA YUICHI
IPC分类号： C01B13/14 , C01G1/00 , C01G3/00 , H01B13/00 , H01L39/24
摘要： PURPOSE:To eliminate reaction products produced at a boundary due to diffusion of foreign substances from a substrate by a method wherein elements constituting superconductor are employed as a substrate materials, and products themselves, produced by a reaction on the substrate because of a thermal treatment, are used as superconducting materials. CONSTITUTION:When a thin film of three-element system oxide superconductor of barium(Ba), yttrium(Y) and copper(Cu) is formed, for instance, Ba and Y are successively deposited on a Cu substrate, and then oxygen 7 is introduced and a thermal treatment is performed. A CuO2 layer 9 with a thickness about 100Angstrom is accordingly formed under a YB2Cu3O6.8 superconductive thin film 10. Ba and Y are deposited simultaneously on the Cu substrate and the same thermal treatment in oxygen gas is performed. Ba and Y are successively or simultaneously deposited on the CuO or CuO2 substrate and the thermal treatment is performed. Cu and Ba are successively or simultaneously deposited on substrate Y2O3 and the same thermal treatment is performed. The above mentioned deposition is performed in oxygen while a substrate is heated.

7. 发明专利

JPH0311542A METHOD AND DEVICE FOR MEASURING EXTREMELY HIGH VACUUM 失效
公开(公告)号：JPH0311542A
公开(公告)日：1991-01-18
申请号：JP14296089
申请日：1989-06-07
申请人： HITACHI LTD
发明人： OGUCHI YUKO , ISHIKAWA YUICHI
IPC分类号： H01J41/02
摘要： PURPOSE:To measure pressure distribution inside a pressure container by introducing ions, or molecules, or atoms into a vacuum vessel, and irradiating them with a laser beam and producing a particle cluster by means of laser cooling, and detecting fluorescence generated when gas particles contained in the vacuum vessel collide with the cluster. CONSTITUTION:Although laser 2a and 2b are enough for stopping an ion beam 61 implanted diagonally downwardly from a vacuum vessel 1, a laser 2c may be provided against the laser 2a and acted upon by the difference of forces by the laser 2a and 2b. The ion beam thus provided with forces gradually slows down and finally stops to form an ion cluster 5. When cooling particles 5 collide with gas particles, the degree of vacuum of which is to be measured, then the cooling particles are excited and emit fluorescence. A detector 3 is used for detecting the strength of the fluorescence. Because the number of gas particles plunged into the above ion cluster is in inverse proportion to the degree of vacuum, the degree of vacuum can be calculated according to the strength of the fluorescence.

8. 发明专利

JPH02262026A METHOD AND APPARATUS FOR NONDESTRUCTIVE INSPECTION 失效
公开(公告)号：JPH02262026A
公开(公告)日：1990-10-24
申请号：JP8301789
申请日：1989-03-31
申请人： HITACHI LTD
发明人： YOSHIMURA TOSHIHIKO , ISHIKAWA YUICHI , OTAKA MASAHIRO , SHIMIZU TASUKU , HASEGAWA KUNIO , OGUCHI YUKO , HIRANO AKIHIKO
IPC分类号： G01L1/00 , G01N27/72 , G01R33/12
摘要： PURPOSE:To measure internal stress and to make it possible to measure mechanical property highly accurately without destruction by providing a fluxmeter which measures the intrinsic magnetic characteristics of a body under test and the change in characteristics in a stress measuring means. CONSTITUTION:When a measuring probe 22 is brought into contact with a body under test 23, a magnetic circuit 24 is formed. When a current is made to flow through a coil 25, magnetic flux is generated in the magnetic circuit 24. When internal stress is present in the body under test, permeability is changed in response to the magnitude of the internal stress, and the magnitude of the magnetic flux is changed. The difference in magnetic fluxes is obtained by measuring the unbalanced current in a specified bridge circuit. Thus, the internal stress is obtained. Meanwhile, an exciting coil 28 and a fluxmeter 21 provided with a pickup coil 29 are provided in the measuring probe 22. Magnetomotive forces having the different values are sequentially imparted. A magnetic hysteresis curve in an internal-stress measuring region is obtained. The magnetic characteristics are obtained from the curve. The mechanical property can be obtained based on the characteristics.

9. 发明专利

JPH0228575A FLUX METER AND ITS PARTS 失效
公开(公告)号：JPH0228575A
公开(公告)日：1990-01-30
申请号：JP8483589
申请日：1989-04-05
申请人： HITACHI LTD
发明人： YOSHIMURA TOSHIHIKO , SHIMIZU TASUKU , ISHIKAWA YUICHI , OTAKA MASAHIRO , OGUCHI YUKO
IPC分类号： G01R33/035 , G01N27/72 , H01L39/24
摘要： PURPOSE:To improve the sensitivity and signal resolution of an instrument equipped with a magnetic flux transmission circuit or magnetic flux transformer by applying a printed coil to a probe coil. CONSTITUTION:A device is provided with a superconductive quantum interferometer (skid) 1 at its upper part and a pickup coil 3 composed of a printed coil is arranged nearby a material 2 to be measured. Further, the skid 1 and pickup coil 3 are provided in a shield 99 so as to cut off external noises. The device has an about 20-200mm diameter W and a 50-200mm height H. Further, the thickness A of the pickup coil 3 is 50mum-3mm and the pickup coil 3 and sample 2 are arranged in contact with or nearby each other. Then the distance B between the coil 3 and sample 2 is 100mum-5mm. Consequently, the magnetic flux conductivity of a magnetic flux transformer and the sensitivity and signal resolution of the instrument can be improved.

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式