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1. 发明专利

JPH08297118A PLATED FILM CRYSTALLIZATION VERIFYING MEANS 失效
公开(公告)号：JPH08297118A
公开(公告)日：1996-11-12
申请号：JP10192895
申请日：1995-04-26
申请人： HITACHI LTD
发明人： MINOSHIMA FUMITAKE , ITO KIKUICHI
IPC分类号： G01N25/02 , G01N31/00 , G01N33/00 , G11B5/84
摘要： PURPOSE: To surely and simply identify and verify a recessed defect caused by the phase change of a plated film owing to heating by dripping high- concentration strong acid at the portion of the plated film. CONSTITUTION: Nitric acid having the concentration of about 10 normal is dripped at the portion where the crystallization of electroless nickel-phosphorus(NiP) is to be confirmed, and the nitric acid is washed away with water several sec later. The inherent dissolution surface state such as whether a plated film is dissolved or not and a chrysanthemum flower shape is observed to verify whether the plated film is crystallized or there is another surface defect. The defective plated film portion owing to high-temperature heating is crystallized. When nitric acid is dripped at this recessed defect section, amorphous NiP is not dissolved, and only crystallized nickel phosphide such as Ni3 P is dissolved. The crystallization section locally generated in an amorphous material is observed as the state recessed from the periphery (fine recessed surface defect: bit). No special facility is required except for a microscope, and this verification can be easily and simply conducted.

2. 发明专利

JPH02242109A CHECKING OF FLATNESS OF MAGNETIC DISC MEDIUM AND SUBSTRATE 失效
公开(公告)号：JPH02242109A
公开(公告)日：1990-09-26
申请号：JP6096489
申请日：1989-03-15
申请人： HITACHI LTD
发明人： ITO RITSU , OTANI YUICHI , YASHIKI HIROSHI , HIRUTA TSUGIO , ITO KIKUICHI , NAKAJIMA YASUO
IPC分类号： G01B11/30
摘要： PURPOSE:To check a flatness of a magnetic disc medium and substrate accurately in a short time with an inexpensive equipment by a method wherein a surface of an object to be measured with white light at an angle of incidence of 25 + or - 20 deg. and a reflection image thereof projected onto a reflector to observe a degree of gradation. CONSTITUTION:An object 1 to be measured as magnetic disc medium or substrate is carried on a rotor 2. The surface of the object 1 to be measured is irradiated with white light at an angle of 25 + or - 20 deg. of incidence from a light source 3 and reflected light thereof is introduced to a reflector 4 to observe a reflection image on the reflector 4. The object 1 to be measured, the rotor 2 and the reflector 4 are covered with a shielding screen 5 to optimize an incident light and the reflected light. When the object 1 to be measured has a good flatness, the reflection image presents an image with a uniform brightness without gradation. When a part of the object 1 to be measured is protruded, the reflection image at the protruded part becomes black (dark). To the contrary, when the part is recessed, the reflection image at the recessed part becomes white (bright). Judgment is performed by comparison with a reference sample for abnormality of the flatness.

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