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    • 3. 发明专利
    • PART RECOGNITION DEVICE
    • JPH0818284A
    • 1996-01-19
    • JP15193094
    • 1994-07-04
    • TOSHIBA CORP
    • SEKIGUCHI SHINGOHIRATE TOSHIMASASUZUKI MASAHIRO
    • G01B11/24H05K13/04
    • PURPOSE:To recognize a part without lowering speed thereof. CONSTITUTION:A mounting head 15 gets an electronic part at a part supply point P, transfers it in a direction of an arrow A and mounts it on a part mounting point Q on a substrate 11. A projector 18 and an optical distributor 19 which output scanning light L in an X-axis direction are provided and an optical reflector 20 is provided movably in an X-axis direction. An movement mechanism for moving the optical reflector 20 in an X-axis direction to follow an electronic part is provided and scanning light L is cast on an electronic part. A receptor and an image processor for taking in reflection light turned back downward by the optical distributor 19 are provided. Main scanning image is taken in continuously synchronously with a signal from a Y-axis direction position detector 31 and written in an image memory, one by one and image data of an electronic part is acquired. Synchronous discrepancy of image data is corrected based on synchronous error detected by an X-axis direction position detector 32 and a reflector position detector 33.
    • 4. 发明专利
    • WATTHOUR METER CHARACTER RECOGNITION DEVICE
    • JPH07325880A
    • 1995-12-12
    • JP22495394
    • 1994-09-20
    • NIPPON DENKI KEIKI KENTEISHOTOSHIBA CORP
    • ABE TAKAYUKITAKAHASHI MASAKISETOMOTO TATSUMISEKIGUCHI SHINGO
    • G01R11/00G06K9/00G06K9/46G06T1/00
    • PURPOSE:To improve the recognition rate of lacking rotation characters of a watthour meter and to accurately recognize division characters by providing a character segmentation means, a reference measure segmentation means, a measurement recognition means and a judgement means. CONSTITUTION:In a measure and character segmentation part 6, the position address, height and width of the character are detected and also the position address and height of a reference measure are detected. Character information is supplied to a character recognition part 7, a prescribed dictionary is referred to and the character is recognized. The recognized result of the character, the degree of similarity, a segmentation information address and a reference measure information address are supplied through a result output part 8 to the result input part 9 of a personal computer 4. The supplied information is supplied to a measure value calculation part 10 further and a minimum measure value is calculated in the part 10. Then, the character is judged in a similarity degree calculation part 11 and a high-order digit is judged in a high-order digit judgement part 12 further. Thus, even when a part of the character of a recognition object lacks, by recognizing the next object character, the character is accurately recognized.
    • 5. 发明专利
    • APPEARANCE INSPECTION DEVICE FOR PRINTED WIRING BOARD
    • JPH0275938A
    • 1990-03-15
    • JP22744588
    • 1988-09-13
    • TOSHIBA CORP
    • SEKIGUCHI SHINGO
    • G01N21/88G01N21/93G01N21/956H05K3/00
    • PURPOSE:To shorten the modifying time of a printed wiring board by extracting all remaining conductors after inputting a photographed circuit pattern to a labeling circuit and expanding and contracting the circuit pattern with a logical filter and extracting harmless remaining conductors. CONSTITUTION:The circuit pattern of a printed wiring board 1 photographed with a camera 10 is inputted to a labeling circuit 11 and logical filter 12 and the circuit 11 only extracts remaining conductors 4 and 5 which do not exist in a reference picture. Both sides of the circuit pattern inputted to the filter 12 are expanded by the half of an allowable creep distance specified by a standard. Then the remaining conductor 4 is connected with the expanded section of a conductor 2 at the expanded section, but, when the expanded section is contracted to the original width, the remaining conductor 4 becomes a remaining conductor which connects the upper and lower conductors 2. Then the pattern is inputted to a labeling circuit 13 and only the remaining conductor 5 is extracted and a deciding section 14 takes out the conductor 5 from the remaining conductors 4 and 5 extracted by the circuit 11 to extract only the conductor 4 which may short-circuit the conductors 2 with each other and does not match the standard. Therefore, the modifying time of the board 1 can be shortened.
    • 6. 发明专利
    • PART MOUNTING DEVICE
    • JPH088591A
    • 1996-01-12
    • JP13975594
    • 1994-06-22
    • TOSHIBA CORP
    • YAMADA TOSHIFUMIKOIKE AKIRASEKIGUCHI SHINGO
    • B23P21/00H05K13/04
    • PURPOSE:To enable a line sensor to fetch the image of a part even when the moving speed of a mounting head becomes higher. CONSTITUTION:A substrate carrying path 14 along which a substrate 13 is carried and a part supplying section 16 provided with a plurality of tape feeders 19 are provided on the base 12 and a mounting head 21 which is freely moved by means of an X-Y robot 22, is provided above the section 16. A line sensor 23 which detects the position of a part 15 is provided between the path 14 and section 16 so that the sensor 23 can be moved in the Y-axis direction by means of a Y-axis moving unit 24. When the head 21 receives the part 15 from the section 16 and moves the part 15 to the substrate 13, the sensor 23 picks up the cut image of the parts 15 extended in the X-axis direction at a plurality of number of times while the sensor 23 is moved in the Y-axis direction. The positional deviation of the part 15 is detected based on the image data and the mounting work is performed by correcting the position of the part 15.
    • 10. 发明专利
    • INSPECTING APPARATUS FOR CRYSTAL DEFECT
    • JPH0694629A
    • 1994-04-08
    • JP24607792
    • 1992-09-16
    • TOSHIBA CORP
    • YAMAGUCHI HIROSHISEKIGUCHI SHINGONISHIKAWA MASAMITSUNOZAWA MASAHITO
    • G01N21/88G01N21/94G01N21/956
    • PURPOSE:To enable measurement of a crystal defect with a high throughput by providing a photosensor having a light-sensing surface being perpendicular to the direction of bending reflection which is different from the direction of regular reflection of a light beam on a complete specular surface and specific to a section gradient of the defect. CONSTITUTION:A scanning direction 9 of a laser beam being parallel to the orientation flat 6 of an Si wafer is made the direction of the axis X, while the direction of an oxidation-induced defect 5 being perpendicular to the orientation flat 6 is made the direction of the axis Y. On the occasion when beam scanning is executed in the direction of the axis X in which the defect 5 exists, an angle of incidence of an incident light 7 is made thetai. When the beam is cast on the defect 5 it is bent by an angle 2theta to the direction of the axis Y by a gradient theta (which is a section gradient of a crystal transformation defect and has uniformity) and reflected. By disposing light-sensing parts 10a and 10b on extensions of reflected lights 8a and 8b deviating by angles + or -2theta from a plane Y-Z in respect to an angle thetai of reflection on this plane, so that the light-sensing surfaces thereof are positioned perpendicularly thereto, only the reflected lights by the defect 5 can be sensed. As to a diffusedly reflected light by a particle or the like, it is advisable to provide a large light-sensing part additionally for receiving it.