专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明专利

JP2007139774A Computer-implemented technique and system for characterizing geometric parameter of edge break in machined part 有权
标题翻译：计算机实现技术和系统，用于表征加工零件边缘几何参数
公开(公告)号：JP2007139774A
公开(公告)日：2007-06-07
申请号：JP2006308642
申请日：2006-11-15
申请人： General Electric Co , ゼネラル・エレクトリック・カンパニイGeneral Electric Company
发明人： HARDING KEVIN GEORGE , ZHENG JIANMING , LI YONGQING , JIA MING , SONG GUIJU , ROSS JOSEPH BENJAMIN , ISAACS RALPH GERALD
IPC分类号： G01B11/24
CPC分类号： G01B11/255 , G06T7/64 , G06T2207/10028 , G06T2207/30108
摘要： PROBLEM TO BE SOLVED: To provide a method, a system, and a computer program code for characterizing an edge break, such as part features and/or geometric discontinuities, that could give rise to edge sharpness, as may be encountered, for example, in a chamfer, bevel, fillet and other part features. SOLUTION: The system includes an interface for setting a window size corresponding to the first segment of an edge in a part, a processor for processing the imaging data point of the edge including the edge sharpness in the part, a processor 36 for generating a line formed by a plurality of interconnection straight lines based on a straight line fitted to the edge; a processor 38 for calculating the inclination difference of the edge; a processor 40 for characterizing the first edge sharpness point, based on a large change in the inclination difference being calculated; and a processor for calculating a radius of curvature for characterizing the first curved bent section. COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：为了提供一种用于表征边缘断裂的方法，系统和计算机程序代码，例如部件特征和/或几何不连续性，如可能会产生边缘锐度，例如，在倒角，斜面，圆角和其他部件特征中。解决方案：该系统包括用于设置与部分中的边缘的第一段相对应的窗口大小的接口，用于处理包括该部分中的边缘锐度的边缘的成像数据点的处理器，用于基于安装在边缘上的直线，产生由多根互连直线形成的线; 用于计算边缘的倾斜差的处理器38; 基于计算出的倾斜差的大的变化，处理器40，用于表征第一边缘锐度点; 以及用于计算用于表征第一弯曲弯曲部分的曲率半径的处理器。版权所有（C）2007，JPO＆INPIT

2. 发明专利

JP2005292136A System for inspecting multiplex resolution and its operation method 审中-公开
标题翻译：用于检查多重分辨率的系统及其操作方法
公开(公告)号：JP2005292136A
公开(公告)日：2005-10-20
申请号：JP2005094396
申请日：2005-03-29
申请人： General Electric Co , ゼネラル・エレクトリック・カンパニイGeneral Electric Company
发明人： HARDING KEVIN GEORGE , ROSS JOSEPH BENJAMIN
IPC分类号： G01N21/88 , G01N21/95 , G06T7/00
CPC分类号： G01N21/8806 , G01N21/9515 , G01N2021/8867 , G01N2021/8874
摘要： PROBLEM TO BE SOLVED: To provide an automatic inspection technique used in a field of a general inspection technique, and more particularly in a manufacture environment.
SOLUTION: The system 1 for inspecting multiplex resolution and its operation method are proposed. This system 10 can be provided with a first scan system 16 having a first resolution. The first scan system 16 executes the scan of the first resolution automatically for a surface region 22 of an object 14, and can be operated so as to identify the position 84 of the surface abnormality of the object 14. The system can be provided with a second scan system having a second resolution lower than the first resolution. The second scan system 18 receives a position 84 of surface abnormality from the first scan system, and can be operated so as to automatically execute the scan of the second resolution for a prescribed region 86 around the position 84 of the surface abnormality.
COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：提供在一般检查技术领域中使用的自动检查技术，并且更具体地在制造环境中。解决方案：提出了用于检测多路分辨率的系统1及其操作方法。该系统10可以设置有具有第一分辨率的第一扫描系统16。第一扫描系统16对对象14的表面区域22自动执行第一分辨率的扫描，并且可以操作以识别对象14的表面异常的位置84.系统可以设置有第二扫描系统具有比第一分辨率低的第二分辨率。第二扫描系统18从第一扫描系统接收表面异常的位置84，并且可以操作以便对表面异常的位置84周围的规定区域86自动执行第二分辨率的扫描。版权所有（C）2006，JPO＆NCIPI

3. 发明专利

JP2004354382A Method and system for measuring flow aperture area 有权
公开(公告)号：JP2004354382A
公开(公告)日：2004-12-16
申请号：JP2004156987
申请日：2004-05-27
申请人： General Electric Co , ゼネラル・エレクトリック・カンパニイGeneral Electric Company
发明人： HARDING KEVIN GEORGE , LITTLE FRANCIS H , ROSS JOSEPH BENJAMIN , REVERMAN JEFFREY JOHN
IPC分类号： F01D25/00 , F02C9/00 , G01B11/24 , G01B11/28 , G06T7/60
CPC分类号： G01B11/285 , G01B11/24
摘要： PROBLEM TO BE SOLVED: To provide a method (400) to measure an aperture (202) of which the picture is made in an object (38), using an optical sensor system (200).
SOLUTION: This method comprises a step (402) for positioning an illumination source (216) making it adjacent to an aperture, a step (404) for illuminating the perimeter part surrounding the aperture, a step (406) which samples an image at the illuminated boundary line and a step (408) for computing the area in the received boundary line. This system is composed of the light source (216), arranged in such a way that it should project a sheet (220) of the first light which intersects a first part (208) of the perimeter part surrounding the aperture and projects a sheet (222) of the second light which intersects a second part (210) of the perimeter part surrounding the aperture, a light-detecting device (224) which receives the part of the sheet of light reflected toward the light-detecting device and intersects the perimeter part surrounding the aperture, and an image-processing processor (226) which samples the image taken from the detection device.
COPYRIGHT: (C)2005,JPO&NCIPI

4. 发明专利

JP2010271312A Inspection system and method with multi-image phase shift analysis 有权
标题翻译：检测系统和方法与多图像相位移动分析
公开(公告)号：JP2010271312A
公开(公告)日：2010-12-02
申请号：JP2010114851
申请日：2010-05-19
申请人： General Electric Co , ゼネラル・エレクトリック・カンパニイGeneral Electric Company
发明人： ABRAMOVICH GIL , HARDING KEVIN GEORGE , ISAACS RALPH GERALD , SONG GUIJU , ROSS JOSEPH BENJAMIN , ZHENG JIANMING
IPC分类号： G01N21/84 , G01B11/25
CPC分类号： G01B11/2527 , G01N21/8806 , G01N2201/0635 , G02B13/22
摘要： PROBLEM TO BE SOLVED: To provide a newly improved inspection system and method for inspecting edge breaking sections. SOLUTION: The inspection system (10) includes a light source (20), a diffraction grating (23), a phase shift unit, an imager (30), and a processor (11). The light source (20) is composed to give off light. The diffraction grating (23) is in route of generated light and is composed to form diffraction grating imageries after light passes through. The phase shift unit is composed to form a plurality of phase shift patterns of diffraction grating image, which is reflected on the surface of an object (16) to form a plurality of projection phase shift patterns. The imager (30) is composed to obtain the image data of projection phase shift pattern. The processor (11) is composed to reproduce the surface of the object from the imagery data. The inspection method is also disclosed. COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供一种新改进的检查系统和检查边缘断裂部分的方法。检测系统（10）包括光源（20），衍射光栅（23），相移单元，成像器（30）和处理器（11）。光源（20）构成发光。衍射光栅（23）处于产生光的路径中，并且构成为在光通过之后形成衍射光栅成像。相移单元被构成为形成衍射光栅图像的多个相移图案，其被反射在物体（16）的表面上以形成多个投影相移图案。成像器（30）被构成以获得投影相移图案的图像数据。处理器（11）被构成为从图像数据再现对象的表面。还公开了检查方法。版权所有（C）2011，JPO＆INPIT

5. 发明专利

JP2007121294A Method and device for inspecting object 有权
标题翻译：用于检查对象的方法和设备
公开(公告)号：JP2007121294A
公开(公告)日：2007-05-17
申请号：JP2006287381
申请日：2006-10-23
申请人： General Electric Co , ゼネラル・エレクトリック・カンパニイGeneral Electric Company
发明人： HU QINGYANG , HAMILTON DONALD WAGNER , HARDING KEVIN GEORGE , ROSS JOSEPH BENJAMIN
IPC分类号： G01B11/02 , G01B11/24 , G01B11/26 , G01B11/30
CPC分类号： G01B11/2513
摘要： PROBLEM TO BE SOLVED: To provide a method of inspecting an object including an image sensor constituted to receive a structural light reflected from an object surface. SOLUTION: This method 38 of inspecting the object 12 includes the emission 40 of light from at least one out of a liquid crystal display (LCD) device and a LCOS (liquid crystal on silicon) device, the phase shift 42 of the light emitted from at least one of the LCD device and the LCOS device, the projection 44 of the phase-shifted light onto a surface of the object, the reception 46 of light reflected from the object surface using the imaging sensor 24, and the analysis 50 for the light received by the imaging sensor to facilitate inspection for at least one part of the object. COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：提供一种检查包括图像传感器的物体的方法，该图像传感器被构造成接收从物体表面反射的结构光。检查对象12的方法38包括来自液晶显示器（LCD）装置和LCOS（硅液晶）装置中的至少一个的发射光40，从LCD装置和LCOS装置中的至少一个发射的光，相移光的投射物44到物体的表面上，使用成像传感器24从物体表面反射的光的接收部46以及分析 50，用于由成像传感器接收的光，以便于对物体的至少一部分进行检查。版权所有（C）2007，JPO＆INPIT

6. 发明专利

JP2007121293A Method and device for inspecting object 审中-公开
标题翻译：用于检查对象的方法和设备
公开(公告)号：JP2007121293A
公开(公告)日：2007-05-17
申请号：JP2006287379
申请日：2006-10-23
申请人： General Electric Co , ゼネラル・エレクトリック・カンパニイGeneral Electric Company
发明人： HU QINGYING , HARDING KEVIN GEORGE , ROSS JOSEPH BENJAMIN , HAMILTON DONALD WAGNER
IPC分类号： G01B11/24 , G01N21/88 , G06T1/00
CPC分类号： G01B11/2513 , F01D5/005 , G01B5/205 , G06T7/521
摘要： PROBLEM TO BE SOLVED: To provide a method 72 for generating masks 50, 52 used together with a light measurement system 10 including a light source 22 for projecting light onto an object 12, and an image sensor 24 for receiving light reflected from the object. SOLUTION: The method includes the determination 74 for an outline 56 of the inspection-objective object, and the generation 86 of an electronic mask based on the outline of the determined object. The electronic masks are provided with electronic openings 62, 68 having outlines 64, 70 defined to be matched substantially with the outline of the determined object viewed from one out of the light source and the image sensor. COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：提供一种用于产生与包括用于将光投射到物体12上的光源22的光测量系统10一起使用的掩模50,52的方法72和用于接收从光源22反射的光的图像传感器24 物体。解决方案：该方法包括基于所确定的对象的轮廓的检查对象的轮廓56的确定74和电子掩模的生成86。电子掩模设置有电子开口62,68，其具有限定为与从光源和图像传感器中的一个观察的所确定的物体的轮廓基本匹配的轮廓64,70。版权所有（C）2007，JPO＆INPIT

7. 发明专利

JP2005257673A Noncontact measuring method and instrument 审中-公开
标题翻译：非线性测量方法和仪器
公开(公告)号：JP2005257673A
公开(公告)日：2005-09-22
申请号：JP2005003357
申请日：2005-01-11
申请人： General Electric Co , ゼネラル・エレクトリック・カンパニイGeneral Electric Company
发明人： LLOYD THOMAS WATKINS JR , ROSS JOSEPH BENJAMIN , BROOKSBY GLEN WILLIAM , NGUYEN VAN-DUC , SCHNEITER JOHN LEWIS , GORDON STEVEN JEFFREY , BENAYAD-CHERIF FAYCAL , NZOMIGNI VICTOR , HAMILTON DONALD
IPC分类号： G01B11/00 , F01D5/14 , F01D21/00 , G01B11/24 , G01B11/25 , G06T1/00 , G06T5/00
CPC分类号： F01D5/141 , F01D21/003 , G01B11/2522 , Y02T50/673
摘要： PROBLEM TO BE SOLVED: To provide a system or the like capable of acquiring accurate and quick measurement for a surface of an object, capable of aligning efficiently and accurately the measurement to setting for reference surface measurement of an ideal object, capable of filter-processing a noise from an aligned measured value, capable of discriminating deformation of the surface, and capable of displaying gage information obtained as a result therein to an operator, as to the multicamera tree-dimensional detection system for observing the object by making clear reflection of a large number of light patterns for the detected object. SOLUTION: A prescribed reference image 29 of an ideal model of the object 12 is stored in a memory 30. An image register 24 is coupled to an imaging device 20 and the memory 30 including the reference image 29 of the ideal model of the object 12. A conversion estimation device 26 compares a scan image 22 with the reference image 29, provides conversion for mapping the scan image 22 onto the reference image 29, and provides setting for a data point of the aligned object. One or more of filter modules 100 processes the data point of the aligned object by empirical information to reduce the noise, and enhances further precision and accuracy for the alignment. COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：为了提供能够对对象的表面进行准确和快速的测量的系统等，能够将测量高精度地准确地对准理想对象的基准表面测量，能够滤波处理来自对准测量值的噪声，能够区分表面的变形，并且能够向操作者显示作为结果获得的量具信息，关于通过明确地观察物体的多摄像机树维度检测系统反射大量的光图案为检测到的物体。对象12的理想模型的规定参考图像29被存储在存储器30中。图像寄存器24耦合到成像装置20和存储器30，存储器30包括理想模型的参考图像29 对象12.转换估计装置26将扫描图像22与参考图像29进行比较，提供用于将扫描图像22映射到参考图像29上的转换，并且提供对准对象的数据点的设置。一个或多个滤波器模块100通过经验信息处理对准的对象的数据点以减少噪声，并且增强对准的进一步的精度和精度。版权所有（C）2005，JPO＆NCIPI

8. 发明专利

JP2005077411A Method and system for image processing on structured optical profile of components 有权
标题翻译：用于组件的结构化光学轮廓图像处理的方法和系统
公开(公告)号：JP2005077411A
公开(公告)日：2005-03-24
申请号：JP2004247900
申请日：2004-08-27
申请人： General Electric Co , ゼネラル・エレクトリック・カンパニイGeneral Electric Company
发明人： HU QINGYING , HARDING KEVIN GEORGE , ROSS JOSEPH BENJAMIN , LORRAINE PETER WILLIAM
IPC分类号： G01B11/24 , G01B11/25
CPC分类号： G01B11/25 , G06T7/521
摘要： PROBLEM TO BE SOLVED: To provide image processing technology for reducing speckle noise and sampling error in structured optical application. SOLUTION: The image processing method for structured optical profile comprises a step for sampling the image (28) of a structured optical pattern (18) in order to obtain intensity distribution (36), and a step for selecting two or more sets of the points (43) sampled from the intensity distribution. Each of these sets is equipped with a plurality of sampled points, respectively. Further, this image processing method includes a step for applying each set of the sampled points to distribution functions, respectively, and a step for sorting the distribution functions in order to select typical distribution function associated with intensity distribution. COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：提供用于减少结构化光学应用中的斑点噪声和采样误差的图像处理技术。解决方案：用于结构化光学轮廓的图像处理方法包括用于对结构化光学图案（18）的图像（28）进行采样以获得强度分布（36）的步骤，以及用于选择两组或多组的步骤从强度分布中取样的点（43）。这些组中的每一个分别配备有多个采样点。此外，该图像处理方法包括分别将各组采样点应用于分布函数的步骤，以及用于对分布函数进行排序以选择与强度分布相关联的典型分布函数的步骤。版权所有（C）2005，JPO＆NCIPI

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式