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1. 发明专利

JP2006105983A Method and apparatus for measuring object shape 审中-公开
标题翻译：用于测量对象形状的方法和装置
公开(公告)号：JP2006105983A
公开(公告)日：2006-04-20
申请号：JP2005283189
申请日：2005-09-29
申请人： General Electric Co , ゼネラル・エレクトリック・カンパニイGeneral Electric Company
发明人： HU QINGYING , HARDING KEVIN GEORGE
IPC分类号： G01B11/25 , G01B11/24
CPC分类号： G01B11/2527 , G06T7/521
摘要： PROBLEM TO BE SOLVED: To provide an improved three-dimensional fringe projection method for enhancing measurement accuracy in non-contact three-dimensional shape measurement methods that use non-scanning techniques. SOLUTION: According to one embodiment of the present method, a system (10) for measuring the shape of an object (12) is provided. The system comprises a projection system (14), operable to project a fringe pattern (18) having a reference mark onto the object (12). The system further comprises an image-processing system (26) that is operable to capture an image (20) of the fringe pattern modulated by the object (12). The image-processing system (26) is further operable, to identify the reference mark in the image of the fringe pattern for constructing the shape of the object (12), based on the reference mark. COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：提供一种用于提高使用非扫描技术的非接触三维形状测量方法中的测量精度的改进的三维条纹投影方法。解决方案：根据本方法的一个实施例，提供了一种用于测量物体（12）的形状的系统（10）。该系统包括投影系统（14），其可操作以将具有参考标记的条纹图案（18）投影到物体（12）上。该系统还包括图像处理系统（26），其可操作以捕获由对象（12）调制的条纹图案的图像（20）。图像处理系统（26）还可操作，以基于参考标记来识别用于构造对象（12）的形状的条纹图案的图像中的参考标记。版权所有（C）2006，JPO＆NCIPI

2. 发明专利

JP2009025119A Profile measuring apparatus and operating method 审中-公开
标题翻译：型材测量装置和操作方法
公开(公告)号：JP2009025119A
公开(公告)日：2009-02-05
申请号：JP2007187994
申请日：2007-07-19
申请人： General Electric Co , ゼネラル・エレクトリック・カンパニイGeneral Electric Company
发明人： HU QINGYING , AZER MAGDI NAIM , HARDING KEVIN GEORGE , DEATON JOHN BRODDUS JR , TEWARI SUDHIR KUMAR
IPC分类号： G01B11/25
摘要： PROBLEM TO BE SOLVED: To provide a profile measuring apparatus which projects a fringe pattern onto an object (22) and is equipped also with an optical unit for acquiring an image of a distorted fringe pattern and which performs thereby accurate measurement of the object, and an operating method.
SOLUTION: The profile measuring apparatus (12) includes a fringe projecting device (32) so constituted as to project the fringe pattern onto the object (22) and the optical unit (34) so constituted as to acquire the image of the distorted fringe pattern modulated by the object (22). Besides, the profile measuring apparatus (12) includes a signal processing unit (60) which is so constituted that it processes the image acquired from the optical unit (34), filters noise from the image and determines real-time estimate values as to parameters relating to manufacture or repair of the object (22).
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：提供一种轮廓测量装置，其将条纹图案投影到物体（22）上，并且还配备有用于获取失真条纹图案的图像的光学单元，由此精确测量对象和操作方法。型材测量装置（12）包括边缘突出装置（32），其被构造成将条纹图案投射到物体（22）和光学单元（34）上，从而获得由物体（22）调制的扭曲条纹图案。此外，轮廓测量装置（12）包括信号处理单元（60），该信号处理单元（60）处理从光学单元（34）获取的图像，对来自图像的噪声进行滤波，并确定关于参数的实时估计值涉及物体（22）的制造或修理。版权所有（C）2009，JPO＆INPIT

3. 发明专利

JP2007121293A Method and device for inspecting object 审中-公开
标题翻译：用于检查对象的方法和设备
公开(公告)号：JP2007121293A
公开(公告)日：2007-05-17
申请号：JP2006287379
申请日：2006-10-23
申请人： General Electric Co , ゼネラル・エレクトリック・カンパニイGeneral Electric Company
发明人： HU QINGYING , HARDING KEVIN GEORGE , ROSS JOSEPH BENJAMIN , HAMILTON DONALD WAGNER
IPC分类号： G01B11/24 , G01N21/88 , G06T1/00
CPC分类号： G01B11/2513 , F01D5/005 , G01B5/205 , G06T7/521
摘要： PROBLEM TO BE SOLVED: To provide a method 72 for generating masks 50, 52 used together with a light measurement system 10 including a light source 22 for projecting light onto an object 12, and an image sensor 24 for receiving light reflected from the object. SOLUTION: The method includes the determination 74 for an outline 56 of the inspection-objective object, and the generation 86 of an electronic mask based on the outline of the determined object. The electronic masks are provided with electronic openings 62, 68 having outlines 64, 70 defined to be matched substantially with the outline of the determined object viewed from one out of the light source and the image sensor. COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：提供一种用于产生与包括用于将光投射到物体12上的光源22的光测量系统10一起使用的掩模50,52的方法72和用于接收从光源22反射的光的图像传感器24 物体。解决方案：该方法包括基于所确定的对象的轮廓的检查对象的轮廓56的确定74和电子掩模的生成86。电子掩模设置有电子开口62,68，其具有限定为与从光源和图像传感器中的一个观察的所确定的物体的轮廓基本匹配的轮廓64,70。版权所有（C）2007，JPO＆INPIT

4. 发明专利

JP2005077411A Method and system for image processing on structured optical profile of components 有权
标题翻译：用于组件的结构化光学轮廓图像处理的方法和系统
公开(公告)号：JP2005077411A
公开(公告)日：2005-03-24
申请号：JP2004247900
申请日：2004-08-27
申请人： General Electric Co , ゼネラル・エレクトリック・カンパニイGeneral Electric Company
发明人： HU QINGYING , HARDING KEVIN GEORGE , ROSS JOSEPH BENJAMIN , LORRAINE PETER WILLIAM
IPC分类号： G01B11/24 , G01B11/25
CPC分类号： G01B11/25 , G06T7/521
摘要： PROBLEM TO BE SOLVED: To provide image processing technology for reducing speckle noise and sampling error in structured optical application. SOLUTION: The image processing method for structured optical profile comprises a step for sampling the image (28) of a structured optical pattern (18) in order to obtain intensity distribution (36), and a step for selecting two or more sets of the points (43) sampled from the intensity distribution. Each of these sets is equipped with a plurality of sampled points, respectively. Further, this image processing method includes a step for applying each set of the sampled points to distribution functions, respectively, and a step for sorting the distribution functions in order to select typical distribution function associated with intensity distribution. COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：提供用于减少结构化光学应用中的斑点噪声和采样误差的图像处理技术。解决方案：用于结构化光学轮廓的图像处理方法包括用于对结构化光学图案（18）的图像（28）进行采样以获得强度分布（36）的步骤，以及用于选择两组或多组的步骤从强度分布中取样的点（43）。这些组中的每一个分别配备有多个采样点。此外，该图像处理方法包括分别将各组采样点应用于分布函数的步骤，以及用于对分布函数进行排序以选择与强度分布相关联的典型分布函数的步骤。版权所有（C）2005，JPO＆NCIPI

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