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1. 发明专利

JPS60117103A HEIGHT MEASURING APPARATUS FOR OBJECT TO BE MEASURED 失效
公开(公告)号：JPS60117103A
公开(公告)日：1985-06-24
申请号：JP22562783
申请日：1983-11-30
申请人： FUJITSU LTD
发明人： ANDOU MORITOSHI , MITA KIKUO , KAKIGI GIICHI
IPC分类号： G01B11/24 , G01B11/02
摘要： PURPOSE:To enlarge scanning range, by forming a reflected light of the light scanning a specimen a linear-shape image and installing a light detecting means in the perpendicular direction to the linear-shape image. CONSTITUTION:A laser beam from a light source scans a specimen with an optical scanning system 1. The reflecting beam forms a linear image with a cylindrical lens. A CCD line sensor 4 is installed in the perpendicular direction to the linear image. A change of the height of the specimen causes vertical movements of the linear shape in the direction of the line sensor 4. An output of the sensor 4 at this time is detected for detection of the height of the specimen. Further, by arranging 2 pairs of measuring systems of cylindrical lens and line sensor to a light source, even if the reflecting beam is shaded by the part, measurement becomes available.

2. 发明专利

JPS6085597A THROUGH HOLE INSPECTING DEVICE 失效
公开(公告)号：JPS6085597A
公开(公告)日：1985-05-15
申请号：JP19478483
申请日：1983-10-18
申请人： FUJITSU LTD
发明人： ANDOU MORITOSHI , MITA KIKUO , KAKIGI GIICHI
IPC分类号： H05K3/00 , G01N21/88 , G01N21/956 , H05K3/42

3. 发明专利

JPS6060540A INSPECTING DEVICE FOR THROUGH-HOLE 失效
公开(公告)号：JPS6060540A
公开(公告)日：1985-04-08
申请号：JP16824083
申请日：1983-09-14
申请人： FUJITSU LTD
发明人： MITA KIKUO , ANDOU MORITOSHI , KAKIGI GIICHI
IPC分类号： G01N21/88 , G01N21/956
摘要： PURPOSE:To discriminate a nondefective and a defective through-hole definitely by providing the 1st binary coding circuit which codes a video signal generated by only light leaked in a mask into a binary signal and the 2nd binary coding circuit which codes a signal generated by both the light leaked in the mask and light leaked in a defective. CONSTITUTION:The video signal S1 is coded by the 1st binary coding circuit 20-1 with a high slice level V1 into the binary signal S2, which is inputted to a correlation circuit 20-3. Namely, this binary-coded signal S2 is inputted as a video signal originating from only the light leaked in the mask for the position detection of the reverse-surface side opening of a through-hole. The video signal S1, on the other hand, is coded by the 2nd binary coding circuit 20-1 on the basis of a low slice level V2 and inputted as a binary-coded signal S4 to a defective searching circuit 20-7. Consequently, it is made extremely definite to discriminate between a nondefective and a defective through-hole.

4. 发明专利

JPS59180314A Through-hole inspecting device 失效
标题翻译：通孔检查设备
公开(公告)号：JPS59180314A
公开(公告)日：1984-10-13
申请号：JP5418683
申请日：1983-03-30
申请人： Fujitsu Ltd
发明人： MITA KIKUO , ANDOU MORITOSHI , KAKIGI GIICHI
IPC分类号： H05K3/00 , G01B11/24 , G01B11/245 , G01B11/30 , H05K3/42
CPC分类号： H05K3/42
摘要： PURPOSE:To perform high-speed continuous processing by holding the pressure on one surface side of a base material higher than the atmospheric pressure, and blowing high-pressure gas from a through-hole and floating a light shield mask. CONSTITUTION:The base material 1 is fixed to an X-Y stage 2 and also forms an air chamber 3 with the X-Y stage 2 interposed to hold airtightness. This air chamber 3 is provided with a blow-in port 5' for sending air 5 with higher pressure than the atmospheric pressure, e.g. compressed air. The high-pressure air 5 is sent in from the blow-in port 5' by an unshown device firstly and blown out of through holes 1' distributed uniformly in the base material 1 to float a transparent base material 6 equipped with the light shield mask 6. Consequently, the high-speed continuous processing is carried out.
摘要翻译：目的：通过将基体材料的一个表面侧的压力保持在高于大气压力的状态下进行高速连续加工，从通孔吹出高压气体并使遮光掩模漂浮。构成：将基材1固定在X-Y平台2上，并且还形成有用于保持气密性的X-Y平台2的空气室3。该空气室3设有用于输送高于大气压的空气5的吹入口5'，例如，压缩的空气。高压空气5首先通过未示出的装置从吹入口5'送入，并从均匀分布在基材1中的通孔1'中吹出，以漂浮配备有遮光罩的透明基材6 因此，进行高速连续处理。

5. 发明专利

JPS59150328A Through-hole inspecting apparatus 失效
标题翻译：通孔检查装置
公开(公告)号：JPS59150328A
公开(公告)日：1984-08-28
申请号：JP1139583
申请日：1983-01-28
申请人： Fujitsu Ltd
发明人： KAKIGI GIICHI , MITA KIKUO , ANDOU MORITOSHI
IPC分类号： G01N21/88 , G01N21/956
CPC分类号： G01N21/95692
摘要： PURPOSE:To detect the defect of a through-hole, by a method wherein a mirror surface member for blocking one opening part of the through-hole and an illumination means for detecting the defect is provided to the side of a blocking member while an illumination means for detecting the through-hole and a light detecting means are provided to the other side thereof. CONSTITUTION:A light detecting apparatus 18a and a light blocking mask 16a for blocking a through-hole are arranged so as to interpose a printed board 11 therebetween and a mirror surface 16a' is provided to the through-hole side of the mask 16a. A through-hole illuminating lamp 17 is provided in close vicinity to the light detecting apparatus 18a and a second light blocking mask 16b is provided so as to be opposed to a second light detecting apparatus 18b while a defect detecting illumination lamp 15 is further provided under said mask 16b. When the through-hole 12 is present directly under the light detecting apparatus 18a, light 17a is reflected by the mirror surface 16a' and the reflected light 17b is detected by the light detecting apparatus 18a. The through-hole of which the position is confirmed is moved to the position directly under the light detecting apparatus 18b and the illumination lamp 15 is lighted while the presence or absence of light from the through-hole is detected by the light detecting apparatus 18b to detect the presence of void or defect of the through-hole.
摘要翻译：目的：为了检测通孔的缺陷，通过一种方法，其中将用于阻挡通孔的一个开口部分的镜面部件和用于检测缺陷的照明装置设置在阻挡部件的侧面，同时照明用于检测通孔的装置和光检测装置设置在其另一侧。结构：用于阻挡通孔的光检测装置18a和遮光掩模16a布置成将印刷电路板11插入其间，并且将镜面16a'设置在掩模16a的通孔侧。在光检测装置18a附近设置有通孔照明灯17，并且第二遮光掩模16b设置成与第二光检测装置18b相对，同时还在下面设置缺陷检测照明灯15 所述掩模16b。当通孔12直接存在于光检测装置18a的下面时，光17a被镜面16a'反射，并且由光检测装置18a检测反射光17b。将确认位置的通孔移动到光检测装置18b正下方的位置，并且在通过光检测装置18b检测到来自通孔的光的存在或不存在的同时照明灯15点亮检测通孔的空隙或缺陷的存在。

6. 发明专利

JPS59121578A BAR CODE READER 失效
公开(公告)号：JPS59121578A
公开(公告)日：1984-07-13
申请号：JP22874782
申请日：1982-12-28
申请人： FUJITSU LTD
发明人： MITA KIKUO , ANDOU MORITOSHI , KAKIGI GIICHI
IPC分类号： G06K7/10
摘要： PURPOSE:To detect a bar code formed on a transparent or transluscent object to be processed as a pattern with good accuracy by irradiating light from the back side of the object to be processed where the bar code is formed to detect a transmitted light pattern by a photodetector. CONSTITUTION:The light from a light source 4 is projected on a mirror 7, its reflected light 8 irradiates the bar code 2 from the back side of a printed distributing board 1 and the tilt angle of the light source 4, the mirror 7 and the photodetector 3 is set so as to make this transmitted light 9 enter the photodetector 3. Further, the bar code 2 read sequentially by sliding a scanning mechanism 5 on a guard rail. The transmitted light 9 is formed on a photodetecting surface in the photodetector 3 by a lens 10 fitted to the tip of the photodetector 3. The detected signal is transmitted to a decode circuit 11, where the signal is decoded and read as information.

7. 发明专利

JPS5969728A Formation of elliptical beam 失效
标题翻译：椭圆形梁的形成
公开(公告)号：JPS5969728A
公开(公告)日：1984-04-20
申请号：JP18118282
申请日：1982-10-14
申请人： Fujitsu Ltd
发明人： ANDOU MORITOSHI , MITA KIKUO , KAKIGI GIICHI
IPC分类号： G01N21/88 , G01N21/956 , G02B27/09 , G02B27/28
CPC分类号： G02B27/0938 , G02B27/09
摘要： PURPOSE:To form light which is emitted by irradiating a laser to a double refraction crystal plate to an elliptical beam which is small in a ratio of a short axis and a long axis, and to raise reflection intensity at the time of scanning, by providing plural pieces of a combination in which double refraction crystal plates having different thicknesses are alternately combined with a 1/2 wavelength plate, respectively. CONSTITUTION:A 1/2 wavelength plate 23 is placed between double refraction crystal plates 21, 22 whose thickness is different from each other, and when a laser light 24 is made incident to the double refraction crystal plate 21, laser light is separated into optical beams 25, 26. When these separated optical beams 25, 26 are made incident to the 1/2 wavelength plate 23, and its emitted optical beams 27, 28 are made incident to the double refraction crystal plate 22, four optical beams 29-32, whose beam center positions are displaced from the original beam, are obtained. This optical beam has no mutual interference since the deflecting face is separated by 45 deg. by the 1/2 wavelength plate 23, and an elliptical beam having intensity of the sum of each light intensity is formed.
摘要翻译：目的：为了形成通过将激光照射到双折射晶体板而发射到短轴和长轴的比率小的椭圆光束而发射的光，并且通过提供扫描时提高反射强度分别具有不同厚度的双折射晶体板与1/2波长板交替组合的多个组合。构成：将1/2波长板23放置在厚度彼此不同的双折射晶体板21,22之间，并且当激光24入射到双折射晶体板21时，将激光分离成光当这些分离的光束25,26入射到1/2波长板23，并且其发射的光束27,28入射到双折射晶体板22时，四个光束29-32 ，其光束中心位置与原始光束位移。由于偏转面分离了45度，该光束没有相互干扰。通过1/2波长板23形成具有每个光强度之和的强度的椭圆光束。

8. 发明专利

JPS59222A Quantizing method of binary-coded signal 失效
标题翻译：二进制信号的量化方法
公开(公告)号：JPS59222A
公开(公告)日：1984-01-05
申请号：JP10960782
申请日：1982-06-25
申请人： Fujitsu Ltd
发明人： KAKIGI GIICHI , MITA KIKUO , ANDOU MORITOSHI
IPC分类号： H03K5/01 , H03K5/08
摘要： PURPOSE: To eliminate the need for shortening a repeated period of a clock signal, and to detect effectively an abnormal pattern having minute width or length, by expanding the width of a binary-coded signal of specified width or less, and thereafter, quantizing it.
CONSTITUTION: A binary-coded signal from a signal input terminal 6 is inputted to the first pulse signal generating circuit 7 and an OR circuit 8 of the first block, and the second pulse signal generating circuit 11 and an AND circuit 12 of the second block. By this first block, only width d1 in width d1, d2 smaller than a repeated period γ of the binary-coded signal is expanded to width (t). Subsequently, by the second block, width d2 is expanded to width (t), and outputs of the respective circuits 8, 12 are given to shift registers 13, 14. Subsequently, a clock from a clock signal generating circuit 9 is given to the registers 13, 14, and an abnormal pattern having minute width or length is detected effectively without shortening a repeated period of a clock signal.
COPYRIGHT: (C)1984,JPO&Japio
摘要翻译：目的：为了消除缩短时钟信号的重复周期的需要，并且通过扩大指定宽度或更小的二进制编码信号的宽度来有效地检测具有微小宽度或长度的异常图案，然后量化它。构成：来自信号输入端子6的二进制编码信号被输入到第一脉冲信号发生电路7和第一块的OR电路8，第二脉冲信号产生电路11和第二块的AND电路12 。通过该第一块，仅宽度d1，窄于二进制编码信号的重复周期γ的宽度d1扩展到宽度（t）。随后，通过第二块，宽度d2被扩展到宽度（t），并且各个电路8,12的输出被提供给移位寄存器13,14。随后，给来自时钟信号发生电路9的时钟寄存器13,14，并且有效地检测具有微小宽度或长度的异常模式，而不缩短时钟信号的重复周期。

9. 发明专利

JPS60247106A CONFIGURATION INSPECTING APPARATUS 失效
公开(公告)号：JPS60247106A
公开(公告)日：1985-12-06
申请号：JP10424984
申请日：1984-05-22
申请人： FUJITSU LTD
发明人： ANDOU MORITOSHI
IPC分类号： G01B11/24 , G01N21/88 , G01N21/956 , G02B21/00
摘要： PURPOSE:To improve the reliability of a printed board, by examining the soldered state of a deep part of an highly integrated IC package, which is mounted on the printed board, by the combination of lighting from the back surface of the printed board and an optical system having a long focal depth. CONSTITUTION:An inspecting apparatus is composed of the following parts: a printed board 2, on which an IC package 1 is mounted; a lighting device 4, which projects light into a narrow gap between the package 1 and the board 2 uniformly through the semi-transparent board 2 from the back side of the printed board 2; a reflecting prism 5, which bends the light from the IC upward at a right angle; and a microscope 6, having a long focal depth. At the time of inspection, the light is projected from the back surface of the board 2. A part of the light is transmitted and another part is diffused. Then a soldered part is uniformly lighted. The transmitted light is bent upward at a right angle by the prism 5, which is provided at the close proximity of the side surface of the package 1. The inspection is performed by a microscope 6. The microscope 6 is composed of an object lens 12 and a small stop 13. A part of the board 2 is lighted as the diffused surface. Therefore, the boundary between the board 2 and the solder fillet can be clearly observed.

10. 发明专利

JPS60200380A INTEGRATED CIRCUIT 失效
公开(公告)号：JPS60200380A
公开(公告)日：1985-10-09
申请号：JP5552484
申请日：1984-03-23
申请人： FUJITSU LTD
发明人： MITA KIKUO , ANDOU MORITOSHI , KAKIGI GIICHI
IPC分类号： G06T7/00 , G06K9/62
摘要： PURPOSE:To obtain an integrated circuit with which an external logical operation is possible between patterns by performing a logical operation between outputs of a register group which stores the input data and another register group which can be rewritten externally as well as a logical operation between outputs of logical arithmetic circuits. CONSTITUTION:An input pattern is supplied to an input pattern storing register R1 through a pattern input terminal P1 and shifted successively and synchronously with a clock CL1 to be stored to input pattern storing registers R2 and R3. While a control pattern is supplied to a control pattern storing register M1 through a control data input terminal C1 and shifted successively and synchronously with a clock CL2 to be stored to control pattern storing registers M2 and M3. A control pattern which masks the data of the register R1 is applied serially to the terminal C1 to drive the clock CL2. Thus mask data are supplied to registers M1-M3 respectively. In such a way, a notice point within the input pattern can be selected by a control pattern and also changed optionally by a change of the control pattern.

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