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1. 发明专利

JP2004292916A Method and apparatus for manufacturing microstructure 审中-公开
公开(公告)号：JP2004292916A
公开(公告)日：2004-10-21
申请号：JP2003089162
申请日：2003-03-27
申请人： Fuji Xerox Co Ltd , Mitsubishi Heavy Ind Ltd , 三菱重工業株式会社 , 富士ゼロックス株式会社
发明人： HOTTA HIROYUKI , YAMADA TAKAYUKI , TAKAHASHI MUTSUYA , GOTO TAKAYUKI , TSUNO TAKESHI
IPC分类号： B81C3/00 , C23C26/00 , C23C28/00
摘要： PROBLEM TO BE SOLVED: To provide a method for manufacturing a microstructure, which can layer an extremely thin film at a high transferring rate, and to provide an apparatus therefor.
SOLUTION: This manufacturing method comprises measuring the distance and adjusting the angle between a donor substrate 12 and a target substrate 16, at three points. Distance-measuring portions 9a, 9b and 9c measure the distance between the donor substrate 12 and the target substrate 16, and angle-adjusting portions 10a, 10b and 10c adjust the distance between a substrate holder 5 connected to a substrate holder 4 for holding the target substrate 16 and a substrate holder 6 to adjust the angle between the donor substrate 12 and the target substrate 16. The distance-measuring portions 9a, 9b and 9c, and the angle-adjusting portions 10a, 10b and 10c are each connected to a control part 11, and the control part 11 controls the angle-adjusting portions 10a, 10b and 10c on the basis of measured values from the distance-measuring portions 9a, 9b and 9c, so that the angle between the donor substrate 12 and the target substrate 16 becomes 0-degree.
COPYRIGHT: (C)2005,JPO&NCIPI

2. 发明专利

JP2004223637A Method for manufacturing laminated structure and laminated structure 有权
公开(公告)号：JP2004223637A
公开(公告)日：2004-08-12
申请号：JP2003012690
申请日：2003-01-21
申请人： Fuji Xerox Co Ltd , Mitsubishi Heavy Ind Ltd , 三菱重工業株式会社 , 富士ゼロックス株式会社
发明人： YAMADA TAKAYUKI , TAKAHASHI MUTSUYA , HOTTA HIROYUKI , OZAWA TAKASHI , SUZUKI SADAICHI , NAGAO TASUKE , GOTO TAKAYUKI , TSUNO TAKESHI
IPC分类号： B81C3/00 , B29C67/00 , B81B1/00
摘要： PROBLEM TO BE SOLVED: To provide a method for manufacturing a laminated structure for manufacturing even the laminated structure having a laminating direction height more than a few hundred μm in a short time and the laminated structure.
SOLUTION: A pattern member 1 in which a plurality of cross-sectional shape members 11-1 to 11-3 corresponding to a cross-sectional pattern of the structure are integrally connected to a frame shaped member 12 by a connecting member 13 is formed by patterning a planar metal member. The pattern member 1 is fixed to a supporting table 3 via an adhesive sheet 2. The structure 5 is manufactured by laminating each of the cross-sectional shape members 11-1 to 11-3 in the pattern member 1 on a target substrate 4, while transferring the members 11-1 to 11-3 in order.
COPYRIGHT: (C)2004,JPO&NCIPI

3. 发明专利

JP2004358602A Manufacturing method of laminated structure and laminated structure 有权
公开(公告)号：JP2004358602A
公开(公告)日：2004-12-24
申请号：JP2003159534
申请日：2003-06-04
申请人： Fuji Xerox Co Ltd , Mitsubishi Heavy Ind Ltd , 三菱重工業株式会社 , 富士ゼロックス株式会社
发明人： TAKAHASHI MUTSUYA , YAMADA TAKAYUKI , HOTTA HIROYUKI , GOTO TAKAYUKI , TSUNO TAKESHI , KINOUCHI MASAHITO
IPC分类号： B81C1/00 , B81C99/00 , B81C5/00
摘要： PROBLEM TO BE SOLVED: To provide a manufacturing method of a laminated structure whereby the laminated structure the height of which is more than a few hundred μm is manufactured in a short period of time and favorably in yield and the laminated structure.
SOLUTION: A process to carry out separation is repeated after arranging a target substrate 46 on a donor substrate on which a plurality of cross-section pattern members 45-1, -2 corresponding to a cross-section pattern of the structure are formed in such a way as to face it and welding this target substrate on the cross-section pattern members 45-1, -2 by positioning it on them. The cross-section pattern members 45-1, -2 are formed as below-mentioned at the time of manufacturing the laminated structure by connecting the cross-section pattern members 45-1, -2 on the target substrate by transferring and laminating it on them by this process. The cross-section pattern members 45-1, -2 are formed by plating in a space of the resist pattern layers 44-1, -2, -3 which are a reversed pattern of the cross-section pattern of the structure, and are formed by removing the resist pattern layers 44-1, -2, -3.
COPYRIGHT: (C)2005,JPO&NCIPI

4. 发明专利

JP2010216969A System, program and mark set for position measurement, and object for position measurement 审中-公开
标题翻译：用于位置测量的系统，程序和标记，以及用于位置测量的对象
公开(公告)号：JP2010216969A
公开(公告)日：2010-09-30
申请号：JP2009063669
申请日：2009-03-16
申请人： Fuji Xerox Co Ltd , 富士ゼロックス株式会社
发明人： SEKO YASUJI , HOTTA HIROYUKI , SAGUCHI YASUYUKI
IPC分类号： G01B11/00 , G01B11/26
摘要： PROBLEM TO BE SOLVED: To provide a system, a program and a mark set for position measurement which maintain the accuracy of the position measurement of an object even when the mark set for the position measurement attached to the object faces a camera straight, and the object for position measurement.
SOLUTION: The system for position measurement includes the mark set 2 which has four or more basic marks attached to the object 1 and being in the known positional relations, wherein at least one of the basic marks is disposed apart from a plane whereon the other three or more basic marks are positioned, and wherein the point of intersection with the plane of a perpendicular line drawn to this plane from the basic mark disposed apart from the plane is located outside a polygon formed by the other three or more basic marks. The system includes further the camera 13 which has a two-dimensional imaging element 12 imaging the mark set 2, and an arithmetic device 14 which computes at least one of a three-dimensional position and an angle of the object, based on an image of the mark set photographed by the camera 13.
COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：为了提供一种用于位置测量的系统，程序和标记组，即使当附接到对象的位置测量的标记设置面向相机直线时，也保持对象的位置测量的精度，以及位置测量对象。
解决方案：用于位置测量的系统包括标记组2，其具有附接到对象1并具有已知位置关系的四个或更多个基本标记，其中至少一个基本标记与其中的其他三个以上的基本标记被定位，并且其中与从与该平面分开的基准标记绘制到该平面的垂直线的平面的交点与位于由另外三个或更多基本标记形成的多边形之外。该系统还包括具有对标记组2进行成像的二维成像元件12的相机13以及基于图像的图像计算物体的三维位置和角度中的至少一个的算术装置14 相机13拍摄的标记集。版权所有（C）2010，JPO＆INPIT

5. 发明专利

JP2010210437A Arithmetic unit for measuring position, and position measurement system and program 审中-公开
标题翻译：用于测量位置的算术单元和位置测量系统和程序
公开(公告)号：JP2010210437A
公开(公告)日：2010-09-24
申请号：JP2009057058
申请日：2009-03-10
申请人： Fuji Xerox Co Ltd , 富士ゼロックス株式会社
发明人： SAGUCHI YASUYUKI , SEKO YASUJI , HOTTA HIROYUKI
IPC分类号： G01B11/00 , G01B11/26
摘要： PROBLEM TO BE SOLVED: To provide an arithmetic unit for measuring positions, reducing installation regions of basic labels as compared with the case where the number of basic labels disposed in an object is not less than four, and also to provide a position measurement system and a position measurement program.
SOLUTION: The position measurement system is provided with: three basic labels a1, a2, a3 that are disposed in an object 1 while the position relationship is known; an imaging apparatus 3 including a two-dimensional image pickup device 2; and the arithmetic unit 4 for measuring positions that calculates one to four three-dimensional position candidates of the object 1, based on the three basic labels a1, a2, a3 captured by the imaging apparatus 3 and performs operation for obtaining at least either of a three-dimensional position and an angle of the object 1 by the calculated three-dimensional position candidates.
COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：与设置在物体中的基本标签的数量不小于4的情况相比，提供用于测量位置的运算单元，减少基本标签的安装区域，并且还提供位置测量系统和位置测量程序。解决方案：位置测量系统具有：位置关系已知时设置在物体1中的三个基本标签a1，a2，a3; 包括二维图像拾取装置2的成像装置3; 以及运算单元4，用于基于由成像装置3拍摄的三个基本标号a1，a2，a3，测量计算物体1的一到四个三维位置候选的位置，并执行用于获得三维位置和物体1的角度乘以所计算的三维位置候选。版权所有（C）2010，JPO＆INPIT

6. 发明专利

JP2010127701A Position measuring apparatus, object to be recognized, and program 审中-公开
标题翻译：位置测量装置，目标识别和程序
公开(公告)号：JP2010127701A
公开(公告)日：2010-06-10
申请号：JP2008301219
申请日：2008-11-26
申请人： Fuji Xerox Co Ltd , 富士ゼロックス株式会社
发明人： SEKO YASUJI , HOTTA HIROYUKI , SAGUCHI YASUYUKI
IPC分类号： G01B11/00 , G01C11/02 , G01C15/06
摘要： PROBLEM TO BE SOLVED: To provide a position measuring apparatus which can perform position measurement of an object with high accuracy, by photographing a point light source and a reference member provided in the object and measuring the position of the point light source and the reference member, with high accuracy from the photographed image.
SOLUTION: The position measuring apparatus 300 includes a camera 30 for photographing the image of the reference member 16, arranged on the object 100 and an arithmetic unit 40 which derives the positions of three or more first reference points and the positions of one or more second reference points from the image of the reference member 16 photographed by the camera 30; acquires the positional relationship between the first reference points and the second reference points on the object 100; and determines the position of the object 100 from the positions of the first reference points and the second reference points on the image and from the positional relation between the first reference points and the second reference points on the object 100.
COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：提供一种位置测量装置，其可以通过拍摄设置在物体中的点光源和参考部件，并且测量点光源的位置并且可以高精度地进行物体的位置测量，并且参考构件，从拍摄图像的高精度。位置测量装置300包括：照相机30，用于拍摄布置在物体100上的基准部件16的图像;以及运算单元40，其计算三个或更多个第一参考点的位置和一个位置或更多的第二参考点，由相机30拍摄的参考构件16的图像; 获取对象100上的第一参考点和第二参考点之间的位置关系; 并根据图像上的第一参考点和第二参考点的位置以及对象100上的第一参考点和第二参考点之间的位置关系来确定对象100的位置。 C）2010，JPO＆INPIT

7. 发明专利

JP2009288172A Indicating device, object recognizing device and program 有权
标题翻译：指示设备，对象识别设备和程序
公开(公告)号：JP2009288172A
公开(公告)日：2009-12-10
申请号：JP2008143313
申请日：2008-05-30
申请人： Fuji Xerox Co Ltd , 富士ゼロックス株式会社
发明人： HOTTA HIROYUKI , SEKO YASUJI , SAGUCHI YASUYUKI
IPC分类号： G01B11/00 , G01B11/26 , G06T1/00
摘要： PROBLEM TO BE SOLVED: To provide an indicating device that is less likely to be affected by the user's manner of usage, in identifying an object.
SOLUTION: This indicating device 100 includes a plurality of reference point aggregations, each being composed of a light emitting point, and a control means that respectively turns on the light emitting points for each reference point aggregation and turns off the light emitting points in others than one of the reference point aggregations, when turning on the light-emitting point in one of the reference point aggregations. The reference point aggregation is constituted by three or more of first reference points, on a plane of which the positional relationship among them is specified and a single second reference point, of which the positional relation with respect to the first reference points is specified. An object 300 is specified, on the basis of the positional relationship between images of the first reference points and an image of the second reference point in the reference point aggregation captured by a camera 20.
COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：提供在识别对象时不太可能受到用户使用方式的影响的指示装置。解决方案：该指示装置100包括多个参考点聚集，每个参考点聚集由发光点组成，并且控制装置分别接通每个参考点聚集的发光点并关闭发光点在其他参考点聚合中的一个中，当在其中一个参考点聚合中打开发光点时。参考点聚合由三个或更多个第一参考点构成，其中指定它们之间的位置关系的平面和指定相对于第一参考点的位置关系的单个第二参考点。基于由照相机20拍摄的参考点聚集中的第一参考点的图像与第二参考点的图像之间的位置关系来指定对象300.（C）2010，JPO和INPIT

8. 发明专利

JP2009199247A Object recognition apparatus, indicating device and program 审中-公开
标题翻译：对象识别装置，指示装置和程序
公开(公告)号：JP2009199247A
公开(公告)日：2009-09-03
申请号：JP2008039023
申请日：2008-02-20
申请人： Fuji Xerox Co Ltd , 富士ゼロックス株式会社
发明人： SAGUCHI YASUYUKI , SEKO YASUJI , HOTTA HIROYUKI
IPC分类号： G06F3/033 , G01B11/00 , G01B11/26 , G06F3/038 , G06T1/00
摘要： PROBLEM TO BE SOLVED: To provide an object recognition apparatus that can easily and precisely measure an object indicated by an indicating device. SOLUTION: The object recognition apparatus 200 comprises a camera 20 for imaging the indicating device 100 for which the first reference points composed of three or more points on a plane and the second reference point composed of one point and located outside a polygon formed with the first reference points as its vertices are arranged, a storage part for storing mutual positional relationships between the first reference points, positional relationships of the second reference point to the first reference points and three-dimensional positions of object, an identification part for identifying images of the first reference points and an image of the second reference point captured by the imaging part by positional relationships between the images of the first reference points and the image of the second reference point, and an operation part for reading out the positional relationships between the first reference points, the positional relationships of the second reference point to the first reference points and the three-dimensional positions of the objects from the storage part and identifying the object 300 indicated by the indicating device 100 according to the images of the first reference points and the image of the second reference point discriminated by the identification part. COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：提供一种可以容易且精确地测量由指示装置指示的对象的对象识别装置。解决方案：物体识别装置200包括用于对指示装置100进行成像的照相机20，其中由平面上的三个或更多个点组成的第一参考点和由一个点组成并位于形成的多边形之外的第二参考点其中第一参考点作为其顶点被布置;存储部分，用于存储第一参考点之间的相互位置关系，第二参考点与第一参考点的位置关系和对象的三维位置;识别部分，用于识别第一参考点的图像和通过第一参考点的图像与第二参考点的图像之间的位置关系由成像部分捕获的第二参考点的图像以及用于读出第二参考点的图像之间的位置关系的操作部分第一参考点，第二参考点的位置关系来自存储部分的对象的第一参考点和三维位置，并且根据第一参考点的图像和由识别部分识别的第二参考点的图像来识别由指示装置100指示的对象300 。版权所有（C）2009，JPO＆INPIT

9. 发明专利

JP2008070343A Position measuring system 审中-公开
标题翻译：位置测量系统
公开(公告)号：JP2008070343A
公开(公告)日：2008-03-27
申请号：JP2006251926
申请日：2006-09-15
申请人： Fuji Xerox Co Ltd , 富士ゼロックス株式会社
发明人： SEKO YASUJI , SAGUCHI YASUYUKI , HOTTA HIROYUKI
IPC分类号： G01B11/00
摘要： PROBLEM TO BE SOLVED: To provide a position measuring system capable of measuring positions of a plurality of light sources or pointing positions.
SOLUTION: The position measuring system comprises pointers 1 and 2, a light emission controller 3 for controlling the light emission of the pointers 1 and 2, CCD image sensors 4 and 5 for imaging light emitted from the pointers 1 and 2, and a PC 6 for calculating the pointing positions of the pointers 1 and 2 based on the images imaged by the image sensors 4 and 5. The pointers 1 and 2 project concentric circle pattern light 9. The PC 6 is connected to a display 10, and displays a cursor 7 at the positions pointed by the pointers 1 and 2. The light emission controller 3 sequentially selects the pointers 1 and 2 and makes them emit light correspondingly to the imaging frames of the image sensors 4 and 5.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提供一种能够测量多个光源或指示位置的位置的位置测量系统。位置测量系统包括指针1和2，用于控制指针1和2的发光的发光控制器3，用于对从指针1和2发射的光成像的CCD图像传感器4和5，以及 PC 6，用于基于由图像传感器4和5成像的图像计算指针1和2的指示位置。指针1和2投影同心圆图案光9.PC 6连接到显示器10，并且在指针1和2指向的位置处显示光标7.发光控制器3依次选择指针1和2，并使它们对应于图像传感器4和5的成像帧发光。版权所有：（C）2008，JPO＆INPIT

10. 发明专利

JP2008021168A Handwriting detection sheet and handwriting system 审中-公开
标题翻译：手写检测表和手写系统
公开(公告)号：JP2008021168A
公开(公告)日：2008-01-31
申请号：JP2006192947
申请日：2006-07-13
申请人： Fuji Xerox Co Ltd , 富士ゼロックス株式会社
发明人： HOTTA HIROYUKI , HAYASHI NAOKI , HIROSE YOSHITSUGU , KOSHIMIZU MINORU , ISHII TSUTOMU , SASAKI SHIGEHIKO
IPC分类号： G06F3/041 , G06F3/042
CPC分类号： G06F3/03545 , G06F3/0421
摘要： PROBLEM TO BE SOLVED: To provide a handwriting detection sheet and a handwriting system, capable of accurately acquiring a handwriting data even in a mixed state of a display image, a code image and handwriting. SOLUTION: An image displayed on electronic paper 23 can be recognized visually from the surface of a handwriting detection sheet 2. Among infrared light projected on a code layer 21, the infrared light passing through a portion other than an oblique line pattern 300 is reflected on an optical layer 22, and the infrared light projected on the oblique line pattern 300 is absorbed by the oblique line pattern 300. The infrared light reflected on the optical layer 22 is incident on an infrared light CCD 431 after a visible light is removed by a visible light cutoff filter 430 of an electronic pen 4. Ink 412 handwritten on a handwriting layer 20 can be recognized visually because of reflecting the visible light. Also, because the visible light is removed by the visible light cutoff filter 430, it is possible to clearly image the image of the oblique line pattern 300. COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提供即使在显示图像，代码图像和手写的混合状态下也能够准确地获取手写数据的手写检测纸和手写系统。
解决方案：可以从手写检测片材2的表面目视识别在电子纸23上显示的图像。在投影在代码层21上的红外光中，穿过除了斜线图案300之外的部分的红外光被反射在光学层22上，并且投射在斜线图案300上的红外光被斜线图案300吸收。在可见光为可见光之后，在光学层22上反射的红外光入射到红外光CCD 431上通过电子笔的可见光截止滤光器430去除。由于反射可见光，手写层20上手写的墨412可以被目视识别。另外，由于可见光截止滤光片430被去除了可见光，所以可以清晰地对图像进行倾斜线图案的形成。（C）2008，JPO＆INPIT

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