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1. 发明专利

JP2009129929A Semiconductor light-emitting chip equipped with reflecting mirror 审中-公开
标题翻译：具有反射镜的半导体发光芯片
公开(公告)号：JP2009129929A
公开(公告)日：2009-06-11
申请号：JP2007299762
申请日：2007-11-19
申请人： Daido Steel Co Ltd , 大同特殊鋼株式会社
发明人： YASUURA KENJI , HIROYA MASUMI , KATO TOSHIHIRO , SONE TOSHINORI , AIKAWA MORITAKA , NISHIOKA HIDEKI , TARUOKA EIICHI
IPC分类号： H01L33/10 , G02B6/42 , H01L33/06 , H01L33/14 , H01L33/30 , H01L33/36 , H01L33/60 , H01S5/183
摘要： PROBLEM TO BE SOLVED: To provide a semiconductor light-emitting chip highly efficient in using output light. SOLUTION: This point light source LED chip (semiconductor light-emitting chip) 10 includes a support layer 14 rigidly combined with one side of the point light source LED chip 10 while having a recessed hole 46 to optically expose a light transmitting face 42 on the bottom face, and a reflecting mirror 48 formed on the inner peripheral surface of the recessed hole 46 to reflect light entering the inner peripheral surface out of light output from the light transmitting face 42. Thereby, even light slanting at a prescribed angle or larger to an optical axis A is made usable by being reflected by the reflecting mirror 48. For example, light is forced to enter the end face 56 of an optical fiber, and the point light source LED chip 10 highly efficient in using output light can be obtained. COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：提供一种在使用输出光时效率高的半导体发光芯片。
解决方案：该点光源LED芯片（半导体发光芯片）10包括与点光源LED芯片10的一侧刚性组合的支撑层14，同时具有凹孔46以光学地暴露光透射面 42，以及形成在凹孔46的内周面上的反射镜48，用于反射从透光面42输出的光进入内周面的光。由此，即使是以规定角度倾斜的光或更大的光轴A可通过被反射镜48反射而被使用。例如，光被迫进入光纤的端面56，并且点光源LED芯片10在使用输出光时是高效的可以获得。版权所有（C）2009，JPO＆INPIT

2. 发明专利

JP2008139088A Visual examination method 审中-公开
标题翻译：视觉检查方法
公开(公告)号：JP2008139088A
公开(公告)日：2008-06-19
申请号：JP2006323781
申请日：2006-11-30
申请人： Daido Steel Co Ltd , 大同特殊鋼株式会社
发明人： SONE TOSHINORI , TARUOKA EIICHI
IPC分类号： G01N21/956 , G01B11/24 , H01L21/66
摘要： PROBLEM TO BE SOLVED: To provide a visual examination method which enables the detection of a local flaw with high inspection precision while permitting the size irregularity of an inspection target such as an electrode pattern or the like in the visual examination of a semiconductor emission element or the like.
SOLUTION: In a case that the planned shape of the inspection target subjected to quality judgment is a linear symmetric shape having at least one symmetric axis, the reference line corresponding to the symmetric axis of the inspection target is set in the image of the inspection target and one image of the inspection target based on the reference line is compared with the other image of the inspection target to judge the quality of the inspection target.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提供一种视觉检查方法，其能够以高检查精度检测局部缺陷，同时在半导体的目视检查中允许诸如电极图案等的检查对象的尺寸不规则发光元件等。解决方案：在质量判断的检查对象的计划形状为具有至少一个对称轴的直线对称形状的情况下，将与检查对象的对称轴对应的基准线设定为将检查对象和基于参考线的检查对象的一个图像与检查对象的其他图像进行比较，以判断检查对象的质量。版权所有（C）2008，JPO＆INPIT

3. 发明专利

JP2003212707A ANTIBACTERIAL AND ANTIFUNGAL POWDER AND METHOD FOR PRODUCING THE SAME 审中-公开
公开(公告)号：JP2003212707A
公开(公告)日：2003-07-30
申请号：JP2002005882
申请日：2002-01-15
申请人： DAIDO STEEL CO LTD
发明人： TARUOKA EIICHI , KAWANOBU YASUTAKA , ANAYAMA KOJI
IPC分类号： A01N59/16 , A01N25/00
摘要： PROBLEM TO BE SOLVED: To provide antibacterial and antifungal powder exhibiting not only antibacterial properties to bacteria, but excellent antifungal effect also on fungi and to provide a method for producing the powder. SOLUTION: This antibacterial and antifungal powder is obtained by mixing an aqueous solution containing a complex composed of a metal silver precursor into an aqueous solution in which titanium oxide particles having a submicrometer size is dispersed, adding a reducing agent to the mixed aqueous solution and stirring the mixture, reductively depositing metal silver particles having nanometer size in an amount of ≥8 weight % to ≤30 wt.% per unit weight of the titanium oxide particles in a dispersed and carried state onto the surface of titanium oxide particles. COPYRIGHT: (C)2003,JPO

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