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    • 2. 发明专利
    • Light emitting device
    • 发光装置
    • JP2011023560A
    • 2011-02-03
    • JP2009167488
    • 2009-07-16
    • Laser Gijutsu Sogo KenkyushoPanasonic Electric Works Co Ltdパナソニック電工株式会社財団法人レーザー技術総合研究所
    • TANAKA KENICHIROTSUBAKI KENJIKUBO MASAOFUJITA MASAYUKIMIYANAGA NORIAKIFUJIMOTO YASUSHITSUBAKIMOTO KOJI
    • H01L33/50
    • PROBLEM TO BE SOLVED: To provide a light emitting device capable of improving wavelength conversion efficiency of a wavelength conversion portion. SOLUTION: The light emitting device includes an LED chip 1, and the wavelength conversion portion 2 disposed on a light extraction surface side of the LED chip 1 to convert part of light emitted from the LED chip 1 into light having a wavelength longer than that of the LED chip 1. The wavelength conversion portion 2 is composed of a structure wherein a plurality of wavelength conversion element portions 21 are combined and arrayed, which use fluorescent glass as glass to which a rare earth element excited with the light emitted from the LED chip 1 to emit the light having the wavelength longer than that of the LED chip 1 is added. In the wavelength conversion portion 2, the wavelength conversion element portions 21 are optical fibers 120 each including the fluorescent glass as a core 121, and the respective optical fibers 120 are arrayed each having an optical-axis direction aligned with the optical axis direction of the LED chip 1. COPYRIGHT: (C)2011,JPO&INPIT
    • 解决的问题:提供能够提高波长转换部的波长转换效率的发光装置。 解决方案:发光器件包括LED芯片1和设置在LED芯片1的光提取表面侧上的波长转换部分2,以将从LED芯片1发射的光的一部分转换成具有波长较长的光 波长转换部分2由多个波长转换元件部分21组合和排列的结构组成,其中使用荧光玻璃作为玻璃,稀土元素被从 添加发光长于LED芯片1的光的LED芯片1。 在波长转换部分2中,波长转换元件部分21是包括作为核心121的荧光玻璃的光纤120,并且各个光纤120排列成具有与光轴方向对准的光轴方向 LED芯片1.版权所有(C)2011,JPO&INPIT
    • 3. 发明专利
    • Non-destructive inspection method and device using laser plasma radiation electromagnetic wave
    • 使用激光等离子体辐射电磁波的非破坏性检测方法和器件
    • JP2009031237A
    • 2009-02-12
    • JP2007216481
    • 2007-07-27
    • Laser Gijutsu Sogo KenkyushoOsaka Univ国立大学法人大阪大学財団法人レーザー技術総合研究所
    • TANAKA KAZUONAKAJIMA HIROTOMOSHIMADA YOSHINORIHASHIMOTO KAZUHISAYAMAURA MICHITERUFUJITA MASAYUKI
    • G01N22/00G01N22/02
    • PROBLEM TO BE SOLVED: To provide a method and device to irradiate laser onto an inspection object surface, generate laser plasma, obtain information of radiated electromagnetic waves, and perform a remote non-destructive inspection inside the inspection object or around the irradiation surface.
      SOLUTION: A plasma form is desired to be linear, and a required frequency is obtained by setting twice of plasma length to be the wavelength of the electromagnetic waves. The electromagnetic waves with good directivity and a defined frequency band can be irradiated by generating one or a plurality of linear laser plasma on the inspection object surface. An equivalent investigation results can be obtained as in the cases that measurement is made by shifting the generation place of plasma and that measurement is made by performing signal processing and using a large opening antenna with sharp directivity. The non-destructive inspection is performed by generating one or a plurality of plasma channels on the inspection surface, generating electromagnetic waves with directivity, guiding the electromagnetic waves generated on the inspection surface, and analyzing the electromagnetic waves reflected from the inspection object.
      COPYRIGHT: (C)2009,JPO&INPIT
    • 要解决的问题:为了提供一种在检查对象表面上照射激光的方法和装置,产生激光等离子体,获得辐射电磁波的信息,并在检查对象内或照射周围进行远程无损检查 表面。 解决方案:等离子体形式希望是线性的,并且通过将等离子体长度设定为电磁波的波长的两倍来获得所需的频率。 可以通过在检查对象表面上生成一个或多个线性激光等离子体来照射具有良好方向性和定义的频带的电磁波。 通过移动等离子体的产生位置进行测量,并且通过执行信号处理并且使用具有尖锐方向性的大开口天线进行测量,可以获得等效的调查结果。 通过在检查面上产生一个或多个等离子体通道,产生具有方向性的电磁波,引导在检查面上产生的电磁波,分析检查对象反射的电磁波,进行非破坏性检查。 版权所有(C)2009,JPO&INPIT
    • 9. 发明专利
    • Method and equipment for exfoliating photoresist
    • 用于激光光刻胶的方法和设备
    • JP2003303789A
    • 2003-10-24
    • JP2002107559
    • 2002-04-10
    • Laser Gijutsu Sogo KenkyushoToyo Seimitsu Kogyo Kk東洋精密工業株式会社財団法人レーザー技術総合研究所
    • FUJITA MASAYUKIYOSHIKADO AKIRA
    • G03F7/42B23K26/00G03F7/36H01L21/027H01L21/302
    • PROBLEM TO BE SOLVED: To obtain a method and equipment for exfoliating photoresist wherein the pollution of the environment, the abuse of water resources, etc., are excluded and productivity can be improved by exfoliating and eliminating photoresist by using an optical means in which the photoresist is eliminated when an electronic component like a circuit board is worked and treated by photolithographic technology. SOLUTION: A circuit board K having a substrate including a photoresist is transferred by transfer equipment C, short-pulse laser light of prescribed intensity is transmitted from laser generating equipment 10 to the photoresist, irradiation is performed by converting the short pulse laser light into belt-shaped laser light having a prescribed width and length by using a radiation head 12. Spreading adjustment and the irradiation are performed so as to obtain intensity by which irradiating laser light generates a thermal shock exfoliation phenomenon on an interface between the photoresist and the substrate. The photoresist is exfoliated and removed along the whose length by moving the circuit board K. COPYRIGHT: (C)2004,JPO
    • 要解决的问题:为了获得排除环境污染,水资源滥用等的去角质光刻胶的方法和设备,通过使用光学装置剥离和消除光致抗蚀剂可以提高生产率 当电子部件如电路板被加工并通过光刻技术处理时,其中光致抗蚀剂被去除。 解决方案:具有包含光致抗蚀剂的基板的电路板K由传送设备C转移,具有规定强度的短脉冲激光从激光发生设备10传输到光致抗蚀剂,照射通过转换短脉冲激光 通过使用辐射头12将光照射成具有规定宽度和长度的带状激光。进行扩散调节和照射,以获得照射激光在光刻胶和光致抗蚀剂之间的界面上产生热冲击剥离现象的强度 底物。 光致抗蚀剂通过移动电路板K沿其长度被剥离和去除。版权所有(C)2004,JPO