专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明专利

JP2014202779A 液晶パネル検査装置有权
标题翻译：液晶面板检查装置
公开(公告)号：JP2014202779A
公开(公告)日：2014-10-27
申请号：JP2013075884
申请日：2013-04-01
申请人：株式会社日本マイクロニクス , Micronics Japan Co Ltd
发明人： MIZUNO KUNIHIRO , KURASHO KEIICHI , KIKUTA MAKOTO
IPC分类号： G02F1/13 , G01B11/30 , G01N21/958
摘要：【課題】コンパクトで、迅速かつ正確に欠陥アドレスを特定し得る液晶パネル検査装置を提供する。【解決手段】検査装置は、ワークテーブル上の液晶パネルの上方及び下方に配置される第1、第2の偏光板と、ワークテーブル上の液晶パネルを第2の偏光板を通して液晶パネルの下面から直角に照射するバックライトユニットと、ワークテーブル上の液晶パネルを前記下面の下方から斜めに照射するための傾斜照明光源と、ワークテーブル上の液晶パネルの点灯検査のためにその画素に電圧を印加するプローブユニットと、バックライトユニットからの照射光及び傾斜照明光源から斜め照射光のいずれか一方を選択的に受けた状態で第1の偏光板を通して液晶パネルの上面を撮影するための撮像装置と、斜め照射光が適正な入射角で液晶パネルに入射するように斜め照射光を液晶パネルの下面に案内する反射手段とを含む。【選択図】図1
摘要翻译：要解决的问题：提供能够快速，准确地识别缺陷地址的紧凑型液晶面板检查装置。解决方案：检查装置包括：第一和第二偏振器，布置在工作台上的液晶面板的上方和下方; 背光单元，其通过所述第二偏振器从所述液晶面板的下表面正交地照射所述工作台上的液晶面板; 倾斜照明源，其从下表面的下部倾斜地照射在工作台上的液晶面板; 探针单元，其对工作台上的液晶面板的像素施加电压以检查其照明; 一种成像装置，其以选择性地接收来自背光单元的照明光和来自倾斜照明光源的倾斜照明光的任何一种的状态，通过第一偏振器对液晶面板的上表面进行成像; 以及反射装置，其将倾斜照明光引导到液晶面板的下表面，使得倾斜照明光以适当的入射角进入液晶面板。

2. 发明专利

JP2008145179A Inspection apparatus 审中-公开
标题翻译：检查装置
公开(公告)号：JP2008145179A
公开(公告)日：2008-06-26
申请号：JP2006330778
申请日：2006-12-07
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： KURASHO KEIICHI , MIZUNO KUNIHIRO , SUZUKI KOJI
IPC分类号： G01M11/00
摘要： PROBLEM TO BE SOLVED: To heighten processing power without having to change the transfer speed of data.
SOLUTION: An inspection apparatus for photographing liquid crystal panels with a camera, processing image data, and performing inspection includes a plurality of sub computers for directly processing the image data, a main computer connected to the camera for capturing image data from the camera, temporarily storing it, and appropriately transmitting it to each sub computer, and a connecting device for connecting the main computer to each sub computer via a plurality of lines. The connecting device includes both a plurality of LAN cables connected to the main computer for transmitting image data from the main computer via the plurality of lines in parallel and a hub connected to each LAN cable and to each sub computer in parallel for selectively transmitting image data transmitted from the main computer to specific sub computers.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提高处理能力而不必改变数据传送速度。解决方案：一种用于用相机拍摄液晶面板，处理图像数据和执行检查的检查装置包括用于直接处理图像数据的多个子计算机，连接到相机的主计算机，用于从相机，临时存储，并将其适当地发送到每个子计算机，以及连接装置，用于经由多条线路将主计算机连接到每个子计算机。连接装置包括连接到主计算机的多个LAN电缆，用于经由并行的多条线路从主计算机传送图像数据，并且并联连接到每个LAN电缆和每个子计算机的集线器，用于选择性地发送图像数据从主计算机发送到特定的子计算机。版权所有（C）2008，JPO＆INPIT

3. 发明专利

JP2010008438A Focusing method of liquid crystal panel inspection device 审中-公开
标题翻译：液晶面板检测装置的聚焦方法
公开(公告)号：JP2010008438A
公开(公告)日：2010-01-14
申请号：JP2008163929
申请日：2008-06-24
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： KURASHO KEIICHI
IPC分类号： G02F1/13 , G02B7/28 , G02B7/36 , G03B13/36
摘要： PROBLEM TO BE SOLVED: To carry out high-speed focusing with high accuracy in a liquid crystal panel inspection device even when only a part of an image has a brightness difference.
SOLUTION: Whole region data consisting of luminance data of N pixels (for example, 4008×2672 pixels) are acquired by photographing a liquid crystal panel 10 with an imaging device 12. The whole region data are divided into M pieces (for example, 20×20=400 pieces) of subregion data. For each of the subregion data, dispersion of luminance data is calculated. The total of dispersion of the M pieces of subregion data is calculated to find a total value. By varying a focusing condition of the imaging device, the above operation is repeated. The total value is acquired for each of a plurality of focusing conditions, and a focusing condition giving a maximum total value is determined as an optimum focusing condition.
COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：即使只有一部分图像具有亮度差，在液晶面板检查装置中高精度地进行高速聚焦。解决方案：通过用成像装置12拍摄液晶面板10来获取由N个像素的亮度数据（例如，4008×2672个像素）组成的整个区域数据。将整个区域数据分成M个（用于例如，20×20 = 400个）次区域数据。对于每个子区域数据，计算亮度数据的色散。计算M个子区域数据的分散的总和以找到总值。通过改变成像装置的聚焦条件，重复上述操作。对于多个聚焦条件中的每一个获取总值，并且将给出最大总值的聚焦条件确定为最佳聚焦条件。版权所有（C）2010，JPO＆INPIT

4. 发明专利

JP2008196951A Defect inspection method and defect inspection device 有权
标题翻译：缺陷检查方法和缺陷检查装置
公开(公告)号：JP2008196951A
公开(公告)日：2008-08-28
申请号：JP2007032006
申请日：2007-02-13
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： KURASHO KEIICHI
IPC分类号： G01N21/88
摘要： PROBLEM TO BE SOLVED: To estimate the density of defects easily and highly accurately with a small operation quantity.
SOLUTION: In a defect inspection method and a defect inspection device for measuring the density of defects on the surface of an inspection object such as a liquid crystal panel, a unit domain centered at each defect is specified, and the whole area of the domain is set as a unit value, relative to a plurality of detected defects, and in a part where each unit domain is overlapped, each unit value is added together and set, and the number of defects in a unit domain centered at the overlapped part is determined by the added value of each unit value. The quality of the inspection object is determined by whether the number of defects in the unit domain exceeds a threshold or not. The unit domain is constituted of a circle around each defect.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：以小的操作量容易且高精度地估计缺陷的密度。解决方案：在用于测量诸如液晶面板的检查对象的表面上的缺陷密度的缺陷检查方法和缺陷检查装置中，指定以每个缺陷为中心的单位域，并且整个区域该域被设置为相对于多个检测到的缺陷的单位值，并且在每个单位域重叠的部分中，将每个单位值相加并设置，并且以重叠的中心的单位域中的缺陷的数量部分由每个单位值的附加值决定。检查对象的质量由单位域中的缺陷数是否超过阈值来确定。单位域由每个缺陷周围的圆组成。版权所有（C）2008，JPO＆INPIT

5. 发明专利

JP2012194000A Automatic camera-resolution measurement method, automatic camera-resolution adjustment method, and image inspection method and device 有权
标题翻译：自动相机分辨率测量方法，自动相机分辨率调整方法和图像检测方法和设备
公开(公告)号：JP2012194000A
公开(公告)日：2012-10-11
申请号：JP2011056994
申请日：2011-03-15
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： KURASHO KEIICHI
IPC分类号： G01M11/02 , G01M11/00
摘要： PROBLEM TO BE SOLVED: To provide a method for simply and accurately measuring or adjusting the resolution of a camera comprising an imaging element; and an image inspection method and device using the method.SOLUTION: A solution includes provision of an automatic camera-resolution measurement method, and an automatic camera-resolution adjustment method, an image inspection method and an image inspection device using the automatic camera-resolution measurement method including steps of: photographing with a camera an object having a cyclical pattern; acquiring a self-correlation coefficient between image data Vand image data Vn produced by shifting the image data Vby one pixel in a direction of acquiring resolution; and detecting a peak of the self-correlation coefficient and acquiring resolution of the camera based on the difference of the number of shifted pixels between the detected two peaks, the number of peak-to-peak areas and the cycle of pattern.
摘要翻译：要解决的问题：提供一种用于简单且准确地测量或调整包括成像元件的相机的分辨率的方法; 以及使用该方法的图像检查方法和装置。解决方案：解决方案包括提供自动相机分辨率测量方法，以及使用自动相机分辨率测量方法的自动相机分辨率调整方法，图像检查方法和图像检查装置，包括以下步骤：拍摄相机具有循环图案的物体; 通过将图像数据V 0 和图像数据V 0 移位一个像素产生的图像数据Vn之间的自相关系数在取得决议的方向; 并且基于检测到的两个峰值之间的移位像素的数量，峰到峰面积的数量和图案的周期的差异来检测自相关系数的峰值并获取照相机的分辨率。版权所有（C）2013，JPO＆INPIT

6. 发明专利

JP2008067154A Method and device for inspecting image quality for color display board 有权
标题翻译：用于检查彩色显示板的图像质量的方法和装置
公开(公告)号：JP2008067154A
公开(公告)日：2008-03-21
申请号：JP2006244014
申请日：2006-09-08
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： KURASHO KEIICHI
IPC分类号： H04N17/04 , G02F1/13
摘要： PROBLEM TO BE SOLVED: To simplify procedures of image quality inspection of a color display board by simplifying procedures for obtaining correspondence relation between a pixel address of the color display board and a pixel address of a photography means.
SOLUTION: In this image inspection method, first correspondence relation between the pixel address of the photography means and the pixel address of the color display board and second correspondence relation about pixels by every color filter of the photography means, which is obtained from the correspondence relation from a first distributed display image acquired by performing distributed display by a simple lighting system are utilized for the first color display board in order to specify addresses of defective pixels of the second color display board and afterward. Furthermore, a second distributed display screen is photographed by the simple lighting system through a filter of any one color of for each color display board after the second sheet and the second distributed display image obtained by this photography is utilized. By utilization of them, the addresses of the defective pixels of the second color display board and afterward are specified.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：通过简化用于获得彩色显示板的像素地址和摄影装置的像素地址之间的对应关系的程序来简化彩色显示板的图像质量检查的过程。解决方案：在该图像检查方法中，摄影装置的像素地址和彩色显示板的像素地址之间的第一对应关系以及由摄影装置的每个滤色器关于像素的第二对应关系，其从为了指定第二彩色显示板的缺陷像素的地址和之后的第一彩色显示板，利用通过简单照明系统执行分布式显示而获得的第一分布式显示图像的对应关系。此外，通过简单的照明系统通过在第二张纸上的每个彩色显示板的任何一种颜色的滤色片和通过该摄影获得的第二分布式显示图像来利用第二分布式显示屏幕拍摄第二分布式显示屏幕。通过利用它们，指定了第二彩色显示板及其后的缺陷像素的地址。版权所有（C）2008，JPO＆INPIT

7. 发明专利

JP2008020588A Liquid crystal panel inspection method and image processor 有权
标题翻译：液晶检测方法和图像处理器
公开(公告)号：JP2008020588A
公开(公告)日：2008-01-31
申请号：JP2006191210
申请日：2006-07-12
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： MIZUNO KUNIHIRO , KURASHO KEIICHI , SUZUKI KOJI
IPC分类号： G02F1/13 , G01B11/30 , G01N21/88
摘要： PROBLEM TO BE SOLVED: To provide a method for inspecting a liquid crystal panel having no polarizing plate, by which foreign matter depositing on a polarizing plate or a diffusing plate of an inspection device can be distinguished from a defect of a liquid crystal panel.
SOLUTION: The method includes: a first photographing step of photographing an exit face of a polarizing plate opposing to a photographing means by the photographing means while the alignment of a liquid crystal of a liquid crystal panel is maintained to allow the light from a light source to transmit through a pair of polarizing plates; a second photographing step of photographing the exit face of the polarizing plate opposing to the photographing means while the liquid crystal panel is removed from an inspection device, polarization directions of the polarizing plates are held perpendicular to each other and the light source is lighting; a third photographing step of photographing an exit face of a diffusing plate opposing to the photographing means by the photographing means while the liquid crystal panel and the other polarizing plate panel are removed from the inspection device and the light source is kept lighting; and an extracting step of extracting a defective portion of the liquid crystal panel based on the images obtained by the respective photographing steps.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提供一种用于检查不具有偏振片的液晶面板的方法，通过该方法可以区分沉积在检查装置的偏振板或扩散板上的异物与液晶的缺陷面板。解决方案：该方法包括：第一拍摄步骤，当维持液晶面板的液晶的取向时，通过拍摄装置拍摄与拍摄装置相对的偏振片的出射面，以允许来自透过一对偏光板的光源; 第二拍摄步骤，当从检查装置中取出液晶面板时，拍摄与拍摄装置相对的偏振片的出射面，偏振片的偏振方向彼此垂直地保持并且光源点亮; 第三拍摄步骤，当液晶面板和另一个偏振板面板从检查装置中取出并且光源保持点亮时，通过拍摄装置拍摄与拍摄装置相对的漫射板的出射面; 以及提取步骤，基于通过各个拍摄步骤获得的图像来提取液晶面板的缺陷部分。版权所有（C）2008，JPO＆INPIT

8. 发明专利

JP2010014436A Defect inspection method and defect inspection device 审中-公开
标题翻译：缺陷检查方法和缺陷检查装置
公开(公告)号：JP2010014436A
公开(公告)日：2010-01-21
申请号：JP2008172589
申请日：2008-07-01
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： KURASHO KEIICHI , SUZUKI KOJI
IPC分类号： G01M11/00 , G01N21/88 , G02F1/13
摘要： PROBLEM TO BE SOLVED: To enhance the efficiency of inspection by preventing excessive inspection. SOLUTION: This defect inspection device is employed for inspecting the existence of a defect of an inspection object and inspecting a plurality of inspection objects continuously. The inspection device is provided with: a conveyance means for conveying the inspection objects continuously; an inspection section for continuously inspecting the inspection objects conveyed by the conveyance means; an image processing section for processing images of the inspection objects inspected continuously by the inspection section to detect defects; and a controller which, when a plurality of similar defects are detected at the same or close positions of a plurality of sheetlike inspection objects inspected continuously by the image processing section, excludes the defects by determining that the defects are not caused by inherent matters of the inspection objects. When a plurality of similar defects are detected at the same positions or close positions of a plurality of sheetlike inspection objects, similarly the defect inspection method also excludes the defects by determining that the defects are not caused by inherent matters of the inspection objects. COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：通过防止过度检查来提高检查效率。
解决方案：该缺陷检查装置用于检查检查对象的缺陷的存在并连续检查多个检查对象。检查装置设有：用于连续传送检查对象的传送装置; 检查部，用于连续检查由所述输送机构输送的检查对象物; 图像处理部，用于处理由检查部连续检查的检查对象的图像，以检测缺陷; 以及控制器，当在由图像处理部分连续检查的多个片状检查对象的相同或近似位置处检测到多个相似的缺陷时，通过确定缺陷不是由于检查对象。当在多个片状检查对象的相同位置或闭合位置处检测到多个类似的缺陷时，同样地，缺陷检查方法也通过确定缺陷不是由检查对象的固有问题引起的，排除缺陷。版权所有（C）2010，JPO＆INPIT

9. 发明专利

JP2008040201A Liquid crystal panel inspection method and device 有权
标题翻译：液晶板检查方法和装置
公开(公告)号：JP2008040201A
公开(公告)日：2008-02-21
申请号：JP2006215354
申请日：2006-08-08
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： MIZUNO KUNIHIRO , KURASHO KEIICHI , KIKUTA MAKOTO
IPC分类号： G02F1/13 , G01M11/00 , G01N21/958
摘要： PROBLEM TO BE SOLVED: To provide a liquid crystal panel inspection method capable of distinguishing an image of dust attached to surfaces of both sides of a liquid crystal panel from a defect in the liquid crystal panel when inspecting the liquid crystal panel without a polarizing plate by using an imaging device.
SOLUTION: On a non-lighting inspection part 10, a spot position is determined by illuminating the liquid crystal panel with backlight and imaging the liquid crystal panel while applying no voltage to the liquid crystal panel without the polarizing plate. Subsequently, the spot position is determined by illuminating the liquid crystal panel with an obliquely illuminating light source. Based on the imaging result, a spot due to external dust is removed and the position of an inner defect is specified. Subsequently, the liquid crystal panel 16 is transferred to a lighting inspection part 11, then, is illuminated with the backlight on the lighting inspection part 11 and the spot position is determined. The position on which a defect position specified by the non-lighting inspection part is superimposed on a defect position specified by the lighting inspection part is decided as a real defect position.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提供一种液晶面板检查方法，其能够在不检测液晶面板的情况下检查液晶面板时将与液晶面板两面的表面附着的灰尘与液晶面板的缺陷区别开来通过使用成像装置的偏振片。解决方案：在非照明检查部件10上，通过用背光照亮液晶面板并对液晶面板进行成像而确定点位置，而在没有偏振板的情况下向液晶面板施加电压。随后，通过用倾斜照明光源照射液晶面板来确定光点位置。基于成像结果，去除由于外部灰尘引起的斑点，并指定内部缺陷的位置。接着，将液晶面板16转印到照明检查部11，然后用照明检查部11的背光照亮，确定光点位置。将由非照明检查部指定的缺陷位置叠加在由照明检查部指定的缺陷位置的位置被确定为实际缺陷位置。版权所有（C）2008，JPO＆INPIT

10. 发明专利

JP2007298787A Processor for display panel 有权
标题翻译：显示面板处理器
公开(公告)号：JP2007298787A
公开(公告)日：2007-11-15
申请号：JP2006127219
申请日：2006-05-01
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： KURASHO KEIICHI , MIZUNO KUNIHIRO
IPC分类号： G09F9/00 , G01B11/00 , G02F1/13
摘要： PROBLEM TO BE SOLVED: To obtain an address of a defective pixel within a photographing area of a middle video camera. SOLUTION: The processor comprises: a panel receiver apparatus which receives a display panel to turn this on; and two or more video cameras which photograph the panel received by the panel receiver apparatus from a first direction angled to the panel and include two or more video cameras aligned in a second direction parallel to the panel. The panel receiver apparatus is provided with: a panel receiver for receiving the panel; at least one probe unit for energizing the panel received by the panel receiver; and a marker which is at least one marker arranged at the probe unit and has a mark for referring to a coordinate position which can be photographed by adjoining video cameras in the second direction. COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：获得中间摄像机的拍摄区域内的缺陷像素的地址。解决方案：处理器包括：接收显示面板以使其开启的面板接收器设备; 以及两个或更多个摄像机，其从面板接收机装置接收的面板从与面板成角度的第一方向拍摄，并且包括沿平行于面板的第二方向排列的两个或更多个摄像机。面板接收装置设置有：接收面板的面板接收器; 至少一个探针单元，用于为面板接收器接收的面板通电; 以及标记，其是布置在探测单元处的至少一个标记，并且具有用于参考在邻接的摄像机沿第二方向拍摄的坐标位置的标记。版权所有（C）2008，JPO＆INPIT

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式