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1. 发明专利

JP2011033570A Evaluation method of distortion aberration of optical lens 审中-公开
标题翻译：光学透镜失真评估方法
公开(公告)号：JP2011033570A
公开(公告)日：2011-02-17
申请号：JP2009182382
申请日：2009-08-05
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： MIZUNO KUNIHIRO , SUZUKI KOJI , KANAI YASUKUNI
IPC分类号： G01M11/02
摘要： PROBLEM TO BE SOLVED: To provide an evaluation method facilitating evaluation work of distortion aberration in optical lenses and displaying a reference rectangle for evaluating the distortion aberration in an optimum specification.
SOLUTION: A liquid crystal display panel 20 is disposed so that a screen 22 of the liquid crystal display panel 20 is perpendicular to an optical axis 28 of an optical lens 16 and the position of the screen 22 is a predetermined distance from the optical lens 16. A reference rectangle 26 is displayed on the screen 22 of the liquid crystal display panel 20 and the reference rectangle 26 is shot using an imaging system 14 consisting of the optical lens 16 and a CCD camera 18 to acquire a distortion rectangle 32. The specification of the reference rectangle 26 is adjusted so that the distortion rectangle 32 does not extend beyond a visual field 24 of the CCD camera 18. A reference length H and a distortion length Hd of the reference rectangle 26 are obtained using a digital coordinate of the reference rectangle 26, and a TV distortion of the optical lens is automatically calculated based on these values.
COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供一种便于光学透镜中的畸变像差的评估工作的评估方法，并且显示用于评估最佳规格中的畸变像差的参考矩形。解决方案：液晶显示面板20设置成使得液晶显示面板20的屏幕22垂直于光学透镜16的光轴28，并且屏幕22的位置距离光学透镜16.在液晶显示面板20的屏幕22上显示参考矩形26，并且使用由光学透镜16和CCD照相机18组成的成像系统14拍摄参考矩形26，以获取失真矩形32 调整参考矩形26的规格，使失真矩形32不延伸超出CCD摄像机18的视场24。使用数字坐标获得参考长度H和参考矩形26的失真长度Hd 并且基于这些值自动计算光学透镜的TV失真。版权所有（C）2011，JPO＆INPIT

2. 发明专利

JP2010271055A Device and method for visual inspection 有权
标题翻译：视觉检查的设备和方法
公开(公告)号：JP2010271055A
公开(公告)日：2010-12-02
申请号：JP2009120696
申请日：2009-05-19
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： MIZUNO KUNIHIRO , SUZUKI KOJI
IPC分类号： G01M11/00 , G01N21/84 , G09G3/20 , G09G5/00 , G09G5/377
摘要： PROBLEM TO BE SOLVED: To provide a device and method for visual inspection almost independent of the degree of skill of an inspector and superior in inspection efficiency, and to provide an inspection system with this device for visual inspection. SOLUTION: The device for visual inspection of a display panel, which includes a means for making an inspection object panel display a test pattern, includes a test pattern storage means, a means for acquiring automatic inspection result information prepared by an automatic inspection device, a means for preparing a marker pattern about a defect which is determined as present in the inspection object panel by the automatic inspection device, based on the acquired automatic inspection result information, a means for superposing the prepared marker pattern on the test pattern, and a means for making the inspection object panel display the test pattern whereon the marker pattern is superposed. The device and the method for visual inspection, and also the inspection system with this device for visual inspection and the method for visual inspection, are provided for the solution. COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供几乎独立于检查员的技术水平和检查效率优异的用于视觉检查的装置和方法，并且提供具有该装置的检查系统的检查系统。
解决方案：显示面板的目视检查装置，包括用于使检查对象面板显示测试图案的装置，包括测试图案存储装置，用于获取通过自动检查准备的自动检查结果信息的装置装置，根据所获取的自动检查结果信息，准备关于由所述自动检查装置在检查对象面板中存在的缺陷的标记图案的装置，将准备好的标记图案叠加在测试图案上的装置，以及用于使检查对象面板显示标记图案叠加的测试图案的装置。该设备和目视检查方法，以及具有该目视检查装置的检查系统和目视检查方法。版权所有（C）2011，JPO＆INPIT

3. 发明专利

JP2008020588A Liquid crystal panel inspection method and image processor 有权
标题翻译：液晶检测方法和图像处理器
公开(公告)号：JP2008020588A
公开(公告)日：2008-01-31
申请号：JP2006191210
申请日：2006-07-12
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： MIZUNO KUNIHIRO , KURASHO KEIICHI , SUZUKI KOJI
IPC分类号： G02F1/13 , G01B11/30 , G01N21/88
摘要： PROBLEM TO BE SOLVED: To provide a method for inspecting a liquid crystal panel having no polarizing plate, by which foreign matter depositing on a polarizing plate or a diffusing plate of an inspection device can be distinguished from a defect of a liquid crystal panel.
SOLUTION: The method includes: a first photographing step of photographing an exit face of a polarizing plate opposing to a photographing means by the photographing means while the alignment of a liquid crystal of a liquid crystal panel is maintained to allow the light from a light source to transmit through a pair of polarizing plates; a second photographing step of photographing the exit face of the polarizing plate opposing to the photographing means while the liquid crystal panel is removed from an inspection device, polarization directions of the polarizing plates are held perpendicular to each other and the light source is lighting; a third photographing step of photographing an exit face of a diffusing plate opposing to the photographing means by the photographing means while the liquid crystal panel and the other polarizing plate panel are removed from the inspection device and the light source is kept lighting; and an extracting step of extracting a defective portion of the liquid crystal panel based on the images obtained by the respective photographing steps.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提供一种用于检查不具有偏振片的液晶面板的方法，通过该方法可以区分沉积在检查装置的偏振板或扩散板上的异物与液晶的缺陷面板。解决方案：该方法包括：第一拍摄步骤，当维持液晶面板的液晶的取向时，通过拍摄装置拍摄与拍摄装置相对的偏振片的出射面，以允许来自透过一对偏光板的光源; 第二拍摄步骤，当从检查装置中取出液晶面板时，拍摄与拍摄装置相对的偏振片的出射面，偏振片的偏振方向彼此垂直地保持并且光源点亮; 第三拍摄步骤，当液晶面板和另一个偏振板面板从检查装置中取出并且光源保持点亮时，通过拍摄装置拍摄与拍摄装置相对的漫射板的出射面; 以及提取步骤，基于通过各个拍摄步骤获得的图像来提取液晶面板的缺陷部分。版权所有（C）2008，JPO＆INPIT

4. 发明专利

JP2008145179A Inspection apparatus 审中-公开
标题翻译：检查装置
公开(公告)号：JP2008145179A
公开(公告)日：2008-06-26
申请号：JP2006330778
申请日：2006-12-07
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： KURASHO KEIICHI , MIZUNO KUNIHIRO , SUZUKI KOJI
IPC分类号： G01M11/00
摘要： PROBLEM TO BE SOLVED: To heighten processing power without having to change the transfer speed of data.
SOLUTION: An inspection apparatus for photographing liquid crystal panels with a camera, processing image data, and performing inspection includes a plurality of sub computers for directly processing the image data, a main computer connected to the camera for capturing image data from the camera, temporarily storing it, and appropriately transmitting it to each sub computer, and a connecting device for connecting the main computer to each sub computer via a plurality of lines. The connecting device includes both a plurality of LAN cables connected to the main computer for transmitting image data from the main computer via the plurality of lines in parallel and a hub connected to each LAN cable and to each sub computer in parallel for selectively transmitting image data transmitted from the main computer to specific sub computers.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提高处理能力而不必改变数据传送速度。解决方案：一种用于用相机拍摄液晶面板，处理图像数据和执行检查的检查装置包括用于直接处理图像数据的多个子计算机，连接到相机的主计算机，用于从相机，临时存储，并将其适当地发送到每个子计算机，以及连接装置，用于经由多条线路将主计算机连接到每个子计算机。连接装置包括连接到主计算机的多个LAN电缆，用于经由并行的多条线路从主计算机传送图像数据，并且并联连接到每个LAN电缆和每个子计算机的集线器，用于选择性地发送图像数据从主计算机发送到特定的子计算机。版权所有（C）2008，JPO＆INPIT

5. 发明专利

JP2010014436A Defect inspection method and defect inspection device 审中-公开
标题翻译：缺陷检查方法和缺陷检查装置
公开(公告)号：JP2010014436A
公开(公告)日：2010-01-21
申请号：JP2008172589
申请日：2008-07-01
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： KURASHO KEIICHI , SUZUKI KOJI
IPC分类号： G01M11/00 , G01N21/88 , G02F1/13
摘要： PROBLEM TO BE SOLVED: To enhance the efficiency of inspection by preventing excessive inspection. SOLUTION: This defect inspection device is employed for inspecting the existence of a defect of an inspection object and inspecting a plurality of inspection objects continuously. The inspection device is provided with: a conveyance means for conveying the inspection objects continuously; an inspection section for continuously inspecting the inspection objects conveyed by the conveyance means; an image processing section for processing images of the inspection objects inspected continuously by the inspection section to detect defects; and a controller which, when a plurality of similar defects are detected at the same or close positions of a plurality of sheetlike inspection objects inspected continuously by the image processing section, excludes the defects by determining that the defects are not caused by inherent matters of the inspection objects. When a plurality of similar defects are detected at the same positions or close positions of a plurality of sheetlike inspection objects, similarly the defect inspection method also excludes the defects by determining that the defects are not caused by inherent matters of the inspection objects. COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：通过防止过度检查来提高检查效率。
解决方案：该缺陷检查装置用于检查检查对象的缺陷的存在并连续检查多个检查对象。检查装置设有：用于连续传送检查对象的传送装置; 检查部，用于连续检查由所述输送机构输送的检查对象物; 图像处理部，用于处理由检查部连续检查的检查对象的图像，以检测缺陷; 以及控制器，当在由图像处理部分连续检查的多个片状检查对象的相同或近似位置处检测到多个相似的缺陷时，通过确定缺陷不是由于检查对象。当在多个片状检查对象的相同位置或闭合位置处检测到多个类似的缺陷时，同样地，缺陷检查方法也通过确定缺陷不是由检查对象的固有问题引起的，排除缺陷。版权所有（C）2010，JPO＆INPIT

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