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    • 3. 发明专利
    • Method for evaluation of multiple exciton generation state in semiconductor
    • 用于评估半导体中多个激子产生状态的方法
    • JP2012173171A
    • 2012-09-10
    • JP2011036258
    • 2011-02-22
    • Univ Of Electro-CommunicationsChuo Univ国立大学法人電気通信大学学校法人 中央大学
    • QING SHENKATAYAMA KENJITOYODA TARO
    • G01N21/17H01L31/04
    • Y02E10/542
    • PROBLEM TO BE SOLVED: To evaluate a generation state of multiple exciton in a semiconductor.SOLUTION: A method for evaluation of multiple exciton generation state in a semiconductor includes: a step for arranging a standard sample behind a diffraction grating in a movable manner; a step for letting a first laser beam as an excitation light and a second laser beam as a probe light enter the standard sample through the diffraction grating, and using the first laser beam to generate light with a striped intensity distribution within the standard sample; a step for observing a diffracted light from the diffraction grating and the standard sample, and identifying a position of the standard sample where the diffracted light disappears by a change in an imaginary part of a complex refractive index of the standard sample; a step for arranging a measurement sample including a semiconductor at the identified position; a step for letting the first and second laser beams enter the measurement sample through the diffraction grating, and using the first laser beam to generate the light with the striped intensity distribution within the measurement sample; and a step for observing the diffracted light from the diffraction grating and the measurement sample.
    • 要解决的问题:评估半导体中多个激子的产生状态。 解决方案:用于评估半导体中的多个激子产生状态的方法包括:以可移动的方式在衍射光栅后面布置标准样品的步骤; 使作为激发光的第一激光束和第二激光束作为探测光的步骤通过衍射光栅进入标准样品,并且使用第一激光束产生在标准样品内具有条纹强度分布的光; 用于观察来自衍射光栅和标准样品的衍射光的步骤,以及通过标准样品的复折射率的虚部的变化来识别衍射光消失的标准样品的位置; 将包括半导体的测量样品布置在所述识别位置的步骤; 使第一和第二激光束通过衍射光栅进入测量样品的步骤,并且使用第一激光束产生具有测量样品内的条纹强度分布的光; 以及用于观察来自衍射光栅和测量样品的衍射光的步骤。 版权所有(C)2012,JPO&INPIT
    • 4. 发明专利
    • Quantum dot absorption substrate and quantum dot absorption substrate manufacturing method
    • 量子吸收基板和量子吸收基板制造方法
    • JP2013110209A
    • 2013-06-06
    • JP2011252701
    • 2011-11-18
    • Univ Of Electro-Communications国立大学法人電気通信大学
    • QING SHENTOYODA TAROONISHI YOHEI
    • H01L31/04
    • Y02E10/50
    • PROBLEM TO BE SOLVED: To provide a quantum dot absorption substrate and a quantum dot absorption substrate manufacturing method, which can improve photoelectric conversion efficiency.SOLUTION: A quantum dot absorption substrate manufacturing method comprises: arranging an inverse opal structure of TiOthat serves as a photoelectric conversion layer 102 on a substrate 101; immersing in a CdS formation solution for a predetermined time, the substrate 101 on which the photoelectric conversion layer 102 having the inverse opal structure TiOis arranged, to cause CdS quantum dots to be absorbed by a skeleton surface of the photoelectric conversion layer 102 of the inverse opal structure and by a surface of the photoelectric conversion layer 102 on the substrate 101 to form a first photosensitization layer 103; and similarly, forming a second photosensitization layer 104 by immersing the substrate 101 in a CdSe formation solution.
    • 要解决的问题:提供可以提高光电转换效率的量子点吸收基板和量子点吸收基板的制造方法。 解决方案:量子点吸收衬底制造方法包括:在衬底101上布置用作光电转换层102的TiO 2 的反蛋白石结构; 将CdS形成溶液浸渍在规定时间内,配置具有反蛋白石结构TiO 2 的光电转换层102的基板101,使CdS量子点为 由反蛋白石结构的光电转换层102的骨架表面和基板101上的光电转换层102的表面吸收,形成第一光敏层103; 并且类似地,通过将​​衬底101浸入CdSe形成溶液中形成第二光敏层104。 版权所有(C)2013,JPO&INPIT