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1. 发明专利

JP2010197345A Method and device for precisely measuring x-ray nano beam intensity distribution 有权
标题翻译：用于精确测量X射线纳米光束强度分布的方法和装置
公开(公告)号：JP2010197345A
公开(公告)日：2010-09-09
申请号：JP2009045688
申请日：2009-02-27
申请人： J Tec:Kk , Osaka Univ , 国立大学法人大阪大学 , 株式会社ジェイテック
发明人： YAMAUCHI KAZUTO , MIMURA HIDEKAZU , OKADA HIROMI
IPC分类号： G01T1/29
CPC分类号： G01N23/201 , G21K2201/06 , G21K2207/00
摘要： PROBLEM TO BE SOLVED: To provide a method and a device for precisely measuring an X-ray nano beam intensity distribution adapted to the measurement of an X-ray having a different wavelength by using one knife edge, and capable of performing optimum measurement corresponding to a focal depth of an X-ray beam or a condition of the other measuring device, concerning a dark field measuring method performing highly accurate measurement of an X-ray beam profile by utilizing a diffraction X-ray and a transmission X-ray by using the knife edge.
SOLUTION: The knife edge 4 is manufactured by changing continuously or stepwise a thickness in the longitudinal direction by a heavy metal having a function for advancing the phase of an X-ray transmitted therethrough, and set to cross the X-ray beam at a thickness position capable of obtaining a phase shift in a range that the transmission X-ray and the diffraction X-ray diffracted by the tip of the knife edge are reinforce with each other, and an X-ray wherein the diffraction X-ray and the transmission X-ray are superimposed on each other is measured by an X-ray detector.
COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：提供一种用于精确测量适于通过使用一个刀刃来测量具有不同波长的X射线的X射线纳米光束强度分布的方法和装置，并且能够执行最佳关于通过利用衍射X射线和透射X射线对X射线束轮廓进行高精度测量的暗场测量方法，对应于X射线束的焦点深度或其他测量装置的状态的测量，射线使用刀刃。解决方案：刀刃4是通过使具有促进透过其的X射线的相位的功能的重金属连续地或逐步地改变纵向的厚度来制造的，并且设置成与X射线束在能够获得透射X射线和由刀刃的前端衍射的衍射X射线彼此增强的范围内的相移的厚度位置，以及X射线并且通过X射线检测器测量透射X射线彼此重叠。版权所有（C）2010，JPO＆INPIT

2. 发明专利

JP2008292438A Ultraprecisely shape measuring method and device 有权
标题翻译：超声波形状测量方法和装置
公开(公告)号：JP2008292438A
公开(公告)日：2008-12-04
申请号：JP2007163132
申请日：2007-05-23
申请人： Institute Of Physical & Chemical Research , J Tec:Kk , Japan Synchrotron Radiation Research Inst , Osaka Univ , 国立大学法人大阪大学 , 株式会社ジェイテック , 独立行政法人理化学研究所 , 財団法人高輝度光科学研究センター
发明人： YAMAUCHI KAZUTO , ISHIKAWA TETSUYA , OHASHI HARUHIKO , TSUMURA HISAFUMI
IPC分类号： G01B11/24
CPC分类号： G01B11/2441 , G01B9/02085 , G01B2290/60 , G01M11/005
摘要： PROBLEM TO BE SOLVED: To provide a ultraprecisely shape measuring method and device for ultraprecisely measuring a long curved mirror which is used in light emitting facilities to condense soft X-ray from hard X-ray, with nano- or sub-nano-order accuracy, particularly for measuring the whole shape of an elliptical or cylindrical X-ray mirror in a region long in one direction.
SOLUTION: A Fizeau type interferometer is used for acquiring a relative angle between partial shape data for the whole measured face of a measured object longer than the diameter of the reference face thereof and adjacent partial shape data. Then, to allow the measurement of the whole shape while applying stitching treatment to each partial shape data using the relative angle and a degree of coincidence of an overlapping region, the measured object 1 and a reference planar mirror 3 are arranged almost parallel to the reference face 2 of the Fizeau type interferometer, the measured object is held on a main inclined stage via an X-stage, and the reference planar mirror is held on a sub inclined stage provided on the main inclined stage.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：提供一种超精密测量方法和装置，用于超精密测量用于发光设备中的长曲面镜，以从硬X射线冷凝软X射线，具有纳米或亚纳米特别是用于测量在一个方向上长的区域中的椭圆形或圆柱形X射线镜的整体形状。解决方案：使用Fizeau型干涉仪来获取测量对象的整个测量面的部分形状数据之间的相对角度比其参考面的直径和相邻部分形状数据长。然后，为了允许使用相对角度和重叠区域的重合程度对每个局部形状数据进行缝合处理来测量整体形状，测量对象1和参考平面镜3几乎平行于参考 Fizeau型干涉仪的面2，测量对象通过X级保持在主倾斜台上，参考平面镜保持在设置在主倾斜台上的副倾斜台上。版权所有（C）2009，JPO＆INPIT

3. 发明专利

JP2008237203A Automatic cell-culturing apparatus 有权
标题翻译：自动细胞培养装置
公开(公告)号：JP2008237203A
公开(公告)日：2008-10-09
申请号：JP2007114821
申请日：2007-03-27
申请人： J Tec:Kk , 株式会社ジェイテック
发明人： TSUMURA HISAFUMI
IPC分类号： C12M3/00
CPC分类号： C12M29/00 , C12M27/10 , C12M37/04
摘要： PROBLEM TO BE SOLVED: To provide an automatic cell-culturing apparatus constructing a system not necessitating a CPC (Cell Processing Center) corresponding to GMC (Good Manufacturing Practice), automating cell seeding, medium exchange, quality control, etc., based on a rotating cultivation technology using a RWV (rotating wall vessel).
SOLUTION: The automatic cell-culturing apparatus includes a rotational culturing device a cylindrical cultivating container 2 having a horizontal rotating shaft 14, an inlet 11 for supplying cell sap, a supply port 12 and outlet 13 for exchanging culture solution in a closed housing, in which the supply port and the outlet are provided as a pair on the outer circumferential cylindrical-face of the cultivating container at positions 180° apart from each other to the center of the rotation, and a syringe shifting means inserting/withdrawing a supply syringe 4 containing new culture solution to the supply port in airtight state and inserting/withdrawing an empty discharging syringe 5 on the outlet in airtight state, in a state setting the supply port and the outlet on a vertical line and locating, the supply port on the upper side, and piston driving means pushing in the piston of the supplying syringe and pulling out the piston of the discharging syringe are provided.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：提供一种构建不需要对应于GMC（良好生产规范）的CPC（细胞处理中心），自动化细胞播种，培养基更换，质量控制等的系统的自动细胞培养装置，基于使用RWV（旋转壁容器）的旋转栽培技术。解决方案：自动细胞培养装置包括旋转培养装置，具有水平旋转轴14的圆柱形培养容器2，用于供应细胞汁液的入口11，供给口12和出口13，用于将培养溶液交换在封闭壳体，其中供给口和出口在培养容器的外圆周面上成对地设置在彼此相对于旋转中心180°的位置处，并且注射器移动装置插入/取出在气密状态下将含有新培养液的注射器4供给到供给口，并且在气密状态下，在供给口和出口设置状态的状态下将空的排出注射器5插入/取出出口，将供给口并且设置有推动供给注射器的活塞并拉出排出注射器的活塞的活塞驱动装置。版权所有（C）2009，JPO＆INPIT

4. 发明专利

JP2012031604A Control apparatus of system for inserting protective plate by cutting natural ground 有权
标题翻译：通过切割天然地埋入保护板的系统控制装置
公开(公告)号：JP2012031604A
公开(公告)日：2012-02-16
申请号：JP2010170657
申请日：2010-07-29
申请人： East Japan Railway Co , Hokuto Co Ltd , J Tec:Kk , Tekken Constr Co Ltd , 東日本旅客鉄道株式会社 , 株式会社ジェイテック , 株式会社ホクト , 鉄建建設株式会社
发明人： ITO YASUHIRO , KUBOKI TSUKASA , KOIZUMI HIDEYUKI , NAGAO TATSUJI , NISHIMURA TOMOAKI
IPC分类号： E21D9/04
摘要： PROBLEM TO BE SOLVED: To provide a control apparatus that enables a protective plate to be pulled while natural ground is cut at a speed consistent with natural ground conditions.SOLUTION: In a system for inserting a protective plate by cutting natural ground, the protective plate 4 is pulled by a traction device 13 while the natural ground is cut by cutting devices 8 and 10, and is inserted into a cut groove formed by cutting. A control apparatus of the system includes: means for measuring a cutting load applied to a cutting member 8; means 22 for measuring a traction speed V of the protective plate 4; and means for setting the cutting load and the traction speed V so as to make both of them compatible with each other. The control apparatus monitors compatibility between the measured cutting load and the measured traction speed V, and changes the setting of both of them when they are incompatible with each other.
摘要翻译：要解决的问题：提供一种控制装置，其能够以与自然地面条件一致的速度切割自然地面的同时使保护板被拉动。解决方案：在通过切割天然地面插入保护板的系统中，保护板4被牵引装置13拉动，同时通过切割装置8和10切割天然地面，并将其插入形成的切割槽通过切割。该系统的控制装置包括：用于测量施加到切割构件8的切割负载的装置; 用于测量保护板4的牵引速度V的装置22; 以及用于设定切割负载和牵引速度V以使它们彼此兼容的装置。控制装置监视所测量的切割负载和测量的牵引速度V之间的兼容性，并且当它们彼此不兼容时改变它们的设置。版权所有（C）2012，JPO＆INPIT

5. 发明专利

JP2007271595A X-ray condensing device 有权
标题翻译： X射线冷凝装置
公开(公告)号：JP2007271595A
公开(公告)日：2007-10-18
申请号：JP2006124378
申请日：2006-03-31
申请人： J Tec:Kk , 株式会社ジェイテック
发明人： TSUMURA HISAFUMI , OKADA HIROMI
IPC分类号： G21K1/06 , H05H13/04
摘要： PROBLEM TO BE SOLVED: To provide an X-ray condensing device for condensing hard X-rays and soft X-rays used in a radiation light facility, which is an X-ray condensing device equipped with a mirror manipulator capable of performing quickly and highly accurately alignment of a K-B mirror having a large numerical aperture (NA), enabling a condensing spot to attain high space resolution below 100 nm.
SOLUTION: K-B mirror arrangement is acquired by arranging mutually vertically a light source, and the first mirror 1 and the second mirror 2 comprising two total reflection mirrors wherein an elliptic shape having a condensing point as a focal point is formed. Either of two parallel laser beams is allowed to enter vertically the first mirror arranged horizontally, and the other is allowed to enter vertically the second mirror arranged vertically after changing the direction by 90°, and adjustment is performed so that each reflected beam from both mirrors is overlapped with an incident beam.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：解决的问题：提供一种用于冷凝硬X射线的X射线聚焦装置和在具有能够执行的镜面操纵器的X射线聚光装置的辐射光设备中使用的软X射线快速高精度地对准具有大数值孔径（NA）的KB反射镜，使得聚光点能够获得低于100nm的高空间分辨率。解决方案：通过相互垂直布置光源获得K-B反射镜布置，并且第一反射镜1和第二反射镜2包括两个全反射镜，其中形成具有聚光点作为焦点的椭圆形。允许两个平行的激光束中的任一个垂直地进入水平布置的第一反射镜，另一个被允许在将方向改变90°之后垂直设置的第二反射镜进入垂直方向，并且进行调整，使得来自两个反射镜的每个反射光束与入射光束重叠。版权所有（C）2008，JPO＆INPIT

6. 发明专利

JP2006014675A Incubator and culture cassette used for the same 有权
标题翻译：孵化器和文化用于同一化学品
公开(公告)号：JP2006014675A
公开(公告)日：2006-01-19
申请号：JP2004196471
申请日：2004-07-02
申请人： J Tec:Kk , Mutsumi Takagi , 株式会社ジェイテック , 睦高木
发明人： TSUMURA HISAFUMI , OKADA HIROMI , TAKAGI MUTSUMI
IPC分类号： C12M3/00
CPC分类号： C12M41/14 , C12M23/42 , C12M41/34
摘要： PROBLEM TO BE SOLVED: To provide an incubator surely preventing not only contamination in the incubator but also contamination during transfer of dispensing operation, etc., and to provide culture cassettes used for the incubator. SOLUTION: The incubator 1 is provided with the plurality of culture cassettes 2 housing and holding each culture dish 3 and demountably mounted in the interior thereof. The culture dish 3 in each cassette is controlled at a gas concentration, temperature and humidity suitable for culture of cells. The side wall of the incubator 1 is equipped with an opening and closing door 10 as described below for taking out each culture cassette 2 with a robot hand 4. The culture cassette 2 is formed into a hermetically closed structure and gas pipes 61 and 62 for introducing/discharging a gas from each cassette 2 are demountably connected in the incubator 1. COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：提供一种孵化器，其不仅可以防止培养箱中的污染，而且可以防止在分配操作等的转移期间的污染，并提供用于培养箱的培养盒。
解决方案：培养箱1设置有多个培养盒2，其容纳并保持每个培养皿3并可拆卸地安装在其内部。每个盒中的培养皿3被控制在适合细胞培养的气体浓度，温度和湿度。培养箱1的侧壁配备有如下所述的用于用机器人手4取出每个培养盒2的打开和关闭门10.培养盒2形成为密封结构，气体管61和62用于来自每个盒2的气体的引入/排出在培养箱1中可拆卸地连接。版权所有（C）2006，JPO＆NCIPI

7. 发明专利

JP2008239247A Cap 审中-公开
标题翻译：帽
公开(公告)号：JP2008239247A
公开(公告)日：2008-10-09
申请号：JP2007114822
申请日：2007-03-27
申请人： J Tec:Kk , 株式会社ジェイテック
发明人： TSUMURA HISAFUMI
IPC分类号： B65D43/16 , B01L3/08 , B04B5/02 , B65D43/22
摘要： PROBLEM TO BE SOLVED: To provide a cap which is openable and closable without connecting and disconnecting of the cap itself when it is used for closing a centrifuging tube or a T-flask as an alternative to a conventional cap, and which makes it possible to split or dispense liquid solution stored in them by inserting a nozzle into an opening with the cap opened. SOLUTION: The cap 1 for use in a spout of the centrifuging tube 2 or the T-flask is equipped with a cap body 5 having an opening 7 capable of closely fitting the spout in an airtight manner by threading or insertion, and a lid 6 capable of opening and closing the opening 7 of the cap body 5. Further, the cap 1 is equipped with an elastic biasing means 9 which presses the lid 6 against the opening 7 with predetermined force under the condition that the opening 7 of the cap body 5 is closed by the lid 6, a seal for close contact between the lid 6 and the opening 7, and an operation portion 11 linked with the lid 6 to open and close the lid 6. COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：为了提供一种可以打开和关闭的帽，当帽子本身用于封闭离心管或T型烧瓶作为常规帽的替代品时，其盖本身不会断开连接，并且这使得通过将喷嘴插入打开盖的开口中，可以分离或分配存储在其中的液体溶液。解决方案：用于离心管2或T型烧瓶的喷口中的盖1装备有具有能够通过穿线或插入以密封方式紧密配合喷口的开口7的盖体5，以及能够打开和关闭盖主体5的开口7的盖6.此外，盖1配备有弹性偏压装置9，弹性偏压装置9以预定的力将盖6按压在开口7上，盖体5被盖6封闭，用于盖6和开口7之间紧密接触的密封件以及与盖6连接以打开和关闭盖6的操作部分11。版权所有（C））2009，JPO＆INPIT

8. 发明专利

JP2008164553A X-ray condensing method using phase recovery method, and device thereof 有权
标题翻译：使用相位恢复方法的X射线冷凝方法及其装置
公开(公告)号：JP2008164553A
公开(公告)日：2008-07-17
申请号：JP2006357566
申请日：2006-12-28
申请人： J Tec:Kk , Osaka Univ , 国立大学法人大阪大学 , 株式会社ジェイテック
发明人： YAMAUCHI KAZUTO , MIMURA HIDEKAZU , OKADA HIROMI
IPC分类号： G21K1/06 , G01N23/207 , G01N23/223 , G02B5/10 , G21K7/00 , H01L21/027
CPC分类号： G21K1/06 , G02B5/0891 , G02B5/10 , G21K2201/067
摘要： PROBLEM TO BE SOLVED: To provide an X-ray wave front measuring method for determining the phase error distribution on a mirror, namely, shape errors, by using an intensity distribution of a condensed beam condensed by the mirror by using a hard X-rays used for actual evaluation, by utilizing a phase recovery method, based on a wave optical theory, and to provide an X-ray condensing method, using the phase recovery method for adjusting optimally an X-ray condensing optical system that uses the measurement method, and to provide a device of the method.
SOLUTION: This method is such that an X-ray mirror, having a wave-front adjusting ability capable of finely adjusting the wave front of reflected X-rays is provided; an X-ray intensity distribution near a focal point is measured; an X-ray intensity distribution near the X-ray mirror is measured, or otherwise by using a known X-ray intensity distribution of an incident X-ray is used; a complex amplitude distribution on a reflection surface is calculated, by using the phase recovery method from the X-ray intensity distribution near the focal point and the X-ray intensity distribution near the reflection surface; wave-front aberrations in the X-ray condensing optical system are calculated from the complex amplitude distribution; and the reflection surface of the X-ray mirror is controlled by the wave-front adjusting ability so that the calculated wave-front aberrations becomes a minimum.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提供一种用于通过使用硬反射镜聚焦的聚光束的强度分布来确定反射镜上的相位误差分布即形状误差的X射线波前测量方法用于实际评估的X射线，通过利用基于波光学理论的相位恢复方法，并且提供X射线聚焦方法，使用相位恢复方法来最佳地调整使用该X射线聚焦光学系统的X射线聚焦光学系统测量方法，并提供该方法的装置。解决方案：该方法是提供具有能够精细地调整反射X射线的波前的波前调整能力的X射线镜。测量焦点附近的X射线强度分布; 测量X射线镜附近的X射线强度分布，或者使用已知的入射X射线的X射线强度分布，通过使用来自焦点附近的X射线强度分布的相位恢复方法和反射面附近的X射线强度分布，计算反射面上的复振幅分布; 根据复振幅分布计算出X射线聚光光学系统中的波前像差; 并且通过波前调整能力来控制X射线镜的反射面，使得所计算的波前像差变得最小。版权所有（C）2008，JPO＆INPIT

9. 发明专利

JP2007218852A Ultra-precision shape measuring method 有权
标题翻译：超精密形状测量方法
公开(公告)号：JP2007218852A
公开(公告)日：2007-08-30
申请号：JP2006042547
申请日：2006-02-20
申请人： J Tec:Kk , Kazuto Yamauchi , 和人山内 , 株式会社ジェイテック
发明人： YAMAUCHI KAZUTO , MIMURA HIDEKAZU
IPC分类号： G01B11/24
CPC分类号： G01B11/2441 , G01B9/02085 , G01B2290/60 , G01M11/005
摘要： PROBLEM TO BE SOLVED: To provide an ultra-precision shape measuring method capable of ultra-precisely measuring in the precision of the nano or sub-nano order a plane mirror or a curved surface mirror having a shape similar to a plane for condensing a hard X-ray or a soft X-ray used in a radiation light facility, especially a measuring object having a steep shape exceeding 1×10 -4 rad in an elliptic shape or a cylindrical shape. SOLUTION: The whole shape is measured by stitching a plurality of microscopic measured data by a Michelson type microinterferometer by using the whole shape data by a Fizeau type interferometer. A curved surface to be measured and a reference plane are measured simultaneously by the Fizeau type interferometer, and the curved surface to be measured and the reference plane are tilted simultaneously with respect to a reference surface, and a plurality of partial shape data of a narrower domain than the curved surface to be measured are acquired, and simultaneously a relative angle between each partial shape data is measured as a tilt angle of the reference plane, and adjacent partial shape data are stitched by utilizing the tilt angle and coincidence of superposed domains, to thereby acquire the whole shape data. COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：为了提供能够超精细地测量纳米或亚纳米级精度的超精密形状测量方法，具有类似于平面的形状的平面镜或曲面反射镜，冷凝在辐射光设备中使用的硬X射线或软X射线，特别是具有椭圆形或圆柱形的超过1×10 -4 rad的陡峭形状的测量对象。
解决方案：通过使用由Fizeau型干涉仪使用整个形状数据，通过迈克尔逊型微型干涉仪缝合多个微观测量数据来测量整个形状。通过Fizeau型干涉仪同时测量待测量的弯曲表面和参考平面，并且待测量的曲面和参考平面相对于参考表面同时倾斜，并且多个部分形状数据较窄获取要测量的曲面的区域，并且同时测量每个局部形状数据之间的相对角度作为参考平面的倾斜角，并且通过利用叠加域的倾斜角度和重合来缝合相邻的部分形状数据，从而获得整个形状数据。版权所有（C）2007，JPO＆INPIT

10. 发明专利

JP2009053055A Method and device for precisely measuring x-ray nano beam intensity distribution 有权
标题翻译：用于精确测量X射线纳米光束强度分布的方法和装置
公开(公告)号：JP2009053055A
公开(公告)日：2009-03-12
申请号：JP2007220306
申请日：2007-08-27
申请人： J Tec:Kk , Osaka Univ , 国立大学法人大阪大学 , 株式会社ジェイテック
发明人： YAMAUCHI KAZUTO , MIMURA HIDEKAZU , OKADA HIROMI
IPC分类号： G01T1/29
摘要： PROBLEM TO BE SOLVED: To provide a method and device for precisely measuring X-ray nano beam intensity distribution that can overcome a problem wherein noise is emphasized by background noise and differentiation of a wire scanning method and can further accurately measure an X-ray beam profile.
SOLUTION: In this method for precisely measuring the X-ray nano beam intensity distribution, the X-ray intensity distribution on the cross section of the X-ray beam is measured, using a dark field measurement method of scanning a knife edge so as to cross an X-ray beam and measuring the X-ray intensity with an X-ray detector arranged at a position of a geometric dark area to an X-ray source behind the knife edge. The knife edge is made of heavy metal having an action of advancing the phase of the X-rays transmitting it, and is set at a thickness allowing acquirement of the phase shift of the range where the transmission X-rays and the diffraction X-rays diffracted at the tip of the knife edge emphasize each other, and X-rays obtained by overlapping the diffraction X-rays and transmission X-rays are measured by the X-ray detector.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：提供一种精确测量X射线纳米光束强度分布的方法和装置，其可以克服背景噪声和线扫描方法的区分强调噪声的问题，并且可以进一步精确地测量X 射线轮廓。解决方案：在这种精确测量X射线纳米光束强度分布的方法中，使用扫描刀刃的暗场测量方法测量X射线束横截面上的X射线强度分布穿过X射线束并且将X射线检测器与布置在几何暗区域的X射线检测器相对于刀刃后方的X射线源测量。刀刃由重金属制成，具有促使X射线发射相位的作用，并且被设定为允许获取透射X射线和衍射X射线的范围的相移的厚度在刀刃的尖端处衍射，彼此强调，并且通过X射线检测器测量通过重叠衍射X射线和透射X射线获得的X射线。版权所有（C）2009，JPO＆INPIT

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