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    • 84. 发明专利
    • Locating system
    • 定位系统
    • JP2007010659A
    • 2007-01-18
    • JP2006176321
    • 2006-06-27
    • Dr Johannes Heidenhain Gmbhドクトル・ヨハネス・ハイデンハイン・ゲゼルシヤフト・ミツト・ベシユレンクテル・ハフツングDr. Johannes Heidenhain Gesellschaft Mit Beschrankter Haftung
    • HOLZAPFEL WOLFGANG
    • G01D5/38G01D5/347
    • G01D5/38G01D5/34715
    • PROBLEM TO BE SOLVED: To provide a locating system which ensures scan unit structure as compact as possible.
      SOLUTION: This is the locating system, in which its scan unit has a plurality of grid structures and at least one reflector element, for detecting relative position between the scan unit with a dimensioned object movable to the scan unit in at least one measuring direction. It has the following features: each element in the scan unit is arranged so that luminous flux diffracted by the dimensioned object may pass through a first grid structure to reach the reflector element then, retroreflection in the direction of the dimensioned object may be caused by this reflector element, subsequently partial luminous flux may pass through a second grid structure to newly reach the dimensioned object; and these first and second grid structures are formed so that a certain lens action may be produced to the partial luminous flux when the partial luminous flux passes initially and next.
      COPYRIGHT: (C)2007,JPO&INPIT
    • 要解决的问题:提供一种确保扫描单元结构尽可能紧凑的定位系统。 解决方案:这是定位系统,其中其扫描单元具有多个栅格结构和至少一个反射器元件,用于检测扫描单元与可移动到扫描单元的尺寸对象中的至少一个中的相对位置 测量方向。 它具有以下特征:扫描单元中的每个元件被布置成使得被尺寸对象衍射的光束可以穿过第一格栅结构以到达反射器元件,然后可能由此引起尺寸对象的方向上的逆向反射 反射器元件,随后部分光通量可以通过第二格栅结构以重新到达尺寸标注的物体; 并且这些第一和第二栅格结构被形成为使得当部分光通量最初和接下来通过时,可能对部分光通量产生一定的透镜作用。 版权所有(C)2007,JPO&INPIT