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    • 76. 发明专利
    • PULLING UP DEVICE FOR SINGLE CRYSTAL SEMICONDUCTOR
    • JPS5836999A
    • 1983-03-04
    • JP13347481
    • 1981-08-26
    • TOSHIBA CERAMICS CO
    • KAWANABE ASAJI
    • C30B15/26H01L21/208
    • PURPOSE:To control the diameter of a single crystal semiconductor ingot without the influence of fluctuations in the melt surface of a molten semiconductor by disposing the photodetecting part of a control mechanism for the diameter of the ingot in the upper part of a chamber in such a way as to face the melt surface. CONSTITUTION:Since the radiation light of a melt surface is detected by a photodetecting part 16 disposed right above molten Si 12, the measuring place is constant despite the vertical fluctuation in the melt surface and the errors owing to the oscillation of an ingot are small. Further, a photodetecting part 16 is provided upper than an Ar gas supply port 9, sticking of gases such as SiO is difficult and the errors in measurement occurring in said sticking are small. Therefore, the accurate information relating to the diameter of the ingot is transmitted to a control mechanism for diameter not shown, and desirable control for diameter is accomplished. Since the outputting of unnecessary operation signals from the control mechanism for diameter is eliminated, the tendency toward an increase in the variance of the impurity concn. in the single crystal ingot is suppressed.