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61. 发明专利

JP2006071367A Microcomponent analyzer and microcomponent analyzing method 有权
标题翻译：微波分析仪和微波分析方法
公开(公告)号：JP2006071367A
公开(公告)日：2006-03-16
申请号：JP2004253181
申请日：2004-08-31
申请人： Central Res Inst Of Electric Power Ind , Mitsubishi Heavy Ind Ltd , 三菱重工業株式会社 , 財団法人電力中央研究所
发明人： KAWAZOE KOHEI , DEGUCHI YOSHIHIRO , TANAKA NOBUYUKI
IPC分类号： G01N27/62 , G01N27/64 , H01J49/04 , H01J49/10
摘要： PROBLEM TO BE SOLVED: To provide a microcomponent analyzer capable of well analyzing a component contained in a granular substance, and a microcomponent analyzing method.
SOLUTION: The microcomponent analyzer 1 is constituted by providing an ionizing part 3, wherein a granular substance is ionized, in a chamber 2. The supply passage 11 connected to a granular substance supply source not shown in Fig. is connected to one end of the chamber 2 and a front chamber 12 is provided on the supply passage 11. The inside of the front chamber 12 is set as a component extraction part 13 where the granular substance is irradiated with a laser beam. An ionizing laser oscillator 16 for supplying a pulselike laser beam to the ionizing part 3 and a component drawing-out laser oscillator 17 for supplying the pulselike laser beam to the component extraction part 13 are provided.
COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：解决方案的问题：提供能够良好地分析粒状物质中所含的成分的微量成分分析装置和微量成分分析方法。解决方案：微量组分分析仪1通过在室2中提供离子化的离子化部分3构成。供给通道11连接到图1中未示出的颗粒状物质供应源。连接到室2的一端，并且在供给通道11上设置有前室12.前室12的内部被设定为用激光束照射粒状物质的部件提取部13。提供了用于向电离部分3提供脉动激光束的电离激光振荡器16和用于将脉动激光束提供给部件提取部分13的部件拉出激光振荡器17。版权所有（C）2006，JPO＆NCIPI

62. 发明专利

JP2005164288A Measuring instrument for trace of component in gas and measuring method using it 有权
标题翻译：测量气体成分跟踪的仪器和使用它的测量方法
公开(公告)号：JP2005164288A
公开(公告)日：2005-06-23
申请号：JP2003400329
申请日：2003-11-28
申请人： Mitsubishi Heavy Ind Ltd , 三菱重工業株式会社
发明人： DEGUCHI YOSHIHIRO , HORI JUNICHIRO
IPC分类号： G01N31/00 , G01N21/63 , G01N21/67
摘要： PROBLEM TO BE SOLVED: To provide a simple and rapid measuring instrument of a trace of a component in gas, and a measuring method using it.
SOLUTION: This measuring instrument of a trace of the component in the gas is equipped with a vacuum cell 12 provided with a vacuum pump 11, a sample introducing pipe 14 for introducing an exhaust gas 13 into the vacuum cell 12, a plasma forming device 15 for forming the plasma of a trace of the component in the exhaust gas 13 supplied into the vacuum cell 12 and a photodetector 17 for detecting the peripheral region of the plasma light 16 emitted from the component. Detection light L is measured in the measuring part 28 of the peripheral region of the plasma light 16.
COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：提供一种简单快速的气体中痕量成分的测量仪器及其使用的测量方法。
解决方案：气体中元件痕迹的测量仪器配备有设置有真空泵11的真空室12，用于将废气13引入真空室12中的样品引入管14，等离子体形成装置15，用于形成提供给真空室12的废气13中的部件的痕迹的等离子体;以及光电检测器17，用于检测从部件发射的等离子体光16的周边区域。检测光L在等离子体光16的周边区域的测量部分28中被测量。版权所有：（C）2005，JPO＆NCIPI

63. 发明专利

JP2005025946A Time-of-flight mass spectrometry apparatus 审中-公开
标题翻译：飞行时间质谱仪器
公开(公告)号：JP2005025946A
公开(公告)日：2005-01-27
申请号：JP2003186547
申请日：2003-06-30
申请人： Mitsubishi Heavy Ind Ltd , 三菱重工業株式会社
发明人： KUBOTA TAKAHIRO , DEGUCHI YOSHIHIRO , DOBASHI SHINSAKU , NAKAMURA KOICHI
IPC分类号： G01N27/62 , G01N27/64 , H01J49/10 , H01J49/40
摘要： PROBLEM TO BE SOLVED: To provide a time-of-flight mass spectrometry apparatus capable of expanding a measurable concentration range and improving the measurement accuracy. SOLUTION: The time-of-flight mass spectrometry apparatus comprises a laser light control part 15. The control part 15 processes an concentration signal indicating the ion concentration detected by an ion detector 14, and controls an excitation laser device 10 so as to reduce the output of laser light L emitted by the laser device 10 if the concentration signal is greater than a given value, and to increase the output of the laser device 10 if the concentration signal is smaller than the given value. COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：提供能够扩大可测量的浓度范围并提高测量精度的飞行时间质谱装置。飞行时间质谱装置包括激光控制部15.控制部15处理表示离子检测器14检测出的离子浓度的浓度信号，并控制激发激光装置10，使如果浓度信号大于给定值，则减少由激光装置10发射的激光L的输出，并且如果浓度信号小于给定值，则增加激光装置10的输出。版权所有（C）2005，JPO＆NCIPI

64. 发明专利

JP2004354163A Optical gas sensor 审中-公开
公开(公告)号：JP2004354163A
公开(公告)日：2004-12-16
申请号：JP2003151035
申请日：2003-05-28
申请人： Mitsubishi Heavy Ind Ltd , 三菱重工業株式会社
发明人： YAMAURA TSUYOTOSHI , DEGUCHI YOSHIHIRO
IPC分类号： G01B11/06 , G01N21/45
摘要： PROBLEM TO BE SOLVED: To provide an optical gas sensor capable of detecting gas with high sensitivity by compensating for low reaction characteristics and capable of arranging a measuring environment by excepting a substance lowering sensitivity.
SOLUTION: The film thickness of a coating material is calculated from the measured light path difference between the light reflected from the interface of the coating material 1 at the leading end of a light transmission medium 2 and air, and the light reflected from the interface of the coating material 1 and the light transmission medium 2 to calculate the concentration of the gas determined by the film thickness. An interference system 5 is used in a light detecting part in order to measure the light path difference. Further, separately from the interference system for measuring the light path difference, light with a wavelength for exciting a substance lowering the function of the coating material 1 is allowed to irradiate. Furthermore, by mixing Ag with Pd as the coating material 1, a change in the occulusion quantity of the gas with respect to the concentration of the gas is reduced.
COPYRIGHT: (C)2005,JPO&NCIPI

65. 发明专利

JP2004325458A Calorific value measuring method, gasifier and its operating method 审中-公开
公开(公告)号：JP2004325458A
公开(公告)日：2004-11-18
申请号：JP2004155046
申请日：2004-05-25
申请人： Mitsubishi Heavy Ind Ltd , 三菱重工業株式会社
发明人： KURODA MASAHIRO , DEGUCHI YOSHIHIRO , KOGA YOSHITAKA
IPC分类号： G01N25/20 , C10J3/02 , C10J3/20 , C10J3/46 , C10J3/48 , G01N21/65
摘要： PROBLEM TO BE SOLVED: To provide a calorific value measuring method for a high-temperature/high-pressure generated gas wherein the responsivity of measurement is dramatically enhanced and the pretreatment of the generated gas is sharply simplified.
SOLUTION: This calorific value measuring method for gasified generated gas is characterized in that the generated gas is dedusted as pretreatment and then the generated gas that contains water is is irradiated with laser light, scattered light from the generated gas is spectrum-analyzed to measure the concentration of combustible gas in the generated gas while measuring the concentration of water in the generated gas, and the calorific value of the water-containing generated gas is calculated from these concentrations.
COPYRIGHT: (C)2005,JPO&NCIPI

66. 发明专利

JP2004186565A Manufacturing method and apparatus for silicon amorphous semiconductor thin film 审中-公开
公开(公告)号：JP2004186565A
公开(公告)日：2004-07-02
申请号：JP2002353907
申请日：2002-12-05
申请人： Mitsubishi Heavy Ind Ltd , 三菱重工業株式会社
发明人： KURODA MASAHIRO , IWASAKI SEIJI , DEGUCHI YOSHIHIRO
IPC分类号： C23C16/24 , C23C16/52 , H01L21/205 , H01L31/04
CPC分类号： Y02E10/50
摘要： PROBLEM TO BE SOLVED: To provide a manufacturing method and apparatus for a silicon amorphous semiconductor thin film which reduces defects therein to hardly cause optical deterioration.
SOLUTION: The inside of a plasma chamber 11 is irradiated with laser light from a laser 12, a fine-grain concentration in plasma is detected from the intensity of transmitted light or scattered light, and at least one of temperatures of a substrate holder 14, the modulation pattern of an output of a high frequency power source 18, a flow velocity of raw material gases and the quantity of diluted gas is controlled to reduce the detected fine-grain concentration. Thus, defect density in the amorphous semiconductor thin film is decreased and optical deterioration can be reduced.
COPYRIGHT: (C)2004,JPO&NCIPI

67. 发明专利

JP2004125681A Detector for trace organic constituent 有权
公开(公告)号：JP2004125681A
公开(公告)日：2004-04-22
申请号：JP2002291922
申请日：2002-10-04
申请人： Mitsubishi Heavy Ind Ltd , 三菱重工業株式会社
发明人： DOBASHI SHINSAKU , DEGUCHI YOSHIHIRO , KUBOTA TAKAHIRO , BABA KEIGO
IPC分类号： G01N27/62 , G01N27/64 , H01J49/10 , H01J49/40 , H01S3/00
摘要： PROBLEM TO BE SOLVED: To provide a detector for trace organic constituents such as PCB in a gas discharged from a PCB treatment device.
SOLUTION: This detector is equipped with a specimen introduction means 13 for continuously introducing a collected specimen 11 into a vacuum chamber 12, a laser emission means 14 for ionizing the introduced specimen 11 in an ionization area 14a by laser light L, an ion acceleration part 16 for accelerating ionized ion molecules 15, an ion trap 17 for temporarily capturing specific ions and thereafter discharging the captured ions, a reflector 18 for reflecting ion molecules discharged from the ion trap, and a time-of-flight mass spectrometer 20 equipped with an ion detector 19 for detecting reflected ions. A laser output measuring instrument 24 for measuring the output of fixed wave (fundamental wave) laser light 21 emitted from the emission means 14 is provided on the downstream side of a dichroic mirror 23 after laser light 21 from the emission means 14 passes through a wavelength converter 22 for converting the wavelength thereof.
COPYRIGHT: (C)2004,JPO

68. 发明专利

JP2004079235A Detecting apparatus of organic trace component 审中-公开
公开(公告)号：JP2004079235A
公开(公告)日：2004-03-11
申请号：JP2002234684
申请日：2002-08-12
申请人： Mitsubishi Heavy Ind Ltd , 三菱重工業株式会社
发明人： DOBASHI SHINSAKU , DEGUCHI YOSHIHIRO , KUBOTA TAKAHIRO , BABA KEIGO
IPC分类号： G01N27/62 , G01N27/64 , H01J49/06 , H01J49/10 , H01J49/40
摘要： PROBLEM TO BE SOLVED: To provide a detecting device of an organic trace component, capable of continuous and highly sensitive analysis.
SOLUTION: This detecting device is equipped with a sample introducing means 13 to continuously introduce a sample 11 into a vacuum chamber 12, an ionizing means 14 to ionize an introduced sample 11 by a laser beam L in an ionizing part 14a, an accelerating means 16 to accelerate an ionized ion element 15, an ion trap 17 to tentatively capture a specific ion and to discharge the captured ion afterward, an ion converging part 18 to converge an ion element discharged from the ion trap, a deflecting part 19 to deflect the converged element, a reflector 20 to reflect the deflected ion element 17 flying at a constant velocity, and a time-of-flight mass spectrometer 22 provided with an ion detector 21 to detect an reflected ion, and an ion position recognizing means 23 to detect the position of the ion is provided in the ion detector 21.
COPYRIGHT: (C)2004,JPO

69. 发明专利

JP2004069251A Pulverized coal combustion system 有权
标题翻译：粉煤燃烧系统
公开(公告)号：JP2004069251A
公开(公告)日：2004-03-04
申请号：JP2002232316
申请日：2002-08-09
申请人： Mitsubishi Heavy Ind Ltd , 三菱重工業株式会社
发明人： DEGUCHI YOSHIHIRO , INOSAWA YOSHINORI
IPC分类号： F23N5/00 , F23C99/00 , F23K3/02 , F23N5/08 , F23C11/00
摘要： PROBLEM TO BE SOLVED: To provide a pulverized coal combustion system, for example, in the boilers of a pulverized coal thermal power plant.
SOLUTION: This pulverized coal combustion system comprises a mill 103 as a pulverizing means for pulverizing coal 102 from a coal yard 101, a pulverized coal supply pipe 107 for supplying the pulverized coal 104 from the mill 103 to the burner 106 of a boiler furnace 105 as a combustor, a laser device radiating laser beam to the inside of the pulverized coal supply pipe 107, a fuel ratio measuring device 110 having a detector for detecting Raman scattered light from solid carbon in the pulverized coal, Raman scattered light from C-H bonding, and the fluorescent light from hydrocarbon and measuring the fuel ratio of the pulverized coal, and a combustion control means 120 controlling the combustion according to the fuel ratio of the pulverized coal from the measured results of the fuel ratio measuring device 110.
COPYRIGHT: (C)2004,JPO
摘要翻译：要解决的问题：例如在粉煤火力发电厂的锅炉中提供粉煤燃烧系统。解决方案：该粉煤燃烧系统包括作为用于从煤场101粉煤102的粉碎装置的磨机103，用于将粉煤104从磨机103供给到燃烧器106的粉煤供给管107 作为燃烧器的锅炉105，将粉煤供给管107的内部照射激光束的激光装置，具有检测来自粉煤中的固体碳的拉曼散射光的检测器的燃料比测定装置110，来自 CH键合和来自烃的荧光并测量粉煤的燃料比，以及根据燃料比测量装置110的测量结果根据粉煤的燃料比控制燃烧的燃烧控制装置120。 P>版权所有（C）2004，JPO

70. 发明专利

JP2004055183A Device and method for measuring co component in gas 审中-公开
公开(公告)号：JP2004055183A
公开(公告)日：2004-02-19
申请号：JP2002207916
申请日：2002-07-17
申请人： Mitsubishi Heavy Ind Ltd , 三菱重工業株式会社
发明人： DEGUCHI YOSHIHIRO , YOSHIDA HIROHISA , OMOTO SETSUO
IPC分类号： H01M8/04 , H01M8/06
CPC分类号： Y02E60/50
摘要： PROBLEM TO BE SOLVED: To provide a CO component measurement device for measuring concentration of a CO component in gas.
SOLUTION: This CO component measurement device is provided with a cell 14 having supply/discharge lines 12 and 13 for the gas 11, a laser radiation means 22 radiating a laser beam 21 to the gas 11 fed into the cell 14, and a light detection means 23 finding an absorption spectrum in a wavelength area of 1561-1563 nm for finding CO concentration from the absorption spectrum in measurement of the absorption spectrum based on the laser beam radiation.
COPYRIGHT: (C)2004,JPO

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