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    • 51. 发明专利
    • Method and device for measuring resistance in strong magnetic field
    • 在强磁场中测量电阻的方法和装置
    • JP2008116236A
    • 2008-05-22
    • JP2006297596
    • 2006-11-01
    • Hitachi Computer Peripherals Co Ltd日立コンピュータ機器株式会社
    • ABE MAKOTOMATSUOKA HIROSHIWADA TATSUHIKO
    • G01R27/02G11B5/455
    • PROBLEM TO BE SOLVED: To prevent the measurement from being affected by the induced voltage between the signal lines connecting the probe and the resistance measurement circuit by improving the resistance measurement technique in the strong magnetic field.
      SOLUTION: The probe 2 is in contact with a work 1 of a measurement object, sends signal to a resistance measurement circuit 6, and measures the electric resistance of the work. A magnet 7 moves parallel in X-axis direction for changing the magnetic field intensity impressed on the work 1, and rotates around the X-axis by 180° for inverting the direction of the magnetic field impressed on the objective work 1. For making an A signal line 4 or a B signal line 5 generate no induced voltage, even if the magnet 7 moves in the X-axis direction, the signal lines are oppositely faced in the Z-axis direction (i.e. in the magnetic field direction) while being separated. Because of no magnetic field line passing through between the two signal lines 4 and 5, even the magnet 7 moves between the arrow marks a to c, no induced voltage is generated. Moreover, an arm 10 is constituted of a resin material, no eddy current is induced.
      COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题:通过改善强磁场中的电阻测量技术,防止测量受连接探针和电阻测量电路的信号线之间的感应电压的影响。

      解决方案:探头2与测量对象的工件1接触,将信号发送到电阻测量电路6,并测量工件的电阻。 磁体7在X轴方向上平行移动,以改变施加在工件1上的磁场强度,并且围绕X轴旋转180°以反转施加在物体工件1上的磁场的方向。为了制造 信号线4或B信号线5即使磁体7在X轴方向上移动也不产生感应电压,信号线在Z轴方向(即磁场方向)上相反地面对,同时 分离。 由于两条信号线4和5之间没有通过磁场线,所以即使磁体7也在箭头a至c之间移动,也不产生感应电压。 此外,臂10由树脂材料构成,不产生涡流。 版权所有(C)2008,JPO&INPIT

    • 53. 发明专利
    • Manufacturing method of magnetic head slider, preamplifier, and magnetic disk drive
    • 磁头滑块,前置放大器和磁盘驱动器的制造方法
    • JP2008052795A
    • 2008-03-06
    • JP2006226454
    • 2006-08-23
    • Hitachi Global Storage Technologies Netherlands Bvヒタチグローバルストレージテクノロジーズネザーランドビーブイ
    • IWASA SHINICHI
    • G11B5/455G11B5/39
    • G11B5/3166G11B5/102G11B5/3173G11B5/455Y10T29/4902
    • PROBLEM TO BE SOLVED: To solve the problem that there is a method of using the magnetic property of a magnetoresistive element as an object of the standard of an actual magnetic head slider but it is too vulnerable to static electricity to use as a source of the standard over a long term. SOLUTION: When initially setting up a tester 500, the preamplifier 514 of a magnetic property measuring device 502 is connected to an emulator 1 to input signals emulating the resistance and resistance change of the magnetoresistive element to use as the standard. The output of the preamplifier 514 is A/D converted to input to an MPU 510 and changed into resistance in the MPU 510 to store in the ROM518. The tester compares the resistance of the measured magnetoresistive element with the resistance stored in the ROM using it as the standard. Since the standard thus setup changes over aging, it is periodically checked and adjusted by connecting the tester to the emulator. COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题为了解决存在使用磁阻元件的磁性的方法作为实际磁头滑块的标准的对象的问题,但是它太容易受到静电的影响,作为 长期来源的标准。 解决方案:当初始设置测试器500时,磁性能测量装置502的前置放大器514连接到仿真器1,以输入仿真磁阻元件的电阻和电阻变化的信号以用作标准。 前置放大器514的输出被A / D转换为输入到MPU 510,并且变成MPU 510中的电阻以存储在ROM518中。 测试仪将测量的磁阻元件的电阻与存储在ROM中的电阻作为标准进行比较。 由于标准因此设置改变了老化,所以通过将测试仪连接到仿真器来定期检查和调整。 版权所有(C)2008,JPO&INPIT
    • 55. 发明专利
    • General-purpose type head medium evaluation device
    • 一般用途型头中评估装置
    • JP2008034099A
    • 2008-02-14
    • JP2007248372
    • 2007-09-26
    • Fujitsu Ltd富士通株式会社
    • UENO TAKAHISA
    • G11B5/455G11B5/00
    • PROBLEM TO BE SOLVED: To solve the problem that good evaluation is not constantly obtained and reliability in measurement is not improved, unless it takes labor and time.
      SOLUTION: A nonvolatile memory 18 where frequency characteristics of each UDT element constituting the signal transmission system of UDT are stored for each UDT element is included, and a system control unit 12 has a function of reading frequency characteristics of each UDT element from the nonvolatile memory 18 to obtain frequency characteristics of the entire system, setting a measuring limit according to a give algorithm based on the frequency characteristics of the entire system, and displaying the limit on a screen to present it to an operator or the like.
      COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题:为了解决不能不时获得良好的评估和测量的可靠性的改进的问题,除非需要劳动和时间。 解决方案:包括为每个UDT元件存储构成UDT的信号传输系统的每个UDT元件的频率特性的非易失性存储器18,并且系统控制单元12具有从每个UDT元件读取每个UDT元件的频率特性的功能 非易失性存储器18,以获得整个系统的频率特性,根据基于整个系统的频率特性的给出算法设置测量极限,并将屏幕上的限制显示给操作者等。 版权所有(C)2008,JPO&INPIT
    • 58. 发明专利
    • Method of manufacturing thin film magnetic head
    • 制造薄膜磁头的方法
    • JP2007273008A
    • 2007-10-18
    • JP2006098326
    • 2006-03-31
    • Shinka Jitsugyo Kk新科實業有限公司SAE Magnetics(H.K.)Ltd.
    • TANZAWA HIDEKIYAMADA HIROKI
    • G11B5/39G11B5/455
    • PROBLEM TO BE SOLVED: To facilitate investigation into the cause of defect and improvement of yield by improving measuring accuracy of QST.
      SOLUTION: A method of manufacturing a thin film magnetic head has: a step S1 in which a magnetoresistive element provided with a free layer in which a magnetization direction is varied in accordance with an external magnetic field and the thin film magnetic head provided with a magnetic shield layer provided at both sides of a lamination direction of the magnetoresistive element are prepared; and a first measuring step S3 in which the external magnetic field is applied to the free layer while performing magnetizing stabilizing processing for magnetizing at least one side of the magnetic shield layer in the fixed direction by a permanent magnet and causing a sense current to flow in the magnetoresistive element, and relation between the external magnetic field and a resistance value of the magnetoresistive element is obtained.
      COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题:通过提高QST的测量精度,便于对缺陷原因进行调查和提高产量。 解决方案:制造薄膜磁头的方法具有:步骤S1,其中设置有磁化方向根据外部磁场而变化的自由层的磁阻元件和设置有薄膜磁头的步骤S1 制备在磁阻元件的层叠方向的两侧设置的磁屏蔽层; 以及第一测量步骤S3,其中外部磁场被施加到自由层,同时执行磁化稳定处理,用于通过永久磁体在固定方向上磁化磁屏蔽层的至少一侧,并使感测电流流入 磁阻元件,以及外部磁场与磁阻元件的电阻值之间的关系。 版权所有(C)2008,JPO&INPIT
    • 59. 发明专利
    • Spindle stage for testing magnetic head having vcm mechanism and magnetic head automatic loading/unloading device
    • 用于测试具有VCM机构和磁头自动装载/卸载装置的磁头的主轴段
    • JP2007272937A
    • 2007-10-18
    • JP2006093813
    • 2006-03-30
    • International Manufacturing & Engineering Services Co Ltd株式会社アイメス
    • ONO KEIADACHI TOMOKI
    • G11B5/455G11B5/588
    • G11B5/455G11B5/105
    • PROBLEM TO BE SOLVED: To provide a spindle stage for testing a magnetic head which can perform highly accurate servo following by an inexpensive VCM mechanism without using a piezoelectric element and a magnetic head which can perform automatic loading/unloading device. SOLUTION: The device is provided with a head arm device having a head arm part rocking-driven by the VCM mechanism, and a clamp member which is the spindle stage for testing a magnetic head measuring electric and mechanical property by loading HGA loaded to the head arm for the surface of a medium and which is moved to an engaging part in which a boss for swage of the HGA is engaged freely attachably and detachably, a lock position at which the HGA in which the boss for swage is engaged in the engaging part is locked, and a clamp member which moves the boss for swage to release position which can be detached and attached in the engaging part. COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题:提供用于测试磁头的主轴台,该磁头可以通过廉价的VCM机构执行高精度的伺服跟随,而不使用可以执行自动装载/卸载装置的压电元件和磁头。

      解决方案:该装置设置有头臂装置,其具有由VCM机构摇摆驱动的头臂部分和作为主轴台的夹具部件,用于通过装载HGA加载来测试电机和机械性能的磁头 移动到介质的表面的头臂,并且移动到接合部分,在该接合部分中,用于挤压HGA的凸台可自由地可拆卸地接合;锁定位置,在该位置处,用于挤压的凸台的HGA 卡合部件被锁定,以及夹紧部件,该夹紧部件使凸台移动以使其脱离并附着在卡合部中。 版权所有(C)2008,JPO&INPIT

    • 60. 发明专利
    • Magnetic field distribution measuring instrument
    • 磁场分布测量仪器
    • JP2007271465A
    • 2007-10-18
    • JP2006097698
    • 2006-03-31
    • Tokyo Institute Of Technology国立大学法人東京工業大学
    • AMAYA KENJIYAMAKAWA SHINICHI
    • G01R33/10G01R33/09G11B5/455G11B5/84
    • PROBLEM TO BE SOLVED: To provide a magnetic field distribution measuring instrument that has high resolution and that simplifies the position control of a probe.
      SOLUTION: The magnetic field distribution measuring instrument comprises the probe having a thin-film magnetometric sensor for detecting magnetic field distribution very close to a measured object as an output signal of voltage or current, an actuator for one-dimensionally translation-scanning the probe in the thickness direction of the thin-film magnetometric sensor, a rotating mechanism for making the measured object rotate in the horizontal plane, an angle sensor for detecting the rotation angle of the measured object, and a magnetic field distribution reconstructing means for reconstructing the magnetic field distribution, based on the output signal from the probe, the position signal of the probe output from the actuator, and a rotation angle signal output from the angle sensor.
      COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题:提供一种具有高分辨率并简化探针的位置控制的磁场分布测量仪器。 解决方案:磁场分布测量仪器包括具有用于检测非常接近测量对象的磁场分布的薄膜磁力计传感器的探针作为电压或电流的输出信号,用于一维平移扫描的致动器 薄膜磁测计传感器的厚度方向上的探针,用于使测量对象物在水平面上旋转的旋转机构,用于检测测量对象的旋转角度的角度传感器,以及用于重建测量对象的旋转角度的磁场分布重建装置 基于来自探针的输出信号的磁场分布,从致动器输出的探针的位置信号和从角度传感器输出的旋转角度信号。 版权所有(C)2008,JPO&INPIT