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1. 发明专利

JP2011075492A Sectional shape measuring device of metal body 审中-公开
标题翻译：金属体部分形状测量装置
公开(公告)号：JP2011075492A
公开(公告)日：2011-04-14
申请号：JP2009229476
申请日：2009-10-01
申请人： Tokyo Institute Of Technology , 国立大学法人東京工業大学
发明人： AMAYA KENJI , TAKIMOTO SHUJI
IPC分类号： G01B7/28 , G01B7/00 , G01N27/02
摘要： PROBLEM TO BE SOLVED: To provide a sectional shape measuring device of a metal body capable of measuring indirectly a change of a sectional shape without depending on conventional direct size measurement or weight measurement.
SOLUTION: The sectional shape measuring device for measuring the sectional shape of the metal body dipped into a conductive liquid includes: one or a plurality of electrodes arranged so as to surround the periphery of the metal body, or a single or a plurality of electrodes arranged movably at the periphery; an AC impedance measuring means for measuring AC impedance between the metal body and the electrode by applying an AC voltage between the metal body and the electrode; and a sectional shape identification means for identifying the sectional shape of the metal body based on a measured value of the AC impedance.
COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供一种金属体的截面形状测量装置，其能够间接地测量截面形状的变化，而不依赖于传统的直接尺寸测量或重量测量。解决方案：用于测量浸入导电液体的金属体的截面形状的截面形状测量装置包括：一个或多个电极，其布置成围绕金属体的周边，或者单个或多个在周边可移动地布置的电极; AC阻抗测量装置，用于通过在金属体和电极之间施加交流电压来测量金属体与电极之间的交流阻抗; 以及截面形状识别装置，用于基于AC阻抗的测量值来识别金属体的截面形状。版权所有（C）2011，JPO＆INPIT

2. 发明专利

JP2011080875A Apparatus and method for measuring refraction index distribution 审中-公开
$Apparatus and method for measuring refraction index distribution$
标题翻译：测量折射指数分布的装置和方法
公开(公告)号：JP2011080875A
公开(公告)日：2011-04-21
申请号：JP2009233686
申请日：2009-10-07
申请人： Tokyo Institute Of Technology , 国立大学法人東京工業大学
发明人： AMAYA KENJI
IPC分类号： G01M11/02
摘要： PROBLEM TO BE SOLVED: To provide an apparatus for measuring refraction index and measuring method, capable of measuring refraction index distribution inside a lens, based on aberration measurements, without having to use a matching liquid.
SOLUTION: The apparatus includes a light source; an inspection object lens for converging a luminous flux from the light source and forming a spot image; an imaging means for imaging the spot image on a focal surface or in the vicinity of the focal surface; a tilting means for giving a plurality of tilt angles between the luminous flux and the inspection object lens, relative to the luminous flux; an aberration analysis means for analyzing aberrations from respective spot images imaged at the plurality of tilt angles; and an identification means for identifying the refraction index distribution.
COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供一种能够测量折射率和测量方法的装置，其能够基于像差测量来测量透镜内部的折射率分布，而不必使用匹配的液体。解决方案：该装置包括光源; 检查物镜，用于会聚来自光源的光通量并形成点图像; 用于对焦点表面上或焦点表面附近的斑点图像进行成像的成像装置; 倾斜装置，用于相对于光通量在光束和检查物镜之间给出多个倾斜角; 用于分析从所述多个倾斜角成像的各个点图像的像差的像差分析装置; 以及用于识别折射率分布的识别装置。版权所有（C）2011，JPO＆INPIT

3. 发明专利

JP2009115827A Optical phase distribution measuring system 审中-公开
标题翻译：光相分布测量系统
公开(公告)号：JP2009115827A
公开(公告)日：2009-05-28
申请号：JP2009047774
申请日：2009-03-02
申请人： Tokyo Institute Of Technology , 国立大学法人東京工業大学
发明人： AMAYA KENJI , HOTTA SHUHEI
IPC分类号： G01J9/02
摘要： PROBLEM TO BE SOLVED: To provide an optical phase distribution measuring system capable of measuring optical phase distribution by identifying optical phase distribution from information on optical intensity distribution easily measurable without using a special measuring device.
SOLUTION: The optical phase distribution measuring system is provided with an optical system with multiple known optical characteristics and a light wave detecting means, and has steps of inputting measured light into each optical system to modulate intensity and phase, detecting the output measured light by the light wave detecting means, and measuring the intensity distribution of the detected measured light; setting an observation equation based on the intensity distribution and the optical characteristics of the respective optical systems; setting a phase distribution identifying inverse problem for identifying the phase distribution of the measured light from the observation equation; formulating the phase distribution identifying inverse problem as a nonlinear optimization problem; and identifying the phase distribution of the measured light by solving the nonlinear optimization problem. A nonlinear objective function is composed of the sum of a function based on the observation equation and an optimization function based on transcendental information.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：提供一种光学相位分布测量系统，其能够通过在不使用特殊测量装置的情况下容易地测量的光强分布的信息中识别光学相位分布来测量光学相位分布。光分布测量系统具有多个已知光学特性的光学系统和光波检测装置，并且具有将测量光输入到每个光学系统中以调制强度和相位的步骤，检测所测量的输出通过光波检测装置的光，并测量检测到的测量光的强度分布; 根据各光学系统的强度分布和光学特性设定观测方程; 设定相位分布识别反问题，用于从观测方程中识别所测量的光的相位分布; 制定相位分布识别逆问题作为非线性优化问题; 并通过求解非线性优化问题来识别测量光的相位分布。非线性目标函数由基于观测方程的函数和基于超越信息的优化函数的和组成。版权所有（C）2009，JPO＆INPIT

4. 发明专利

JP2009032365A Magnetic recording and reproducing device, magnetic recording method, and magnetic reproducing method 审中-公开
标题翻译：磁记录和再现装置，磁记录方法和磁复制方法
公开(公告)号：JP2009032365A
公开(公告)日：2009-02-12
申请号：JP2007197726
申请日：2007-07-30
申请人： Tokyo Institute Of Technology , 国立大学法人東京工業大学
发明人： AMAYA KENJI , YAMAKAWA SHINICHI
IPC分类号： G11B5/02
摘要： PROBLEM TO BE SOLVED: To provide a magnetic recording and reproducing device in which recording density of a magnetic disk can be efficiently improved, a magnetic recording method by which a record is written into the magnetic disk with high density, and a magnetic reproducing method by which the record written in the magnetic disk is read with high density.
SOLUTION: In the magnetic recording and reproducing device performing recording and/or reproducing of information signals for the magnetic disk, the device is provided with: a spindle motor rotatively driving the magnetic disk; a plurality of recording heads forming recording bits on the magnetic disk, performing recording of the information signals, and having azimuth angles being different from one another; a plurality of reading heads performing reading of the information signals recorded in the magnetic disk; a head feeding mechanism for scanning the recording head and the reading head; an amplifying part amplifying the information signal recorded and reproduced by the recording head and/or the reading head; an A/D converter A/D-converting the information signal; and a re-constitution part of recording data.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：为了提供一种磁记录和再现装置，其中可以有效地提高磁盘的记录密度，将记录被写入高密度磁盘的磁记录方法和磁性以高密度读取记录在磁盘中的记录的再现方法。解决方案：在执行磁盘信息信号的记录和/或再现的磁记录和再现装置中，该装置设置有：主轴电机，可旋转地驱动磁盘; 多个记录头，在磁盘上形成记录位，执行信息信号的记录，并具有彼此不同的方位角; 多个读取头，执行读取记录在磁盘中的信息信号; 用于扫描记录头和读取头的头部进给机构; 放大部分，放大由记录头和/或读取头记录和再现的信息信号; A / D转换器对信息信号进行A / D转换; 和记录数据的重新组成部分。版权所有（C）2009，JPO＆INPIT

5. 发明专利

JP2008014699A Film thickness measuring method and film thickness measuring device in electrolysis processing 审中-公开
标题翻译：薄膜厚度测量方法和薄膜厚度测量装置在电解加工中的应用
公开(公告)号：JP2008014699A
公开(公告)日：2008-01-24
申请号：JP2006184277
申请日：2006-07-04
申请人： Tokyo Institute Of Technology , 国立大学法人東京工業大学
发明人： AMAYA KENJI
IPC分类号： G01B7/06 , C25D21/12
摘要： PROBLEM TO BE SOLVED: To provide a method and a device for monitoring especially film thickness while electrolysis processing without breaking the electrolysis processing object, and without affecting adverse effect to the electrolysis process by the measurement. SOLUTION: A magnetic sensor is arranged on the object to be electrolysis processed; the magnetic flux density distribution is measured; the surface current density of the electrolysis object is calculated from the flux density distribution; and the film thickness of the object is measured on real time while performing the electrolysis processing. By calculating the data of the flux density distribution data after the electrolysis processing, the film thickness of the object can be measured after the electrolysis processing. COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提供一种电解处理时特别是膜厚的方法和装置，而不破坏电解处理对象，并且不会影响通过测量对电解过程的不利影响。解决方案：磁性传感器布置在待电解处理的物体上; 测量磁通密度分布; 根据通量密度分布计算电解对象的表面电流密度; 并且在进行电解处理时实时地测量物体的膜厚度。通过计算电解处理后的通量密度分布数据的数据，可以在电解处理后测量物体的膜厚。版权所有（C）2008，JPO＆INPIT

6. 发明专利

JP2014162928A Method and apparatus for diagnosing electric protection of metal structure 审中-公开
标题翻译：用于诊断金属结构电气保护的方法和装置
公开(公告)号：JP2014162928A
公开(公告)日：2014-09-08
申请号：JP2013031723
申请日：2013-02-21
申请人： Tokyo Institute Of Technology , 国立大学法人東京工業大学 , Port & Airport Research Institute , 独立行政法人港湾空港技術研究所 , Nippon Corrosion Engineering Co Ltd , 日本防蝕工業株式会社
发明人： AMAYA KENJI , YONETANI NAOKI , AKIRA YOSHIKAZU , YAMAJI TORU , IIDA TOMOHIRO , TASHIRO KENKICHI
IPC分类号： C23F13/00 , B63B59/00 , B63B59/04 , G01N27/00 , G01N27/26
摘要： PROBLEM TO BE SOLVED: To provide a method and an apparatus for diagnosing electric protection of a metal structure, in which an amount of current in many sacrificial anodes is identified using a small number of potential measurement points and which can economically and efficiently diagnose an electric protection state of the metal structure as a result.SOLUTION: The method for diagnosing electric protection of a metal structure comprises: a first step S1 of measuring a potential of sea water in the vicinity of a metal structure as a potential measured value; a second step S2 of identifying a surface potential (identification value) and current density (identification value) of individual sacrificial anodes by first numerical analysis; a third step S3 of calculating a surface potential (estimate value) of each part and current value (estimate value) of the individual sacrificial anodes in the whole of the metal structure by second numerical analysis; a fourth step S4 of calculating an amount of consumption of the individual sacrificial anodes; and a fifth step S5 of comparing the surface potential, the current value and the amount of consumption of each part (estimate value) for the whole of the metal structure, with each predetermined reference value, and diagnosing an electric protection state of the metal structure.
摘要翻译：要解决的问题：提供用于诊断金属结构的电保护的方法和装置，其中使用少量的潜在测量点识别许多牺牲阳极中的电流量，并且可以经济地和有效地诊断电金属结构的保护状态。解决方案：用于诊断金属结构的电保护的方法包括：测量金属结构附近的海水的电位作为潜在测量值的第一步骤S1; 通过第一数值分析识别各个牺牲阳极的表面电位（识别值）和电流密度（识别值）的第二步骤S2; 通过第二数值分析来计算每个部件的表面电位（估计值）和各个牺牲阳极在整个金属结构中的当前值（估计值）的第三步骤S3; 计算各个牺牲阳极的消耗量的第四步骤S4; 以及第五步骤S5，将每个预定的参考值与整个金属结构的每个部分（估计值）的表面电位，电流值和消耗量进行比较，并且诊断金属结构的电保护状态。

7. 发明专利

JP2010047814A Current measurement method and current measurement device for sacrificial anode in electrically conductive liquid 审中-公开
标题翻译：电导液体中阳极阳极的电流测量方法和电流测量装置
公开(公告)号：JP2010047814A
公开(公告)日：2010-03-04
申请号：JP2008214768
申请日：2008-08-25
申请人： Hioki Ee Corp , Tokyo Institute Of Technology , 国立大学法人東京工業大学 , 日置電機株式会社
发明人： AMAYA KENJI , NAKAYAMA ATSUSHI
IPC分类号： C23F13/00 , B63B59/00
摘要： PROBLEM TO BE SOLVED: To provide a current measurement method and a current measurement device for a sacrificial anode in an electrically conductive liquid, for measuring a corrosive protection current generated from a sacrificial anode during electric corrosion protection without removing the sacrificial anode. SOLUTION: A cover having insulating properties is installed so as to cover the sacrificial anode, a current is applied between a counter electrode installed at the outside of the cover and a metal structure, the potential at the outside of the cover and the potential at the inside of the cover are measured, respectively, and further, the current value of the corrosion protection current is estimated from the potential at the outside of the cover and the current value of the current to be applied when the potential difference between the outside of the cover and the inside of the cover is zero. COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：为了提供用于导电液体中的牺牲阳极的电流测量方法和电流测量装置，用于测量在电腐蚀保护期间从牺牲阳极产生的腐蚀性保护电流而不去除牺牲阳极。
解决方案：安装具有绝缘特性的盖以覆盖牺牲阳极，电流施加在安装在盖的外部的对置电极与金属结构之间，盖的外部的电位和分别测量盖子内部的电位，此外，防腐蚀电流的当前值根据盖子外部的电位和要施加的电流的当前值来估计，盖子外侧和盖子内部为零。版权所有（C）2010，JPO＆INPIT

8. 发明专利

JP2009122050A Method and device for measuring object to be measured 审中-公开
标题翻译：用于测量对象的方法和装置
公开(公告)号：JP2009122050A
公开(公告)日：2009-06-04
申请号：JP2007298478
申请日：2007-11-16
申请人： Nissan Motor Co Ltd , Tokyo Institute Of Technology , 国立大学法人東京工業大学 , 日産自動車株式会社
发明人： AMAYA KENJI , SATO ISAO , MORI DAIKI , SUKEGAWA TAKAYA , KISHIMOTO KIKUO
IPC分类号： G01J5/48 , G01J5/62 , G01L11/02
摘要： PROBLEM TO BE SOLVED: To provide a method for measuring an object to be measured capable of accurately measuring the distribution of the temperature and/or the pressure of the object to be measured, and to provide a device thereof.
SOLUTION: This method for measuring an object to be measured comprises a stage for sensing, by means of an infrared light sensing means 30, infrared light which is radiated from an object 10 to be measured and is reflected by a mirror 20, disposed on a portion around the object 10. The method, further, comprises a stage for calculating the distribution of the temperature and/or pressure of the object 10, based on the infrared light detected.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：提供一种能够精确测量被测量物体的温度和/或压力分布的待测物体的测量方法，并提供其装置。解决方案：用于测量待测物体的方法包括用于通过红外光检测装置30检测从待测物体10辐射并被反射镜20反射的红外光的平台，设置在物体10周围的部分上。该方法还包括基于检测到的红外光计算物体10的温度和/或压力分布的台。版权所有（C）2009，JPO＆INPIT

9. 发明专利

JP2007046933A Fluorescent image-detecting method, fluorescent image-detecting substrate, fluorescent image detector, program and recording medium 审中-公开
标题翻译：荧光图像检测方法，荧光成像检测基板，荧光图像检测器，程序和记录介质
公开(公告)号：JP2007046933A
公开(公告)日：2007-02-22
申请号：JP2005229250
申请日：2005-08-08
申请人： Tokyo Institute Of Technology , 国立大学法人東京工業大学
发明人： AMAYA KENJI
IPC分类号： G01N21/64 , C12M1/00 , C12M1/34 , C12Q1/68 , G01N21/78 , G01N33/53 , G01N37/00
摘要： PROBLEM TO BE SOLVED: To provide a fluorescent image-detecting method using a gene chip capable of efficiently detecting a fluorescent image with high accuracy, a fluorescent image detecting substrate, a fluorescent image detector, a program and a recording medium.
SOLUTION: In the fluorescent image detecting method for making a plurality of the probe substances fixed on the fluorescent image detecting substrate react with a target substance, labeled with a fluorescent substance on the fluorescent image detecting substrate and measuring the fluorescent image of the fluorescence of the reaction product after reaction, to detect the reaction of the probe substances and the target substance, the respective probe substances are fixed on the fluorescent image detecting substrate in a geometrical pattern like state, and the correlation of the geometrical pattern with the fluorescence intensity is detected, with respect to the respective probe substances after reaction.
COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：解决问题：提供使用能够高精度有效地检测荧光图像的基因芯片的荧光图像检测方法，荧光图像检测基板，荧光图像检测器，程序和记录介质。解决方案：在用于使固定在荧光图像检测基板上的多个探针物质的荧光图像检测方法与在荧光图像检测基板上用荧光物质标记的目标物质反应并测量荧光图像的荧光图像反应后的反应产物的荧光，为了检测探针物质和目标物质的反应，各个探针物质以几何图案状态固定在荧光图像检测基板上，并且几何图案与荧光的相关性相对于反应后的各探针物质，检测强度。版权所有（C）2007，JPO＆INPIT

10. 发明专利

JP2013169389A Ultrasonic image composing apparatus, ultrasonic image composing method, and ultrasonic image composing processing program 审中-公开
标题翻译：超声波图像组合装置，超声图像组合方法和超声图像组合处理程序
公开(公告)号：JP2013169389A
公开(公告)日：2013-09-02
申请号：JP2012036115
申请日：2012-02-22
申请人： Tokyo Institute Of Technology , 国立大学法人東京工業大学
发明人： AMAYA KENJI , NAKAMURA NATSUMI
IPC分类号： A61B8/00
摘要： PROBLEM TO BE SOLVED: To provide an ultrasonic image composing apparatus which can compose an ultrasonic three-dimensional image of an examination object based on a plurality of two-dimensional ultrasonic tomograms, wherein the plurality of two-dimensional ultrasonic tomograms are obtained by putting a standard object having a specific shape between the examination object and an ultrasonic probe and then taking the ultrasonic tomograms of the examination object and the standard object.SOLUTION: An ultrasonic image composing apparatus includes: the ultrasonic probe for transmitting and accepting an ultrasonic wave; the standard object having a specific shape; an ultrasonic tomogram generator for generating the ultrasonic tomograms based on the ultrasonic wave accepted by the ultrasonic probe; and an ultrasonic image composing processor for composing the ultrasonic image of the examination object based on the plurality of the ultrasonic tomograms, wherein the plurality of the ultrasonic tomograms are generated by the ultrasonic tomogram generator and make copies of the examination object and the standard object in their respective ultrasonic tomograms.
摘要翻译：要解决的问题：提供一种能够基于多个二维超声波断层图像构成检查对象的超声三维图像的超声波图像合成装置，其中，通过放置多个二维超声波断层图像来获得多个二维超声波断层图像在检查对象和超声波探头之间具有特定形状的标准对象，然后取检查对象和标准对象的超声波断层图像。解决方案：超声波图像合成装置包括：用于发送和接收超声波的超声波探头; 标准物体具有特定的形状; 超声波断层图像发生器，用于基于由超声波探头接收的超声波产生超声波断层图像; 以及超声波图像构成处理器，用于根据所述多个所述超声波断层图像来构成所述检查对象的超声波图像，其中，所述超声波断层图像由所述超声波断层图像生成器生成，并且将所述检查对象和所述标准对象的副本各自的超声波断层图像。

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