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41. 发明专利

JP2015011029A 検出器の気密性パッケージング有权
标题翻译：气体包装检测器
公开(公告)号：JP2015011029A
公开(公告)日：2015-01-19
申请号：JP2014126823
申请日：2014-06-20
申请人：ゼネラル・エレクトリック・カンパニイ , General Electric Co
发明人： BENJAMIN JOHN OLECHNOWICZ
IPC分类号： G01N23/203
CPC分类号： G01T3/008 , G01T3/00 , H01J47/12
摘要：【課題】中性子検出器のような原子状粒子検出器において、信号強度を高め、且つ電圧破壊の可能性を減少させる。【解決手段】原子状粒子検出アセンブリ10が、原子状粒子を検出する1又は複数の検出器20を含み、検出器は、第一の動作圧力を有する第一のチェンバ22の内部に配置されている。原子状粒子検出アセンブリは、検出器を支持する接合装置を含み、接合装置は、第一の動作圧力と異なる第二の動作圧力を有する第二のチェンバを画定する。感知電子回路が検出器に取り付けられており、感知電子回路は接合装置の第二のチェンバの内部に格納されている。【選択図】図1
摘要翻译：要解决的问题：提供具有改善的信号强度和降低的电压击穿可能性的诸如中子探测器的原子粒子检测器。解决方案：原子粒子检测组件10包括检测原子粒子的一个或多个检测器20。检测器位于具有第一操作压力的第一室22内。原子粒子检测组件包括支撑探测器的连接装置。连接装置限定具有不同于第一操作压力的第二操作压力的第二室。感测电子装置附接到检测器，感测电子装置容纳在接合装置的第二腔室内。

42. 发明专利

JP5583489B2 Damage evaluation method and apparatus of the metal material 有权
公开(公告)号：JP5583489B2
公开(公告)日：2014-09-03
申请号：JP2010136752
申请日：2010-06-16
申请人：株式会社日立製作所 , 九州電力株式会社
发明人：順佐藤 , 晋也今野 , 国弘市川 , 章宏金谷 , 肇渡邊 , 淳一楠元
IPC分类号： G01N23/203
摘要： PROBLEM TO BE SOLVED: To provide a method capable of high accuracy damage evaluation for metallic material and residual life prediction as well.SOLUTION: A damage evaluation method for metallic material comprises a measurement step (S2) of measuring crystal orientation at a plurality of measuring points of a specimen of metallic material by an EBSP method, an analysis step (S3) of analyzing a misorientation function value that is defined by a crystal misorientation at each measuring point relative to a reference measuring point among the plurality of measuring points to obtain a damage parameter of the specimen, and evaluation steps (S4) and (S5) of evaluating a damage rate of the specimen based on the damage parameter of the specimen from the analysis in the analyzing step by reference to a correlation between damage rate and damage parameter previously obtained from an other specimen that is made of the same kind of metallic material as the specimen and has a known damage rate.

43. 发明专利

JP5489488B2 有权
公开(公告)号：JP5489488B2
公开(公告)日：2014-05-14
申请号：JP2009043605
申请日：2009-02-26
IPC分类号： G01N23/225 , G01N23/203 , H01J37/22

44. 发明专利

JP5473072B2 Methods for quantifying the crystal orientation difference accuracy, system, program, and program recording medium 有权
公开(公告)号：JP5473072B2
公开(公告)日：2014-04-16
申请号：JP2010166682
申请日：2010-07-26
申请人：株式会社原子力安全システム研究所
发明人：昌幸釜谷
IPC分类号： G01N23/203
摘要： PROBLEM TO BE SOLVED: To provide a method, system and computer program for quantizing an error, in other words, quantizing measurement accuracy in crystal orientation difference measurement, and to provide a computer program recording medium.SOLUTION: By calculating misorientation of different distance between measurement points from one piece of crystal orientation distribution data, a relation between the distance between measurement points and the misorientation is approximated linearly, the magnitude (Bn) of the misorientation is calculated by extrapolation when the measurement point distance is zero, and the magnitude Bn is used as an index of measurement accuracy. The quantitative indication of the measurement accuracy can be referred to when comparing a measurement result obtained in a different measurement condition (measurement accuracy) state. Further, the measurement condition can be adjusted so as to make the measurement accuracy coincident. In addition, the use of an index representative of misorientation that does not depend upon the distance of a measurement point can compare crystal orientation data of a different measurement condition (distance between measurement points).

45. 发明专利

JP2013032991A Residual stress measuring method for metallic material 审中-公开
标题翻译：金属材料残余应力测量方法
公开(公告)号：JP2013032991A
公开(公告)日：2013-02-14
申请号：JP2011169587
申请日：2011-08-02
申请人： Nippon Steel & Sumitomo Metal , 新日鐵住金株式会社
发明人： SAKURADA EISAKU
IPC分类号： G01L1/25 , G01N23/203
摘要： PROBLEM TO BE SOLVED: To provide a method for easily and accurately measuring a residual stress distribution of a metallic material at a metallic structure level in a whole area of a sample even if the sample is relatively large.SOLUTION: A method for measuring residual stress on a metallic material includes: a step S1 of acquiring a crystal orientation distribution from a backscattered electron diffraction pattern of a metallic material; a step S2 of calculating lattice strain between adjacent lattice points from the crystal orientation distribution; a step S3 of calculating plastic strain from dislocation density indicated by a difference in orientation in the crystal orientation distribution; a step S4 of calculating elastic strain from a difference between the lattice strain and the plastic strain; a step S5 of plastically deforming the metallic material by applying a predetermined load to it, executing steps S1 to S4 again to the plastically-deformed metallic material, and measuring a coordinate displacement on a surface of the plastically-deformed metallic material; and a step S6 of associating a coordinate before the plastic deformation with the coordinate after the plastic deformation on the basis of the coordinate displacement, and obtaining a difference in a residual stress component between before and after the plastic deformation.
摘要翻译：要解决的问题：提供一种即使样品相对较大，也可以容易且准确地测量样品的整个区域中的金属结构水平的金属材料的残余应力分布的方法。解决方案：用于测量金属材料上的残余应力的方法包括：从金属材料的背散射电子衍射图案获取晶体取向分布的步骤S1; 从晶体取向分布计算相邻格子点之间的晶格应变的步骤S2; 从晶体取向分布中的取向差异表示的位错密度计算塑性应变的步骤S3; 从晶格应变和塑性应变之间的差计算弹性应变的步骤S4; 通过对其施加预定的载荷使金属材料发生塑性变形的步骤S5，再次对塑性变形的金属材料执行步骤S1至S4，并测量塑性变形的金属材料的表面上的坐标位移; 以及步骤S6，其根据坐标位移将塑性变形前的坐标与塑性变形后的坐标相关联，得到塑性变形前后的残余应力分量的差。版权所有（C）2013，JPO＆INPIT

46. 发明专利

JP5127313B2 Inspection system 有权
公开(公告)号：JP5127313B2
公开(公告)日：2013-01-23
申请号：JP2007158413
申请日：2007-06-15
申请人：義久石黒
发明人：方紀羽場 , 宏興王 , 義久石黒 , 篤憲山口 , 重雄中東
IPC分类号： G01N23/04 , G01N23/203
摘要： PROBLEM TO BE SOLVED: To more efficiently perform the inspection of a material and to perform X-ray inspection with high precision. SOLUTION: A first inspection set includes an electric field radiation type electron emitter and an X-ray detector and is used in the inspection of the material. A second inspection set is equipped with an electric field radiation type annular electron emitter which annularly surrounds radially outside of an anode leading end part and the electron cutting-off members arranged at the positions on both sides of the X-ray irradiation direction of the annular electron emitter and used in X-ray inspection. COPYRIGHT: (C)2009,JPO&INPIT

47. 发明专利

JP2012013502A Method and device for ion scattering spectroscopy measurement 审中-公开
标题翻译：用于离子散射光谱测量的方法和装置
公开(公告)号：JP2012013502A
公开(公告)日：2012-01-19
申请号：JP2010149355
申请日：2010-06-30
申请人： Fujitsu Ltd , 富士通株式会社
发明人： ITANI TSUKASA
IPC分类号： G01N23/203
摘要： PROBLEM TO BE SOLVED: To provide an ion scattering spectroscopy measuring method which can appropriately determine irradiation quantity of probe particles.SOLUTION: The ion scattering spectroscopy measuring method comprises: a step for starting radiation of probe particles to a sample; a step for integrating the number of the probe particles scattered at the sample and detected to a first irradiation quantity and obtaining a first ion scattering spectrum; a step for integrating the number of the detected probe particles to a second irradiation quantity which is more than the first irradiation quantity and obtaining a second ion scattering spectrum; a step for calculating a first scattering ratio which is the number of the detected probe particles per unit irradiation quantity for a first energy range corresponding to a first element in the sample, based on the first ion scattering spectrum; a step for calculating a second scattering ratio for the first energy range based on the second ion scattering spectrum; and a step for determining whether the difference of the second scattering ratio from the first scattering ratio is small or not relative to the standard.
摘要翻译：要解决的问题：提供可以适当地确定探针颗粒的照射量的离子散射光谱测量方法。解决方案：离子散射光谱测量方法包括：将探针颗粒的辐射开始到样品的步骤; 将在样品上散布的探针颗粒的数量与第一照射量进行积分并获得第一离子散射光谱的步骤; 将检测出的探针粒子的数量与超过第一照射量的第二照射量进行积分并获得第二离子散射光谱的步骤; 基于第一离子散射光谱计算作为与样品中的第一元素对应的第一能量范围的每单位照射量的检测出的探针粒子的个数的第一散射比的步骤; 基于第二离子散射光谱计算第一能量范围的第二散射比的步骤; 以及用于确定第二散射比与第一散射比的差是否相对于标准小的步骤。版权所有（C）2012，JPO＆INPIT

48. 发明专利

JP2012002614A Damage evaluation method and apparatus for metallic material 有权
标题翻译：金属材料的损伤评估方法和装置
公开(公告)号：JP2012002614A
公开(公告)日：2012-01-05
申请号：JP2010136752
申请日：2010-06-16
申请人： Hitachi Ltd , Kyushu Electric Power Co Inc , 九州電力株式会社 , 株式会社日立製作所
发明人： SATO JUN , KONNO SHINYA , ICHIKAWA KUNIHIRO , KANETANI AKIHIRO , WATANABE HAJIME , KUSUMOTO JUNICHI
IPC分类号： G01N23/203
摘要： PROBLEM TO BE SOLVED: To provide a method capable of high accuracy damage evaluation for metallic material and residual life prediction as well.SOLUTION: A damage evaluation method for metallic material comprises a measurement step (S2) of measuring crystal orientation at a plurality of measuring points of a specimen of metallic material by an EBSP method, an analysis step (S3) of analyzing a misorientation function value that is defined by a crystal misorientation at each measuring point relative to a reference measuring point among the plurality of measuring points to obtain a damage parameter of the specimen, and evaluation steps (S4) and (S5) of evaluating a damage rate of the specimen based on the damage parameter of the specimen from the analysis in the analyzing step by reference to a correlation between damage rate and damage parameter previously obtained from an other specimen that is made of the same kind of metallic material as the specimen and has a known damage rate.
摘要翻译：要解决的问题：提供一种能够对金属材料进行高精度损伤评估和残余寿命预测的方法。解决方案：金属材料的损伤评估方法包括通过EBSP方法测量金属材料样品的多个测量点处的晶体取向的测量步骤（S2），分析取向差的分析步骤（S3）通过在各测量点处相对于基准测量点的晶体取向定义的功能值，以获得样本的损伤参数，以及评估步骤（S4）和（S5）评估损伤率参照分析步骤中分析的试样的损伤参数，根据先前从与样品相同种类的金属材料制成的其他样品获得的损伤率和损伤参数之间的相关性，并且具有已知伤害率。版权所有（C）2012，JPO＆INPIT

49. 发明专利

JP2011237221A Stress state estimation method for austenitic stainless steel 审中-公开
标题翻译：用于奥氏体不锈钢的应力状态估计方法
公开(公告)号：JP2011237221A
公开(公告)日：2011-11-24
申请号：JP2010107434
申请日：2010-05-07
申请人： Ihi Corp , 株式会社Ihi
发明人： KUBUSHIRO KEIJI , MORISHIMA KEIKO
IPC分类号： G01N3/32 , G01N23/203
摘要： PROBLEM TO BE SOLVED: To provide a stress state estimation method for an austenitic stainless steel, the method capable of highly accurately evaluating stresses acted on a fatigue crack.SOLUTION: The estimation method for a state comprises: a first step of performing a crack development testing on a specimen of an austenitic stainless steel; a second step of measuring a thickness of martensite generated on a fracture surface of a tested specimen employing EBSP (Electron Backscatter Diffraction Pattern) method; a third step of obtaining a correlation curve between a stress intensity factor and a thickness of the martensite at the crack; a fourth step of measuring a thickness of martensite generated in employing the EBSP method; and a fifth step of obtaining a stress intensity factor at the fatigue crack from the thickness of martensite in the evaluation object based on the correlation curve.
摘要翻译：要解决的问题：为了提供奥氏体不锈钢的应力状态估计方法，能够高精度地评估作用于疲劳裂纹的应力的方法。解决方案：一种状态的估计方法包括：对奥氏体不锈钢的试样进行裂纹展开试验的第一步骤; 使用EBSP（电子反散射衍射图案）法测定在试样的断裂面上产生的马氏体的厚度的第二工序; 获得裂纹时的应力强度因子和马氏体的厚度之间的相关曲线的第三步骤; 测量采用EBSP法生成的马氏体的厚度的第四步骤; 以及根据相关曲线从评估对象中的马氏体厚度获得疲劳裂纹的应力强度因子的第五步骤。版权所有（C）2012，JPO＆INPIT

50. 发明专利

JP4796254B2 X-ray array detector 有权
公开(公告)号：JP4796254B2
公开(公告)日：2011-10-19
申请号：JP2001527299
申请日：2000-09-20
申请人：ジョーダン・バレー・セミコンダクターズ・リミテッドJordan Valley Semiconductors Ltd.
发明人：グヴィルツマン，アモス , ドヴラット，アミ , メイザー，アイザック , ヨキン，ボリス
IPC分类号： G01N23/203 , G01N23/20 , G01T1/24 , G21K1/06
CPC分类号： G01N23/20 , G01T1/247

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