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    • 43. 发明专利
    • Cvd equipment, plasma formation method and solar cell
    • CVD设备,等离子体形成方法和太阳能电池
    • JP2005072102A
    • 2005-03-17
    • JP2003296748
    • 2003-08-20
    • Mitsubishi Heavy Ind Ltd三菱重工業株式会社
    • NODA SHOHEIKAWAMURA KEISUKETAKEUCHI YOSHIAKI
    • H05H1/46C23C16/505H01L21/205H01L31/04
    • Y02E10/50
    • PROBLEM TO BE SOLVED: To provide CVD equipment whose productivity improves when a thin film is formed. SOLUTION: The CVD equipment is provided with a vacuum container with which gaseous species are filled, a driving electrode arranged in the vacuum container and a ground electrode disposed in the vacuum container. A film creating substrate where the thin film is formed by plasma generated in the vacuum container is installed between the driving electrode and the ground electrode. The driving electrode includes a plurality of ladder electrodes, and a plurality of the ladder electrodes are disposed at equal intervals. Grooves (13) are made in a plurality of the ladder electrodes so that the thin films are uniformly formed. COPYRIGHT: (C)2005,JPO&NCIPI
    • 要解决的问题:提供当形成薄膜时生产率提高的CVD设备。 解决方案:CVD设备设置有填充气体的真空容器,布置在真空容器中的驱动电极和设置在真空容器中的接地电极。 通过在真空容器中产生的等离子体形成薄膜的成膜基板安装在驱动电极和接地电极之间。 驱动电极包括多个梯形电极,并且多个梯形电极以相等的间隔设置。 沟槽(13)制成多个梯形电极,使得薄膜均匀地形成。 版权所有(C)2005,JPO&NCIPI
    • 45. 发明专利
    • MEASURING APPARATUS BY LASER-INDUCED FLUORESCENCE METHOD
    • JPH08278251A
    • 1996-10-22
    • JP8015095
    • 1995-04-05
    • MITSUBISHI HEAVY IND LTD
    • DEGUCHI YOSHIHIRONODA SHOHEI
    • G01P5/18G01N21/64G01P13/00
    • PURPOSE: To provide an apparatus in which a density and a flow velocity can be measured simultaneously by a laser-induced fluorescence method and in which the flow velocity can be measured two-dimensionally. CONSTITUTION: A measuring apparatus is provided with means 1, 2 which output a dye pulsed laser beam at a wavelength corresponding to an electron energy difference, with a means 3 which branches the laser beam, with two cylindrical lenses 5a, 5b to which a plurality of linear reflection coatings have been executed and with a means 4 by which two striped sheet beams passed through the cylindrical lenses 5a, 5b are incident on a measuring field 12 at different angles. In addition, the measuring apparatus is provided with means 6, 7, 8 by which mesa-shaped light and dark parts formed on the measuring field 12 are measured and with a computing unit 10 by which the density of measured molecules is decided on the basis of the fluorescent intensity of the bright parts out of the measured mesh-shaped bright and dark parts and by which the flow velocity of the measured molecules and their movement direction are found two- dimensionally on the basis of the movement, in terms of time, of the crossing of the dark parts.
    • 46. 发明专利
    • SLAG THICKNESS MEASURING APPARATUS
    • JPH0882518A
    • 1996-03-26
    • JP21862594
    • 1994-09-13
    • MITSUBISHI HEAVY IND LTD
    • KURODA MASAHIRONODA SHOHEI
    • G01B17/02G01N29/00G01N29/18
    • PURPOSE: To achieve a higher accuracy by preventing the generation of a delay echo in an apparatus for measuring the thickness of a slag adhering to an internal wall of a furnace of a combustion furnace. CONSTITUTION: A slag 2 adheres to the furnace interior 10 side of a furnace wall 1, a retarding material 4 with a part thereof on the furnace interior 10 side tapered is inserted into the furnace wall 1 and an ultrasonic wave from an ultrasonic transmitter/receiver 5 is emitted from a probe 3. A part of the transmitted wave 7 of the ultrasonic wave is reflected at an end face 8 on the furnace interior side to generate an end face echo and further passes through the slag 2 to generate a slag surface echo being reflected totally on the furnace interior side surface 9 of the slag. The thickness of the slag 2 is measured from a time interval between both the echoes. But the tapered shape of the retarding material 4 eliminates reflection on the side in the course of the retarding material 4, thereby enabling accurate measurement without eventual generation of a delay echo nor overlapping of the echoes.
    • 49. 发明专利
    • METHOD AND DEVICE FOR CONCENTRATION MEASUREMENT BY LIF
    • JPH0743303A
    • 1995-02-14
    • JP18995393
    • 1993-07-30
    • MITSUBISHI HEAVY IND LTD
    • DEGUCHI YOSHIHIRONODA SHOHEI
    • G01N21/64
    • PURPOSE:To make concentration measurement possible by LIF(laser inductive fluorescence method) even in liquid combustion site, solid combustion site, etc. CONSTITUTION:The first and second pigment lasers 13a and 13b are oscillated by an excitation pulse laser 11, and two laser lights of different wave lengths are outputted with a slight time lag. The two laser lights are, after combination, applied on a measurement field 18 through a beam expander. At this time, two excited to-be-measured molecule and fluorescence occurring from a background part are imaged with two CCD cameras 20a and 20b which are synchronized with the pigment lasers 13a and 13b. At that time, the CCD camera 20a images the background light and fluorescence from the to-be-measured molecule and the other camera 20b images only the background light. By subtracting the output of one CCD camera from that of the other, only the fluorescence emitted from the to-be-measured molecule is extracted, so that two dimensional concentration distribution of the to-be-measured molecule is obtained.