专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

31. 发明专利

JP4384834B2 High stability spin stand platform 有权
公开(公告)号：JP4384834B2
公开(公告)日：2009-12-16
申请号：JP2001540766
申请日：2000-11-21
申请人：ドーバーインストルメントコーポレイション
发明人：フランク．カットルズーラ , フィリップエム．グリーン
IPC分类号： F16C29/02 , G11B5/455 , B23Q1/38 , G11B5/55 , G11B25/04 , G11B33/10
CPC分类号： B23Q1/38 , G11B5/455 , G11B5/5552 , G11B25/043 , G11B33/10

32. 发明专利

JP4371885B2 Anomaly detection method and the magnetic recording and reproducing apparatus of the vertical magnetic head 有权
公开(公告)号：JP4371885B2
公开(公告)日：2009-11-25
申请号：JP2004108073
申请日：2004-03-31
申请人：株式会社東芝
发明人：和人下村 , 祐介大日向
IPC分类号： G11B5/39 , G11B5/455

33. 发明专利

JP2009266358A Method for measuring write width and/or read width of composite magnetic head and measuring device 有权
标题翻译：用于测量写入宽度和/或读取复合磁头和测量装置的宽度的方法
公开(公告)号：JP2009266358A
公开(公告)日：2009-11-12
申请号：JP2009056170
申请日：2009-03-10
申请人： Hitachi High-Technologies Corp , 株式会社日立ハイテクノロジーズ
发明人： MOCHIZUKI HIDEKI , SAKURAI YOSHIHIRO , SUZUKI TOSHIAKI , YAMAMOTO YUKIO
IPC分类号： G11B5/455 , G11B5/00 , G11B5/39 , G11B5/65
CPC分类号： G11B5/455 , G11B5/59627
摘要： PROBLEM TO BE SOLVED: To provide a method for measuring a write width/a read width of a composite magnetic head for easily measuring a write sensitive width of a write head and/or a read sensitive width of a read head by reading and writing data with respect to a DTM, etc., having a track width narrower than a write sensitive width of a write head and to provide a measuring device using the method.
SOLUTION: In the method for measuring a write width and/or a read width of a composite magnetic head, a read characteristics profile having a peak as a read voltage characteristics for a moving distance is obtained by writing a test data in a designated track of eccentric tracks of such as a DTM by the composite magnetic head (write head) in a prescribed track, reading the test data from the designated track by moving the composite magnetic head (read head) in a radial direction of a disk and crossing the designated track and a write sensitive width or a read sensitive width is calculated on the basis of the read characteristics profile.
COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：提供一种用于测量复合磁头的写入宽度/读取宽度的方法，用于通过读取来容易地测量读取头的写入敏感宽度和/或读取敏感宽度并且相对于DTM等写入具有比写入头的写入敏感宽度窄的轨道宽度的数据，并且使用该方法提供测量装置。解决方案：在用于测量复合磁头的写入宽度和/或读取宽度的方法中，具有作为移动距离的读取电压特性的峰值的读取特性曲线通过将测试数据写入到通过复合磁头（写入头）在规定的轨迹中指定诸如DTM的偏心轨道的轨迹，通过沿着盘的径向方向移动复合磁头（读取头）从指定轨道读取测试数据，以及基于读取特性曲线来计算穿过指定轨道并写入敏感宽度或读取敏感宽度。版权所有（C）2010，JPO＆INPIT

34. 发明专利

JP2009266341A Characteristic evaluating method and characteristic evaluating apparatus for magnetic head 审中-公开
标题翻译：磁头特性评估方法及特征评估装置
公开(公告)号：JP2009266341A
公开(公告)日：2009-11-12
申请号：JP2008117360
申请日：2008-04-28
申请人： Fujitsu Ltd , 富士通株式会社
发明人： AKEMA SHIGERU
IPC分类号： G11B5/455
CPC分类号： G11B5/455 , G11B5/4555
摘要： PROBLEM TO BE SOLVED: To provide a characteristics evaluating apparatus for a magnetic head which can accurately and easily evaluate the resistance of a magnetic head to an external magnetic field.
SOLUTION: The characteristics evaluating apparatus includes: a magnetic field generating apparatus 14 for generating a magnetic field to be applied to a head slider; a rotating support mechanism 16 that rotates and supports the head slider between a position where the magnetic field of the magnetic field generating apparatus and a hard bias magnetic field of the head slider are antiparallel and a position where an air-bearing surface of the head slider is perpendicular; an external magnetic field applying means 17, 18 for applying a static magnetic field to the head slider using the magnetic field generating apparatus 14 at the position where the magnetic field of the magnetic field generating apparatus and the hard bias magnetic field of the head slider are antiparallel; and a means 17, 21 for applying an alternating magnetic field onto the head slider using the magnetic field generating apparatus 14, and carrying out measurement of ρH at the position where the air-bearing surface of the head slider is perpendicular to the direction of the magnetic field of the magnetic field generating apparatus.
COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：提供一种能够精确且容易地评估磁头与外部磁场的电阻的磁头特性评价装置。特征评估装置包括：磁场产生装置14，用于产生要施加到磁头滑块的磁场; 旋转支撑机构16，其在磁场发生装置的磁场与磁头滑动器的硬偏置磁场的位置之间旋转并支撑磁头滑块，并且磁头滑动器的空气轴承表面的位置是反平行的是垂直的外部磁场施加装置17,18，用于在磁场产生装置的磁场和磁头滑动器的硬偏置磁场的位置处使用磁场产生装置14向磁头滑块施加静态磁场反平行以及用于使用磁场产生装置14向磁头滑动器施加交变磁场的装置17,21，并且在磁头滑块的空气轴承表面垂直于磁场产生装置的磁场。版权所有（C）2010，JPO＆INPIT

35. 发明专利

JP2009211798A Method for inspecting thin film magnetic heads 审中-公开
标题翻译：检查薄膜磁头的方法
公开(公告)号：JP2009211798A
公开(公告)日：2009-09-17
申请号：JP2008325376
申请日：2008-12-22
申请人： Tdk Corp , Tdk株式会社
发明人： SHIMAZAWA KOJI
IPC分类号： G11B5/455 , G11B5/39
CPC分类号： G01R33/1207
摘要： PROBLEM TO BE SOLVED: To satisfactorily simulate an alternating magnetic field of high frequency in a method of inspecting a magnetic property of a thin-film magnetic head.
SOLUTION: (1) A magnetic field application bar B' is arranged opposite to a row bar B so that a magnetic pole chip part of a first magnetic field application element 71 faces a corresponding magnetic field sensor section of a thin-film magnetic head, and a magnetic pole chip part of a second magnetic field application element 72 faces a corresponding lapping guide L, (2) the magnetic field application bar B' and the row bar B are moved relative to each other so that the output voltage of at least one lapping guide L becomes the largest by applying the magnetic field to the lapping guide L from a second magnetic field application element 72 while supplying electricity to the lapping guide L, and (3) the alternating magnetic field is applied, while applying electricity to the magnetic field sensor section, to the magnetic field sensor section of the thin-film magnetic head from a first magnetic field application element 71 while changing magnetic field strength, and a relationship between the intensity of the magnetic field and an output voltage of a magnetic field sensor section is obtained.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：为了在检查薄膜磁头的磁特性的方法中令人满意地模拟高频交变磁场。解决方案：（1）磁棒施加杆B'与行杆B相对地布置，使得第一磁场施加元件71的磁极片部分面对相应的薄膜的磁场传感器部分磁头和第二磁场施加元件72的磁极片部分面对相应的研磨引导件L，（2）磁场施加杆B'和排条B相对于彼此移动，使得输出电压通过从第二磁场施加元件72向研磨引导件L施加磁场，同时向研磨导向件L供电，并且（3）施加交变磁场，同时施加至少一个研磨导轨L的最大值电磁力传感器部分的电力，同时改变磁场强度，从第一磁场施加元件71到薄膜磁头的磁场传感器部分，以及关系式减弱磁场强度并获得磁场传感器部分的输出电压。版权所有（C）2009，JPO＆INPIT

36. 发明专利

JP2009204491A Method of monitoring probe pin wear 审中-公开
标题翻译：探测引脚的磨损方法
公开(公告)号：JP2009204491A
公开(公告)日：2009-09-10
申请号：JP2008047666
申请日：2008-02-28
申请人： Fujitsu Ltd , 富士通株式会社
发明人： ITO FUMIYUKI , SAITO SHINICHI
IPC分类号： G01R1/06 , G01R31/00 , G11B5/455
摘要： PROBLEM TO BE SOLVED: To automatically detect the wear of a probe pin in a normal test measuring process concerning a method of monitoring probe pin wear.
SOLUTION: The method of monitoring probe pin wear includes: a process for measuring to repeat a resistant value of a body to be inspected in the predetermined number of times by contacting the probe pin on a measuring terminal part of the body of to be inspected; a process for obtaining measuring irregularity of the measured resistant value; and an irregularity determining process for determining whether the obtained measured irregularity is predetermined regulation value and above or not.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：在通常的测试过程中自动检测探针的磨损，涉及到探针引脚磨损的监测方法。检测探头针磨损的方法包括：通过使探针在身体的测量端部上接触到测量来重复要检查的身体的电阻值在预定次数的方法被检查用于获得测量的电阻值的测量不规则性的过程; 以及用于确定所获得的测量不规则性是否为预定调节值以上的不规则性确定处理。版权所有（C）2009，JPO＆INPIT

37. 发明专利

JP2009199684A Magnetic field applying device 审中-公开
标题翻译：磁场应用器件
公开(公告)号：JP2009199684A
公开(公告)日：2009-09-03
申请号：JP2008041705
申请日：2008-02-22
申请人： Hitachi Computer Peripherals Co Ltd , 日立コンピュータ機器株式会社
发明人： ABE MAKOTO , MATSUOKA HIROSHI , WADA TATSUHIKO
IPC分类号： G11B5/455
摘要： PROBLEM TO BE SOLVED: To provide a magnetic field applying device capable of uniformly generating an intense magnetic field in a wide range with reduced power.
SOLUTION: In the magnetic field applying device, recessed parts of two cores whose cross sectional surfaces have U-shapes are freely movably constituted in a position bonded to each other and a position separated from each other in a direction opposed to each other. In the position bonded to each other, tip parts of one sides of U-shaped two sides nearly parallel to each other come in contact with each other and the other sides do not come in contact with but come close to each other. Thereby, the intense magnetic field can be generated with reduced power. Intense magnetic field can be uniformly applied to a wide range of a long bar-shaped magnetic field applied object by providing the magnetic field applied object on the tip part of one side of the sides coming close to each other. Thereby, measurement of many elements at a time is enabled when resistance is measured by application of a magnetic field.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：提供能够在功率降低的情况下在宽范围内均匀地产生强磁场的磁场施加装置。解决方案：在磁场施加装置中，横截面为U形的两个芯的凹部自由移动地构成在彼此接合的位置和彼此相对的方向上彼此相对的位置。在彼此接合的位置上，相互平行的U形两侧的一侧的尖端部彼此接触，另一侧不接触而彼此接近。因此，可以以降低的功率产生强磁场。通过在彼此靠近的侧面的一侧的尖端部分上设置磁场施加对象，可以将强磁场均匀地施加到宽的棒状的磁场施加物体。因此，当通过施加磁场测量电阻时，能够一次测量许多元件。版权所有（C）2009，JPO＆INPIT

38. 发明专利

JPWO2007116472A1 ヘッド試験装置およびヘッド試験解析システム审中-公开
公开(公告)号：JPWO2007116472A1
公开(公告)日：2009-08-20
申请号：JP2008509623
申请日：2006-03-31
申请人：富士通株式会社
发明人：哲也椋 , 哲也椋 , 高田　英治 , 英治高田
IPC分类号： G01M99/00 , G11B5/455
CPC分类号： G11B5/455 , G11B5/4555
摘要：ヘッドが記録媒体にアクセスする際に出力するアクセス信号を外部装置に適切かつ容易に取り込ませる。磁気ヘッドが搭載される搭載部130と、搭載部130に搭載された磁気ヘッドに試験用アクセスを実行させるヘッド操作部1511と、試験用アクセスの際に磁気ヘッドが出力する試験用アクセス信号を入手し、その入手した試験用アクセス信号が所定基準を満たしているか否かを判定することでその磁気ヘッドを試験する試験部1512と、試験用アクセス信号を入手し、その入手した試験用アクセス信号をこのヘッド試験装置の外部に出力する信号出力部1513と、信号出力部1513が出力した試験用アクセス信号がこのヘッド試験装置の外部で試験用アクセスに同期して取り込まれるのに使用される基準信号を出力する基準出力部1521とを備えた。

39. 发明专利

JP2009162490A Charged amount evaluation element 审中-公开
标题翻译：收费金额评估单位
公开(公告)号：JP2009162490A
公开(公告)日：2009-07-23
申请号：JP2007339115
申请日：2007-12-28
申请人： Fujitsu Ltd , 富士通株式会社
发明人： MARUYAMA KAZUNORI , ENDO YASUHIRO , OSHIMA YOSHITAKA , WAKANA SHINICHI
IPC分类号： G01R29/24 , G11B5/455
摘要： PROBLEM TO BE SOLVED: To provide a charged amount evaluation element capable of evaluating the amount of charge transferred through the surface of a workpiece with high sensitivity and high resolution, in a manufacturing process of an electronic device such as a magnetic head.
SOLUTION: In this charged amount evaluation element for evaluating quantitatively the charged amount on the surface of the workpiece in a conductive thin film forming device, at least the surface thereof is constituted of counter electrodes provided on an insulating substrate and a wiring part for connecting each electrode, and an insulating protection film having an opening part is formed on the counter electrodes.
COPYRIGHT: (C)2009,JPO&INPIT

40. 发明专利

JP4286711B2 Apparatus and method for measuring the magnetic field of the recording head 有权
公开(公告)号：JP4286711B2
公开(公告)日：2009-07-01
申请号：JP2004136459
申请日：2004-04-30
申请人：富士通株式会社
发明人：隆久上野 , 誠吾井垣 , 亨堀江 , 巌岡本
IPC分类号： G11B5/455 , G11B5/00 , G11B20/10 , G11B27/36
CPC分类号： G11B27/36 , G11B5/455 , G11B2005/001 , G11B2220/2516 , G11B2220/2525

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式