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    • 32. 发明专利
    • EVALUATION SYSTEM FOR DEGREE OF DAMAGE
    • JPH02276953A
    • 1990-11-13
    • JP9733889
    • 1989-04-19
    • HITACHI LTD
    • ANZAI HIDEYAURAYAMA YOSHINAOFUKAI AKIRAKUNIYA JIRO
    • G01N23/227G01N21/00G01R33/035
    • PURPOSE:To establish the system which detects exoelectrons of an actual machine and predicts the degree of fatigue damage of an actual machine structure without destruction by gathering emitted exoelectrons by a current collecting plate and detecting a magnetic field which is produced with a fine flowing current. CONSTITUTION:A light source 10 is fixed to a container 9 which is installed at a part to be measured and its light passes through a lens 11 to irradiate a specific range to be measured. Consequently, the emitted exoelectrons are gathered to a current collecting electrode 4 to generate the fine current. A magnetic shield 3 produces the magnetic field by a coil 5 which is shielded from an external magnetic field with the fine current. This magnetic field is gathered by a superconductor-made pickup coil 12 which is cooled by a low- temperature container 14 and sent to a superconducting quantum interference device (SQUID) 7 and quantified by a magnetic measuring instrument 8 and then a microcomputer 15 takes an analysis and compares the result with the master curve between the amount of emitted electrons and the degree of damage which is given in advance to detect the degree of damage of the measured part without destruction.