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    • 21. 发明专利
    • ATOMIC ABSORPTION ANALYSIS METHOD AND APPARATUS
    • JP2000275172A
    • 2000-10-06
    • JP7963199
    • 1999-03-24
    • NIPPON KOKAN KK
    • AKIYOSHI TAKANORICHINO ATSUSHISUGIMOTO KAZUMASAISHIDA TOMOHARU
    • G01N1/28G01N21/31
    • PROBLEM TO BE SOLVED: To hold conventional characteristics of an atomic absorption method while expanding a measuring concn. range by irradiating the atomic layer of a sample with laser beam with a specific wavelength and measuring the presence amt. of an element to be analyzed in the sample from the attenuation quantity of the intensity of the transmitted laser beam. SOLUTION: The beam emitted from a wavelength variable laser 1 is converted to beam with a proper diameter by an incident optical system 2 and this beam passes through the atomic vapor layer 4 formed in an atomizing part 3 to transmit through a spectroscope or optical filter 6 through a photometric optical system 5 and the intensity thereof is measured by an intensity-of-light detector 7 such as a photomultiplier. At this time, the wavelength of the wavelength variable laser 1 is set to that of laser beam with a wavelength half value width of 0.001-0.002 nm wherein an output wavelength is adjusted to the center position ±0.001 nm of an element to be analyzed entered in literature to be known and this wavelength beam is absorbed by the atomic vapor layer 4. On the basis of the relation between the absorption quantity and concn. of a sample with known concn., the concn. of the sample is calculated from the absorption quantity of the sample to be analyzed. By this constitution, the narrowness of a measuring concn. range being a defect of an atomic absorption method is eliminated.
    • 26. 发明专利
    • METHOD AND DEVICE FOR ONLINE ANALYSIS OF MOLTEN METAL
    • JPH11108829A
    • 1999-04-23
    • JP28114397
    • 1997-09-30
    • NIPPON KOKAN KK
    • AKIYOSHI TAKANORISAKASHITA AKIKOISHIBASHI YOICHICHINO ATSUSHIMAEKAWA TOSHIYA
    • G01N33/20G01N21/31
    • PROBLEM TO BE SOLVED: To permit the analysis of the concentration of an element in molten metal by irradiating the surface of the molten metal with both laser light with an output wavelength adjusted to the absorption wavelength of the element and reference laser light and measuring a reference wavelength in reflected light and the laser light intensity of the absorption wavelength. SOLUTION: Laser light with a reference wavelength generated by a device 12 for emitting laser light with a reference wavelength is condensed by a condensing lens 2 via a beam splitter 13 and is brought to be incident onto an optical fiber 3 together with laser light with an absorption wavelength generated by a device 1 for emitting laser light with an absorption wavelength. The laser light with a reference wavelength and laser light with an absorption wavelength which come out of the other end of the optical fiber 3 are passed through a metallic vapor phase 8 and reflected at the surface of molten metal 9. The reflected laser light is passed through the optical fiber 3 and guided to a photo detector 6. In the photo detector 6, the intensities of the laser light with a reference wavelength and the laser light with an absorption light at each wavelength are measured to obtain the concentration of an element to be analyzed in the metallic vapor phase 8.