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    • 11. 发明专利
    • Method for comparing charactristic curve of semic0nductor
    • 比较半导体特征曲线的方法
    • JP2006278891A
    • 2006-10-12
    • JP2005098431
    • 2005-03-30
    • Agilent Technol Incアジレント・テクノロジーズ・インクAgilent Technologies, Inc.
    • ISHIZUKA KOJI
    • H01L21/66H01L21/02
    • G01R31/31912G01R31/318314
    • PROBLEM TO BE SOLVED: To facilitate the speedy grasp of a test result and a device-specific trend. SOLUTION: An analysis system of mesurements of a semiconductor element comprises a display means 30 for displaying the measurements stored in a storing means 20 as a graph in an individual window, an input means 10 for selecting several windows, a mesurement rendering means 210 for storing the information of types of the graphs displayed on several individual windows selected and dislaying the graph of the measuements; and a computing means 40 for laying a position of a graph axis in the case of the same graph type, making transparent only the inside of the display area of one graph and making transparent at least the inside of the display area of the other graph, displaying the one graph as a top window on the display device 30, and making opaque at least the inside of the display area of the graph in the bottom window to lay the other graphs under the one graphs. COPYRIGHT: (C)2007,JPO&INPIT
    • 要解决的问题:为了方便快速掌握测试结果和设备特定的趋势。 解决方案:半导体元件的测量分析系统包括显示装置30,用于将存储在存储装置20中的测量作为单独窗口中的图形显示,用于选择几个窗口的输入装置10,测量渲染装置 210,用于存储在所选择的几个单独的窗口上显示的图形的类型的信息,并且剔除测量的图形; 以及用于在相同图形类型的情况下放置图形轴的位置的计算装置40,使得仅透明一个图形的显示区域的内部并至少透明另一个图形的显示区域的内部, 将一个图形显示为显示装置30上的顶部窗口,并且在底部窗口中至少使图形的显示区域的内部不透明,以将其他图形放置在一个图形下。 版权所有(C)2007,JPO&INPIT
    • 15. 发明专利
    • Signal generating apparatus and serial data pattern generating method
    • 信号发生装置和串行数据模式生成方法
    • JP2009204610A
    • 2009-09-10
    • JP2009021907
    • 2009-02-02
    • Tektronix Internatl Sales Gmbhテクトロニクス・インターナショナル・セールス・ゲーエムベーハー
    • MURALIDHARAN A KARAPATTUDESAI SAMPATHKUMAR R
    • G01R27/28
    • G01R31/31917G01R31/31912
    • PROBLEM TO BE SOLVED: To perform Inter-Symbol Interference (ISI) scaling on an S-parameter touchstone file to generate ISI scaling to a serial data pattern generated by direct digital synthesis.
      SOLUTION: A user sets a data rate required for a serial data pattern, a voltage amplitude, and a parameter sheet like an encoding system via a user interface of a signal generating apparatus. An ISI scaling value is selected and applied to the S-parameter touchstone file indicating a transmission path. A serial data pattern parameter and the ISI scaling value used together with the S-parameter touchstone file are compiled to generate a digital data waveform recording file. Digital data is converted into an analog serial data pattern accompanied by an ISI scaling effect by adding the digital data waveform recording file to a waveform generating circuit.
      COPYRIGHT: (C)2009,JPO&INPIT
    • 要解决的问题:在S参数试金石文件上执行符号间干扰(ISI)缩放,以生成通过直接数字合成生成的串行数据模式的ISI缩放。 解决方案:用户通过信号发生设备的用户界面设置串行数据模式,电压幅度和参数表所需的数据速率,如编码系统。 选择ISI缩放值并将其应用于指示传输路径的S参数测绘文件。 编译串行数据模式参数和与S参数试金石文件一起使用的ISI缩放值,以生成数字数据波形记录文件。 通过将数字数据波形记录文件添加到波形发生电路,数字数据被转换成伴随ISI缩放效果的模拟串行数据模式。 版权所有(C)2009,JPO&INPIT
    • 16. 发明专利
    • High speed channel selector switch
    • 高速通道选择开关
    • JP2005044800A
    • 2005-02-17
    • JP2004209994
    • 2004-07-16
    • Agilent Technol Incアジレント・テクノロジーズ・インクAgilent Technologies, Inc.
    • ALI MOHAMMED ERSHAD
    • H01H19/00G01R31/28G01R31/319H01H9/54H01H19/02H01H19/54H04B17/00
    • H04B17/0082G01R31/31905G01R31/31912Y10T307/74
    • PROBLEM TO BE SOLVED: To provide a compact means for accurately evaluating an optoelectronics system. SOLUTION: The meas has a high speed channel selector switch (300). The switch (300) has a first unit (400) having a plurality of contacts (410) operable to electrically connect to a plurality of high-speed data lines (310) to be inspected. The first unit (400) has an additional contact (415) operable to electrically connect to a signal line (320). The switch (300) has a second unit (500) operable to selectively and electrically connect to one of the plurality of contacts (410) of the fist unit (400) to the additional contact (415) of the first unit (400). The second unit (500) electrically connects the remaining contacts (410) of the first unit (400) to each terminal impedance (530). COPYRIGHT: (C)2005,JPO&NCIPI
    • 要解决的问题:提供一种用于精确评估光电子系统的紧凑手段。

      解决方案:meas具有高速通道选择开关(300)。 开关(300)具有第一单元(400),该第一单元具有多个触点(410),该多个触点可操作以电连接到待检查的多个高速数据线(310)。 第一单元(400)具有可操作以电连接到信号线(320)的附加触点(415)。 开关(300)具有第二单元(500),其可操作以选择性地和电连接到第一单元(400)的多个触点(410)中的一个到第一单元(400)的附加触点(415)。 第二单元(500)将第一单元(400)的剩余触点(410)电连接到每个端子阻抗(530)。 版权所有(C)2005,JPO&NCIPI

    • 17. 发明专利
    • Method and system for re-display of input/output signal waveform on inspected device
    • 输入/输出信号波形检测检测方法及系统
    • JP2004061508A
    • 2004-02-26
    • JP2003278215
    • 2003-07-23
    • Agilent Technol Incアジレント・テクノロジーズ・インクAgilent Technologies, Inc.
    • SHEN HSIU-HUANJORDAN STEPHEN DENNISKRECH ALAN S JR
    • G01R13/28G01R13/02G01R31/28G01R31/3177G01R31/319
    • G01R31/3177G01R13/0263G01R31/31912
    • PROBLEM TO BE SOLVED: To provide a method for reacquiring input/output signal waveforms of an inspected device.
      SOLUTION: In the method, first a waveform of input/output signals for the inspected device is displayed. Data of input/output signals are collected according to a first data acquisition mechanism. The waveform of input/output signals is displayed using these acquired data. Users are provided with an interface for selecting a part of the waveform to be reacquired by using a second data acquisition mechanism. Reconstruction of data is performed using this second data acquisition mechanism. Waveforms of input/output signals are redisplayed. Then data acquired by using the second data acquisition mechanism are used to display a part of waveform selected for reacquisition, while data acquired in accordance with the first data acquisition mechanism are used to display remaining part of the waveform nonselected for reacquisition.
      COPYRIGHT: (C)2004,JPO
    • 要解决的问题:提供一种用于重新获取被检查装置的输入/输出信号波形的方法。

      解决方案:在该方法中,首先显示被检查设备的输入/输出信号的波形。 根据第一数据采集机制收集输入/输出信号的数据。 使用这些采集的数据显示输入/输出信号的波形。 为用户提供了一个接口,用于通过使用第二数据采集机制来选择要重新获取的波形的一部分。 使用该第二数据采集机构进行数据重构。 重新显示输入/输出信号的波形。 然后,使用第二数据采集机构获取的数据用于显示选择用于重新采集的波形的一部分,而根据第一数据采集机制获取的数据用于显示未选择用于重新采集的波形的剩余部分。 版权所有(C)2004,JPO