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    • 15. 发明专利
    • MANUFACTURE OF SEMICONDUCTOR LASER ELEMENT
    • JPS57149785A
    • 1982-09-16
    • JP17397281
    • 1981-10-29
    • SHARP KK
    • YAMAMOTO SABUROUKURATA YUKIOMATSUI KANEKIKOMURO AKIRAYANO MORICHIKA
    • H01L21/308H01L21/208H01S5/00H01S5/223
    • PURPOSE:To improve element characteristics and laser output characteristics for long life by a method wherein striped structure is provided for the inside of crystal by utilizing a high-concentration impurity contained in an ohmic contact layer for electrode formation by using a layer solid phase diffusion technique. CONSTITUTION:The first layer n-Ga1-xAlxAS13, the second layer n-GaAS 14 becoming an active layer, the third layer p-Ga1-xAlxAS15, the fourth layer n- GaAs 16 are successively stacked on an n-GaAS substrate 12 to form double heter junction structure. In the layer 16, the region becoming a filament section is etched in V-notch type grooved shape to form a V notch filament section 17 and furthermore, the fifth layer p -GaAS 18 is staked on the layer 16. And a dopant diffusion layer 19 in which an impurity doped to the layer 18 is diffused in solid phase by thermal treatment is formed at the part locating around the in terface of the layer 18. The region formed the layer 19 is converted from n type to p type by the induction of a p type impurity and becomes a micro region because the layer 19 is formed by diffusion from right below the vertical angle section of the bottom of the V notch groove.
    • 16. 发明专利
    • SELECTION METHOD OF SEMICONDUCTOR LASER DEVICE
    • JPS54130889A
    • 1979-10-11
    • JP3906578
    • 1978-03-31
    • SHARP KK
    • TAKENAKA TAKUOHAYASHI HIROSHIKOMURO AKIRAMURATA KAZUHISAYANO MORICHIKA
    • H01L21/66H01S5/00
    • PURPOSE:To improve a selection probability by using the etch-pit method or the X- ray tomograph method to form a pattern corresponding to the dislocation density which exists in a crystal grown layer and using a microscope to observe this pattern. CONSTITUTION:N-type GaAs substrate 1 having (100) face is used as a laser substrate, and N-type Ga0.7Al0.3As layer 2, p-type or N-type GaAs active layer 3, p- type Ga0.7Al0.3As layer 4 and p-type GaAs layer 5 are laminated on substrate 1 and are grown epitaxially in liquid phase. Next, melting KOH is applied onto top layer 5 to expose etc-hpit 11 corresponding to dislocation of the crystal surface to the surface, and insulating film 6 such as SiO2 and Si3N4 is caused to adhere to all the surface of layer 5. After that, stripe part 21 is provided in film 6, and Zn for ohmic contact is diffused into layer 5 through this part 21, and p-side electrode 8 and N- side electrode 7 are caused to adhere to the surface and the reverse face. Next, the substrate is cut off along the cleavage face, and devices are observed individually through electrode 8 and film 6 by a microscope and are cheked for goodness on a basis of the pit generation state.
    • 17. 发明专利
    • SEMICONDUCTOR LASER DEVICE
    • JPS54114091A
    • 1979-09-05
    • JP2109278
    • 1978-02-24
    • SHARP KK
    • KURATA YUKIOYANO MORICHIKAYAMAMOTO SABUROUMATSUI KANEKIKOMURO AKIRA
    • G11B7/125H01S5/00H01S5/026
    • PURPOSE:To ensure the high SN signal detection by combining the interaction between the optical driving system and the information detection system and then securing the self-amplification for the detection signal by the synergetic effect of the both systems. CONSTITUTION:The n-layer 2, p-layer 3 of GaAs plus electrode 4 are laminated on copper state 1, and laser element 7 and photo detector 8 are divided at groove 6. The p-layer of the photo detector is converted to n-layer 9, and the resistance value varies with irradiation of the light. When switch 10 is closed, the laser beam is emitted. And the light given from the groove side is received at detector 8, and the light emitted from the opposite side is irradiated to, for example, the optical disk and then turned to the reflected light corresponding to the disk information to be put into element 7 again. With the reincidence of the light, the laser output of elememt 7 increases, and the electric resistance of detector 8 decreases to layer 9. Thus, the driving current of element 7 increases by constant power source 11, and then the read signal of the reflected light corresponding to the disk information is amplified by the positive feedback. And the binary state is obtained from the current value of detector 12 by the presence or absence of the reflected light.