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91. 发明专利

JP2013019696A Biological measurement apparatus and image formation method 有权
标题翻译：生物测量装置和图像形成方法
公开(公告)号：JP2013019696A
公开(公告)日：2013-01-31
申请号：JP2011151086
申请日：2011-07-07
申请人： Univ Of Tsukuba , 国立大学法人筑波大学 , Hamamatsu Photonics Kk , 浜松ホトニクス株式会社
发明人： KUDO HIROYUKI , SAITO NAOYA , UEDA YUKIO , YOSHIMOTO KENJI , YAMASHITA YUTAKA
IPC分类号： G01N21/17 , A61B6/03 , A61B8/00 , G01N22/02 , G01N29/00 , G01N29/44
CPC分类号： A61B5/7203 , A61B5/0073 , A61B5/0082 , A61B6/5247 , A61B8/15 , A61B8/5207 , A61B10/0041 , G01N21/4795 , G06T11/006
摘要： PROBLEM TO BE SOLVED: To provide a biological measurement apparatus and an image formation method that can form an image which is as uniform as possible by suppressing differences in spatial resolution and noise characteristic with positions in a region to be measured.SOLUTION: A biological measurement apparatus 10 includes a light irradiation part which irradiates a region B to be measured with light, an optical detection part which detects diffused light from the region to be measured, and an arithmetic part 14 which forms a reconstructed image associated with the interior of the region to be measured. The operation part 14 forms the reconstructed image by calculating J coefficients w(J is the number of pixels of the reconstructed image) which are set by the pixels of the reconstructed image, and larger than 0 and equal to or less than 1, and performing a sequential approximation operation using an iterative expression (where (k) is an integer of 1 to N, N is the number of times of iterative operation, xis a pixel value in a (k)th iterative operation of a (j)th pixel, and dis an update quantity in the (k)th iterative operation of the (j)th pixel).
摘要翻译：解决的问题：提供一种可以通过抑制在待测区域中的位置的空间分辨率和噪声特性的差异来形成尽可能均匀的图像的生物测量装置和图像形成方法。解决方案：生物测量装置10包括用光照射待测区域B的光照射部分，检测来自待测区域的漫射光的光检测部分和形成重建的运算部分14的运算部分14。与要测量的区域的内部相关联的图像。操作部分14通过计算由重构图像的像素设置的J个系数，从而形成重构图像，并且大于0且等于或小于1，并且使用迭代表达式（其中（k）是1到N的整数）执行顺序近似运算，N是迭代操作的次数，x 是第（j）个像素的（k）次迭代运算中的像素值，d 是第（j）个像素的（k）次迭代运算中的更新量。版权所有（C）2013，JPO＆INPIT

92. 发明专利

JP2013016867A Manufacturing method of light-emitting element 有权
标题翻译：发光元件的制造方法
公开(公告)号：JP2013016867A
公开(公告)日：2013-01-24
申请号：JP2012231625
申请日：2012-10-19
申请人： Hamamatsu Photonics Kk , 浜松ホトニクス株式会社
发明人： FUKUYO FUMITSUGU , FUKUMITSU KENJI , UCHIYAMA NAOMI
IPC分类号： B23K26/38 , B28D1/22 , B28D5/00 , C03B33/02 , C03B33/033 , C03B33/07 , H01L21/301
CPC分类号： H01L21/78 , B23K26/0057 , B23K26/40 , B23K2201/40 , B23K2203/50 , B28D1/221 , B28D5/0011 , C03B33/0222 , C03B33/033 , C03B33/07 , C03B33/074 , H01L2924/01015
摘要： PROBLEM TO BE SOLVED: To cut a wafer having a group III-V compound semiconductor layer, efficiently with high accuracy.SOLUTION: The manufacturing method of a light-emitting element includes the steps for: forming a modifying region by irradiating laser light while matching a focal point to the interior of the substrate of a wafer where a semiconductor layer consisting of a group III-V compound semiconductor is laminated on the surface of a substrate; forming a cutting start point region, by the modifying region, on the inside of the laser light incident surface of the substrate by a predetermined distance along a scheduled cut line for cutting the wafer into chip-shape; and cutting the wafer along the cutting start point region.
摘要翻译：要解决的问题：以高精度有效地切割具有III-V族化合物半导体层的晶片。解决方案：发光元件的制造方法包括以下步骤：通过照射激光来形成修改区域，同时将焦点与晶片的衬底的内部匹配，其中由III族组成的半导体层 -V化合物半导体层压在基板的表面上; 通过修改区域在基板的激光入射面的内侧沿着用于将晶片切割成芯片形状的预定切割线形成预定距离的切割起点区域; 并沿切割起点区域切割晶片。版权所有（C）2013，JPO＆INPIT

93. 发明专利

JP2013011617A Spectroscopic measurement device, spectroscopic measurement method and spectroscopic measurement program 有权
标题翻译：光谱测量装置，光谱测量方法和光谱测量方案
公开(公告)号：JP2013011617A
公开(公告)日：2013-01-17
申请号：JP2012201993
申请日：2012-09-13
申请人： Hamamatsu Photonics Kk , 浜松ホトニクス株式会社
发明人： IGUCHI KAZUYA , SUZUKI KENGO
IPC分类号： G01N21/64 , G01J3/443 , G01N21/01
摘要： PROBLEM TO BE SOLVED: To provide a spectroscopic device, method and program that can be optimally used in evaluation of a luminescent material.SOLUTION: A spectroscopic measurement device 1A comprises: an integrating sphere 20 that includes an internally-located sample S, an incident aperture part 21 for allowing excitation light to enter and an output aperture part 22 for outputting measured light coming from the sample S; a spectroscopic analyzer 30 that disperses the measured light and acquires a wavelength spectrum; and a data analyzer 50. The analyzer 50 includes: a target area setting part that sets a first target area corresponding to the excitation light in the wavelength spectrum and a second target area corresponding to luminescence from the sample S; and a sample information analysis part that uses the first and second target areas to analyze the wavelength spectrum. The sample information analysis part, with respect to an excitation light spectrum, conforms an excitation light peak in a referential wavelength spectrum to the excitation light peak in the wavelength spectrum of the sample, and executes spectral substraction in the conformation state.
摘要翻译：要解决的问题：提供可以最佳地用于评估发光材料的光谱装置，方法和程序。光谱测量装置1A包括：积分球20，其包括内部定位的样品S，用于允许激发光进入的入射孔部分21和用于输出来自样品的测量光的输出孔部分22 S; 分光分析器30，其分散测量的光并获取波长谱; 分析器50包括：目标区域设置部分，其设置与波长谱中的激发光对应的第一目标区域和对应于来自样本S的发光的第二目标区域; 以及使用第一和第二目标区域来分析波长谱的样本信息分析部分。关于激发光谱的样品信息分析部件将参考波长光谱中的激发光峰值与样品的波长谱中的激发光峰值一致，并且在构象状态下执行光谱减弱。版权所有（C）2013，JPO＆INPIT

94. 发明专利

JP2013010314A Structural color development 有权
标题翻译：结构色彩发展
公开(公告)号：JP2013010314A
公开(公告)日：2013-01-17
申请号：JP2011145581
申请日：2011-06-30
申请人： Hamamatsu Photonics Kk , 浜松ホトニクス株式会社
发明人： HARA SHIGEO , YAMANAKA TAKAHIKO
IPC分类号： B32B3/30 , B32B7/02
CPC分类号： G02B5/287 , G02B1/005 , Y10T428/10 , Y10T428/16 , Y10T428/18 , Y10T428/24521 , Y10T428/24711 , Y10T428/2495 , Y10T428/249921 , Y10T428/249994 , Y10T428/261 , Y10T428/269 , Y10T428/8305
摘要： PROBLEM TO BE SOLVED: To provide a structural color development which can allow an angle range of observable structural colors to be widened and various structural colors to be observed according to an observation angle.SOLUTION: The structural color development 1 of a film-like shape has a front surface layer 10 disposed on the front surface 1a side thereof and a back surface layer 20 disposed on the back surface 1b side thereof. Each of the front surface layer 10 and the back surface layer 20 contains a block copolymer and has a micro phase-separated structure including lamellar micro domains, each of which has a wave-like shape having amplitudes in the thickness direction D1 of the structural color development 1. The maximum value of prescribed distances d1 in the micro domains 12 of the front surface layer 10 is made larger than the wavelength of a visible light range and the prescribed distances d2 in the micro domains 22 of the back surface layer 20 are made equal to or smaller than the wavelength of the visible light range.
摘要翻译：要解决的问题：提供可以使可观察到的结构颜色的角度范围变宽并且根据观察角度观察各种结构颜色的结构色彩发展。解决方案：膜状形状的结构显色1具有设置在其表面1a侧的前表面层10和设置在其背面1b侧的背面层20。前表面层10和后表面层20中的每一个都含有嵌段共聚物，并且具有微相分离结构，其包括层状微畴，每个微结构域具有在结构颜色的厚度方向D1上具有振幅的波浪形状使前表面层10的微区域12中的规定距离d1的最大值比可见光范围的波长大，背面层20的微区域22的规定距离d2成为等于或小于可见光范围的波长。版权所有（C）2013，JPO＆INPIT

95. 发明专利

JP2012242790A Sample observation method and lens holder 有权
标题翻译：样品观察方法和镜头保持器
公开(公告)号：JP2012242790A
公开(公告)日：2012-12-10
申请号：JP2011115976
申请日：2011-05-24
申请人： Hamamatsu Photonics Kk , 浜松ホトニクス株式会社
发明人： ISHIZUKA TOSHIMICHI , ARATA IKUO , KURODA TAKAHIKO
IPC分类号： G02B21/00
摘要： PROBLEM TO BE SOLVED: To provide a sample observation method using a solid immersion lens, which allows a desired position of a sample to be observed, and a lens holder holding a solid immersion lens.SOLUTION: The sample observation method for observing a sample S disposed in a recess 7 of a holding member 6 includes: a step of inserting an optical member 30 into the recess 7 and placing the optical member 30 on the sample S in a state where a contact surface 32 of the optical member 30 is projected from an aperture surface 9 of the holding member 6; a step of pressing a lens lower surface 22 of a solid immersion lens 20 onto the contact surface 32 of the optical member 30; and a step of moving the solid immersion lens 20 along the contact surface 32 of the optical member 30.
摘要翻译：要解决的问题：提供使用固体浸没透镜的样品观察方法，其允许观察样品的期望位置，以及保持固体浸没透镜的透镜架。解决方案：用于观察设置在保持构件6的凹部7中的样品S的样品观察方法包括：将光学构件30插入凹部7并将光学构件30放置在样品S上的步骤光学构件30的接触表面32从保持构件6的孔表面9突出的状态; 将固体浸没透镜20的透镜下表面22按压到光学构件30的接触表面32上的步骤; 以及沿着光学构件30的接触表面32移动固体浸没透镜20的步骤。版权所有（C）2013，JPO＆INPIT

96. 发明专利

JP2012242165A X-ray device 有权
标题翻译： X射线装置
公开(公告)号：JP2012242165A
公开(公告)日：2012-12-10
申请号：JP2011110387
申请日：2011-05-17
申请人： Hamamatsu Photonics Kk , 浜松ホトニクス株式会社
发明人： OBA AKIRA , OSUGA SHINJI , NAKANO TOMOYASU , ONODA SHINOBU
IPC分类号： G01N23/223
摘要： PROBLEM TO BE SOLVED: To provide an x-ray device capable of generating stable pulse x-rays by a simple configuration.SOLUTION: An x-ray device 1 includes an x-ray source 10, an irradiation part 20, an imaging part 30, a detection part 40, a vacuum container 50, and a control part 60. The x-ray source 10 continuously outputs x-rays. The irradiation part 20 has an input end 21 and an output end 22, and when an x-ray reaches the input end 21 along a certain specific azimuth, the x-ray can be outputted from the output terminal 22 to a sample 90. The imaging part 30 forms an image of a secondary x-ray generated from the sample 90 on a light receiving surface of the detection part 40. The detection part 40 inputs the secondary x-ray (fluorescent x-ray or scattered x-ray) generated from the sample 90 when the x-ray outputted from the output end 22 of the irradiation part 20 is applied to the sample 90, generates and accumulates an electric charge in accordance with the input of the secondary x-ray and reads out the accumulated electric charge.
摘要翻译：要解决的问题：提供能够通过简单的构造产生稳定的脉冲X射线的X射线装置。解决方案：X射线装置1包括x射线源10，照射部20，成像部30，检测部40，真空容器50和控制部60.X射线源 10个连续输出x射线。照射部20具有输入端21和输出端22，并且当X射线沿着特定的方位到达输入端21时，x射线可以从输出端22输出到样本90。成像部分30在检测部分40的光接收表面上形成从样本90产生的次级x射线的图像。检测部分40输入产生的次级x射线（荧光X射线或散射的x射线）当从照射部20的输出端22输出的x射线被施加到样本90时，从样本90产生并根据次级X射线的输入累积电荷，并且读出积累的电收费。版权所有（C）2013，JPO＆INPIT

97. 发明专利

JP2012242157A Device for inspecting semiconductor sample 有权
标题翻译：用于检查半导体样品的器件
公开(公告)号：JP2012242157A
公开(公告)日：2012-12-10
申请号：JP2011110329
申请日：2011-05-17
申请人： Hamamatsu Photonics Kk , 浜松ホトニクス株式会社
发明人： NAKAJIMA YUJI , IWAKI YOSHITAKE
IPC分类号： G01R31/302
摘要： PROBLEM TO BE SOLVED: To provide a device for inspecting a semiconductor sample capable of surely suppressing generation of noise due to fluctuation in a potential difference between ground of the semiconductor sample and ground of an electrical characteristics measuring means even when the fluctuation in the potential difference occurs.SOLUTION: A device IE1 for inspecting a semiconductor sample includes: a constant voltage source 9 which applies a constant voltage to the semiconductor sample S; an electrical characteristic measurement part 11 which measures electrical characteristics of the semiconductor sample S; and a reverse phase adder 33 in which a signal inputted into the electrical characteristic measurement part 11 is added to a reversed potential difference between ground of the semiconductor sample S (sample ground G1) connected to an external power supply device 41 and ground of the constant voltage source 9 (detection circuit ground G2).
摘要翻译：要解决的问题：提供一种用于检查半导体样品的装置，其能够确保抑制由于半导体样品的接地与电特性测量装置的接地之间的电位差的波动而产生的噪声，即使当波动电位差发生。解决方案：用于检查半导体样品的器件IE1包括：向半导体样品S施加恒定电压的恒压源9; 测量半导体样品S的电特性的电特性测量部11; 反相相位加法器33将输入到电特性测量部11的信号与连接到外部电源装置41的半导体样品S（取样接地G1）的接地之间的反向电位差加上恒定的接地电压源9（检测电路接地G2）。版权所有（C）2013，JPO＆INPIT

98. 发明专利

JP2012242117A Spectral device 审中-公开
标题翻译：光谱设备
公开(公告)号：JP2012242117A
公开(公告)日：2012-12-10
申请号：JP2011109426
申请日：2011-05-16
申请人： Hamamatsu Photonics Kk , 浜松ホトニクス株式会社
发明人： USHIZU GIYOUSEI , KATO HISAYOSHI
IPC分类号： G01J3/36 , G01J3/26
摘要： PROBLEM TO BE SOLVED: To simplify the positional adjustment of an optical member of a spectral device.SOLUTION: A spectral device 1 comprises: a spectral part 5 comprising a plurality of dichroic mirrors DMdisposed therein, each having a different wavelength band characteristic from others; a wavelength selection part 25 comprising a plurality of band pass filters BPFprovided as opposing the respective dichroic mirrors DM; a photomultiplier tube 2 comprising a photoelectric surface 7, a plurality of channels Cprovided correspondingly to the respective band pass filters BPF, and a plurality of anodes 14; and a holding part 50 that holds the wavelength selection part 25 in a housing. The holding part 50 comprises a main body part 51 in which the band pass filters BPFare arrayed in one direction, and a pair of wall parts 52 and 52 that protrude from the main body part 51 as opposing each other. The dichroic mirrors DMare arrayed between the pair of wall parts 52 and 52 along the array direction of the band pass filters BPF.
摘要翻译：要解决的问题：为了简化光谱器件的光学部件的位置调整。解决方案：光谱设备1包括：光谱部分5，其包括设置在其中的多个分色镜DM，其中每个分色镜具有与其他不同的波长带特征; 波长选择部分25包括与相应的分色镜DM相对的多个带通滤波器BPF k SB; 光电倍增管2包括光电表面7，与相应带通滤波器BPF k 相应设置的多个通道C m < ，和多个阳极14; 以及将波长选择部25保持在壳体内的保持部50。保持部50包括在一个方向上排列带通滤波器BPF k 的主体部51，以及从主体突出的一对壁部52,52 身体部分51彼此相对。分色镜DM n 沿着带通滤波器BPF k 。版权所有（C）2013，JPO＆INPIT

99. 发明专利

JP2012229306A Ultraviolet light-generating target, electron-beam-excited ultraviolet light source, and method for producing ultraviolet light-generating target 有权
标题翻译：超紫外线发光靶，电子束激光紫外光源，以及生产超紫外线发光靶的方法
公开(公告)号：JP2012229306A
公开(公告)日：2012-11-22
申请号：JP2011097260
申请日：2011-04-25
申请人： Hamamatsu Photonics Kk , 浜松ホトニクス株式会社
发明人： HONDA CHIKANORI , FUKUYO FUMITSUGU , SUZUKI TAKASHI , ICHIKAWA NORIO , HATTORI TSUYOAKI , KAWAI KOJI , SO JUSEI
IPC分类号： C09K11/80
CPC分类号： F21K2/00 , C09K11/7766 , H01J63/04 , H01J63/06
摘要： PROBLEM TO BE SOLVED: To provide: an ultraviolet light-generating target that can increase ultraviolet light generation efficiency; an electron-beam-excited ultraviolet light source; and a method for producing the ultraviolet light-generating target.SOLUTION: An ultraviolet light-generating target 20 is provided with: a substrate 21 comprising sapphire, quartz, or rock crystal; and a Pr:LuAG polycrystalline film 22 that is provided on the substrate 21 and that generates ultraviolet light by receiving an electron beam. It is possible to significantly increase ultraviolet light generation efficiency compared to when using a Pr:LuAG monocrystalline film by means of using Pr:LuAG polycrystals as the target.

100. 发明专利

JP2012223451A Device and method for measuring concentration 有权
标题翻译：用于测量浓度的装置和方法
公开(公告)号：JP2012223451A
公开(公告)日：2012-11-15
申请号：JP2011095318
申请日：2011-04-21
申请人： St Marianna Univ School Of Medicine , Hamamatsu Photonics Kk , 学校法人聖マリアンナ医科大学 , 浜松ホトニクス株式会社
发明人： KOYAMA YASUAKI , OZAKI TAKEO , SUZUKI SUSUMU
IPC分类号： A61B5/1455
CPC分类号： A61B5/14551 , A61B5/0261 , A61B5/0295 , A61B5/14535 , A61B5/14546 , A61B5/1455 , A61B5/14553 , A61B5/6814 , A61B5/72 , A61B5/742 , A61H31/005 , A61H2201/5092 , A61H2230/201 , A61H2230/208
摘要： PROBLEM TO BE SOLVED: To provide a concentration measurement device and method for objectively determining whether or not chest compression is appropriately executed.SOLUTION: The concentration measurement device 1 determines the amount of temporal and relative changes (ΔcHb, ΔOHb) in total hemoglobin concentration and/or oxygenated hemoglobin concentration in the head, due to repeated chest compressions. The concentration measurement device 1 includes: a light-input unit 21 that inputs measurement light to the head; a light-detection unit 22 that detects the measurement light propagated through the head, and generates a detection signal corresponding to the intensity of the measurement light; and a CPU 14 that determines the amount of relative changes (ΔcHb, ΔOHb) on the basis of the detection signal, and removes frequency components having frequencies lower than a predetermined frequency out of frequency components included in the amount of relative changes (ΔcHb, ΔOHb) through a filtering process.
摘要翻译：要解决的问题：提供一种用于客观地确定是否适当地执行胸部按压的浓度测量装置和方法。解决方案：浓度测量装置1确定头部中总血红蛋白浓度和/或氧合血红蛋白浓度的时间和相对变化量（ΔcHb，ΔO 2 Hb），由于胸部按压反复。集中测量装置1包括：将测量光输入到头部的光输入单元21; 光检测单元22，其检测通过头部传播的测量光，并产生与测量光的强度对应的检测信号; 以及基于检测信号确定相对变化量（ΔcHb，ΔO 2 Hb）的CPU14，并且去除具有低于预定频率的频率的频率分量通过滤波处理，包括在相对变化量（ΔcHb，ΔO 2 Hb）中的频率分量。版权所有（C）2013，JPO＆INPIT

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