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1. 发明公开

EP4425042A1 STAGE LAMP HAVING LIGHT PARAMETER MEASUREMENT FUNCTION 审中-公开
公开(公告)号：EP4425042A1
公开(公告)日：2024-09-04
申请号：EP22928136.5
申请日：2022-07-26
申请人： Guangzhou Haoyang Electronic Co., Ltd.
发明人： JIANG, Weikai
IPC分类号： F21S10/00 , F21V33/00 , G01M11/02
CPC分类号： F21W2131/40620130101 , F21Y2115/1020160801 , F21S10/00 , F21V33/00 , G01M11/02
摘要： The present invention discloses a stage light fixture with an optical parameter detection function, which includes a light head, a supporting arm and a case. A light source for generating a light path, a light guiding member for guiding light to deviate from the light path, and an optical parameter detector are provided in the light head. The light guiding member can be freely switched into/out of the light path via a driving mechanism. The optical parameter detector can receive and detect the light guided out by the light guiding member. According to the present invention, the light guiding member can be switched into the light path to guide the light to the optical parameter detector for detection, only when the stage light fixture is started to work, or detection is performed at an interval between operations of the stage light fixture, while the light guiding member is switched out of the light path when the stage light fixture is in operation. Therefore, the light guiding member will not affect the projection effect of light beams. In addition, at least part of the light of the light source is firstly guided out by the light guiding member, and is then detected by the optical parameter detector, rather than directly putting the optical parameter detector into the light path, which thus can avoid a cable connected to the optical parameter detector from damage caused by heat under irradiation of strong light of the light source, which will result in a short circuit.

2. 发明公开

EP4419866A1 PROCÉDÉ DE CARACTÉRISATION FONCTIONNELLE D'OBJECTIFS OPTIQUES 审中-公开
公开(公告)号：EP4419866A1
公开(公告)日：2024-08-28
申请号：EP22808730.0
申请日：2022-10-21
申请人： Fogale Nanotech
发明人： LEGROS, Eric , PETITGRAND, Sylvain
IPC分类号： G01B11/24 , G01M11/02
CPC分类号： G01M11/0271 , G01B11/2441 , G01B9/0209

3. 发明授权

EP3295145B1 APPARATUS, SYSTEM AND METHOD OF DETERMINING ONE OR MORE OPTICAL PARAMETERS OF A LENS 有权
公开(公告)号：EP3295145B1
公开(公告)日：2024-08-21
申请号：EP16792277.2
申请日：2016-05-10
IPC分类号： G01M11/02 , G02C7/00 , A61B3/02 , G02C7/02 , G02C13/00 , G06T7/00
CPC分类号： G01M11/0221 , G01M11/0264 , G01M11/0235

4. 发明公开

EP4402450A1 METHOD AND APPARATUS FOR QUALITY CONTROL OF OPHTHALMIC LENSES 审中-公开
公开(公告)号：EP4402450A1
公开(公告)日：2024-07-24
申请号：EP22790450.5
申请日：2022-09-15
申请人： Schneider GmbH & Co. KG
发明人： GERRATH, Torsten , BUCHENAUER, Helwig
IPC分类号： G01M11/02 , G01B11/25
CPC分类号： G01M11/0257 , G01M11/0264 , G01M11/0278

5. 发明公开

EP4377631A1 METHODS AND SYSTEMS FOR VALIDATING PARALLELISM BETWEEN INTERNAL FACETS 审中-实审
公开(公告)号：EP4377631A1
公开(公告)日：2024-06-05
申请号：EP22848825.0
申请日：2022-07-26
申请人： Lumus Ltd.
发明人： GELBERG, Jonathan , SHARLIN, Elad , RONEN, Eitan
IPC分类号： G01B11/26 , G01N21/01 , G02B26/08 , G02B27/00 , G01M11/02
CPC分类号： G01B11/272 , G02B26/0883

6. 发明授权

EP3764159B1 PORTABLE OPTIC METROLOGY THERMAL CHAMBER MODULE AND METHOD THEREFOR 有权
公开(公告)号：EP3764159B1
公开(公告)日：2024-06-05
申请号：EP20155009.2
申请日：2020-01-31
IPC分类号： G03B43/00 , G01M11/02 , G02F1/01
CPC分类号： G02F1/0147 , G01M11/02 , G03B43/00

7. 发明公开

EP4363795A1 KALIBRIERNORMAL ZUR MESSUNG DES WINKELS ZWISCHEN EINER OPTISCHEN ACHSE EINES AUTOKOLLIMATORS UND EINER MECHANISCHEN LINEARACHSE 审中-实审
公开(公告)号：EP4363795A1
公开(公告)日：2024-05-08
申请号：EP22735432.1
申请日：2022-06-27
申请人： Trioptics GmbH
发明人： HEINISCH, Josef
IPC分类号： G01B11/27 , G01B21/04 , G01M11/02
CPC分类号： G01B11/272 , G01B21/042 , G01M11/0221

8. 发明公开

EP4350440A1 METHODS AND SYSTEM FOR DETERMINING ABERRATIONS OF A PROJECTION SYSTEM 审中-公开
公开(公告)号：EP4350440A1
公开(公告)日：2024-04-10
申请号：EP22199929.5
申请日：2022-10-06
申请人： ASML Netherlands B.V.
发明人： GEELEN, Paul, Jean, Maurice
IPC分类号： G03F7/20 , G01M11/02 , G01B9/02098 , G01J9/02 , G01M11/00
摘要： Methods, and corresponding systems for, determining one or more aberrations of a projection system (for example a projection system of a lithographic apparatus) are disclosed. One method comprises performing a phase stepping or phase scanning process using a first patterning device (at object level) that comprises a specular diffraction grating. Also disclosed is a calibration method for determining calibration data which characterizes any differences between: aberrations of a projection system determined using a diffusive grating at object level and aberrations of a projection system determined using a specular grating at object level.

9. 发明公开

EP4350316A1 OPTICAL FIBER TEST METHOD AND OPTICAL FIBER WINDING DEVICE 审中-实审
公开(公告)号：EP4350316A1
公开(公告)日：2024-04-10
申请号：EP21944065.8
申请日：2021-05-31
申请人： Nippon Telegraph And Telephone Corporation
发明人： YAMADA, Yusuke , KIKUCHI, Masashi , SAKURAI, Akira , TETSUTANI, Shigekatsu , TANIOKA, Hiroaki
IPC分类号： G01M11/02 , G02B6/00
摘要： An object of the present invention is to provide an optical fiber testing method and an optical fiber winding device capable of appropriately reproducing the same lateral pressure and minute bending state in a test of an optical fiber as those in an optical cable.
In the optical fiber testing method according to the present invention, an optical fiber 51-2 of the second layer wound around a bobbin 12 is used as an object to be tested. Lateral pressure to the optical fiber 51-2 of the second layer is applied by an optical fiber 51-3 of the third layer. The lateral pressure is adjusted by a tension when the optical fiber 51-3 of the third layer is wound around the bobbin. In other words, since the lateral pressure is applied to the optical fiber to be tested from another optical fiber, the same lateral pressure and minute bending state as those in the optical cable can be reproduced.

10. 发明授权

EP3921598B8 POSITIONING SYSTEM FOR POSITIONING AN OBJECT 有权转让
公开(公告)号：EP3921598B8
公开(公告)日：2024-03-20
申请号：EP20704370.4
申请日：2020-02-07
发明人： HENSELMANS, Rens
IPC分类号： G01B21/04 , G01M11/02 , G01B5/008 , G01B7/008 , G01B11/00 , G01B5/00

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